Nothing Special   »   [go: up one dir, main page]

CERN Accelerating science

CERN Document Server 2,050 záznamov nájdených  1 - 10ďalšíkoniec  skoč na záznam: Hľadanie trvalo 0.69 sekúnd. 
1.
Characterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing / Barbero, Mario Sacristán (CERN ; IES, Montpellier) ; Slipukhin, Ivan (CERN ; IES, Montpellier) ; Cecchetto, Matteo (CERN) ; Prelipcean, Daniel (CERN) ; Aguiar, Ygor (CERN) ; Bilko, Kacper (CERN) ; Emriskova, Natalia (CERN) ; Waets, Andreas (CERN) ; Coronetti, Andrea (CERN) ; Kastriotou, Maria (Rutherford Appleton Laboratory) et al.
Ultrahigh-energy (UHE) (>5 GeV/n) heavy ion beams exhibit different properties when compared to standard and high-energy ion beams. Most notably, fragmentation is a fundamental feature of the beam that may have important implications for electronics testing given the ultrahigh energies and, hence, ranges, preserved by the fragments. [...]
2024 - 8 p. - Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1557-1564
2.
Fragmented High-Energy Heavy-Ion Beams for Electronics Testing / García Alía, Rubén (CERN) ; Bilko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; Cerutti, Francesco (CERN) ; Coronetti, Andrea (CERN ; IES, Montpellier) ; Emriskova, Natalia (CERN) ; Esposito, Luigi (CERN) ; Pujol, Francesc Salvat (CERN) ; Waets, Andreas (CERN ; U. Zurich (main)) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne) ; Saigné, Frédéric (IES, Montpellier) et al.
Fragmented heavy-ion beams obtained from the interaction of highly energetic ions with thick targets relative to the ion ranges are proposed to mimic the high-penetration linear energy transfer (LET) spectrum present in space and for electronics testing. Our experimental data characterizing fragmented heavy-ion beams show an excellent level of agreement with the Monte Carlo simulations, serving as an initial proofof-concept of the proposed single-event effect (SEE) testing approach..
2023 - 10 p. - Published in : IEEE Trans. Nucl. Sci. 70 (2023) 486-495 Fulltext: PDF;
In : 2022 IEEE Nuclear and Space Radiation Effects Conference, Provo, Utah, USA, 18 - 23 Jul 2022, pp.486-495
3.
Heavy Ion Energy Deposition and SEE Intercomparison Within the RADNEXT Irradiation Facility Network / García Alía, Rubén (CERN) ; Coronetti, Andrea ; Bilko, Kacper ; Cecchetto, Matteo ; Datzmann, Gerd ; Fiore, Salvatore ; Girard, Sylvain
RADNEXT is an EU-funded network of irradiation facilities and radiation effects’ experts aimed at increasing the quantity and quality of user access to accelerator infrastructure and improving the diversity and harmonization across facilities. Along with beam provision to worldwide radiation effects’ users, RADNEXT has an ambitious research program oriented at improving radiation effects’ testing, of which an example of a heavy ion facility intercomparison at very different energy regimes is included in this work. [...]
2023 - 10 p. - Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1596-1605
4.
Longitudinal Direct Ionization Impact of Heavy Ions on See Testing for Ultrahigh Energies / Wyrwoll, Vanessa (CERN) ; Alia, Rubén García (CERN) ; Røed, Ketil (Oslo U.) ; Cazzaniga, Carlo (Rutherford) ; Kastriotou, Maria (CERN) ; Fernández-Martínez, Pablo (CERN) ; Coronetti, Andrea (CERN) ; Cerutti, Francesco (CERN)
Ultrahigh-energy (UHE) heavy ions show various advantages at testing single-event effect (SEE) in modern technologies, due to their highly penetrating nature. However, the intercepting material in the beam line contributes to the modification of the beam structure by generation of fragments produced via nuclear interactions. [...]
2020 - 10 p. - Published in : IEEE Trans. Nucl. Sci. 67 (2020) 1530-1539 Fulltext from publisher: PDF;
5.
The CELESTA CubeSat In-Flight Radiation Measurements and Their Comparison With Ground Facilities Predictions / Coronetti, Andrea (CERN) ; Zimmaro, Alessandro (CERN) ; Alía, Rubén García (CERN) ; Danzeca, Salvatore (CERN) ; Masi, Alessandro (CERN) ; Slipukhin, Ivan (CERN) ; Amodio, Alessio (CERN) ; Dijks, Jasper (CERN) ; Peronnard, Paul (CERN) ; Secondo, Raffaello (CERN) et al.
The CELESTA CubeSat has employed radiation monitors developed by the Conseil Européen pour la Recherche Nucléaire (CERN) Centre, used for measuring the radiation environment at accelerators, to measure the space radiation field in a medium-Earth orbit (MEO). The technology is based on three static random-access memories (SRAMs) that are sensitive to single-event upsets (SEUs) and single-event latchups (SELs). [...]
