Generating test data with enhanced context-free grammars
PM Maurer - Ieee Software, 2002 - ieeexplore.ieee.org
PM Maurer
Ieee Software, 2002•ieeexplore.ieee.orgThe use of context-free grammars to improve functional testing of very-large-scale integrated
circuits is described. It is shown that enhanced context-free grammars are effective tools for
generating test data. The discussion covers preliminary considerations, the first tests,
generating systematic tests, and testing subroutines. The author's experience using context-
free grammars to generate tests for VLSI circuit simulators indicates that they are remarkably
effective tools that virtually anyone can use to debug virtually any program.<>
circuits is described. It is shown that enhanced context-free grammars are effective tools for
generating test data. The discussion covers preliminary considerations, the first tests,
generating systematic tests, and testing subroutines. The author's experience using context-
free grammars to generate tests for VLSI circuit simulators indicates that they are remarkably
effective tools that virtually anyone can use to debug virtually any program.<>
The use of context-free grammars to improve functional testing of very-large-scale integrated circuits is described. It is shown that enhanced context-free grammars are effective tools for generating test data. The discussion covers preliminary considerations, the first tests, generating systematic tests, and testing subroutines. The author's experience using context-free grammars to generate tests for VLSI circuit simulators indicates that they are remarkably effective tools that virtually anyone can use to debug virtually any program.<>
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