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We present fast methods for separating the direct and global illumination components of a scene measured by a camera and illuminated by a light source. In theory, the separation can be done with just two images taken with a high frequency binary illumination pattern and its complement. In practice, a larger number of images are used to overcome the optical and resolution limitations of the camera and the source. The approach does not require the material properties of objects and media in the scene to be known. However, we require that the illumination frequency is high enough to adequately sample the global components received by scene points. We present separation results for scenes that include complex interreflections, subsurface scattering and volumetric scattering. Several variants of the separation approach are also described. When a sinusoidal illumination pattern is used with different phase shifts …