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A. Krishnamoorthy
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2020 – today
- 2024
- [j7]Karumbathil Rasmi, Machuveettil Joseph Jacob, Alexander Rumyanstev, A. Krishnamoorthy:
On a Queueing-Inventory Model with Age-Based Selling of Items to Distinct Priority Groups. Oper. Res. Forum 5(4): 82 (2024) - 2023
- [c2]M. Shamanna, E. Abuayob, G. Aenuganti, C. Alvares, J. Antony, A. Bahudhanam, A. Chandran, P. Chew, A. Chatterjee, B. Chauhan, N. Dandeti, J. Desai, M. Doyle, T. Dmukauskas, P. Farache, E. Fetzer, K. Fischer, P. Hack, Y. Greenzweig, John Giacobbe, Walid M. Hafez, E. Haralson, A. Hegde, A. Illa, M. Islam, S. Jain, M. Jang, J. Nguyen, T. Tong, L. Jiang, Eric Karl, P. Kalangi, G. Khoo, A. Krishnamoorthy, B. Kuns, W. Li, R. Livengood, T. Malik, R. Priyanka, H. Faraby, Y. Maymon, K. Mistry, K. Morgan, S. Natarajan, O. Nevo, M. Oh, P. Pardy, J. Park, P. Penmatsa, Boyd Phelps, C. Peterson, S. Rajappa, A. Raveh, A Rezaie, T. Ravishankar, R. Ramaswamy, S. Reddy, R. Saha, S. Sen, R. Sanchez, R. Sanaga, B. Simkhovich, Bernhard Sell, M. Senger, B. Schnarch, M. Seshadri, O. Sidorov, S. Subramanian, K. Subramanian, B. Truong, S. Bangalore, Jeffery Hicks, S. Venkatesh, D. Christensen, K. Bhargav, M. Von Haartman, P. Joshi, S. Zickel, C.-H. Lin, J. Huening, T.-H. Wu, N. Bakken, A. Afzal, A. Raman, Sj. Rao, V. Kawar, J. Neirynck, D. Bradley, M. Duwe, S. Wu, V. Patil, M. Bayoumy:
E-Core Implementation in Intel 4 with PowerVia (Backside Power) Technology. VLSI Technology and Circuits 2023: 1-2 - 2022
- [j6]Shankha Shubhra Sarkar, Anindya Sen, A. Krishnamoorthy, V. Vijayarajan:
Route Planning Service for Emergency Vehicles with Increased Accuracy and Efficiency for Online Platforms. SN Comput. Sci. 3(5): 400 (2022)
2010 – 2019
- 2012
- [j5]S. Prakash, K. Palanikumar, A. Krishnamoorthy:
Thrust force evaluation in drilling medium density fibre (MDF) panels using design of experiments. Int. J. Manuf. Technol. Manag. 25(1/2/3): 95-112 (2012)
2000 – 2009
- 2005
- [j4]A. Krishnamoorthy, Achilleas Anastasopoulos:
Code and receiver design for the noncoherent fast-fading channel. IEEE J. Sel. Areas Commun. 23(9): 1769-1778 (2005) - [j3]Ramana Murthy, Y. W. Chen, A. Krishnamoorthy, X. T. Chen:
SiLKTM etch optimization and electrical characterization for 0.13 mum interconnects. Microelectron. Reliab. 45(3-4): 507-516 (2005) - [j2]C. F. Tsang, C. K. Chang, A. Krishnamoorthy, K. Y. Ee, Y. J. Su, H. Y. Li, W. H. Li, L. Y. Wong:
A study of post-etch wet clean on electrical and reliability performance of Cu/low k interconnections. Microelectron. Reliab. 45(3-4): 517-525 (2005) - 2004
- [j1]C. F. Tsang, C. Y. Li, A. Krishnamoorthy, Y. J. Su, H. Y. Li, L. Y. Wong, W. H. Li, L. J. Tang, K. Y. Ee:
Impact of barrier deposition process on electrical and reliability performance of Cu/CVD low k SiOCH metallization. Microelectron. J. 35(9): 693-700 (2004)
1990 – 1999
- 1995
- [c1]Mike Simone, A. Essen, A. Ike, A. Krishnamoorthy, Tak Maruyama, Niteen Patkar, M. Ramaswami, Michael Shebanow, V. Thirumalaiswamy, DeForest Tovey:
Implementation Trade-Offs in Using a Restricted Data Flow Architecture in a High Performance RISC Microprocessor. ISCA 1995: 151-162
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