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Liviu Militaru
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2020 – today
- 2022
- [c2]Camille Laguna
, Mathieu Bernard, Julien Garrione, Niccolo Castellani, Valentina Meli, S. Martin, François Aussenac, D. Rouchon, N. Rochat, Emmanuel Nolot, Guillaume Bourgeois, Marie Claire Cyrille, Liviu Militaru, A. Souifi, François Andrieu, Gabriele Navarro
Multilayer Structure in SeAsGeSi-based OTS for High Thermal Stability and Reliability Enhancement. ESSDERC 2022: 225-228 - 2021
- [c1]Camille Laguna
Multilayer OTS Selectors Engineering for High Temperature Stability, Scalability and High Endurance. IMW 2021: 1-4
2010 – 2019
- 2017
- [j7]Slah Hlali
Effect of interface traps for ultra-thin high-k gate dielectric based MIS devices on the capacitance-voltage characteristics. Microelectron. Reliab. 75: 154-161 (2017) - 2015
- [j6]Inga Zbierska, Liviu Militaru, Françis Calmon, Sylvain Feruglio
Electrical characterization and TCAD simulations of multi-gate bulk nMOSFET. Microelectron. J. 46(7): 588-592 (2015) - 2011
- [j5]W. Hourani, B. Gautier, Liviu Militaru, D. Albertini, A. Descamps-Mandine, R. Arinero:
Influence of the surrounding ambient on the reliability of the electrical characterization of thin oxide layers using an atomic force microscope. Microelectron. Reliab. 51(12): 2097-2101 (2011)
2000 – 2009
- 2007
- [j4]Nabil Sghaier
Analysis of slow traps centres in submicron MOSFETs by random telegraph signal technique. Microelectron. J. 38(4-5): 610-614 (2007) - [j3]T. Nguyen, C. Busseret, Liviu Militaru, A. Poncet, D. Aimé, Nicolas Baboux, Carole Plossu:
Parameters extraction of hafnium based gate oxide capacitors. Microelectron. Reliab. 47(4-5): 729-732 (2007) - 2006
- [j2]Nabil Sghaier
Static and low-frequency noise characterization in submicron MOSFETs for memories cells applications. Microelectron. J. 37(11): 1399-1403 (2006) - 2001
- [j1]Liviu Militaru, A. Souifi, M. Mouis, Alain Chantre, G. Brémond:
Investigation of deep traps in silicon-germanium epitaxial base bipolar transistors with a single polysilicon quasi self-aligned architecture. Microelectron. Reliab. 41(2): 253-263 (2001)
Coauthor Index
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