Nothing Special   »   [go: up one dir, main page]

CERN Accelerating science

CERN Document Server Encontrados 13 registros  1 - 10siguiente  ir al registro: La búsqueda tardó 0.60 segundos. 
1.
Simulating Monolithic Active Pixel Sensors: A Technology-Independent Approach Using Generic Doping Profiles / Wennlöf, Håkan (DESY) ; Dannheim, Dominik (CERN) ; Viera, Manuel Del Rio (DESY ; Bonn U.) ; Dort, Katharina (CERN ; Giessen U.) ; Eckstein, Doris (DESY) ; Feindt, Finn (DESY) ; Gregor, Ingrid-Maria (DESY) ; Huth, Lennart (DESY) ; Lachnit, Stephan (DESY ; Hamburg U.) ; Mendes, Larissa (DESY ; Bonn U.) et al.
The optimisation of the sensitive region of CMOS sensors with complex non-uniform electric fields requires precise simulations, and this can be achieved by a combination of electrostatic field simulations and Monte Carlo methods. [...]
arXiv:2408.00027.
- 22.
Fulltext
2.
Performance study of ATLAS ITk strip endcap modules using charged particle beams / ATLAS Collaboration
The current Inner Detector of the ATLAS experiment is to be replaced with the all-silicon Inner Tracker (ITk), built from pixel and strip modules, to cope with high pile-up and harsh radiation environment expected during the operation of the High-Luminosity Large Hadron Collider (HL-LHC). During prototyping and early production phases of the ITk project, the performance of all types of ITk strip modules has been extensively evaluated using high-energy electron or hadron beams available at the DESY II and CERN SPS test beam facilities. [...]
ATL-ITK-SLIDE-2024-288.- Geneva : CERN, 2024 - 1 p. Fulltext: PDF; External link: Original Communication (restricted to ATLAS)
In : 42nd International Conference on High Energy Physics, Prague, Cz, 18 - 24 Jul 2024
3.
Simulations and performance studies of a MAPS in 65 nm CMOS imaging technology / Simancas, Adriana (DESY ; Bonn U.) ; Braach, Justus (CERN ; Hamburg U., Dept. Math.) ; Buschmann, Eric (CERN) ; Chauhan, Ankur (DESY) ; Dannheim, Dominik (CERN) ; Viera, Manuel Del Rio (DESY ; Bonn U.) ; Dort, Katharina (CERN ; Giessen U.) ; Eckstein, Doris (DESY) ; Feindt, Finn (DESY) ; Gregor, Ingrid-Maria (DESY) et al.
Monolithic active pixel sensors (MAPS) produced in a 65 nm CMOS imaging technology are being investigated for applications in particle physics. The MAPS design has a small collection electrode characterized by an input capacitance of ~fF, granting a high signal-to-noise ratio and low power consumption. [...]
arXiv:2402.14524.- 2024-05-03 - 5 p. - Published in : Nucl. Instrum. Methods Phys. Res., A 1064 (2024) 169414 Fulltext: 2402.14524 - PDF; Publication - PDF;
In : 13th International "Hiroshima" Symposium on the Development and Application of Semiconductor Tracking Detectors, Vancouver, Canada, 3 - 8 Dec 2023, pp.169414
4.
Towards a new generation of Monolithic Active Pixel Sensors / Chauhan, Ankur (DESY) ; Viera, Manuel Del Rio (DESY ; Bonn U.) ; Eckstein, Doris (DESY) ; Feindt, Finn (DESY) ; Gregor, Ingrid-Maria (DESY) ; Hansen, Karsten (DESY) ; Huth, Lennart (DESY) ; Mendes, Larissa (DESY ; U. Campinas) ; Mulyanto, Budi (DESY) ; Rastorguev, Daniil (DESY ; Wuppertal U.) et al.
A new generation of Monolithic Active Pixel Sensors (MAPS), produced in a 65 nm CMOS imaging process, promises higher densities of on-chip circuits and, for a given pixel size, more sophisticated in-pixel logic compared to larger feature size processes. MAPS are a cost-effective alternative to hybrid pixel sensors since flip-chip bonding is not required. [...]
arXiv:2210.09810.- 2023 - 3 p. - Published in : Nucl. Instrum. Methods Phys. Res., A 1047 (2023) 167821 Fulltext: PDF;
In : 15th Pisa Meeting on Advanced Detectors, La Biodola - Isola D'elba, Italy, 22 - 28 May 2022, pp.167821
5.
