Abstract Laser Voltage Imaging (LVI) is a new application developed from Laser Voltage
Probing (LVP). Most LVP applications have focused on design debug or design …

This paper will give an overview of the history of Laser Voltage Probing, explain the physical
background of the signal generation process, provide insight into various detection schemes …

Optical probing, though developed as silicon debugging tools from the chip backside, has
shown its capability of extracting secret data, such as cryptographic keys and user …

A variety of EFA techniques have been deployed to improve scan chain failure isolation. In
contrast to other laser techniques, modulation mapping (MM) does not require electrically …

Laser probing remains invaluable to the semiconductor industry for isolating and diagnosing
defects in silicon transistors in integrated circuits during electrical stress tests. However …

Backside E-Beam Probing on Nano Scale Devices Page 1 Paper 23.2 INTERNATIONAL TEST
CONFERENCE 1 1-4244-1128-9/07/$25.00 ©2007 IEEE Backside E-Beam Probing on Nano …

Abstract The Laser Voltage Imaging (LVI) technique, introduced in 2007 [1][2], has been
demonstrated as a successful defect localization technique to address problems on …

Laser voltage probing (LVP) provides signal levels from circuit nodes through the backside
of integrated circuits. Previous investigations presented voltage sweeping and modulation …

Abstract Electro Optical Probing (EOP) technique is an efficient backside contactless
technique to measure waveforms in modern VLSI circuits. The signal related intensity …

After providing a brief introduction to Laser Voltage Probing (LVP), along with useful
information and further reading suggestions, this paper provides a deep dive into current …