Ecm Clas Type
Ecm Clas Type
Ecm Clas Type
Abrasive water jet machining Ultrasonic grinding Electron beam machining Laser beam machining Ion beam machining .....
A method of controlling the planarity of the multiple metal and dielectric layers A process of physically removing material from places of high topography to flatten and level the wafer surface (IC wafer planarization) A wafer surface planarization technology applied in the manufacturing of sub-0.35 um semiconductor devices.
Planarization
Planarity across the die is important for photolithography processes, which projects a pattern of light onto the wafer surface
dispensed to create a lubricating layer between the pad surface and the wafer. The slurry contains chemicals that react with the wafer surface, and abrasive particles that impact the wafer surface to achieve mechanical removal.
CMP Abrasives
The choice of slurry abrasive particle (vary in size, shape and hardness) is vital for achieving the desired removal rate and surface roughness of a material.
CeO2, ZrO2 and SiO2 in high pH solutions are commonly used to polish silicon oxide, and Al2O3 is most commonly used for metal (Cu W, AL) CMP.
Contact mechanics-based:
Fluid mechanics-based: 2-step removal process= chemical modification of film surface layer followed by abrasion of the modified layer
Lubricating layer
CMP - Process
CMP - SPCR
Solid phase chemical reaction (SPCR)
Chemical passivation layer generated: process of inducing and removing the chemical passivation layer thru force of action
CMP Machines
Example:
- self-leveling upper head with both rotational and linear (both vertical for loading and unloading and horizontal for oscillating) motions, which holds a wafer or wafer coupon of any shape from 0.25 to 4, - mechanically applied servo-controlled normal load programmable from 5 to 500 N thus producing contact pressures from 0.05 to 500 psi,
- self-leveling spring-loaded upper holder with passive rotation, which holds a conditioner or another specimen from 0.5 to 4.25, - either rotational or orbital lower platen for a polishing pad from 1 to 9. - slurry feeding and draining.
(source: http://www.cetr.com/Brochures)
A controlled anodic electrochemical dissolution process of the workpiece (anode) with the tool (cathode) in an electrolytic cell, during an electrolysis
process
An electrochemical anodic dissolution process in which a direct current with high density and low voltage is passed between a workpiece and a preshaped tool (the cathode).
At the anodic workpiece surface, metal is dissolved into metallic ions by the deplating reaction, and thus the tool shape is copied into the workpiece.
A relatively new and important method of removing metal by anodic dissolution and offers a number of advantages over other machining methods.
electrolysis has involved the dissolution of iron from the anode, and the generation of hydrogen at the cathode. No
other actions take place at the electrodes. Example: electrochemical reactions during ECM of iron
in sodium chloride (NaCl) electrolyte
ECM forming is carried out so that the shape of the tool electrode is transferred onto, or duplicated in, the workpiece.
High accuracy in shape duplication and high rates of metal removal, effected at very high current densities of the order 10 100 A/cm2, at relative low voltage from 8 to 30 V, while maintaining a very narrow machining gap (of the order of 0.1 mm) by feeding the tool electrode in the direction of metal removal from the work surface, with feed rate from 0.1 to 20 mm/min.
Duplicating, drilling and sinking operations in the manufacture of dies, press and glass-making moulds, turbine and compressor blades for gas-turbine engine, the generation of passages, cavities, holes and slots in parts, and the like
Working voltage between the tool electrode (cathode) and workpiece (anode) Machining feed rate Inlet and outlet pressure of electrolyte (or flow rate)
Inlet temperature of electrolyte
0.05 to 0.3mm [0.002 to 0.012 in] 0.1 to 20mm/min [0.004 to 0.7 in/min Brass, Copper, Bronze
NaCl at 60 to 240 g/l [ to 2 lb/gal] NaNO3 at 120 to 480 g/l [1 to 4 lb/gal ] Proprietary Mixture 20 to 50o C [68 to 122oF] 1 l/min/100A [0.264 gal/min/100A] 1500 to 3000 m/min [5000 to 10,000 fpm] 0.15 to 3 MPa [22 to 436 psi] 0.1 to 0.3 MPa [15 to 43.6
ECMed Parts
Summary of ECM
The rate of material machining depend on workpiece material, is equal from 1,200 to 2,500 mm3 for each 1,000A of power supply The accuracy of ECM depend on shape and dimensions of machining workpiece and approximately from 0.05 mm to 0.3 mm at using continuous current, and from 0.02 mm to 0.05 mm at using pulse ECM; The surface roughness of machined surface is decreasing with increasing machining rate (for typical materials), approximately from Ra=0.1 mm to Ra= 2.5 mm; ECM generates no residual stress into material of workpiece; and there is no tool wear.
Nano Machining:
A work material removed process by cutting tools under nano scales. That is the cutting parameters used are in nanometer scales: 1 ~ 999 nm depth of cut or 1 ~ 999 nm undeformed chip thickness.
Precision grinding involved a maximum precision to about 1.0 mm and expected to reach 100nm SPDT (single-point diamond turning), UPDG (ultra-precision diamond grinding), ELID grinding (electrolytic in-process dressing), etc. Applications to optical and electronic industries
SPDT, UPDG processes are similar in that chips of usually small size
Capable of producing surfaces with mirror finishing w/o polishing Using specially designed machine tools of high rigidity with air bearing spindles
microcracks
SPDT is performed on very soft ductile metals, e.g. pure copper, while UPDG usually performed on very hard brittle materials, e.g. glasses and ceramics.
High hardness High strength Good fracture toughness High wear resistance Good chemical stability Good thermal stability
Spherical mirror
[Shaw 1996]
Machine tool: Deckel Maho DMU50V 5 Axis Grinding wheel: #325,#1200,#4000 @3000rpm Feed Rate : 100~600mm/min Dressing Current : Duty ratio 10~60% @90V
Cast-iron bonding material for holding the diamond particles is removed by the electrolysis during in-process dressing and fresh diamond particles protrude out for grinding. Super fine diamond grit (grit size up to #150,000)
Effect of ELID
Without ELID(0.3795mm)
Grinding conditions: Feedrate: 500mm/min Spindle: 3000rpm Electric power: 0%, 30%@90V Wheel : CIB-D wheel #1200
Workpiece
Wheel
Multi purpose machine tool for micro machining (-turning, -milling, drilling, -EDM, -ECM) Working area : 200 100 100mm (Resolution 0.1 m) DI water /Oil for EDM medium Design of motion controller
Contact: Dr. A.S. Kumar, mpeask@nus.edu.sg, MicroTool 6.5 micron Hole
1.5 mm length shaft
Micro Milling
Micro EDM
References
1. C.L. Borst, W.N. Gill and R.J. Gutmann, ChemicalMechanical Polishing of Low Dielectric Constant Polymers and Organosilicate Glasses, Kluwer Academic Publishers,, Boston,2002 2. M. C. Shaw, Principles of Abrasive Processing, Clarendon Press, Oxford, 1996 3. C.C. Chen, L.S. Shu and S.R. Lee, J. of Materials Processing Techn, 140(2003), pp.373-78 4. ECM, http://www.unl.edu/nmrc/ecm1/ecm1.htm 5. H.S. Lim, K. Fathima, et al., Intl J. of Machine Tool & Manufacture, 42 (2003) pp935-43.