1.
|
An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons
/ Wrobel, Frédéric (IES, Montpellier) ; Aguiar, Ygor (CERN) ; Marques, Cleiton (IES, Montpellier) ; Lerner, Giuseppe (CERN) ; Alía, Rubén García (CERN) ; Saigné, Frédéric (IES, Montpellier) ; Boch, Jérôme (IES, Montpellier)
In the atmosphere, it is generally understood that neutrons are the main contributor to the soft error rate (SER) in electronic devices. These particles are indeed able to trigger nuclear reactions in the sensitive regions of the devices, leading to secondary ions that may ionize the matter sufficiently to upset a memory cell or induce a transient signal, known as soft errors. [...]
2022 - 12 p.
- Published in : Electronics 12 (2022) 104
Fulltext: PDF;
|
|
2.
|
An Analysis of the Significance of the 14N(n, p) 14C Reaction for Single-Event Upsets Induced by Thermal Neutrons in SRAMs
/ Coronetti, Andrea (CERN ; Montpellier U.) ; García Alía, Rubén (CERN) ; Lucsanyi, David (CERN) ; Letiche, Manon (Laue-Langevin Inst.) ; Kastriotou, Maria ; Cazzaniga, Carlo ; Frost, Christopher D ; Saigné, Frédéric (Montpellier U.)
The thermal neutron threat to the reliability of electronic devices caused by $^{10}\text{B}$ capture is a recognized issue that prompted changes in the manufacturing process of electronic devices with the aim of limiting as much as possible the presence of this isotope nearby device sensitive volumes (SVs). $^{14}\text{N}$ can also capture thermal neutrons and release low-energy protons (LEPs; through the $^{14}\text{N}$ (n, p) $^{14}\text{C}$ reaction) that have high enough linear energy transfer (LET) to cause single-event upsets (SEUs). [...]
2023 - 9 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1634-1642
|
|
3.
|
Proton Direct Ionization Upsets at Tens of MeV
/ Coronetti, Andrea (CERN ; IES, Montpellier) ; García Alía, Rubén (CERN) ; Lucsanyi, David (CERN) ; Wang, Jialei (Leuven U.) ; Saigné, Frédéric (IES, Montpellier) ; Javanainen, Arto (Jyvaskyla U. ; Vanderbilt U. (main)) ; Leroux, Paul (Leuven U.) ; Prinzie, Jeffrey (Leuven U.)
Experimental monoenergetic proton single-event upset (SEU) cross sections of a 65-nm low core-voltage static random access memory (SRAM) were found to be exceptionally high not only at low energies (< 3 MeV), but also at energies $>$ 3 MeV and extending up to tens of MeV. The SEU cross Section from 20-MeV protons exceeds the 200-MeV proton SEU cross Section by almost a factor of 3. [...]
2023 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 70 (2023) 314-321
Fulltext: PDF;
In : 2022 IEEE Nuclear and Space Radiation Effects Conference, Provo, Utah, USA, 18 - 23 Jul 2022, pp.314-321
|
|
4.
|
|
5.
|
Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring
/ Slipukhin, Ivan (CERN) ; Coronetti, Andrea (CERN) ; Alía, Rubén García (CERN) ; Saigné, Frédéric (IES, Montpellier) ; Boch, Jérôme (IES, Montpellier) ; Dilillo, Luigi (IES, Montpellier) ; Aguiar, Ygor Q (CERN) ; Cazzaniga, Carlo ; Kastriotou, Maria ; Dodd, Torran
System-level testing of electronics is an affordable method of assessment of the performance of complete electronic systems designed for applications in the radiation environment. Compared to component-level testing, system-level test offers a much smaller degree of observability about the performance of particular system elements. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1948-1955
|
|
6.
|
SEE Flux and Spectral Hardness Calibration of Neutron Spallation and Mixed-Field Facilities
/ Cecchetto, Matteo (CERN) ; Fernández-Martínez, Pablo (CERN) ; García Alía, Rubén (CERN) ; Ferraro, Rudy (CERN) ; Danzeca, Salvatore (CERN) ; Wrobel, Frédéric (IES, Montpellier) ; Cazzaniga, Carlo (Daresbury) ; Frost, Christopher D (Daresbury)
The approach of calibrating neutron environments through well-known Single Event Upset (SEU)-based SRAM memories is applied to a neutron spallation and mixed-field facility. Implications on the Soft Error Rate (SER) induced by intermediate energy neutrons are evaluated comparing operational environments, such as ground level and accelerator shielded areas, with those reproducible by facilities. [...]
