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"Two-Pattern ∆IDDQ Test for Recycled IC Detection."

Prattay Chowdhury et al. (2019)

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DOI: 10.1109/VLSID.2019.00033

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-14

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  - https://dblp.org/rec/conf/vlsid/ChowdhuryGSA19
Prattay Chowdhury, Ujjwal Guin, Adit D. Singh, Vishwani D. Agrawal:
Two-Pattern ∆IDDQ Test for Recycled IC Detection. VLSID 2019: 82-87

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