A discussion has been held on the application of distance education at the CAD Laboratory
of the Kaunas University of Technology. Modern capabilities of the Internet open the ways of …

At speed delay testing is important for embedded systems. Attempts to solve the problems of
delay testing only with non-scan or scan-based tests are unsuccessful. There is no need to …

Separate testing of hardware and software of embedded systems is insufficient. Communication
between hardware and software parts needs to be tested during the integrated testing. …

The paper presents two functional fault models that are devoted for functional delay test
generation for non-scan synchronous sequential circuits. These fault models form one joint …

The software prototype model can be used for the generation of the verification test. The input
stimuli, which form essential activity vectors, are selected from randomly generated ones …

The test can be developed at the functional level of the circuit. Such an approach allows
developing the test at the early stages of the design process in parallel with other activities of …

The design complexity of systems on a chip drives the need to reuse legacy or intellectual
property cores, whose gate‐level implementation details are unavailable. In this paper we …

We present a test generation approach that enables to construct functional test patterns at
early stages of the design according to the software prototype of the circuit. The presented …

… и информационным наукам, автор научной работы — Rimantas Seinauskas … по
компьютерным и информационным наукам , автор научной работы — Rimantas Seinauskas …

The paper presents two methods of functional delay test development based on the software
prototype as well as the results of their application to benchmark circuits. The first method is …