IEEE STD C37.016™-2018Cor 1-2021

IEEE Standard for AC High Voltage
STANDARDS
Circuit Switchers 15.5 kV through
245 kV
Corrigendum 1
IEEE Power and Energy Society
Developed by the
Switchgear Committee
IEEE Std C37.016™-2018/Cor 1-2021

(Corrigendum to IEEE Std C37.016-2018)
Authorized licensed use limited to: Chang Gung Univ.. Downloaded on July 18,2023 at 08:12:45 UTC from IEEE Xplore. Restrictions apply.
IEEE Std C37.016™-2018/Cor 1-2021
(Corrigendum to IEEE Std C37.016-2018)

245 kV
Corrigendum 1
Developed by the
Switchgear Committee
of the
IEEE Power and Energy Society
Approved 9 November 2022

IEEE SA Standards Board
1
Copyright © 2022 IEEE. All rights reserved.
Abstract: This corrigendum is to improve the current IEEE Std C37.016™.
Keywords: circuit switcher, coordinated disconnect, design tests, IEEE C37.016™, interrupter,
operating mechanism, primary-bus fault, production tests, ratings, service conditions, stored
energy, transformer-limited fault, transient recovery voltage
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6
Participants
At the time this standard was completed, the PE/SWG/HVCB-WG_C37.016 Working Group had the
following membership:
Neil McCord, Chair

John Hall, Vice Chair
Patrick DiLillo Scott Lanning Damian Perrin

Ken Edwards Dave Mitchell Brian Roberts
Bill Hurst Stephanie Montoya Michael Skidmore
Roy Hutchins Thomas Pellerito Christopher Slattery
Todd Irwin Vernon Toups
The following members of the individual Standards Association balloting group voted on this standard.
Balloters may have voted for approval, disapproval, or abstention.
Roy Alexander Todd Irwin Bansi Patel

Saleman Alibhay Richard Jackson Pathik Patel
Thomas Barnes Laszlo Kadar Moises Ramos
W.J. (Bill) Bergman Peter Kelly Charles Rogers
Steven Bezner Tanuj Khandelwal Zoltan Roman
Gustavo Brunello James Kinney Bartien Sayogo
Paul Cardinal Chung-Yiu Lam Oleksandr Sergeyenko
Stephen Conrad Scott Lanning P. Sivaraman
Doug Edwards An Le Michael Skidmore
Jorge Fernandez Daher Ting Li Gary Smullin
Rostyslaw Fostiak Neil McCord David Tepen
Carl Fredericks Jeffrey McElray John Vergis
Kamal Garg Ali Naderian Jahromi John Wang
Jalal Gohari Dennis Neitzel Lanyi Wang
Stephen Grier Jeffrey Nelson Keith Waters
John Harley James Niemira Kenneth White
Werner Hoelzl Joe Nims Richard York
Philip Hopkinson Kris Zibert
When the IEEE SA Standards Board approved this standard on 9 November 2021, it had the following
membership:
Gary Hoffman, Chair

Jon Walter Rosdahl, Vice Chair
John D. Kulick, Past Chair
Konstantinos Karachalios, Secretary
Edward A. Addy Howard Li Mehmet Ulema

Doug Edwards Daozhuang Lin Lei Wang
Ramy Ahmed Fathy Kevin Lu F. Keith Waters
J. Travis Griffith Daleep C. Mohla Karl Weber
Thomas Koshy Chenhui Niu Sha Wei
Joseph L. Koepfinger* Damir Novosel Howard Wolfman
David J. Law Annette Reilly Daidi Zhong
Dorothy Stanley
*Member Emeritus
7
Introduction
This introduction is not part of IEEE C37.016-2018 Standard for AC High Voltage Circuit Switchers 15.5 kV through
245 kV.
The purpose of this corrigenda is to correct errors in the 2018 version of the standard.
8
Contents
5. Ratings .......................................................................................................................................................10
5.13 TRV related to the rated primary-bus fault breaking current ............................................................10
7.Design (type) tests ......................................................................................................................................11

7.11 Mechanical and environmental tests .................................................................................................11
7.14 Short-circuit current making and breaking tests ...............................................................................12
9
245 kV
Corrigendum 1
NOTE—The editing instructions contained in this corrigendum define how to merge the material contained therein into
the existing base standard and its amendments to form the comprehensive standard.
The editing instructions are shown in bold italic. Four editing instructions are used: change, delete, insert, and replace.
Change is used to make corrections in existing text or tables. The editing instruction specifies the location of the change
and describes what is being changed by using strikethrough (to remove old material) and underscore (to add new
material). Delete removes existing material. Insert adds new material without disturbing the existing material. Insertions
may require renumbering. If so, renumbering instructions are given in the editing instruction. Replace is used to make
changes in figures or equations by removing the existing figure or equation and replacing it with a new one. Editing
instructions, change markings, and this NOTE will not be carried over into future editions because the changes will be
incorporated into the base standard.
5. Ratings
5.13 TRV related to the rated primary-bus fault breaking current
5.13.1 Standard values of TRV
In Table 3, change Row 1 Cell 2 as shown:
Table 3—Standard values of TRV for system-fed faults with rated maximum voltages 100
kV and above with representation by four parameters
Rated First pole- Ampli- TRV

First
maximum to-clear tude Time Rate of
reference Time t1 peak Time t2 Voltage u′ Time t′
voltage factor delay td rise u1/t1
factor kaf voltage U1 (μs) value uc (μs) (kV) (μs)
Ur kpp (μs) (kV/μs)
(pu) (kV) (kV)
(kV) (pu)
10
7. Design (type) tests
7.11 Mechanical and environmental tests
7.11.5 Low and high temperature tests
7.11.5.2 Low temperature test data and sequence
In Table 12, change Column 1 Cells 12 and 13 as shown:
Table 12—Test sequence for low temperature test