Characterization of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process / Rinella, Gianluca Aglieri (CERN) ; Alocco, Giacomo (INFN, Cagliari) ; Antonelli, Matias (INFN, Trieste) ; Baccomi, Roberto (INFN, Trieste) ; Beole, Stefania Maria (INFN, Turin) ; Blidaru, Mihail Bogdan (Heidelberg U.) ; Buttwill, Bent Benedikt (Heidelberg U.) ; Buschmann, Eric (CERN) ; Camerini, Paolo (Trieste U. ; INFN, Trieste) ; Carnesecchi, Francesca (CERN) et al.
Analogue test structures were fabricated using the Tower Partners Semiconductor Co. CMOS 65 nm ISC process. [...]
arXiv:2403.08952.- 2024-09-21 - 40 p. - Published in : Nucl. Instrum. Methods Phys. Res., A 1069 (2024) 169896 Fulltext: 2403.08952 - PDF; Publication - PDF;
6.
Developing a Monolithic Silicon Sensor in a 65nm CMOS Imaging Technology for Future Lepton Collider Vertex Detectors / Simancas, Adriana (DESY, Zeuthen ; Bonn U.) ; Braach, Justus (CERN ; Hamburg U.) ; Buschmann, Eric (CERN) ; Chauhan, Ankur (DESY, Zeuthen) ; Dannheim, Dominik (CERN) ; Viera, Manuel Del Rio (DESY, Zeuthen ; Bonn U.) ; Dort, Katharina (CERN ; Giessen U.) ; Eckstein, Doris (DESY, Zeuthen) ; Feindt, Finn (DESY, Zeuthen) ; Gregor, Ingrid-Maria (DESY, Zeuthen) et al.
Monolithic CMOS sensors in a 65 nm imaging technology are being investigated by the CERN EP Strategic R&D; Programme on Technologies for Future Experiments for an application in particle physics. The appeal of monolithic detectors lies in the fact that both sensor volume and readout electronics are integrated in the same silicon wafer, providing a reduction in production effort, costs and scattering material. [...]
arXiv:2303.18153.- 2022-11-05 - 7 p. - Published in : 10.1109/NSS/MIC44845.2022.10398964 Fulltext: PDF;
In : 2022 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector (RTSD) Conference (NSS/MIC 2022), Milan, Italy, 5 - 12 Nov 2022
7.
Comparison of different sensor thicknesses and substrate materials for the monolithic small collection-electrode technology demonstrator CLICTD / Dort, Katharina (CERN) ; Ballabriga, Rafael (CERN) ; Braach, Justus (CERN) ; Buschmann, Eric (CERN) ; Campbell, Michael (CERN) ; Dannheim, Dominik (CERN) ; Huth, Lennart (DESY) ; Kremastiotis, Iraklis (CERN) ; Kröger, Jens (CERN) ; Linssen, Lucie (CERN) et al.
Small collection-electrode monolithic CMOS sensors profit from a high signal-to-noise ratio and a small power consumption, but have a limited active sensor volume due to the fabrication process based on thin high-resistivity epitaxial layers. In this paper, the active sensor depth is investigated in the monolithic small collection-electrode technology demonstrator CLICTD. [...]
arXiv:2204.10569.- 2022-10-11 - 11 p. - Published in : Nucl. Instrum. Methods Phys. Res., A 1041 (2022) 167413 Fulltext: 1-s2.0-S0168900222007069-main - PDF; 2204.10569 - PDF;
8.
Transient Monte Carlo Simulations for the Optimisation and Characterisation of Monolithic Silicon Sensors / Ballabriga, Rafael (CERN) ; Braach, Justus (CERN) ; Buschmann, Eric (CERN) ; Campbell, Michael (CERN) ; Dannheim, Dominik (CERN) ; Dort, Katharina (CERN) ; Huth, Lennart (DESY) ; Kremastiotis, Iraklis (CERN) ; Kröger, Jens (CERN) ; Linssen, Lucie (CERN) et al.
