1.
|
|
2.
|
|
3.
|
Radiation Effects on Deep Submicrometer SRAM-based FPGAs under the CERN Mixed-Field Radiation Environment
/ Tsiligiannis, G (CERN) ; Danzeca, S (CERN) ; Garcia-Alia, R (CERN) ; Infantino, A (CERN) ; Lesea, A (Xilinx, San Jose) ; Brugger, M (CERN) ; Masi, A (CERN) ; Gilardoni, S (CERN) ; Saigné, F (IES, Montpellier)
In this paper, the single-event effects on a 28-nm static random access memory-based field-programmable gate array (FPGA) under CERN’s mixed-particle field are analyzed. The methodology followed for CERN electronics radiation hard- ness assurance and the particularities of testing an FPGA under a mixed-particle field are demonstrated. [...]
2018 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 65 (2018) 1511-1518
|
|
4.
|
Electronics Irradiation With Neutrons at the NEAR Station of the n_TOF Spallation Source at CERN
/ Cecchetto, Matteo (CERN) ; Sacristan Barbero, Mario (CERN) ; Lerner, Giuseppe (CERN) ; García Alía, Rubén (CERN) ; Aguiar, Ygor (CERN) ; Senajova, Dominika (CERN) ; Garcia Infantes, Francisco (CERN) ; Pavon Rodriguez, Jose Antonio (CERN) ; Sabate Gilarte, Marta (CERN) ; Vlachoudis, Vasilis (CERN) et al.
We study the neutron field at the NEAR station of the neutron time-of-flight (n_TOF) facility at CERN, through Monte Carlo simulations, well-characterized static random access memories (SRAMs), and radio-photoluminescence (RPL) dosimeters, with the aim of providing neutrons for electronics irradiation. Particle fluxes and typical quantities relevant for electronics testing were simulated for several test positions at NEAR and compared to those at the CERN high-energy accelerator mixed-field facility (CHARM), highlighting similitudes and differences. [...]
2023 - 9 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1587-1595
|
|
5.
|
Comparison Between In-flight SEL Measurement and Ground Estimation Using Different Facilities
/ Kerboub, N (CNES, Toulouse ; CERN ; nourdine.kerboub@cern.ch) ; Alia, R G (CERN) ; Mekki, J (CNES, Toulouse) ; Bezerra, F (CNES, Toulouse) ; Monteuuis, A (CERN) ; Fernández-Martinez, P (CERN) ; Danzeca, S (CERN) ; Brugger, M (CERN) ; Standarovski, D (CNES, Toulouse) ; Rauch, J (CNES, Toulouse)
This paper describes a comparison between in-orbit single-event effects (SEE) rate measurement acquired by the CARMEN-3 experiment on-board the JASON-3 satellite (middle earth orbit, 1336 km, 66°) and an estimation using SEE rate calculation approaches from several facilities. A SRAM memory sensitive to single-event latchup (SEL) has been monitored in orbit, and the number of events per day was estimated using monoenergetic data coming from the Kernfysisch Versneller Instituut (protons) and Université Catholique de Louvain (heavy-ions) facilities as well as using mixed-field data coming from the Cern High energy AcceleRator Mixed field (CHARM) facility. [...]
2019 - 7 p.
- Published in : IEEE Trans. Nucl. Sci. 66 (2019) 1541-1547
In : Conference on Radiation and its Effects on Components and Systems, Gothenburg, Sweden, 16 - 21 Sep 2018, pp.1541-1547
|
|
6.
|
Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate
/ García Alía, Rubén (CERN) ; Tali, Maris (CERN) ; Brugger, Markus (CERN) ; Cecchetto, Matteo (CERN) ; Cerutti, Francesco (CERN) ; Cononetti, Andrea (CERN) ; Danzeca, Salvatore (CERN) ; Esposito, Luigi (CERN) ; Fernández-Martínez, Pablo (CERN) ; Gilardoni, Simone (CERN) et al.
We investigate, through measurements and simulations, the possible direct ionization impact on the accelerator soft-error rate (SER), not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the-art commercial components considered in the 65–16-nm technological range, indirect ionization is still expected to dominate the overall SER in the accelerator mixed-field. [...]
2019 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 67 (2019) 345-352
Fulltext: PDF;
|
|
7.
|
|
8.
|
Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment
/ Söderström, Daniel (Jyvaskyla U.) ; Matana Luza, Lucas (Montpellier U.) ; Kettunen, Heikki (Jyvaskyla U.) ; Javanainen, Arto (Jyvaskyla U. ; Vanderbilt U.) ; Farabolini, Wilfrid (CERN ; Saclay) ; Gilardi, Antonio (CERN ; Naples U. ; INFN Naples) ; Coronetti, Andrea (Jyvaskyla U. ; CERN) ; Poivey, Christian (ESTEC, Noordwijk) ; Dilillo, Luigi (Montpellier U.)
This study investigates the response of synchronous dynamic random access memories to energetic electrons and especially the possibility of electrons to cause stuck bits in these memories. Three different memories with different node sizes (63, 72, and 110 nm) were tested. [...]
2021 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 68 (2021) 716-723
|
|
9.
|
The CELESTA CubeSat In-Flight Radiation Measurements and Their Comparison With Ground Facilities Predictions
/ Coronetti, Andrea (CERN) ; Zimmaro, Alessandro (CERN) ; Alía, Rubén García (CERN) ; Danzeca, Salvatore (CERN) ; Masi, Alessandro (CERN) ; Slipukhin, Ivan (CERN) ; Amodio, Alessio (CERN) ; Dijks, Jasper (CERN) ; Peronnard, Paul (CERN) ; Secondo, Raffaello (CERN) et al.
The CELESTA CubeSat has employed radiation monitors developed by the Conseil Européen pour la Recherche Nucléaire (CERN) Centre, used for measuring the radiation environment at accelerators, to measure the space radiation field in a medium-Earth orbit (MEO). The technology is based on three static random-access memories (SRAMs) that are sensitive to single-event upsets (SEUs) and single-event latchups (SELs). [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1623-1630
|
|
10.
|
|