WO2007094849A3 - Antireflective coating material - Google Patents
Antireflective coating material Download PDFInfo
- Publication number
- WO2007094849A3 WO2007094849A3 PCT/US2006/046811 US2006046811W WO2007094849A3 WO 2007094849 A3 WO2007094849 A3 WO 2007094849A3 US 2006046811 W US2006046811 W US 2006046811W WO 2007094849 A3 WO2007094849 A3 WO 2007094849A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- value
- antireflective coating
- coating material
- group
- mhsio
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/04—Polysiloxanes
- C09D183/06—Polysiloxanes containing silicon bound to oxygen-containing groups
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0752—Silicon-containing compounds in non photosensitive layers or as additives, e.g. for dry lithography
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Wood Science & Technology (AREA)
- Organic Chemistry (AREA)
- Architecture (AREA)
- Structural Engineering (AREA)
- Silicon Polymers (AREA)
- Paints Or Removers (AREA)
Abstract
Silsesquioxane resins useful in forming the antireflective coating having the formula (PhSiO(3-x)/2(OH)x)mHSiO(3-x)/2(OH)x)n(MeSiO(3-x)/2(OH)x)p(RSiO(3-x)/2(OH)x)q where Ph is a phenyl group, Me is a methyl group, R is a polyethylene oxide group, x has a value of 0, 1 or 2; m has a value of 0.01 to 0.99, n has a value of 0.01 to 0.99, p has a value of 0.01 to 0.99, q has a value of 0.01 to 0.50 and m + n + p + q ≈ l.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US77261606P | 2006-02-13 | 2006-02-13 | |
US60/772,616 | 2006-02-13 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2007094849A2 WO2007094849A2 (en) | 2007-08-23 |
WO2007094849A3 true WO2007094849A3 (en) | 2008-05-22 |
Family
ID=38371945
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2006/046811 WO2007094849A2 (en) | 2006-02-13 | 2006-12-07 | Antireflective coating material |
Country Status (2)
Country | Link |
---|---|
TW (1) | TW200731015A (en) |
WO (1) | WO2007094849A2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8809482B2 (en) | 2008-12-10 | 2014-08-19 | Dow Corning Corporation | Silsesquioxane resins |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20100114075A (en) | 2008-01-15 | 2010-10-22 | 다우 코닝 코포레이션 | Silsesquioxane resins |
CN102245723B (en) * | 2008-12-10 | 2014-12-17 | 陶氏康宁公司 | Wet-etchable antireflective coatings |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020187422A1 (en) * | 2000-06-23 | 2002-12-12 | International Business Machines Corporation | Antireflective silicon-containing compositions as hardmask layer |
US20030120018A1 (en) * | 1999-06-10 | 2003-06-26 | Teresa Baldwin | Spin-on-glass anti-reflective coatings for photolithography |
US20050282090A1 (en) * | 2002-12-02 | 2005-12-22 | