Test Data Compression: The System Integrator's Perspective
Page 10726
Abstract
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but also the bandwidth requirements. In this paper we provide a quantitative analysis of two distinctive TDC methods from the system integratorýs standpoint considering a core based SOC environment. The proposed analysis addresses four parameters: compression ratio, test application time, area overhead and power dissipation. Based on our analysis, some future research directions are given which can lead to an easier integration of TDC in the SOC design flow and to further improve the four parameters.
References
[1]
{1} Virginia Polytechnic Institute and State University. http://www.ee.vt.edu/~ha/cadtools/cadtools.html.
[2]
{2} I. Bayraktaroglu and A. Orailoglu. Test Volume and Application Time Reduction Through Scan Chain Concealment. In DAC, volume 38, pp 151-155, June 2001.
[3]
{3} B. Bottoms. The third millennium's test dilemma. IEEE Design & Test of Computers, 15(4):7-11, Oct. 1998.
[4]
{4} F. Brglez, D. Bryan, and K. Kozminski. Combinational profiles of sequential benchmark circuits. In ISCAS, pp 1929-1934, May 1989.
[5]
{5} A. Chandra and K. Chakrabarty. Combining Low-Power Scan Testing and Test Data Compression for System-on-a-chip. In DAC, volume 38, pp 113-120, June 2001.
[6]
{6} A. Chandra and K. Chakrabarty. Frequency-Directed Run-Length (FDR) Codes with Application to System-on-a-Chip Test Data Compression. In VTS, pp 114-121, Apr. 2001.
[7]
{7} R. Dorsch and H.-J. Wunderlich. Tailoring ATPG for Embedded Testing. In ITC, pp 530-537, Oct. 2001.
[8]
{8} P. T. Gonciari, B. Al-Hashimi, and N. Nicolici. Improving Compression Ratio, Area overhead, and Test Application Time in System-ona-Chip Test Data Compression/Decompression. In DATE, pp 604- 611, Mar. 2002.
[9]
{9} P. T. Gonciari, B. Al-Hashimi, and N. Nicolici. Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing. In ITC, pp 64-73, Oct. 2002.
[10]
{10} P. T. Gonciari, B. Al-Hashimi, and N. Nicolici. Reducing Synchronization Overhead in Test Data Compression Environments. In Digest of Papers ETW, pp 147-152, May 2002.
[11]
{11} P. T. Gonciari, B. Al-Hashimi, and N. Nicolici. Useless Memory Allocation: Problems and Solutions. In VTS, pp 423-430, Apr. 2002.
[12]
{12} H. Ichihara, K. Kinoshita, I. Pomeranz, and S. Reddy. Test Transformation to Improve Compaction by Statistical Encoding. In VLSI Design, pp 294-299, Jan. 2000.
[13]
{13} ITRS. The International Technology Roadmap for Semiconductors, 2001 Edition. http://public.itrs.net/.
[14]
{14} A. Jas, J. Ghosh-Dastidar, and N. A. Touba. Scan Vector Compression/Decompression Using Statistical Coding. In VTS, pp 114-121, Apr. 1999.
[15]
{15} A. Khoche and J. Rivoir. I/O Bandwidth Bottleneck for Test: Is it Real ? In Proceedings of Test Resource Partitioning Workshop, pp 2.3-1-2.3-6, Nov. 2000.
[16]
{16} B. Koenemann, C. Barnhart, B. Keller, T. Snethen, O. Farnsworth, and D. Wheater. A Smart BIST Variat with Guaranteed Encoding. In ATS, pp 325-330, Nov. 2001.
[17]
{17} E. J. Marinissen et al. On IEEE P1500's Standard for Embedded Core Test. JETTA, 18(4), Aug. 2002.
[18]
{18} N. Nicolici and B. M. Al-Hashimi. Multiple Scan Chains for Power Minimization during Test Application in Sequential Circuits. IEEE Computer, 51(6):721-734, June 2002.
[19]
{19} J. Rajski. DFT for High-Quality Low Cost Manufacturing Test. In ATS, pp 3-8, Nov. 2001.
[20]
{20} S. Reda and A. Orailoglu. Reducing Test Application Time Through Test Data Mutation Encoding. In DATE, pp 387-393, Mar. 2002.
[21]
{21} P. M. Rosinger, P. T. Gonciari, B. Al-Hashimi, and N. Nicoli. Analysing trade-offs in scan power and test data compression for system-on-a-chip. IEE Proceedings, Computers and Digital Techniques , 149(4):188-196, July 2002.
[22]
{22} Synopsys Inc. Design compiler reference manual, 2001.
[23]
{23} S. Wang and S. Gupta. ATPG for heat dissipation minimization during test application. IEEE Computer, 47(2):256-262, Feb. 1998.
[24]
{24} B. G. West. At-Speed Structural Test. In ITC, pp 795-800, Sept. 1999.
[25]
{25} L. Whetsel. Adapting Scan Architectures for Low Power Operation. In ITC, pp 863-872, Oct. 2000.
[26]
{26} Y. Zorian. A distributed BIST control scheme for complex VLSI devices. In VTS, pp 4-9, 1993.
Index Terms
- Test Data Compression: The System Integrator's Perspective
Recommendations
Analysis of Test Application Time for Test Data Compression Methods Based on Compression Codes
We present an analysis of test application time for test data compression techniques that are used for reducing test data volume and testing time in system-on-a-chip (SOC) designs. These techniques are based on data compression codes and on-chip ...
Test data compression and test time reduction using an embedded microprocessor
Special section on low powerSystems-on-a-chip (SOCs) with many complex intellectual property cores require a large volume of data for manufacturing test. The computing power of the embedded processor in a SOC can be used to test the cores within the chip boundary, reducing the ...
Test data compression using dictionaries with selective entries and fixed-length indices
We present a dictionary-based test data compression approach for reducing test data volume in SOCs. The proposed method is based on the use of a small number of ATE channels to deliver compressed test patterns from the tester to the chip and to drive a ...
Comments
Please enable JavaScript to view thecomments powered by Disqus.Information & Contributors
Information
Published In
March 2003
1112 pages
ISBN:0769518702
Sponsors
Publisher
IEEE Computer Society
United States
Publication History
Published: 03 March 2003
Check for updates
Qualifiers
- Article
Conference
DATE03
Sponsor:
Acceptance Rates
Overall Acceptance Rate 518 of 1,794 submissions, 29%
Upcoming Conference
DATE '25
- Sponsor:
- sigda
Contributors
Other Metrics
Bibliometrics & Citations
Bibliometrics
Article Metrics
- 0Total Citations
- 115Total Downloads
- Downloads (Last 12 months)0
- Downloads (Last 6 weeks)0
Reflects downloads up to 16 Nov 2024
Other Metrics
Citations
View Options
Login options
Check if you have access through your login credentials or your institution to get full access on this article.
Sign in