2024 - 8 p. - Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1623-1630
6.
Assessment of the Quirónsalud Proton Therapy Centre Accelerator for Single Event Effects Testing / Coronetti, Andrea (CERN) ; Emriskova, Natalia (CERN) ; Alía, Rubén García (CERN) ; Sanchez, Juan Antonio Vera ; Mazal, Alejandro
High-energy proton testing is used for single-event effect (SEE) qualification of electronics employed in several radiation-harsh environments. Given the increasing demand, exploiting the capabilities of proton therapy centers for electronics testing may become desirable. [...]
2024 - 9 p. - Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1571-1579
7.
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random-Access Memory / Bosser, A L (Jyvaskyla U. ; LIRMM, Montpellier) ; Gupta, V (LIRMM, Montpellier ; Caltech, Pasadena (main)) ; Javanainen, A (Jyvaskyla U. ; Vanderbilt U. (main)) ; Tsiligiannis, G (CERN) ; La Lumondiere, S D (Aerospace Corp.) ; Brewe, D (Argonne (main)) ; Ferlet-Cavrois, V (ESTEC, Noordwijk) ; Puchner, H (Cypress Semiconductor, San Jose) ; Kettunen, H (Jyvaskyla U.) ; Gil, T (LIRMM, Montpellier) et al.
This paper identifies the failure modes of a commercial 130-nm ferroelectric random access memory. The devices were irradiated with heavy-ion and pulsed focused X-ray beams. [...]
2018 - 7 p. - Published in : 10.1109/TNS.2018.2797543
In : Conference on Radiation and its Effects on Components and Systems, CERN, Geneva, Switzerland, 2 - 6 Oct 2017
8.
Ultraenergetic Heavy-Ion Beams in the CERN Accelerator Complex for Radiation Effects Testing / Alía, Rubén García (CERN) ; Fernández Martínez, Pablo (CERN) ; Kastriotou, Maria (CERN) ; Brugger, Markus (CERN) ; Bernhard, Johannes (CERN) ; Cecchetto, Matteo (CERN) ; Cerutti, Francesco (CERN) ; Charitonidis, Nikolaos (CERN) ; Danzeca, Salvatore (CERN) ; Gatignon, Lau (CERN) et al.
Traditional heavy-ion testing for single-event effects is carried out in cyclotron facilities with energies around 10 MeV/n. Despite their capability of providing a broad range of linear energy transfer (LET) values, the main limitations are related to the need of testing in a vacuum and with the sensitive region of the components accessible to the low range ions. [...]
2019 - 8 p. - Published in : IEEE Trans. Nucl. Sci. 66 (2019) 458-465 Fulltext: PDF;
9.
Very-High-Energy Heavy Ion Beam Dosimetry Using Solid State Detectors for Electronics Testing / Waets, Andreas (CERN ; Zurich U.) ; Bilko, Kacper (CERN) ; Coronetti, Andrea (CERN) ; Emriskova, Natalia (CERN) ; Sacristan Barbero, Mario (CERN) ; García Alía, Rubén (CERN) ; Durante, Marco (Darmstadt, GSI) ; Schuy, Christoph (Darmstadt, GSI) ; Wagner, Tim (Darmstadt, GSI) ; Esposito, Luigi Salvatore (CERN) et al.
Very-high-energy (VHE), heavy ions are of particular interest for single event effects (SEEs) testing due to their combination of high linear energy transfer (LET) and high penetration within electronics components. The dosimetry of such beams poses an important challenge for facilities aiming to provide VHE ions for radiation effects testing. [...]
2024 - 9 p. - Published in : IEEE Trans. Nucl. Sci. 71 (2024) 1837-1845
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1837-1845
10.
Proton Direct Ionization Upsets at Tens of MeV / Coronetti, Andrea (CERN ; IES, Montpellier) ; García Alía, Rubén (CERN) ; Lucsanyi, David (CERN) ; Wang, Jialei (Leuven U.) ; Saigné, Frédéric (IES, Montpellier) ; Javanainen, Arto (Jyvaskyla U. ; Vanderbilt U. (main)) ; Leroux, Paul (Leuven U.) ; Prinzie, Jeffrey (Leuven U.)
Experimental monoenergetic proton single-event upset (SEU) cross sections of a 65-nm low core-voltage static random access memory (SRAM) were found to be exceptionally high not only at low energies (< 3 MeV), but also at energies $>$ 3 MeV and extending up to tens of MeV. The SEU cross Section from 20-MeV protons exceeds the 200-MeV proton SEU cross Section by almost a factor of 3. [...]
2023 - 8 p. - Published in : IEEE Trans. Nucl. Sci. 70 (2023) 314-321 Fulltext: PDF;
In : 2022 IEEE Nuclear and Space Radiation Effects Conference, Provo, Utah, USA, 18 - 23 Jul 2022, pp.314-321

Nenašli ste čo ste hľadali? Skúste Vašu otázku na iných serveroch:
recid:2913173 v Amazon
recid:2913173 v CERN EDMS
recid:2913173 v CERN Intranet
recid:2913173 v CiteSeer
recid:2913173 v Google Books
recid:2913173 v Google Scholar
recid:2913173 v Google Web
recid:2913173 v IEC
recid:2913173 v IHS
recid:2913173 v INSPIRE
recid:2913173 v ISO
recid:2913173 v KISS Books/Journals
recid:2913173 v KISS Preprints
recid:2913173 v NEBIS
recid:2913173 v SLAC Library Catalog