An ever-increasing demand for high-performance silicon sensors requires complex sensor designs that are challenging to simulate and model. The combination of electrostatic finite element simulations with a transient Monte Carlo approach provides simultaneous access to precise sensor modelling and high statistics. [...]
arXiv:2202.03221.- 2022-05-11 - 16 p. - Published in : Nucl. Instrum. Methods Phys. Res., A 1031 (2022) 166491 2202.03221: PDF; Fulltext: PDF; Fulltext from publisher: PDF;
9.
Transient Monte Carlo Simulations for the Optimisation and Characterisation of Monolithic Silicon Sensors / Ballabriga Sune, Rafael (CERN) ; Braach, Justus (Hamburg University (DE)) ; Buschmann, Eric (CERN) ; Campbell, Michael (CERN) ; Dannheim, Dominik (CERN) ; Dort, Katharina (Justus-Liebig-Universitaet Giessen (DE)) ; Huth, Lennart (Deutsches Elektronen-Synchrotron (DE)) ; Kremastiotis, Iraklis (KIT - Karlsruhe Institute of Technology (DE)) ; Kroeger, Jens (Ruprecht Karls Universitaet Heidelberg (DE)) ; Linssen, Lucie (CERN) et al.
An ever-increasing demand for high-performance silicon sensors requires complex sensor designs that are challenging to simulate and model. The combination of electrostatic finite element simulations with a transient Monte Carlo approach provides simultaneous access to precise sensor modelling and high statistics. [...]
CLICdp-Pub-2021-003.- Geneva : CERN, 2021 - 16. Fulltext: PDF;
10.
Corryvreckan: A Modular 4D Track Reconstruction and Analysis Software for Test Beam Data / Dannheim, Dominik (CERN) ; Dort, Katharina (Justus-Liebig-Universitaet Giessen (DE)) ; Huth, Lennart (Deutsches Elektronen-Synchrotron (DE)) ; Hynds, Daniel (Nikhef National institute for subatomic physics (NL)) ; Kremastiotis, Iraklis (KIT - Karlsruhe Institute of Technology (DE)) ; Kroeger, Jens (Ruprecht Karls Universitaet Heidelberg (DE)) ; Munker, Magdalena (CERN) ; Pitters, Florian Michael (Austrian Academy of Sciences (AT)) ; Schütze, Paul (DESY) ; Spannagel, Simon (DESY) et al.
Corryvreckan is a versatile, highly configurable software with a modular structure designed to reconstruct and analyse test beam and laboratory data. It caters to the needs of the test beam community by providing a flexible offline event building facility to combine detectors with different read-out schemes, with or without trigger information, and includes the possibility to correlate data from multiple devices based on timestamps. [...]
arXiv:2011.12730; CLICdp-Pub-2020-005; DESY-20-210.- Geneva : CERN, 2021-03-04 - 23 p. - Published in : JINST 16 (2021) P03008 Fulltext: CLICdp-Pub-2020-005 - PDF; 2011.12730 - PDF; Fulltext from publisher: PDF;

CERN Document Server : Encontrados 13 registros   1 - 10siguiente  ir al registro:
Vea también: autores con nombres similares
6 Huth, L
5 Huth, L.
¿Le interesa recibir alertas sobre nuevos resultados de esta búsqueda?
Defina una alerta personal vía correo electrónico o subscríbase al canal RSS.
¿No ha encontrado lo que estaba buscando? Intente su búsqueda en:
Huth, Lennart en Amazon
Huth, Lennart en CERN EDMS
Huth, Lennart en CERN Intranet
Huth, Lennart en CiteSeer
Huth, Lennart en Google Books
Huth, Lennart en Google Scholar
Huth, Lennart en Google Web
Huth, Lennart en IEC
Huth, Lennart en IHS
Huth, Lennart en INSPIRE
Huth, Lennart en ISO
Huth, Lennart en KISS Books/Journals
Huth, Lennart en KISS Preprints
Huth, Lennart en NEBIS
Huth, Lennart en SLAC Library Catalog
Huth, Lennart en Scirus