CPK Training
CPK Training
CPK Training
Chapter 8 2
Learning Objectives
Chapter 8 3
Process Capability
Chapter 8 4
Process Control
Chapter 8 5
Process Capability
Chapter 8 6
Capable V.S. In-Control Process
Chapter 8 7
Capable V.S. In-Control Process
Chapter 8 8
Capable V.S. In-Control Process
Chapter 8 9
Process Capability
Chapter 8 10
How Do We Know a Process is
Capable?
CP and CPK statistical process indexes
Chapter 8 11
The Cp Index
Spec width Upper spec Lower spec
Cp
Natural tolerance 6
L.S. 6 U.S.
10
Cp 2 units
5
Engineering Tol.
• Formula: 6 sigma
Chapter 8 13
CP and CPK
Chapter 8 14
CP and CPK
Chapter 8 15
CP and CPK
Chapter 8 16
CP and CPK
(Key)
• Dominant characteristics– Those
characteristics that greatly influence product
quality and are most important to product form,
fit, or function.
Chapter 8 17
CP and CPK
Chapter 8 19
CP and CPK
99.73%
Chapter 8 [SIGMA] 4 3 2 1 X 1 2 3 4 21
Process Fallout Table
Centered Process
Process capability Parts per million
ratio defective
0.50 133,600.00
0.75 24,400.00
1.00 2,700.00
1.10 967.00
1.20 318.00
1.30 96.00
1.40 26.00
1.50 6.80
1.60 1.60
1.70 0.34
1.80 0.06
Chapter 8 2.00 0.0018 22
Relationship of Specifications,
Control Limits, and Natural
Tolerance Limits in the Process
Chapter 8 23
Relationship of Specifications,
Control Limits, and Natural
Tolerance Limits in the Process
Chapter 8 24
Relationship of Specifications,
Control Limits, and Natural
Tolerance Limits in the Process
LSL USL
Target
Cp Cp
spread
Cp
(Avg)
從製程中隨機抽30個樣
本 (短期製程能力分析)
計算平均數,標準差, 是否通過常態性檢定 是
Cp/Cpk指標 且Cpk1.23
決定SPC管制計畫中的4個
否 W
檢查並排除影響量測儀器及製程產
生變異之原因,考慮進行長程製程 開始使用計量值或前置管制
能力分析
圖
(長期製程能力分析)
使用管制圖時,每次取兩個
以上之樣本,至少收集25筆
(天)以上之資料
是否通過常態性檢定
是
且Cpk>1
檢查全距管制圖是否穩定,去掉脫
離管制界限之異常點 決定SPC管制計畫,開始
否 使用管制圖
確認資料之正確性並使用目標值作為製程
檢查平均管制圖是否穩定, 平均,再一次估計Cp/Cpk指標
去掉異常點後再計算Cp及
Cpk之指標
否 考慮以實驗設計的方法減少製程變
決定SPC管制計畫,開始使 是 是否通過常態性檢 異,或更新設備
用 管制圖 定並接受Cpk>1
Chapter 8 32
Procedures for Determining
Process Capability
Chapter 8 33
Procedures for Determining
Process Capability
2) Determine if Specifications are now being
met – conduct “Short Term” Process
Capability Study
a. Get current data
b. Calculate X and s (usually from grouped
data) to estimate the mean and standard
deviation of the process.
( n= 30)
Chapter 8 34
Procedures for Determining
Process Capability
c. Assume normality and estimate percent
meeting specifications. Determine from
frequency distribution if the assumption is
valid.
d. If specs are being met, generally go to
another problem. If specs are not being
met, proceed below.
Chapter 8 35
Procedures for Determining
Process Capability
3) Determine Inherent Variability, Using X-
R/Pre-Control Charts
a. Get consecutive samples, two (2) or more at
a time in a sample group. Get at least twenty
(20) groups over a shift or other short
production run during which operation
appears stable or without unusual problems.
