IEEE-A Machine Learning-Based Framework For Predictive Maintenance of Semiconductor Laser For Optical Communication
IEEE-A Machine Learning-Based Framework For Predictive Maintenance of Semiconductor Laser For Optical Communication
IEEE-A Machine Learning-Based Framework For Predictive Maintenance of Semiconductor Laser For Optical Communication
Abstract—Semiconductor lasers, one of the key components for Since its invention in 1962, the performance and the productivity
optical communication systems, have been rapidly evolving to meet of semiconductor lasers have been extensively improved to meet
the requirements of next generation optical networks with respect the demands of next generation high speed optical networks
to high speed, low power consumption, small form factor etc.
However, these demands have brought severe challenges to the in terms of linewidth, power consumption, cost etc. [1], [2].
semiconductor laser reliability. Therefore, a great deal of attention However, the performance of the laser during operation can
has been devoted to improving it and thereby ensuring reliable be adversely affected by several intrinsic and external factors
transmission. In this paper, a predictive maintenance framework such as contamination [3], [4], facet oxidation [5], threading
using machine learning techniques is proposed for real-time heath
dislocations in the substrate [6], crystal defects, a high ambient
monitoring and prognosis of semiconductor laser and thus enhanc-
ing its reliability. The proposed approach is composed of three temperature [3], etc. Many of these factors are hard to predict but
stages: i) real-time performance degradation prediction, ii) degra- induce laser degradation and failure, and thereby result in optical
dation detection, and iii) remaining useful life (RUL) prediction. network disruption and high maintenance costs. Moreover, the
First of all, an attention based gated recurrent unit (GRU) model lifetime of the laser device is prone to a wear-out failure mode
is adopted for real-time prediction of performance degradation.
(i.e., gradual degradation) defined as the usual failure mode
Then, a convolutional autoencoder is used to detect the degradation
or abnormal behavior of a laser, given the predicted degradation of a device operating over its service [7]. The complexity of
performance values. Once an abnormal state is detected, a RUL the laser structure, and the diversity of the factors inducing
prediction model based on attention-based deep learning is utilized. the degradation make the reliability assessment a challenging
Afterwards, the estimated RUL is input for decision making and issue [3]. Therefore, a great deal of research has been devoted
maintenance planning. The proposed framework is validated using
to improving the laser reliability.
experimental data derived from accelerated aging tests conducted
for semiconductor tunable lasers. The proposed approach achieves The qualification of laser reliability is typically performed
a very good degradation performance prediction capability with a with laboratory data, obtained from accelerated life tests
small root mean square error (RMSE) of 0.01, a good anomaly de- conducted under high stress conditions such as high
tection accuracy of 94.24% and a better RUL estimation capability temperatures or high drive current. This speeds up the
compared to the existing ML-based laser RUL prediction models. degradation and thereby shortens the time to failure of the
Index Terms—Anomaly detection, machine learning, predictive device, otherwise the time required to collect field lifetime
maintenance, remaining useful prediction, semiconductor laser. data from operational devices can be years [8]. Conventionally,
the laser lifetime is estimated by extrapolating a mathematical
I. INTRODUCTION fit of the laser current or output power over time. However,
such a reliability extrapolation is inaccurate and can result in
EMICONDUCTOR lasers have been widely used as optical
S communication light sources for high speed data transmis-
sion due to their high efficiency, low cost, and compactness.
considerable overestimation or underestimation of the actual
lifetime of the laser. The laser is considered degraded if the
value crosses the threshold, which is determined based on
the laser design and specifications. However, the threshold
Manuscript received January 7, 2022; revised March 11, 2022; accepted approach is imprecise and leads to a high false alarm rate.
March 27, 2022. Date of publication April 12, 2022; date of current version
July 16, 2022. This work was supported in part by the CELTIC-NEXT through Recently, machine learning (ML) concepts achieving higher
project AI-NET-PROTECT under Project C2019/3-4 and in part by the German accuracy and prediction capability have been proposed to
Federal Ministry of Education and Research under Grant FKZ16KIS1279K. improve the laser reliability estimation. Abdelli et al. [9], [10]
(Corresponding author: Khouloud Abdelli.)
