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Impact of flux selection, pulsed beams and operation mode on system failure observability during radiation qualification
/ Zimmaro, Alessandro (CERN ; IES, Montpellier) ; Ferraro, Rudy (CERN) ; Boch, Jérôme (IES, Montpellier) ; Saigné, Frédéric (IES, Montpellier) ; García Alía, Rubén (CERN) ; Masi, Alessandro (CERN) ; Danzeca, Salvatore (CERN)
Systems and Systems on Chip (SoCs) under radiation can have complex failure modes with different probabilities. [...]
2022. - 8 p.
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SAMbuCa: Sensors Acquisition and Motion Control Framework at CERN
/ Masi, Alessandro (CERN) ; Andreassen, Odd (CERN) ; Arruat, Michel (CERN) ; Danzeca, Salvatore (CERN) ; Di Castro, Mario (CERN) ; Donzé, Mathieu (CERN) ; Fargier, Sylvain (CERN) ; Ferraro, Rudy (CERN) ; Gulin, Marco (CERN) ; Kozsar, Ioan (CERN) et al.
Motion control systems at CERN often have challenging requirements, such as high precision in extremely radioactive environments with millisecond synchronization. These demanding specifications are particularly relevant for Beam Intercepting Devices (BIDs) such as the collimators of the Large Hadron Collider (LHC). [...]
2023 - 8 p.
- Published in : JACoW ICALEPCS 2023 (2023) TH2BCO04
Fulltext: PDF;
In : 19th International Conference on Accelerator and Large Experimental Physics Control Systems (ICALEPCS 2023), Cape Town, South Africa, 7 - 13 Oct 2023, pp.TH2BCO04
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3.
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2023 Compendium of Radiation-Induced Effects for Candidate Particle Accelerator
/ Ferraro, Rudy (CERN) ; Gkountoumis, Panagiotis (CERN) ; Foucard, Gilles (CERN) ; Ventura, Antonio (CERN) ; Scialdone, Antonio (CERN ; Montpellier U.) ; Zimmaro, Alessandro (CERN ; Montpellier U.) ; Glecer, Bruno (CERN) ; Koseoglou, Sokratis (CERN) ; Botias, Cai Arcos (CERN) ; Masi, Alessandro (CERN) et al.
The sensitivity of a variety of components for particle accelerator electronics has been analyzed against Single Event Effects, Total Ionizing Dose and Displacement Damage. The tested parts include analog, linear, digital, and mixed devices..
2023 - 8 p.
- Published in : 10.1109/REDW61050.2023.10265814
In : 2023 IEEE Radiation Effects Data Workshop (REDW 2023): (in conjunction with 2023 NSREC), Kansas City, Missouri, United States, 24 - 28 Jul 2023
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4.
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Exploring Radiation-Induced Vulnerabilities in RFICs Through Traditional RF Metrics
/ Scialdone, Antonio (CERN ; LIRMM, Montpellier ; Montpellier U. ; CNRS, France) ; Ferraro, Rudy (cern) ; Dilillo, Luigi (LIRMM, Montpellier ; Montpellier U. ; CNRS, France) ; Saigne, Frederic (Montpellier U. ; CNRS, France) ; Boch, Jérôme (CNRS, France ; Montpellier U.) ; Masi, Alessandro (CERN) ; Danzeca, Salvatore (CERN)
This article describes how to analyze radiation-induced effects using traditional radio-frequency (RF) metrics in RF integrated circuits (RFICs) to be used in the implementation of software-defined radios (SDRs). The impacts of total ionizing dose (TID) and single-event effects (SEEs) on the device characteristics are shown and their consequences for an SDR are discussed. [...]
2023 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.2068-2075
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General Purpose and Neural Network Approach for Benchmarking Microcontrollers Under Radiation
/ Giordano, Marco (Zurich, ETH ; CERN) ; Ferraro, Rudy (CERN) ; Magno, Michele (Zurich, ETH) ; Danzeca, Salvatore (CERN)
In this work a testing methodology for micro-controllers exposed to radiation is proposed. General purpose benchmarks are reviewed to provide a mean of testing all the macro-areas of a microcontroller, and a neural network benchmark is introduced as a representative class of novel computing algorithms for IoT devices. [...]
2021 - 8 p.
- Published in : 10.1109/RADECS53308.2021.9954496
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2021), Vienna, Austria, 13 - 17 Sep 2021, pp.1-8
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Testing and Validation Methodology for a Radiation Monitoring System for Electronics in Particle Accelerators
/ Zimmaro, Alessandro (CERN ; IES, Montpellier) ; Ferraro, Rudy (CERN) ; Boch, Jerome (IES, Montpellier) ; Saigne, Frederic (IES, Montpellier) ; Garcia Alia, Ruben (CERN) ; Brucoli, Matteo (CERN) ; Masi, Alessandro (CERN) ; Danzeca, Salvatore (CERN)
In this work, a methodology for the design and validation of a radiation monitoring (RadMON) system for electronic systems in particle accelerators is presented. The methodology expands the common radiation hardness assurance (RHA) procedure implemented at CERN, including new steps dedicated to both system-level testing, focused on a wireless device, and sensors characterization and readout validation. [...]
2022 - 9 p.
- Published in : IEEE Trans. Nucl. Sci. 69 (2022) 1642-1650
Fulltext: PDF;
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Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation
/ Coronetti, Andrea (CERN ; Jyvaskyla U.) ; Garcia Alia, Ruben (CERN) ; Budroweit, Jan (DLR, Bremen) ; Rajkowski, Tomasz (Unlisted, FR) ; Da Costa Lopes, Israel (IES, Montpellier) ; Niskanen, Kimmo (IES, Montpellier) ; Soderstrom, Daniel (Jyvaskyla U.) ; Cazzaniga, Carlo (Rutherford) ; Ferraro, Rudy (CERN) ; Danzeca, Salvatore (CERN) et al.
2021 - 12 p.
- Published in : IEEE Trans. Nucl. Sci. 68 (2021) 958-969
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10.
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Study of the Impact of the LHC Radiation Environments on the Synergistic Displacement Damage and Ionizing Dose Effect on Electronic Components
/ Ferraro, Rudy (CERN ; LIRMM, Montpellier) ; Danzeca, Salvatore (CERN) ; Cangialosi, Chiara (CERN) ; García Alía, Rubén (CERN) ; Cerutti, Francesco (CERN) ; Tsinganis, Andrea (CERN) ; Dilillo, Luigi (LIRMM, Montpellier) ; Brugger, Markus (CERN) ; Masi, Alessandro (CERN)
Bipolar-based components can exhibit a higher (or lower) degradation when exposed to both total ionizing dose (TID) and displacement damage (DD) effects simultaneously than the sum of the two separated effects. This paper investigates the implications of this synergistic effect on the radiation qualification process of large hadron collider's (LHC's) electronic equipment. [...]
2019 - 9 p.
- Published in : IEEE Trans. Nucl. Sci. 66 (2019) 1548-1556
In : Conference on Radiation and its Effects on Components and Systems, Gothenburg, Sweden, 16 - 21 Sep 2018, pp.1548-1556
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