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Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring
/ Slipukhin, Ivan (CERN) ; Coronetti, Andrea (CERN) ; Alía, Rubén García (CERN) ; Saigné, Frédéric (IES, Montpellier) ; Boch, Jérôme (IES, Montpellier) ; Dilillo, Luigi (IES, Montpellier) ; Aguiar, Ygor Q (CERN) ; Cazzaniga, Carlo ; Kastriotou, Maria ; Dodd, Torran
System-level testing of electronics is an affordable method of assessment of the performance of complete electronic systems designed for applications in the radiation environment. Compared to component-level testing, system-level test offers a much smaller degree of observability about the performance of particular system elements. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1948-1955
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Characterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing
/ Barbero, Mario Sacristán (CERN ; IES, Montpellier) ; Slipukhin, Ivan (CERN ; IES, Montpellier) ; Cecchetto, Matteo (CERN) ; Prelipcean, Daniel (CERN) ; Aguiar, Ygor (CERN) ; Bilko, Kacper (CERN) ; Emriskova, Natalia (CERN) ; Waets, Andreas (CERN) ; Coronetti, Andrea (CERN) ; Kastriotou, Maria (Rutherford Appleton Laboratory) et al.
Ultrahigh-energy (UHE) (>5 GeV/n) heavy ion beams exhibit different properties when compared to standard and high-energy ion beams. Most notably, fragmentation is a fundamental feature of the beam that may have important implications for electronics testing given the ultrahigh energies and, hence, ranges, preserved by the fragments. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1557-1564
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Radiation Environment in the Large Hadron Collider During the 2022 Restart and Related RHA Implications
/ Biłko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; García Alía, Rubén (CERN) ; Aguiar, Ygor (CERN) ; Danzeca, Salvatore (CERN) ; Di Francesca, Diego (CERN) ; Gilardoni, Simone (CERN) ; Girard, Sylvain (ICJ, Lyon ; IUF, Paris) ; Ricci, Daniel (CERN) ; Sebban, Marc (Lab. Hubert Curien, St. Etienne) ; Uznanski, Slawosz (CERN)
In this work, we present the radiation environment of the large hadron collider (LHC), focusing on the year 2022, the first after the Long Shutdown 2 (LS2) (2019–2021). We highlight the most prominent radiation-level changes with respect to the 2018 operation, commenting on the related Radiation Hardness Assurance implications. [...]
2024 - 11 p.
- Published in : IEEE Trans. Nucl. Sci. 71 (2024) 607-617
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Mixed-Field Radiation Monitoring and Beam Characterization Through Silicon Diode Detectors
/ Biłko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; García Alía, Rubén (CERN) ; Sacristan Barbero, Mario (CERN) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne ; IUF, Paris) ; Aguiar, Ygor Q (CERN) ; Cecchetto, Matteo (CERN) ; Belanger-Champagne, Camille (TRIUMF) ; Danzeca, Salvatore (CERN) ; Hajdas, Wojtek (PSI, Villigen) ; Hands, Alex (TRIUMF) et al.
We present a calibration of a commercial silicon diode with proton and alpha beams and gamma rays. The diode together with a fast acquisition chain can be exploited for both direct and indirect (through the secondary radiation field) beam characterization. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 71 (2024) 777-784
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An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons
/ Wrobel, Frédéric (IES, Montpellier) ; Aguiar, Ygor (CERN) ; Marques, Cleiton (IES, Montpellier) ; Lerner, Giuseppe (CERN) ; Alía, Rubén García (CERN) ; Saigné, Frédéric (IES, Montpellier) ; Boch, Jérôme (IES, Montpellier)
In the atmosphere, it is generally understood that neutrons are the main contributor to the soft error rate (SER) in electronic devices. These particles are indeed able to trigger nuclear reactions in the sensitive regions of the devices, leading to secondary ions that may ionize the matter sufficiently to upset a memory cell or induce a transient signal, known as soft errors. [...]
2022 - 12 p.