Khouloud Abdelli is with ADVA Optical Networking SE, 82152 Mu- proposed a federated learning approach for semiconductor laser
nich/Martinsried, Germany, and also with Kiel University (CAU), Chair of lifetime prediction, and developed an artificial neural network
Communications, 24143 Kiel, Germany (e-mail: kabdelli@advaoptical.com). model for laser mean time to failure (MTTF) prediction given
Helmut Grießer is with ADVA Optical Networking SE, 82152 Mu-
nich/Martinsried, Germany (e-mail: hgriesser@adva.com). the laser characteristics. However, the degradation trend over
Stephan Pachnicke is with the Kiel University (CAU), Chair of Communica- time, which impacts the estimation of MTTF, is not taken into
tions, 24143 Kiel, Germany (e-mail: stephan.pachnicke@tf.uni-kiel.de). consideration as features for the ML model. We also presented a
Color versions of one or more figures in this article are available at
https://doi.org/10.1109/JLT.2022.3163579. long short-term memory (LSTM) model for laser failure modes,
Digital Object Identifier 10.1109/JLT.2022.3163579 trained with synthetic data modelling the different laser
0733-8724 © 2022 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.
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Fig. 14. Results of the comparison of the proposed method with MLP, CNN
and RNN in terms of MAPE and CVRMSE.
Fig. 13. Normalized current histograms of the real and synthetic data after TABLE I
80 h. COMPUTIONAL TIME OF PROPOSED MODEL AND OTHER METHODS
100
xi − xi
M AP E = (17)
N i = 1
xi
N 2
100 i = 1 (xi − xi )
CV RM SE = (18)
x̄ N
where xi and xi denote the predicted and the true current values
respectively. N represents the number of test samples. x̄ is the
average of the true current values. It is to be noted that a lower
value of MAPE and CVRMSE indicates a better prediction
capability.
The different ML models are trained with the synthetic dataset
and tested with the real experimental dataset. The results of
the comparison illustrated in Fig. 14 show that the proposed
model achieves the smallest values of MAPE and CVRMSE,
which proves that the proposed method yields better prediction
performance.
The comparison of the results of computational inference time
between the proposed model and the other methods are shown
in Table I. As it can be seen, the proposed ML model consumes
slightly more time than MLP and CNN models due to its deeper
architecture, however, it executes faster than the RNN method.
We evaluate the short-term and long-term prediction capabil-
ity of the proposed model. Note that the model is trained with
current measurements till 1000 h, and that it is tested to forecast
Fig. 15. Histograms of prediction errors: (a) for short-term prediction (one
the current values at 1500 h, 2000 h and 3000 h. As shown in step forecasting), and (b) long-term prediction (multi-step forecasting).
Fig. 15, the ML model accurately predicts the next value of the
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ABDELLI et al.: MACHINE LEARNING-BASED FRAMEWORK FOR PREDICTIVE MAINTENANCE 4705
Fig. 16. Results of laser current prediction for two random test samples:
(a) short-term prediction of the current at 1500 h, (b) long-term prediction of
Fig. 18. Impact of the input sequence length on the performance of the ML
the current up to 3000 h.
model for performance degradation prediction.
current measurement (one step prediction) with small prediction CVRMSE decreases with reducing the input sequence length.
errors with a mean of 0.004 and a standard deviation of 0.027, Reducing the input sequence length leads to a loss of the infor-
and forecasts the next three values of the current measurements mation representing the degradation trend, which impacts the
for the next time frames by achieving low prediction errors with capability of the ML model in capturing the relevant features
a mean of -0.029 and a standard deviation of 0.032. for accurate prediction.
Fig. 16 shows the predicted values of two random samples. It
can be observed that the forecasted values are close to the actual E. Validation Results of the ML Model for Anomaly Detection
values and that they are following the same degradation trend
as the actual values, which demonstrates the effectiveness of the The ML model for anomaly detection is trained with synthetic
proposed model in predicting the current measurements. data, modelling the normal behavior of laser devices. After the
Instead of adopting the one-step prediction ML model mul- training, the model is tested with experimental data of normal
tiple times for performing long-term prediction, whereby the and anomalous lasers. To assess the anomaly detection capabil-
ity, the following metrics are adopted:
prediction for the prior time step is used as an input for making r Precision (P) quantifies the relevance of the predictions
a prediction on the following time step, we investigated the ca-
pability of the ML model in performing a multi-step forecasting made by the ML model. It is expressed as:
by predicting the entire forecast sequence in a one-shot manner. TP
P = , (19)
Fig. 17 shows the adjusted architecture of the ML model for TP + FP
performing two step prediction. The two step ML model is where T P denotes the number of “anomalous” sequences cor-
trained as well with the synthetic dataset and tested with the rectly classified, and F P represents the number of “normal”
experimental dataset. The test results show that the two-step sequences misclassified as “anomalous”.
model achieves higher values of CVRMSE (4.8%) and MAPE r Recall (R) provides the total relevant results correctly
(5.8%) compared to the performance yielded by the one step classified by the ML model. It is formulated as:
model, which proves that it is less accurate.
