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Elyse Rosenbaum
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2020 – today
- 2024
- [c32]Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum:
Reduced RC Time Constant High Voltage Tolerant Supply Clamp for ESD Protection in 16nm FinFET Technology. IRPS 2024: 1-7 - [c31]Matthew Drallmeier, Yujie Zhou, Elyse Rosenbaum:
On-Chip Single-Shot Pulse Generator for TDDB Characterization on a Sub-Nanosecond Timescale. IRPS 2024: 8 - 2023
- [c30]Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum:
Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology. IRPS 2023: 1-7 - [c29]Weiman Yan, Ernest Wu, Alexander G. Schwing, Elyse Rosenbaum:
Semantic Autoencoder for Modeling BEOL and MOL Dielectric Lifetime Distributions. IRPS 2023: 1-9 - [c28]Yujie Zhou, David LaFonteese, Elyse Rosenbaum:
Collector Engineering of ESD PNP in BCD Technologies. IRPS 2023: 1-6 - 2022
- [c27]Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum:
A High Voltage Tolerant Supply Clamp for ESD Protection in a 45-nm SOI Technology. IRPS 2022: 5 - [c26]Alan Yang, Jie Xiong, Maxim Raginsky, Elyse Rosenbaum:
Input-to-State Stable Neural Ordinary Differential Equations with Applications to Transient Modeling of Circuits. L4DC 2022: 663-675 - [i2]Alan Yang, Jie Xiong, Maxim Raginsky, Elyse Rosenbaum:
Input-to-State Stable Neural Ordinary Differential Equations with Applications to Transient Modeling of Circuits. CoRR abs/2202.06453 (2022) - 2021
- [c25]Shudong Huang, Elyse Rosenbaum:
Compact Model of ESD Diode Suitable for Subnanosecond Switching Transients. IRPS 2021: 1-7 - [c24]Milan Shah, Yujie Zhou, David LaFonteese, Elyse Rosenbaum:
Considerations in High Voltage Lateral ESD PNP Design. IRPS 2021: 1-10 - [c23]Jie Xiong, Alan Yang, Maxim Raginsky, Elyse Rosenbaum:
Neural Networks for Transient Modeling of Circuits : Invited Paper. MLCAD 2021: 1-7 - 2020
- [j18]Yang Xiu
, Elyse Rosenbaum
Analysis and Design of Integrated Voltage Regulators for Supply Noise Rejection During System-Level ESD. IEEE Trans. Circuits Syst. 67-I(12): 4199-4210 (2020) - [c22]Alex Ayling
Sub-nanosecond Reverse Recovery Measurement for ESD Devices. IRPS 2020: 1-8 - [c21]Artsiom Balakir, Alan Yang, Elyse Rosenbaum:
An Interpretable Predictive Model for Early Detection of Hardware Failure. IRPS 2020: 1-5 - [c20]Alan Yang, AmirEmad Ghassami, Maxim Raginsky, Negar Kiyavash, Elyse Rosenbaum:
Model-Augmented Conditional Mutual Information Estimation for Feature Selection. UAI 2020: 1139-1148
2010 – 2019
- 2019
- [c19]Keven Feng, Sandeep Vora, Rui Jiang, Elyse Rosenbaum, Shobha Vasudevan:
Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors. DATE 2019: 156-161 - [i1]Alan Yang, AmirEmad Ghassami, Maxim Raginsky, Negar Kiyavash, Elyse Rosenbaum:
Model-Augmented Nearest-Neighbor Estimation of Conditional Mutual Information for Feature Selection. CoRR abs/1911.04628 (2019) - 2018
- [c18]Yang Xiu, Samuel Sagan, Advika Battini, Xiao Ma, Maxim Raginsky, Elyse Rosenbaum:
Stochastic modeling of air electrostatic discharge parameters. IRPS 2018: 2 - 2016
- [j17]Kuo-Hsuan Meng, Zaichen Chen, Elyse Rosenbaum:
Compact distributed multi-finger MOSFET model for circuit-level ESD simulation. Microelectron. Reliab. 63: 11-21 (2016) - [j16]Kuo-Hsuan Meng, Vrashank Shukla, Elyse Rosenbaum:
Full-Component Modeling and Simulation of Charged Device Model ESD. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(7): 1105-1113 (2016) - [j15]Yingyan Lin
A Study of BER-Optimal ADC-Based Receiver for Serial Links. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(5): 693-704 (2016) - 2015
- [c17]Zaichen Chen, Robert Mertens, Collin Reiman, Elyse Rosenbaum:
Improved GGSCR layout for overshoot reduction. IRPS 2015: 3 - 2012
- [c16]Adam C. Faust, Rajan Narasimha, Karan S. Bhatia, Ankit Srivastava, Chhay Kong, Hyeon-Min Bae, Elyse Rosenbaum, Naresh R. Shanbhag:
FEC-based 4 Gb/s backplane transceiver in 90nm CMOS. CICC 2012: 1-4 - 2011
- [c15]Elyse Rosenbaum, Vrashank Shukla, Min-Sun Keel:
ESD protection networks for 3D integrated circuits. 3DIC 2011: 1-7 - [c14]Nicholas Olson, Nathan Jack, Vrashank Shukla, Elyse Rosenbaum:
CDM-ESD induced damage in components using stacked-die packaging. CICC 2011: 1-4
2000 – 2009
- 2009
- [j14]Farzan Farbiz, Elyse Rosenbaum:
A new compact model for external latchup. Microelectron. Reliab. 49(12): 1447-1454 (2009) - [c13]Elyse Rosenbaum, Hyeon-Min Bae, Karan S. Bhatia, Adam C. Faust:
