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Jinju Kim
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2020 – today
- 2023
- [c6]SungMan Rhee, Hyunjin Kim, Sangku Park, Taiki Uemura, Yuchul Hwang, Seungjin Choo, Jinju Kim, Hwasung Rhee, Shin-Young Chung:
Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk. IRPS 2023: 1-4 - 2022
- [j3]Neta Yodovich, Jinju Kim:
Exploring the Feminization of Backseat Gaming Through Girlfriend Reviews YouTube Channel. Games Cult. 17(5): 795-815 (2022) - [c5]Seonglim Lee, Jaehye Suk, Jinsook Kim, Jinu Jung, Jinju Kim:
Do ICT Competence in and ICT Service Use Affect Life Satisfaction? Focusing on Mobile ICT Services. HCI (48) 2022: 156-163 - 2021
- [j2]Myonghwa Park, Linh Bui Khanh, Miri Jeong, Eun Jeong Choi, Nayoung Lee, Minjung Kwak, Jahyeon Kim, Jinju Kim, Jihye Jung, Thi-Thanh-Tinh Giap, Hyunjeong Guk, Junsik Na:
ICT-based person-centered community care platform (IPC3P) to enhance shared decision-making for integrated health and social care services. Int. J. Medical Informatics 156: 104590 (2021) - [c4]Hai Jiang, Jinju Kim, Kihyun Choi, Hyewon Shim, Hyunchul Sagong, Junekyun Park, Hwasung Rhee, Euncheol Lee:
Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction. IRPS 2021: 1-6 - 2020
- [c3]Hai Jiang, Hyun-Chul Sagong, Jinju Kim, Hyewon Shim, Yoohwan Kim, Junekyun Park, Taiki Uemura, Yongsung Ji, Taeyoung Jeong, Dongkyun Kwon, Hwasung Rhee, Sangwoo Pae, Brandon Lee:
Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology. IRPS 2020: 1-5
2010 – 2019
- 2019
- [c2]Hai Jiang, Hyun-Chul Sagong, Jinju Kim, Junekyun Park, Sangchul Shin, Sangwoo Pae:
Localized Layout Effect Related Reliability Approach in 8nm FinFETs Technology: From Transistor to Circuit. IRPS 2019: 1-5 - 2018
- [j1]Minjung Jin, Kangjung Kim, Yoohwan Kim, Hyewon Shim, Jinju Kim, Gunrae Kim, Sangwoo Pae:
Investigation of BTI characteristics and its behavior on 10 nm SRAM with high-k/metal gate FinFET technology having multi-VT gate stack. Microelectron. Reliab. 81: 201-209 (2018) - [c1]Hyunjin Kim, Minjung Jin, Hyun-Chul Sagong, Jinju Kim, Ukjin Jung, Minhyuck Choi, Junekyun Park, Sangchul Shin, Sangwoo Pae:
A systematic study of gate dielectric TDDB in FinFET technology. IRPS 2018: 4
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