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Time resolution and power consumption of a monolithic silicon pixel prototype in SiGe BiCMOS technology
/ Paolozzi, L. (Geneva U.) ; Cardarelli, R. (INFN, Rome2) ; Débieux, S. (Geneva U.) ; Favre, Y. (Geneva U.) ; Ferrère, D. (Geneva U.) ; Gonzalez-Sevilla, S. (Geneva U.) ; Iacobucci, G. (Geneva U.) ; Kaynak, M. (IHP, Frankfurt) ; Martinelli, F. (CERN ; Ecole Polytechnique, Lausanne) ; Nessi, M. (CERN) et al.
SiGe BiCMOS technology can be used to produce ultra-fast, low-power silicon pixel sensors that provide state-of-the-art time resolution even without an internal gain mechanism. The development of such sensors requires the identification of the main factors that may degrade the timing performance and the characterisation of the dependance of the sensor time resolution on the amplifier power consumption. [...]
arXiv:2005.14161.-
2020-11-13 - 12 p.
- Published in : JINST 15 (2020) P11025
Fulltext: PDF; Fulltext from publisher: PDF;
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2.
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Efficiency and time resolution of monolithic silicon pixel detectors in SiGe BiCMOS technology
/ Iacobucci, G. (Geneva U.) ; Paolozzi, L. (Geneva U.) ; Valerio, P. (Geneva U.) ; Moretti, T. (Geneva U.) ; Cadoux, F. (Geneva U.) ; Cardarelli, R. (Geneva U.) ; Cardella, R. (Geneva U.) ; Débieux, S. (Geneva U.) ; Favre, Y. (Geneva U.) ; Ferrere, D. (Geneva U.) et al.
A monolithic silicon pixel detector prototype has been produced in the SiGe BiCMOS SG13G2 130 nm node technology by IHP. The ASIC contains a matrix of hexagonal pixels with pitch of approximately 100 $\mu$m. [...]
arXiv:2112.08999.-
2022-02-10 - 17 p.
- Published in : JINST 17 (2022) P02019
Fulltext: 2112.08999 - PDF; document - PDF;
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3.
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Testbeam Results of the Picosecond Avalanche Detector Proof-Of-Concept Prototype
/ Iacobucci, G. (Geneva U.) ; Zambito, S. (Geneva U.) ; Milanesio, M. (Geneva U.) ; Moretti, T. (Geneva U.) ; Saidi, J. (Geneva U.) ; Paolozzi, L. (Geneva U. ; CERN) ; Munker, M. (Geneva U.) ; Cardella, R. (Geneva U.) ; Martinelli, F. (Geneva U.) ; Picardi, A. (Geneva U. ; CERN) et al.
The proof-of-concept prototype of the Picosecond Avalanche Detector, a multi-PN junction monolithic silicon detector with continuous gain layer deep in the sensor depleted region, was tested with a beam of 180 GeV pions at the CERN SPS. The prototype features low noise and fast SiGe BiCMOS frontend electronics and hexagonal pixels with 100 μm pitch. [...]
arXiv:2208.11019.-
2022-10-25 - 22 p.
- Published in : JINST 17 (2022) P10040
Fulltext: document - PDF; 2208.11019 - PDF;
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4.
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Picosecond Avalanche Detector — working principle and gain measurement with a proof-of-concept prototype
/ Paolozzi, L. (Geneva U. ; CERN) ; Munker, M. (Geneva U.) ; Cardella, R. (Geneva U.) ; Milanesio, M. (Geneva U.) ; Gurimskaya, Y. (Geneva U.) ; Martinelli, F. (Geneva U.) ; Picardi, A. (Geneva U. ; CERN) ; Rücker, H. (IHP, Frankfurt) ; Trusch, A. (IHP, Frankfurt) ; Valerio, P. (Geneva U.) et al.
The Picosecond Avalanche Detector is a multi-junction silicon pixel detector based on a $\mathrm{(NP)_{drift}(NP)_{gain}}$ structure, devised to enable charged-particle tracking with high spatial resolution and picosecond time-stamp capability. It uses a continuous junction deep inside the sensor volume to amplify the primary charge produced by ionizing radiation in a thin absorption layer. [...]
arXiv:2206.07952.-
2022-10-20 - 15 p.
- Published in : JINST 17 (2022) P10032
Fulltext: 2206.07952 - PDF; Publication - PDF;
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5.
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A 50 ps resolution monolithic active pixel sensor without internal gain in SiGe BiCMOS technology
/ Iacobucci, Giuseppe (Geneva U.) ; Cardarelli, R. (INFN, Rome2) ; Débieux, S. (Geneva U.) ; Di Bello, F.A. (Geneva U.) ; Favre, Y. (Geneva U.) ; Hayakawa, D. (Geneva U.) ; Kaynak, M. (IHP, Frankfurt) ; Nessi, M. (Geneva U. ; CERN) ; Paolozzi, L. (Geneva U.) ; Rücker, H. (IHP, Frankfurt) et al.
A monolithic pixelated silicon detector designed for high time resolution has been produced in the SG13G2 130 nm SiGe BiCMOS technology of IHP Mikroelektronik. This proof-of-concept chip contains hexagonal pixels of 65 {\mu}m and 130 {\mu}m side. [...]
arXiv:1908.09709.-
2019-11-06 - 10 p.
- Published in : JINST 14 (2019) P11008
Fulltext: fulltext1751067 - PDF; 1908.09709 - PDF; Fulltext from Publisher: PDF;
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6.