Chapter 8 36
Procedures for Determining
Process Capability
Chapter 8 37
Procedures for Determining
Process Capability
Chapter 8 38
Procedures for Determining
Process Capability
f. Estimate the standard deviation from the
last average range:
Estimate of σ= R /d2
g. Use midpoint of specification limits as the
process mean, assume normality, and
estimate percent meeting specs.
Chapter 8 39
Procedures for Determining
Process Capability
h. If specs can be met, investigate process to
determine why specs are not being met.
Chapter 8 40
Procedures for Determining
Process Capability
i. If specs cannot be met, consider
management alternatives:
Change specs
Change process
Make best of it
Drop product
j. Set up X -R charts for future control.
Chapter 8 41
Chapter 8 42
SPC Control Plan
Sheet of .
Supplier (2) Supplier No.
(1) Address (3) Supplier Representative
City/State (4)
Phone No. (5)
(6) Control Characteristics
A. F.
B. G.
C. H.
D. I.
E. J.
Chapter 8 43
SPC Control Plan
(7) (8) (9) (10) (11) (12) (13) (14)
Spec Station/ Inspection Sample Inspection Analysis Cpk Reaction to
Limit Location Methods Size Frequency Method Index Out of Control
A.
B.
C.
D.
E.
F.
G.
H.
I.
J.
Submitted by . Approved By .
(15) (16)
Title . Date .
Chapter 8 44
DATA COLLECTION FOR CAPABILITY ANALYSIS
Char measured
Part No & Name
SAMPLE DATA:
Value No Value No Value No Value No Value
No
1 21 41 61 81
2 22 42 62 82
3 23 43 63 83
4 24 44 64 84
5 25 45 65 85
6 26 46 66 86
7 27 47 67 87
8 28 48 68 88
9 29 49 69 89
10 30 50 70 90
11 31 51 71 91
12 32 52 72 92
13 33 53 73 93
14 34 54 74 94
15 35 55 75 95
16 36 56 76 96
17 37 57 77 97
18 38 58 78 98
19 39 59 79 99
20 40 60 80 100
Remarks
TALLY SHEET:
VALUE
TALLY
FREQUENCY
Chapter 8 45
Process Capability Studies
Chapter 8 47
Process Capability Studies
Chapter 8 48
CPK
• A key characteristic will be considered
capable if the supplier can demonstrate with
90% confidence that the true Cpk exceeds
1.0. (In some cases, an alternate Cpk
requirement will be defined in the contract.)
When computing Cpk (see section 7-3.2), the
number of measurements collected must be
taken into account. Table 2.3.2 must be used to
determine the minimum calculated Cpk to
demonstrate capability
Chapter 8 49
TABLE 2.3.2 CPK
Chapter 8 50
CPK
• The values in the above table are the
calculated Cpk values required to be 90%
confident that the actual Cpk is greater than or
equal to the Cpk value at the top of the
respective column. The values listed in the
column titled “Number of measurements taken”
are the actual number of measurements, not
the number of plot points. The table assumes
that the underlying distribution of the
individual measurements are normally
distributed with a fixed mean and standard
deviation.
Chapter 8 51
CPK
• Examples:
If 30 parts are measured and the required Cpk
is 1.0, the calculated Cpk from the 30 parts
needs to be at least 1.23.
Chapter 8 52
Cp, Cpk Index / Process Capability
Studies
(1)The test specification limits for incoming
diodes is .008 ohms (upper) and .001 (lower)
and the standard deviation for this population
is .002 ohms. What is Cp index for this
process? Does this number indicate the
process is within the specification limits?
Chapter 8 53
Cp, Cpk Index / Process Capability
Studies
Why or why not?
a. Suppose action was taken on this incoming
test process and the standard deviation is
now .001 ohms. What is the Cpk index? Is it
within the limits? Given that x =0.04
Chapter 8 54
Cp, Cpk Index / Process Capability
Studies
(2) Measurements of the solder thicknesses on
print circuit boards going through the wave
solder machine are naturally between .006
and .012. Given that
.001
,whereas the specification limits are at
.004, .002
from the mean of .009. What is the
Cp/Cpk index for this process?