2019 - 9 p.
- Published in : IEEE Trans. Nucl. Sci. 66 (2019) 1532-1540
In : Conference on Radiation and its Effects on Components and Systems, Gothenburg, Sweden, 16 - 21 Sep 2018, pp.1532-1540
|
|
7.
|
|
|
Impact of flux selection, pulsed beams and operation mode on system failure observability during radiation qualification
/ Zimmaro, Alessandro (CERN ; IES, Montpellier) ; Ferraro, Rudy (CERN) ; Boch, Jérôme (IES, Montpellier) ; Saigné, Frédéric (IES, Montpellier) ; García Alía, Rubén (CERN) ; Masi, Alessandro (CERN) ; Danzeca, Salvatore (CERN)
Systems and Systems on Chip (SoCs) under radiation can have complex failure modes with different probabilities. [...]
2022. - 8 p.
|
|
8.
|
Fragmented High-Energy Heavy-Ion Beams for Electronics Testing
/ García Alía, Rubén (CERN) ; Bilko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; Cerutti, Francesco (CERN) ; Coronetti, Andrea (CERN ; IES, Montpellier) ; Emriskova, Natalia (CERN) ; Esposito, Luigi (CERN) ; Pujol, Francesc Salvat (CERN) ; Waets, Andreas (CERN ; U. Zurich (main)) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne) ; Saigné, Frédéric (IES, Montpellier) et al.
Fragmented heavy-ion beams obtained from the
interaction of highly energetic ions with thick targets relative
to the ion ranges are proposed to mimic the high-penetration
linear energy transfer (LET) spectrum present in space and
for electronics testing. Our experimental data characterizing
fragmented heavy-ion beams show an excellent level of agreement
with the Monte Carlo simulations, serving as an initial proofof-concept of the proposed single-event effect (SEE) testing
approach..
2023 - 10 p.
- Published in : IEEE Trans. Nucl. Sci. 70 (2023) 486-495
Fulltext: PDF;
In : 2022 IEEE Nuclear and Space Radiation Effects Conference, Provo, Utah, USA, 18 - 23 Jul 2022, pp.486-495
|
|
9.
|
Characterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing
/ Barbero, Mario Sacristán (CERN ; IES, Montpellier) ; Slipukhin, Ivan (CERN ; IES, Montpellier) ; Cecchetto, Matteo (CERN) ; Prelipcean, Daniel (CERN) ; Aguiar, Ygor (CERN) ; Bilko, Kacper (CERN) ; Emriskova, Natalia (CERN) ; Waets, Andreas (CERN) ; Coronetti, Andrea (CERN) ; Kastriotou, Maria (Rutherford Appleton Laboratory) et al.
Ultrahigh-energy (UHE) (>5 GeV/n) heavy ion beams exhibit different properties when compared to standard and high-energy ion beams. Most notably, fragmentation is a fundamental feature of the beam that may have important implications for electronics testing given the ultrahigh energies and, hence, ranges, preserved by the fragments. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1557-1564
|
|
10.
|
Radiation Effects on Deep Submicrometer SRAM-based FPGAs under the CERN Mixed-Field Radiation Environment
/ Tsiligiannis, G (CERN) ; Danzeca, S (CERN) ; Garcia-Alia, R (CERN) ; Infantino, A (CERN) ; Lesea, A (Xilinx, San Jose) ; Brugger, M (CERN) ; Masi, A (CERN) ; Gilardoni, S (CERN) ; Saigné, F (IES, Montpellier)
In this paper, the single-event effects on a 28-nm static random access memory-based field-programmable gate array (FPGA) under CERN’s mixed-particle field are analyzed. The methodology followed for CERN electronics radiation hard- ness assurance and the particularities of testing an FPGA under a mixed-particle field are demonstrated. [...]
2018 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 65 (2018) 1511-1518
|
|