01 Semiconductors
01 Semiconductors
01 Semiconductors
According to Pauli’s exclusion principle, no two electrons in a crystal can have the
same quantum state.
Thus the energy levels of one atom cannot superimpose on the levels of the other,
instead, they remain very close and get modified.
This modification is not appreciable in the case of energy levels of electrons in the
inner shells (completely filled).
But in the outermost shells, modification is appreciable because the electrons are
shared by many neighbouring atoms.
Due to influence of high electric field between the core of the atoms and the shared
electrons, energy levels are split-up or spread out forming energy bands.
Formation of Energy Bands in Si
Energy
Conduction Band
• • 3p2
Forbidden Energy Gap • • 3s2
Valence Band
Crystalline
Solids
Metal
Insulator Semiconductor
(Conductor)
Insulator
At room temperature, some valence electrons gain energy more than the
energy gap and move to conduction band to conduct even under the
influence of a weak electric field.
As an electron leaves the valence band, it leaves some energy level in the
valence band as unfilled.
Such unfilled states are termed as ‘holes’ in the valence band. They are
positive charge carriers.
1
For E < EF : f ( E EF ) = =1
1 + exp (−)
At T = 0K all the states are occupied (probability one) up to EF0 and all the states above EF0 are empty
(occupation probability zero).
As the temperature increases, we might expect more and more electrons to be in states above EF (E > EF)
Fermi-Dirac distribution (Considering T > 0K)
1 1
For E = EF : 𝑓 𝐸 = 𝐸𝐹 =
1 + exp 0
=
2
1
For E >> EF : f ( E EF ) = = 0
1 + exp (+)
1
For E << EF : f ( E EF ) = =1
1 + exp (−)
Energy Band Representations
Energy Band Structure Representation…
Band
Gap
Eg
E-k Diagram
1.43 eV
1.11 eV
Why Silicon is Preffered?
Si-SiO2 interface has the least defect density among all semiconductors.
Semiconductor
Presence
of Dopant
Intrinsic Extrinsic
N-type P-type
Intrinsic Semiconductor
Valence electrons
Covalent Bond
Ge Ge Ge Ge
Broken Covalent Bond
Free electron ( - )
Ge Ge Ge Ge Hole ( + )
Ge Ge Ge Ge C.B
+
Eg 0.66 eV
Ge Ge Ge Ge V.B
+ +
Heat Energy
Intrinsic Semiconductor
Methods of Doping:
i) Thermal Diffusion
ii) Ion Implantation
In both cases, impurities are brought in contact with the substrate surface and are given sufficient energy to make
them enter below the substrate surface.
In case of diffusion, the required energy is supplied thermally, whereas for ion implantation, an electric field is
applied to energize the dopants.
Criteria of Doping:
i) Size of Dopant (must be of the same order)
ii) Valency of Dopant (must be ±1)
iii) Position of Dopant (should be substitutional not interstitial)
Extrinsic or Impure Semiconductor:
N - Type Semiconductors:
Ge Ge Ge
C.B
-
Eg = 0.66 eV
Ge As Ge
+ V.B
Ge Ge Ge Donor level
+
Ge Ge Ge
C.B
Ge In Ge
Eg = 0.66 eV
+
V.B
Ge Ge Ge Acceptor level
+
Donor
Level
Acceptor
Level
Carrier Transport Phenomena
Carrier Transport Phenomena
The net flow of the electrons and holes in a semiconductor will
generate currents.
The process by which these charged particles move is called transport.
Here we consider two basic transport mechanisms in a semiconductor
crystal:
drift—the movement of charge due to electric fields, and
diffusion—the flow of charge due to density gradients.
The carrier transport phenomena are the foundation for finally
determining the current-voltage characteristics of semiconductor
devices.
Drift
An electric field applied to a semiconductor will produce a force on electrons and
holes so that they will experience a net acceleration and net movement, provided there
are available energy states in the conduction and valence bands. This net movement of
charge due to an electric field is called drift. The net drift of charge gives rise to a
drift current.
Electric Field = 0
Drift Velocity
The carriers in extrinsic semiconductors move randomly like gas molecules.
Under the influence of a constant electric field (E), the carriers will be accelerated to a certain direction.
However, the carriers will be also retarded due to mutual collision.
The steady velocity attained by the carriers under such an influence of electric field is known as drift
velocity.
The current density (J) i.e. the current per unit area (A. m-2) of the conducting medium is
given by
where σ = nqμ is called the conductivity [(Ω.m)-1] of the semiconductor. The above is a
general expression.
For n-type semiconductor with electron concentration n and electron mobility μn, the
current density is
For p-type semiconductor with hole concentration p and electron mobility μp, the current
density is
As a semiconductor contains both electrons and holes, the total drift current density is
given by
(a) Diffusion of electrons due to a density gradient. (b) Diffusion of holes due to a density gradient.
Let the concentration of carriers varies with distance x in a semiconductor. Now, if dn/dx
is the concentration gradient in the semiconductor, then the diffusion current density is
given by:
negative
Total Current Density