Article

Nine-Coded Compression Technique with Application to Reduced Pin-Count Testing and Flexible On-Chip Decompression

Authors:

Mohammad Tehranipour,

Mehrdad Nourani,

Krishnendu ChakrabartyAuthors Info & Claims

DATE '04: Proceedings of the conference on Design, automation and test in Europe - Volume 2

Page 21284

Published: 16 February 2004 Publication History

Abstract

This paper presents a new test data compression technique based on a compression code that uses exactly nine code-words. In spite of its simplicity, it provides significant reduction intest data volume and test application time. In addition, the decompression logic is very small and independent of the precomputed test data set. Our technique leaves many don't-care bitsunchanged in the compressed test set, and these bits can be filled randomly to detect non-modeled faults. The proposed technique can be efficiently adopted for single- or multiple-scan chain designs to reduce test application time and pin requirement. Experimentalresults for ISCAS'89 benchmarks illustrate the flexibility and efficiency of the proposed technique.

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Cited By

Shi YTogawa NYanagisawa MOhtsuki TKyung CChoi KHa S(2008)GECOMProceedings of the 2008 Asia and South Pacific Design Automation Conference10.5555/1356802.1356943(577-582)Online publication date: 21-Jan-2008
https://dl.acm.org/doi/10.5555/1356802.1356943
Lin CChen HGielen G(2007)A selective pattern-compression scheme for power and test-data reductionProceedings of the 2007 IEEE/ACM international conference on Computer-aided design10.5555/1326073.1326180(520-525)Online publication date: 5-Nov-2007
https://dl.acm.org/doi/10.5555/1326073.1326180
Polian IFujiwara H(2007)Functional Constraints vs. Test Compression in Scan-Based Delay TestingJournal of Electronic Testing: Theory and Applications10.1007/s10836-007-5013-723:5(445-455)Online publication date: 1-Oct-2007
https://dl.acm.org/doi/10.1007/s10836-007-5013-7
Show More Cited By

Index Terms

Nine-Coded Compression Technique with Application to Reduced Pin-Count Testing and Flexible On-Chip Decompression

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Published In

cover image ACM Conferences

DATE '04: Proceedings of the conference on Design, automation and test in Europe - Volume 2

February 2004

606 pages

ISBN:0769520855

Copyright © Copyright (c) 2004 Institute of Electrical and Electronics Engineers, Inc. All rights reserved.

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SIGDA: ACM Special Interest Group on Design Automation

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IEEE Computer Society

United States

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Published: 16 February 2004

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DATE04: Design, Automation and Test in Europe 2004

February 16 - 20, 2004

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Overall Acceptance Rate 518 of 1,794 submissions, 29%

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Cited By

Shi YTogawa NYanagisawa MOhtsuki TKyung CChoi KHa S(2008)GECOMProceedings of the 2008 Asia and South Pacific Design Automation Conference10.5555/1356802.1356943(577-582)Online publication date: 21-Jan-2008
https://dl.acm.org/doi/10.5555/1356802.1356943
Lin CChen HGielen G(2007)A selective pattern-compression scheme for power and test-data reductionProceedings of the 2007 IEEE/ACM international conference on Computer-aided design10.5555/1326073.1326180(520-525)Online publication date: 5-Nov-2007
https://dl.acm.org/doi/10.5555/1326073.1326180
Polian IFujiwara H(2007)Functional Constraints vs. Test Compression in Scan-Based Delay TestingJournal of Electronic Testing: Theory and Applications10.1007/s10836-007-5013-723:5(445-455)Online publication date: 1-Oct-2007
https://dl.acm.org/doi/10.1007/s10836-007-5013-7
Polian IFujiwara HGielen G(2006)Functional constraints vs. test compression in scan-based delay testingProceedings of the conference on Design, automation and test in Europe: Proceedings10.5555/1131481.1131769(1039-1044)Online publication date: 6-Mar-2006
https://dl.acm.org/doi/10.5555/1131481.1131769
Shi YTogawa NKimura SYanagisawa MOhtsuki THirose F(2006)FCSCANProceedings of the 2006 Asia and South Pacific Design Automation Conference10.1145/1118299.1118454(653-658)Online publication date: 24-Jan-2006
https://dl.acm.org/doi/10.1145/1118299.1118454
Han YHu YLi HLi X(2005)Using MUXs Network to Hide Bunches of Scan ChainsProceedings of the 6th International Symposium on Quality of Electronic Design10.1109/ISQED.2005.127(238-243)Online publication date: 21-Mar-2005
https://dl.acm.org/doi/10.1109/ISQED.2005.127
Polian ICzutro ABecker B(2005)Evolutionary Optimization in Code-Based Test CompressionProceedings of the conference on Design, Automation and Test in Europe - Volume 210.1109/DATE.2005.144(1124-1129)Online publication date: 7-Mar-2005
https://dl.acm.org/doi/10.1109/DATE.2005.144
Arslan BOrailoglu A(2004)Design space exploration for aggressive test cost reduction in CircularScan architecturesProceedings of the 2004 IEEE/ACM International conference on Computer-aided design10.1109/ICCAD.2004.1382671(726-731)Online publication date: 7-Nov-2004
https://dl.acm.org/doi/10.1109/ICCAD.2004.1382671

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