Dataset
Operating Supply Operating Number of
Item Description (see
sequence voltage energy operating sequences
Table 10)
a Pre-test checks — 1 — — —
Minimum Rated 2
b Pre-test operations O, C, CO 2 Maximum Rated 2
Rated Rated 2
c Circuit switcher CLOSED – cool down
d Tightness test (see subclause 7.8)
Low temperature
e O, C, CO 3 Rated Rated Variablea
operations
Auxiliary heaters OFF
Minimum density
fb O 3 Rated Rated 0.5
operation c
Auxiliary heaters ON
g Circuit switcher OPEN
h Tightness test (see subclause 7.8)
C–3 min–O Rated Rated 1
Low temperature
i CO–3 min 3 Rated Rated 3
operations d
C–ta–O–ta Rated Rated 46
C–ta –O–ta–C–
Increasing
30 min–
j temperature 3 Rated Rated Variable
O–ta–C–ta–O–
operations
30 min
Minimum Rated 2
j k Post-test operations O, C, CO 2 Maximum Rated 2
Rated Rated 2
kl Post-test checks — 1 — — —
a Manufacturer shall determine the number of operations necessary to demonstrate low temperature operating
characteristics.
b For circuit switchers whose gas densities can be controlled by auxiliary heaters, perform this item. For circuit switchers
that have no control of gas density, this item shall be skipped.

c This operation is performed as the test object approaches the minimum functional density. The intent is to demonstrate
acceptable travel characteristics as close as practical to the minimum functional density.

d t is the intentional test delay between successive operations determined by the manufacturer.
a
11
7.11.5.3 High temperature test data and sequence
In Table 13, relabel Column 1 as shown:
Table 13—Test sequence for high temperature test

Dataset
Operating Supply Operating Number of
Item Description (see
sequence voltage energy operating sequences
Table 10)
ma Pre-test checks — 1 — — —
Minimum Rated 2
nb Pre-test operations O,C,CO 2 Maximum Rated 2
Rated Rated 2
oc Circuit switcher CLOSED – warm up
pd Tightness test (see subclause 7.8)
High temperature
qe O,C,CO 3 Rated Rated Variablea
operations
rf Circuit switcher OPEN
sg Tightness test (see subclause 7.8)
C−3 min−O 3 Rated Rated 1
High temperature
th CO–3min 3 Rated Rated 3
operationsb
C−ta−O−ta 3 Rated Rated 46
C−ta−O−ta−C−30
Decreasing
min−
ui temperature 3 Rated Rated Variable
O−ta−C−ta−O−30
operations
min
Minimum Rated 2
v j Post-test operations O,C,CO 2 Maximum Rated 2
Rated Rated 2
wk Post-test checks — 1 — — —
a Manufacturer shall determine the number of operations necessary to demonstrate high temperature operating
characteristics.
b
ta is the intentional test delay between successive operations determined by the manufacturer.
7.14 Short-circuit current making and breaking tests
7.14.1 General
Change item a) as follows:
a) For test voltage E for all test duties
In Equation (1) replace text as shown:
,for single-phase tests in substitution for there-phase tests, or
,the power frequency recovery voltage during breaking tests, or
Insert new Equation (2) as shown:
E = U r , the applied phase-to-phase voltage during three-phase making tests on a three-pole

circuit switcher, or (2)
12
Renumber Equation (2) to Equation (3) and make changes as shown:
Ur
E= , for three-phase test: the applied voltage during single-phase making tests on a
3
three-pole circuit switcher (2) (3)
13
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IEEE Standard for AC High Voltage

IEEE Std C37.016™-2018/Cor 1-2021

IEEE Standard for AC High Voltage

Approved 9 November 2022

The Institute of Electrical and Electronics Engineers, Inc.

PDF: ISBN 978-1-5044-8180-9 STD25092

Notice and Disclaimer of Liability Concerning the Use of IEEE Standards

Comments on standards should be submitted using the Contact Us form. 2

Laws and regulations

Updating of IEEE Standards documents

Neil McCord, Chair

Patrick DiLillo Scott Lanning Damian Perrin

Roy Alexander Todd Irwin Bansi Patel

Gary Hoffman, Chair

Edward A. Addy Howard Li Mehmet Ulema

7.Design (type) tests ......................................................................................................................................11

5.13 TRV related to the rated primary-bus fault breaking current

5.13.1 Standard values of TRV

In Table 3, change Row 1 Cell 2 as shown:

Rated First pole- Ampli- TRV

7.11 Mechanical and environmental tests

7.11.5 Low and high temperature tests

7.11.5.2 Low temperature test data and sequence

In Table 12, change Column 1 Cells 12 and 13 as shown:

Table 12—Test sequence for low temperature test

that have no control of gas density, this item shall be skipped.

acceptable travel characteristics as close as practical to the minimum functional density.

In Table 13, relabel Column 1 as shown:

Table 13—Test sequence for high temperature test

7.14 Short-circuit current making and breaking tests

Change item a) as follows:

a) For test voltage E for all test duties

In Equation (1) replace text as shown:

,for single-phase tests in substitution for there-phase tests, or

,the power frequency recovery voltage during breaking tests, or

Insert new Equation (2) as shown:

E = U r , the applied phase-to-phase voltage during three-phase making tests on a three-pole

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