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Virginia H. Brecher

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1990 – 1999

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1997
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Paul B. Chou, A. Ravishankar Rao, Martin C. Sturzenbecker, Frederick Y. Wu, Virginia H. Brecher:
Automatic defect classification for semiconductor manufacturing. Mach. Vis. Appl. 9(4): 201-214 (1997)
1995
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Byron Dom, Virginia H. Brecher:
Recent advances in the automatic inspection of integrated circuits for pattern defects. Mach. Vis. Appl. 8(1): 5-19 (1995)

1980 – 1989

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1988
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Byron Dom, Virginia H. Brecher, Raymond Bonner, John S. Batchelder, Robert S. Jaffe:
The P300: A system for automatic patterned wafer inspection. Mach. Vis. Appl. 1(4): 205-221 (1988)
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Byron Dom, Virginia H. Brecher, Raymond Bonner, John S. Batchelder, Robert S. Jaffe:
Errata. Mach. Vis. Appl. 2(1): 65 (1988)

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