Chapter 8 55
Cp, Cpk Index / Process Capability
Studies
(3) When should a process capability study be
conducted?
Chapter 8 56
Process Capability
Chapter 8 57
Uses of process capability data:
Chapter 8 58
Reasons for Poor Process Capability
Chapter 8 59
Chapter 8 60
Chapter 8 61
Chapter 8 62
Probability Plotting
Chapter 8 63
• The distribution may not be normal; other types of
probability plots can be useful in determining the
appropriate distribution.
Chapter 8 64
Chapter 8 65
Chapter 8 66
For the hard bake process:
Chapter 8 67
One-Sided PCR
Chapter 8 68
Interpretation of the PCR
Chapter 8 69
Assumptions for Interpretation of
Numbers in Table 8.2
Chapter 8 70
Chapter 8 71
• Cp does not take
process centering
into account
• It is a measure
of potential
capability, not
actual capability
Chapter 8 72
A Measure of Actual Capability
Chapter 8 73
Normality and Process Capability
Ratios
• The assumption of normality is critical to the
usual interpretation of these ratios (such as
Table 8.2)
• For non-normal data, options are
1. Transform non-normal data to normal
2. Extend the usual definitions of PCRs to handle
non-normal data
3. Modify the definitions of PCRs for general
families of distributions
Chapter 8 74
Other Types of Process Capability Ratios
• First generation
• Second generation
• Third generation
• Lots of research has been done to develop
ratios that overcome some of the problems
with the basic ones
• Not much evidence that these ratios are used to
any significant extent in practice
Chapter 8 75
Chapter 8 76
Chapter 8 77
Chapter 8 78
Chapter 8 79
Chapter 8 80
Chapter 8 81
Process Capability
Analysis using Control
Charts
Chapter 8 82
Since LSL = 200
Chapter 8 83
Chapter 8 84
Chapter 8 85
Measurement Accuracy
Chapter 8 86
Accuracy and Precision
We have focused
only on precision
Chapter 8 87
Chapter 8 88
Gauge R&R Studies
Chapter 8 89
Chapter 8 90
Chapter 8 91
7.8 Gauge and Measurement Systems
Capability Studies
• Determine how much of the observed
variability is due to the gauge or measurement
system
• Isolate the components of variability in the
measurement system
• Assess whether the gauge is capable (suitable
for the intended application)
Chapter 8 92
Chapter 8 93
Chapter 8 94
Chapter 8 95
The P/T ratio:
Chapter 8 96
Chapter 8 97
Estimating the Variance Components
Chapter 8 98
Chapter 8 99
The gauge is not capable by this criterion
Chapter 8 100
Discrimination Ratio
Chapter 8 101
Gauge R&R Studies Are Usually Conducted
with a Factorial Experiment
Chapter 8 102
This is a two-factor factorial experiment
ANOVA methods are used to analyze the data and yo estimate the
variance components
Chapter 8 103
Chapter 8 104
Chapter 8 105
Chapter 8 106
Chapter 8 107
• Negative estimates of a variance component
would lead to filling a reduced model, such as,
for example:
Chapter 8 108
Chapter 8 109
For this Example
Chapter 8 110
Other Topics in Gauge R&R
Studies
• Section 8.7.3 provides a description of methods to
obtain confidence intervals on the variance
components and measures of gauge R&R
Chapter 8 111
Statistical Tolerance
Chapter 8 112
Statistical Tolerance
Chapter 8 114
Statistical Tolerance
• This is illustrated by again using the
previous assembly. Assume that capability
studies indicate that if the .005 tolerance on
component a could be example to .010 , a
secondary operation could be eliminated.
What effect will this have on the total length
tolerance?
Tassy 0.0202 0.0202 0.0402
.01 4.0 4.0 16.0
Tassy .049 .0245
Chapter 8 115
Statistical Tolerance
• This is an increase of only .0015 for a
component increase of .005. This
illustrates an important characteristic of the
statistical combination of component
variances. The Effect of a component with
small variance is vary small; the component
with the largest variance has the greatest
effect on overall variance.
