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"Dynamic voltage scaling for SEU-tolerance in low-power memories."

Seokjoong Kim, Matthew R. Guthaus (2012)

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DOI: 10.1109/VLSI-SOC.2012.6379031

access: closed

type: Conference or Workshop Paper

metadata version: 2022-09-06

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Seokjoong Kim, Matthew R. Guthaus:
Dynamic voltage scaling for SEU-tolerance in low-power memories. VLSI-SoC 2012: 207-212

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