Dynamic scheduling of test routines for efficient online self-testing of embedded microprocessors
N Bartzoudis, V Tantsios… - 2008 14th IEEE …, 2008 - ieeexplore.ieee.org
N Bartzoudis, V Tantsios, K McDonald-Maier
2008 14th IEEE International On-Line Testing Symposium, 2008•ieeexplore.ieee.orgThis paper presents a self-testing framework targeting the LEON3 embedded
microprocessor with built-in test-scheduling features. The proposed design exploits existing
post production test sets, designed for software-based testing of embedded
microprocessors. The framework also includes a constraint-based approach of test-routine
scheduling. The initial results show that the test execution time could be dynamically scaled
by the test selection algorithm.
microprocessor with built-in test-scheduling features. The proposed design exploits existing
post production test sets, designed for software-based testing of embedded
microprocessors. The framework also includes a constraint-based approach of test-routine
scheduling. The initial results show that the test execution time could be dynamically scaled
by the test selection algorithm.
This paper presents a self-testing framework targeting the LEON3 embedded microprocessor with built-in test-scheduling features. The proposed design exploits existing post production test sets, designed for software-based testing of embedded microprocessors. The framework also includes a constraint-based approach of test-routine scheduling. The initial results show that the test execution time could be dynamically scaled by the test selection algorithm.
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