We investigated the impact of the input sequence length on TP
R = , (20)
the performance of the one step ML model. We trained the ML TP + FN
model with sequences of length 5, 6, 7, and 8, respectively. where F N denotes Number of “anomalous” sequences misclas-
Fig. 18 shows that the ML model’s performance in terms of sified as “normal”.
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4706 JOURNAL OF LIGHTWAVE TECHNOLOGY, VOL. 40, NO. 14, JULY 15, 2022
Fig. 19. The optimal threshold selection based on the precision, recall and F1
score scores yielded by the autoencoder.
Fig. 20. Influence of the sequence length on the performance of the ML model
for anomaly detection in terms of F1 score.
P.R
F 1 = 2. (21)
P + R
TP + TN
A = , (22)
TP + TN + FP + FN
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ABDELLI et al.: MACHINE LEARNING-BASED FRAMEWORK FOR PREDICTIVE MAINTENANCE 4707
TABLE II
RESULTS OF THE COMPARISON OF THE PROPOSED METHOD WITH OTHER ML
TECHNIQUES USING RMSE, MAE, AND COMPUTATIONAL TIME
Fig. 23. Influence of the sequence length on the performance of the ML model
for RUL prediction.
V. CONCLUSION
An ML-based predictive maintenance framework for semi-
conductor lasers is proposed for real-time monitoring and prog-
nosis of the laser device during operation. The proposed ap-
proach contains three main steps: real-time performance degra-
dation prediction, degradation detection and RUL prediction.
An attention based GRU model is used to predict the laser
Fig. 22. Results of Predicted RULs by the proposed model vs. actual RULs.
performance degradation (i.e., the laser current increase). The
convolutional autoencoder is adopted to detect any degradation
or abnormal behavior of the laser. An attention-based deep
learning model is used to estimate the RUL of the laser. The
different models are trained with synthetic data generated by the
RMSE and the MAE. The results shown in Table II demonstrate
GAN model, and tested with experimental data of tunable lasers.
that the proposed method outperforms the other ML models
The results demonstrate that the attention-based GRU model
by achieving the smallest scores of RMSE and MAE. The
achieves a good degradation performance prediction (RMSE
comparison results of the computational time (inference time)
of 0.01), the convolutional autoencoder yields a high detection
of the proposed model and other ML methods in Table II
accuracy of 94.2%, and the attention-based deep learning model
show that the proposed method consumes more time in testing
achieves a good RUL estimation (RMSE of 142 hours), which
(inference) due to its deep architecture, and that the shallow
demonstrates the effectiveness of the proposed framework. The
ML techniques RF and SVR are much less time consuming in
results show also that adding statistical features underlying
testing.
the degradation trend helps to improve the performance of the
The proposed approach achieves also better prediction capa-
RUL prediction model, and that adding the attention mechanism
bility compared to the recently presented CNN-LSTM model
enhances the prediction capability. The results demonstrate as
for laser RUL estimation [12] (RMSE = 385 hours, MAE =
well that the GAN is able to produce laser reliability data that is
261 hours) by providing 63.14% and 75.9% improvements in
close to the real experimental data, and in case of limited in-field
RMSE and MAE metrics respectively.
data or experimental data, synthetic data generated by GAN is a
To assess further the RUL estimation capability of the pro-
good solution to train the ML model, and that the performance of
posed model, we compare the predicted RUL values to the true
the ML model trained with the synthetic data is good when tested
RULs at different stages of degradation. As shown in Fig. 22,
with real data. The same concept of the proposed framework
the RUL values estimated by the model are very close to the
is readily applicable to other optoelectronic devices such as
true RUL values, which proves the effectiveness of the proposed
semiconductor optical amplifiers due to the similarity of their
model in accurately predicting the RUL of the laser device.
structures.
The impact of reducing the length of the input sequence
on the performance of the ML model for RUL prediction is
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