User profiles for Jae-Yeon Baek

Jae Yeon Baek

Graduate Student, University of California, Berkeley
Verified email at eecs.berkeley.edu
Cited by 353

High-performance Si microwire photovoltaics

…, SW Boettcher, RM Briggs, JY Baek… - Energy & …, 2011 - pubs.rsc.org
Crystalline Si wires, grown by the vapor–liquid–solid (VLS) process, have emerged as
promising candidate materials for low-cost, thin-film photovoltaics. Here, we demonstrate VLS-…

Effects of nutrition education program based on social cognitive theory for low sodium consumption among housewives living in certain regions of Seoul

JY Baek, HY Yi, JY Hwang, K Kim - … of the Korean Society of Food …, 2017 - koreascience.kr
There are limited programs for low sodium intake based on the nutrition education model for
housewives who cook family meals. The objective of this study was to evaluate the effects of …

Predicting congressional votes based on campaign finance data

S Smith, JY Baek, Z Kang, D Song… - 2012 11th …, 2012 - ieeexplore.ieee.org
The USA is witnessing a heavy debate about the influence of political campaign contributions
and votes cast on the floor of the United States Congress. We contribute quantitative …

[PDF][PDF] Effect of Periodic Virtual Metrology Recalibration on Blended Metrology Schemes

JYC Baek - 2012 - Citeseer
Risk and cost must be balanced in the design of semiconductor processing metrology. More
specifically, one needs to balance the cost of operating the metrology tool, and the loss in …

Optimal training and efficient model selection for parameterized large margin learning

Y Zhou, JY Baek, D Li, CJ Spanos - … and Data Mining: 20th Pacific-Asia …, 2016 - Springer
Recently diverse variations of large margin learning formalism have been proposed to
improve the flexibility and the performance of classic discriminative models such as SVM. …

Real-time inspection system utilizing scatterometry pupil data

JY Baek, P Leray, AL Charley… - Journal of Micro …, 2014 - spiedigitallibrary.org
Scatterometry-based critical dimension (CD), also known as optical CD (OCD), significantly
matches CD scanning electron microscopy in accuracy and precision, in addition to offering …

Enhancing metrology by combining spatial variability and global inference

CJ Spanos, JY Baek - Metrology, Inspection, and Process …, 2013 - spiedigitallibrary.org
Recently, there has been significant interest in so-called Hybrid or Holistic Metrology, the
practice of combining measurements from multiple sources in order to improve the estimation …

Performance Evaluation of Blended Metrology Schemes Incorporating Virtual Metrology

JY Baek, CJ Spanos - IEEE transactions on semiconductor …, 2013 - ieeexplore.ieee.org
This paper formulates and explores the tradeoff between re-calibration and off-line metrology
to find the optimal number of samples that maximizes the profit. A sequence of metrology …

Pattern Analysis of Movement Behavior of Medaka (Oryzias latipes): A Decision Tree Approach

S Lee, J Kim, JY Baek, MW Han, S Kim… - Computer Analysis of …, 2005 - Springer
The medaka, Oryzias latipes, is a small, egg-laying, freshwater, bony fish which is native to
Asian countries. We were continuously investigated behavioral sequences of the medaka …

Optimization of blended virtual and actual metrology schemes

JYC Baek, CJ Spanos - Metrology, Inspection, and Process …, 2012 - spiedigitallibrary.org
There are two competing costs that occur in off line semiconductor processing metrology.
One is the cost of operating the metrology tool, and the other is the loss in terms of processing …