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"Built-In Self Test for Analog and Mixed-Signal Designs."

Kwang-Ting Cheng (1996)

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DOI: 10.1109/ATS.1996.10001

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kwang-Ting Cheng:
Built-In Self Test for Analog and Mixed-Signal Designs. Asian Test Symposium 1996: 197-198

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