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Time resolution of a SiGe BiCMOS monolithic silicon pixel detector without internal gain layer with a femtosecond laser
/ Milanesio, M. (Geneva U.) ; Paolozzi, L. (Geneva U. ; CERN) ; Moretti, T. (Geneva U.) ; Latshaw, A. (Geneva U.) ; Bonacina, L. (Geneva U.) ; Cardella, R. (Geneva U.) ; Kugathasan, T. (Geneva U.) ; Picardi, A. (Geneva U. ; CERN) ; Elviretti, M. (IHP, Frankfurt) ; Rücker, H. (IHP, Frankfurt) et al.
The time resolution of the second monolithic silicon pixel prototype produced for the MONOLITH H2020 ERC Advanced project was studied using a femtosecond laser. The ASIC contains a matrix of hexagonal pixels with 100 μm pitch, readout by low-noise and very fast SiGe HBT frontend electronics. [...]
arXiv:2401.01229.-
2024-04-24 - 11 p.
- Published in : JINST 19 (2024) P04029
Fulltext: 2401.01229 - PDF; Publication - PDF;
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7.
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Testbeam results of irradiated SiGe BiCMOS monolithic silicon pixel detector without internal gain layer
/ Moretti, T. (Geneva U.) ; Milanesio, M. (Geneva U.) ; Cardella, R. (Geneva U.) ; Kugathasan, T. (Geneva U.) ; Picardi, A. (Geneva U. ; CERN) ; Semendyaev, I. (Geneva U.) ; Elviretti, M. (IHP, Frankfurt) ; Rücker, H. (IHP, Frankfurt) ; Nakamura, K. (KEK, Tsukuba) ; Takubo, Y. (KEK, Tsukuba) et al.
Samples of the monolithic silicon pixel ASIC prototype produced in 2022 within the framework of the Horizon 2020 MONOLITH ERC Advanced project were irradiated with 70 MeV protons up to a fluence of 1 x 1016 neq/cm2, and then tested using a beam of 120 GeV/c pions. The ASIC contains a matrix of 100 μ m pitch hexagonal pixels, readout out by low noise and very fast frontend electronics produced in a 130 nm SiGe BiCMOS technology process. [...]
arXiv:2404.12885.-
2024-07-29 - 15 p.
- Published in : JINST 19 (2024) P07036
Fulltext: 2404.12885 - PDF; Publication - PDF;
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8.
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Radiation tolerance of SiGe BiCMOS monolithic silicon pixel detectors without internal gain layer
/ Milanesio, M. (Geneva U.) ; Paolozzi, L. (Geneva U. ; CERN) ; Moretti, T. (Geneva U.) ; Cardella, R. (Geneva U.) ; Kugathasan, T. (Geneva U.) ; Martinelli, F. (Geneva U.) ; Picardi, A. (Geneva U. ; CERN) ; Semendyaev, I. (Geneva U.) ; Zambito, S. (Geneva U.) ; Nakamura, K. (KEK, Tsukuba) et al.
A monolithic silicon pixel prototype produced for the MONOLITH ERC Advanced project was irradiated with 70 MeV protons up to a fluence of 1 x 10^16 1 MeV n_eq/cm^2. The ASIC contains a matrix of hexagonal pixels with 100 μm pitch, readout by low-noise and very fast SiGe HBT frontend electronics. [...]
arXiv:2310.19398.-
2024-01-15 - 13 p.
- Published in : JINST 19 (2024) P01014
Fulltext: 2310.19398 - PDF; publication - PDF;
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9.
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20 ps time resolution with a fully-efficient monolithic silicon pixel detector without internal gain layer
/ Zambito, S. (Geneva U.) ; Milanesio, M. (Geneva U.) ; Moretti, T. (Geneva U.) ; Paolozzi, L. (Geneva U. ; CERN) ; Munker, M. (Geneva U.) ; Cardella, R. (Geneva U.) ; Kugathasan, T. (Geneva U.) ; Martinelli, F. (Geneva U.) ; Picardi, A. (Geneva U. ; CERN) ; Elviretti, M. (Leibniz U., Hannover) et al.
A second monolithic silicon pixel prototype was produced for the MONOLITH project. The ASIC contains a matrix of hexagonal pixels with 100 μm pitch, readout by a low-noise and very fast SiGe HBT frontend electronics. [...]
arXiv:2301.12244.-
2023-03-28 - 16 p.
- Published in : JINST
Fulltext: 2301.12244 - PDF; Publication - PDF;
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10.
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Measurements and analysis of different front-end configurations for monolithic SiGe BiCMOS pixel detectors for HEP applications
/ Martinelli, Fulvio (CERN ; Ecole Polytechnique, Lausanne) ; Magliocca, Chiara (Geneva U.) ; Cardella, Roberto (Geneva U.) ; Charbon, Edoardo (Ecole Polytechnique, Lausanne) ; Iacobucci, Giuseppe (Geneva U.) ; Nessi, Marzio (Geneva U. ; CERN) ; Paolozzi, Lorenzo (Geneva U. ; CERN) ; Rücker, Holger (IHP, Frankfurt) ; Valerio, Pierpaolo (Geneva U.)
This paper presents a small-area monolithic pixel detector ASIC designed in 130 nm SiGe BiCMOS technology for the upgrade of the pre-shower detector of the FASER experiment at CERN. The purpose of this prototype is to study the integration of fast front-end electronics inside the sensitive area of the pixels and to identify the configuration that could satisfy at best the specifications of the experiment. [...]
arXiv:2111.11184.-
2021-12-22 - 20 p.
- Published in : JINST 16 (2021) P12038
Fulltext: 2111.11184 - PDF; document - PDF;
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