Chapter 8 116
Statistical Tolerance
• Exercise
• Compare the tolerance found using the
conventional engineering approach to the
statistically computed assembly tolerance.
• Consider the four blocks:AB, BC, CD and
DE shown below. Each of these is
independent. Determine the specification
for the total assembly AE.
A B C D E
.750〞 .320 〞 .475 〞 .100 〞
.002 〞 .001 〞 .003 〞 .002 〞
Chapter 8 117
Statistical Tolerance
• Assume that each part component was
studied for capability, and we found that
each required process creating the
respective component linear length was
stabilized (that is, in control). Each process
had respective dimensional
characteristics as shown below:
Chapter 8 118
Component X
AB .750 〞 .00067 〞
BC .320 〞 .000333
CD .475 〞 .001 〞
DE .100 〞 .00067 〞
Chapter 8 119
Statistical Tolerance
• From this data, it is apparent that if we
assemble these four components, that the
grand average of these parts would be
1.645 〞. This is determined by the
following calculation :
X AB =.750 〞
X BC =.320 〞
X CD =.475 〞
X DE = .100 〞
Chapter 8
Total X AE =.100 〞(Assembly average)120
Statistical Approach
• Assume that each part component was studied
for capability, and we found hat each required
process creating the respective component linear
length was stabilized (that is , in control ).
• Each process had respective dimension
characteristic as shown below:
Chapter 8 121
Component X
AB .750” .00067”
BC .320” .00033”
CD .475” .001”
DE .100” .00067”
Chapter 8 122
Form this data, it is apparent that if we assemble
these four components, that the grand average of
those parts would be 1.645”. This is determined
by the following calculation:
X AB =.750”
X BC =.320”
X CD =.475”
X DE =.100”
Chapter 8 123
If we could determine the standard deviation
of AE, then we could be able to find that
region
within which 99.7% of all linear lengths of AE
(the assembly) would lie. This region be
defined as:
Chapter 8 124
The standard deviation of the assembly AE can
be found by calculating the square root of the
sum of the square of each component. This can
be stated mathematically as follows:
AE AB 2 BC 2 CD 2 DE 2
Therefore,
Upper tolerance X 3 AE AE
Lower tolerance X 3 AE AE
s 0.9105, b 0.9210
Chapter 8 127
Shaft Bearing
0.9105
0.9210
.9000 .9050 .9100 .9150 .9200 .9250 .9300
Figure 11-6 Distributions for Shaft and Bearing with Overlapping Variation
Chapter 8 128
and d xb xs
Hence d b s 0.0105
The standard deviation for the bearing I.D., s ,
may be approximated as
0.9195 0.9015
s 0.003
6
Similarly, the standard deviation for the bearing
I.D., b , may be approximated using
0.9335 0.9085
b 0.00417
6
Chapter 8 129
Hence, the standard deviation for the difference, d
may be approximated using the equation with
a1 1 and a2 1
as below:
d s2 b2 0.0032 0.00417 2
0.005134
Chapter 8 131
0 0.0105
z 2.045
0.005134
0.0105
d xb xs in cm
Chapter 8 133
Thirty applicants,
three underwriters
Each underwriter
evaluates each
application twice
The applications are
“blinded” by
removing names,
SSNs, addresses,
and other identifying
information
Chapter 8 134
Attribute Gauge Capability
• Determine the proportion of time that the
underwriter agrees with him/herself – this
measures repeatability
• Determine the proportion of time that the
underwriter agrees with the correct
classification – this measures bias
• Minitab performs the analysis – using the
attribute agreement analysis routine
Chapter 8 135
Chapter 8 136
Chapter 8 137
8.8 Setting Specifications on Discrete Components
Chapter 8 138
Chapter 8 139
Chapter 8 140
Chapter 8 141
Chapter 8 142
Chapter 8 143
8.9 Estimating the Natural Tolerance Limits
of a Process
Chapter 8 144
Chapter 8 145
Chapter 8 146
Learning Objectives
Chapter 8 147