- Published in : Electronics 12 (2022) 104
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LHC Oxygen Run Preparation in the CERN Injector Complex
/ Slupecki, Maciej (CERN) ; Aguglia, Davide (CERN) ; Aguiar, Ygor (Universite Jean Monnet (FR)) ; Alemany Fernandez, Reyes (CERN) ; Argyropoulos, Theodoros (CERN) ; Barlow, Roger Andrew (CERN) ; Bartosik, Hannes (CERN) ; Bellodi, Giulia (CERN) ; Bilko, Kacper (Universite Jean Monnet (FR)) ; Borburgh, Jan (CERN) et al.
The Ion Accelerator Complex, composed of a linear accelerator (Linac3) and a chain of synchrotrons (Low Energy Ion Ring: LEIR, Proton Synchrotron: PS, Super Proton Synchrotron: SPS and the Large Hadron Collider: LHC) will operate oxygen ion beams for Oxygen–Oxygen (O–O) and proton–Oxygen (p–O) collisions in the LHC in Run 3. [...]
CERN-ACC-NOTE-2024-0001.
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2024. - 29 p.
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CERN Super Proton Synchrotron Radiation Environment and Related Radiation Hardness Assurance Implications
/ Biłko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; García Alía, Rubén (CERN) ; Di Francesca, Diego (CERN) ; Aguiar, Ygor (CERN) ; Danzeca, Salvatore (CERN) ; Gilardoni, Simone (CERN) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne) ; Esposito, Luigi Salvatore (CERN) ; Fraser, Matthew Alexander (CERN) ; Mazzola, Giuseppe (CERN) et al.
The super proton synchrotron (SPS) is the second largest accelerator at CERN where protons are accelerated between 16 and 450 GeV/c. Beam losses, leading to the mixed-field radiation of up to MGy magnitude, pose a threat to the reliability of the electronic equipment and polymer materials located in the tunnel and its vicinity. [...]
2023 - 10 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1606-1615
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Analysis of the Radiation Field Generated by 200-MeV Electrons on a Target at the CLEAR Accelerator at CERN
/ Lerner, Giuseppe (CERN) ; Pelissou, Pierre (CERN ; INSA, Toulouse) ; Aguiar, Ygor Q (CERN) ; Sacristan Barbero, Mario (CERN) ; Cecchetto, Matteo (CERN) ; Biłko, Kacper (CERN) ; Coussen, Louise (CERN ; INSA, Toulouse) ; Emriskova, Natalia (CERN) ; García Alía, Rubén (CERN) ; Dyks, Luke (CERN ; Oxford U.) et al.
The radiation showers generated by the interaction of high-energy electrons with matter include neutrons with an energy distribution peaked at the MeV scale, produced via photonuclear reactions, allowing measurements of neutron-induced single-event effects (SEEs) in electronic devices. In this work, we study a setup where the 200-MeV electron beam of the CLEAR accelerator at European Organization for Nuclear Research [Centre Européen pour la Recherche Nucléaire (CERN)] is directed on an aluminum target to produce a radiation field with a large neutron component. [...]
2023 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1572-1579
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Electronics Irradiation With Neutrons at the NEAR Station of the n_TOF Spallation Source at CERN
/ Cecchetto, Matteo (CERN) ; Sacristan Barbero, Mario (CERN) ; Lerner, Giuseppe (CERN) ; García Alía, Rubén (CERN) ; Aguiar, Ygor (CERN) ; Senajova, Dominika (CERN) ; Garcia Infantes, Francisco (CERN) ; Pavon Rodriguez, Jose Antonio (CERN) ; Sabate Gilarte, Marta (CERN) ; Vlachoudis, Vasilis (CERN) et al.
We study the neutron field at the NEAR station of the neutron time-of-flight (n_TOF) facility at CERN, through Monte Carlo simulations, well-characterized static random access memories (SRAMs), and radio-photoluminescence (RPL) dosimeters, with the aim of providing neutrons for electronics irradiation. Particle fluxes and typical quantities relevant for electronics testing were simulated for several test positions at NEAR and compared to those at the CERN high-energy accelerator mixed-field facility (CHARM), highlighting similitudes and differences. [...]
2023 - 9 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1587-1595
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