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5th Asian Test Symposium 1996: Hsinchu, Taiwan
- 5th Asian Test Symposium (ATS '96), November 20-22, 1996, Hsinchu, Taiwan. IEEE Computer Society 1996, ISBN 0-8186-7478-4
Keynote Speech
- Sudhakar M. Reddy:
"Challenges in Testing". 2
Test Pattern Generation
- Vishwani D. Agrawal, Michael L. Bushnell, Qing Lin:
Redundancy Identification Using Transitive Closure. 4-9 - Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen:
Invalid State Identification for Sequential Circuit Test Generation. 10-15 - Irith Pomeranz, Sudhakar M. Reddy:
On Test Generation for Interconnected Finite-State Machines: The Input Sequence Propagation Problem. 16-21 - Dirk Stroobandt, Jan Van Campenhout
:
Hierarchical Test Generation with Built-In Fault Diagnosis. 22-28 - J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor:
Circuit Partitioned Automatic Test Pattern Generation Constrained by Three-State Buses and Restrictors. 29-33 - Michael Nicolaidis, Rubin A. Parekhji, M. Boudjit:
E-Groups: A New Technique for Fast Backward Propagation in System Level Test Generation. 34-41 - Y.-M. Hur, J.-H. Shin, K.-H. Lee, Y.-S. Son, I.-C. Lim, Y.-H. Kim:
Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing. 42-
Board and System-Level Test
- Wuudiann Ke:
Hybrid Pin Control Using Boundary-Scan And Its Applications. 44-49 - Jin-Hua Hong, Chung-Hung Tsai, Cheng-Wen Wu:
Hierarchical Testing Using the IEEE Std 1149.5 Module Test and Maintenance Slave Interface Module. 50-55 - Po-Ching Hsu, Sying-Jyan Wang:
Testing And Diagnosis Of Board Interconnects In Microprocessor-Based Systems. 56-61 - Chauchin Su, Shyh-Shen Hwang, Shyh-Jye Jou, Yuan-Tzu Ting:
Syndrome Simulation And Syndrome Test For Unscanned Interconnects. 62-67 - Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara:
A Test Methodology for Interconnect Structures of LUT-based FPGAs. 68-74 - Wang-Dauh Tseng, Kuochen Wang:
Testable Design and Testing of MCMs Based on Multifrequency Scan. 75-
Design for Testability
- Yoshihiro Konno, Kazushi Nakamura, Tatsushige Bitoh, Koji Saga, Seiken Yano:
A Consistent Scan Design System for Large-Scale ASICs. 82-87 - Toshinori Hosokawa, Kenichi Kawaguchi, Mitsuyasu Ohta, Michiaki Muraoka:
A Design for testability Method Using RTL Partitioning. 88-93 - Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita:
Partially Parallel Scan Chain for Test Length Reduction by Using Retiming Technique. 94-99 - Kuen-Jong Lee, Jing-Jou Tang, Tsung-Chu Huang, Cheng-Liang Tsai:
Combination Of Automatic Test Pattern Generation And Built-In Intermediate Voltage Sensing For Detecting CMOS Bridging Faults. 100-
Concurrent Error Detection and Fault Tolerance
- Naotake Kamiura, Yutaka Hata, Kazuharu Yamato:
On Design of Fail-Safe Cellular Arrays. 107-112 - Yoon-Hwa Choi, Pong-Gyou Lee:
Concurrent Error Detection and Fault Location in a Fast ATM Switch. 113-118 - Kazuo Kawakubo, Koji Tanaka, Hiromi Hiraishi:
Formal Verification Of Self-Testing Properties Of Combinational Circuits. 119-122 - Yupin Luo, Shiyuan Yang, Dongcheng Hu:
Constructing an Edge-Route Guaranteed Optimal Fault-Tolerant Routing for Biconnected Graphs. 123-
Synthesis for Testability
- Tomoo Inoue, Toshimitsu Masuzawa, Hiroshi Youra, Hideo Fujiwara:
An Approach To The Synthesis Of Synchronizable Finite State Machines With Partial Scan. 130-135 - Zhuxing Zhao, Zhongcheng Li, Yinghua Min:
Waveform Polynomial Manipulation Using Bdds. 136-141 - Li-Ren Huang, Jing-Yang Jou, Sy-Yen Kuo, Wen-Bin Liao:
Easily Testable Data Path Allocation Using Input/Output Registers. 142- - Harry Hengster, Rolf Drechsler, Bernd Becker, Stefan Eckrich, Tonja Pfeiffer:
AND/EXOR based Synthesis of Testable KFDD-Circuits with Small Depth. 148- - Uwe Sparmann, Holger Müller, Sudhakar M. Reddy:
Minimal Delay Test Sets for Unate Gate Networks. 155-
IDDQ and Fault Modeling
- Kuen-Jong Lee, Jing-Jou Tang:
Two Modeling Techniques For CMOS Circuits To Enhance Test Generation And Fault Simulation For Bridging Faults. 165-171 - Toshimasa Kuchii, Masaki Hashizume, Takeomi Tamesada:
Algorithmic Test Generation for Supply Current Testing of TTL Combinational Circuits. 171-176 - Hisashi Kondo, Kwang-Ting Cheng:
An Efficient Compact Test Generator for IDDQ Testing. 177-182 - Ad J. van de Goor, Georgi Gaydadjiev
Realistic Linked Memory Cell Array Faults. 183-188 - Teruhiko Yamada, Tsuyoshi Sasaki:
On Current Testing of Josephson Logic Circuits Using the 4JL Gate Family. 189-
Keynote Speech
- Kwang-Ting Cheng:
Built-In Self Test for Analog and Mixed-Signal Designs. 197-198 - Li-Ren Huang, Jing-Yang Jou, Sy-Yen Kuo:
An Efficient PRPG Strategy By Utilizing Essential Faults. 199-204 - Saman Adham, Sanjay Gupta:
DP-BIST: A Built-In Self Test For DSP DataPaths A Low Overhead and High Fault Coverage Technique. 205-212 - Bin-Hong Lin, Shao-Hui Shieh, Cheng-Wen Wu:
A MISR Computation Algorithm for Fast Signature Simulation. 213-218 - Kowen Lai, Christos A. Papachristou:
BIST Testability Enhancement of System Level Circuits : Experience with An Industrial Design. 219-
Circuit and System-Level Diagnostics
- Irith Pomeranz, Sudhakar M. Reddy:
Low-Complexity Fault Diagnosis Under the Multiple Observation Time Testing Approach. 226-231 - Tao Wei, Mike W. T. Wong, Yim-Shu Lee:
Efficient Multifrequency Analysis of Fault Diagnosis in Analog Circuits Based on Large Change Sensitivity Computation. 232-237 - Yuan-Tzu Ting, Li Wei Chao, Wei Chung Chao:
A Practical Implementation Of Dynamic Testing Of An Ad Converter. 238-243 - Christopher P. Fuhrman
Comparison Diagnosis in Large Multiprocessor Systems. 244-
Industrial Applications
- Najmi T. Jarwala, Paul W. Rutkowski, Shianling Wu, Chi W. Yau:
Lessons Learned from Practical Applications of BIST/B-S Technology. 251-257 - Jwu E. Chen:
Yield Improvement by Test Error Cancellation. 258-262 - Vladimir Castro Alves, A. Ribeiro Antunes, Meryem Marzouki:
A Pragmatic, Systematic And Flexible Synthesis For Testability Methodology. 263-268 - Daisuke Teratani, Yoshiaki Kakuda, Tohru Kikuno:
A New Model with Time Constraints for Conformance Testing of Communication Protocols. 269-
Practical Issues
- Cheng-Ping Wang, Chin-Long Wey:
Test Generation Of Analog Switched-Current Circuits. 276-281 - Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois:
Thermal Monitoring Of Safety-Critical Integrated Systems. 282-288 - Xiaofan Yang, Tinghuai Chen, Zehan Cao, Zhongshi He, Hongqing Cao:
A New Scheme For The Fault Diagnosis Of Multiprocessor Systems. 289-294 - Serge N. Demidenko, Vincenzo Piuri:
On-Line Testing In Digital Neural Networks. 295-
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