Moving signals on and off chip. CICC 2009: 585-592 - 2008
- [c12]Kelvin K. Hsueh, Sin-Hao Ke, Jeffrey Lee, Elyse Rosenbaum:
UVeriESD: An ESD verification tool for SoC design. APCCAS 2008: 53-56 - 2007
- [j13]Karan S. Bhatia, Sami Hyvonen, Elyse Rosenbaum:
A Compact, ESD-Protected, SiGe BiCMOS LNA for Ultra-Wideband Applications. IEEE J. Solid State Circuits 42(5): 1121-1130 (2007) - 2006
- [j12]Hongmei Li, Cole E. Zemke, Giorgos Manetas, Vladimir I. Okhmatovski
An automated and efficient substrate noise analysis tool. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(3): 454-468 (2006) - [j11]Junjun Li, Sopan Joshi, Ryan Barnes, Elyse Rosenbaum:
Compact modeling of on-chip ESD protection devices using Verilog-A. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(6): 1047-1063 (2006) - [c11]Karan S. Bhatia, Sami Hyvonen, Elyse Rosenbaum:
An 8-mW, ESD-protected, CMOS LNA for Ultra-Wideband Applications. CICC 2006: 385-388 - 2005
- [j10]Sami Hyvonen, Sopan Joshi, Elyse Rosenbaum:
Comprehensive ESD protection for RF inputs. Microelectron. Reliab. 45(2): 245-254 (2005) - [c10]Elyse Rosenbaum, Sami Hyvonen:
On-chip ESD protection for RF I/Os: devices, circuits and models. ISCAS (2) 2005: 1202-1205 - 2004
- [j9]Rouwaida Kanj, Elyse Rosenbaum:
Critical evaluation of SOI design guidelines. IEEE Trans. Very Large Scale Integr. Syst. 12(9): 885-894 (2004) - [c9]Rouwaida Kanj, Timothy Lehner, Bhavna Agrawal, Elyse Rosenbaum:
Noise characterization of static CMOS gates. DAC 2004: 888-893 - 2003
- [j8]Sopan Joshi, Elyse Rosenbaum:
Simulator-independent compact modeling of vertical npn transistors for ESD and RF circuit simulation. Microelectron. Reliab. 43(7): 1021-1027 (2003) - [c8]Junjun Li, Sopan Joshi, Elyse Rosenbaum:
A Verilog-A compact model for ESD protection NMOSTs. CICC 2003: 253-256 - 2002
- [c7]Hongmei Li, Jorge Carballido, Harry H. Yu, Vladimir I. Okhmatovski
Comprehensive frequency-dependent substrate noise analysis using boundary element methods. ICCAD 2002: 2-9 - [c6]Rouwaida Kanj, Elyse Rosenbaum:
A critical look at design guidelines for SOI logic gates. ISCAS (3) 2002: 261-264 - 2001
- [j7]Elyse Rosenbaum, Jie Wu:
Trap generation and breakdown processes in very thin gate oxides. Microelectron. Reliab. 41(5): 625-632 (2001) - [j6]Jie Wu, Patrick Juliano, Elyse Rosenbaum:
Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions. Microelectron. Reliab. 41(11): 1771-1779 (2001) - [j5]Yu Wang, Patrick Juliano, Sopan Joshi, Elyse Rosenbaum:
Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits. Microelectron. Reliab. 41(11): 1781-1787 (2001) - 2000
- [j4]Danqing Chen, Erhong Li, Elyse Rosenbaum, Sung-Mo Kang:
Interconnect thermal modeling for accurate simulation of circuittiming and reliability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(2): 197-205 (2000)
1990 – 1999
- 1999
- [c5]Tong Li, Ching-Han Tsai, Elyse Rosenbaum, Sung-Mo Kang:
Substrate Modeling and Lumped Substrate Resistance Extraction for CMOS ESD/Latchup Circuit Simulation. DAC 1999: 549-554 - [c4]Danqing Chen, Erhong Li, Elyse Rosenbaum, Sung-Mo Kang:
Interconnect thermal modeling for determining design limits on current density. ISPD 1999: 172-178 - 1998
- [j3]Yi-Kan Cheng, Prasun Raha, Chin-Chi Teng, Elyse Rosenbaum, Sung-Mo Kang:
ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(8): 668-681 (1998) - 1997
- [j2]Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang:
iTEM: a temperature-dependent electromigration reliability diagnosis tool. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(8): 882-893 (1997) - 1996
- [c3]Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang:
iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips. DAC 1996: 548-551 - [c2]Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang:
Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects. DAC 1996: 752-757 - [c1]Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang:
ETS-A: A New Electrothermal Simulator for CMOS VLSI Circuits. ED&TC 1996: 566-570 - 1993
- [j1]Robert H. Tu, Elyse Rosenbaum, Wilson Y. Chan, Chester C. Li, Eric R. Minami, Khandker N. Quader, Ping K. Ko, Chenming Hu:
Berkeley reliability tools-BERT. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(10): 1524-1534 (1993)
Coauthor Index
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last updated on 2024-10-07 21:24 CEST by the dblp team
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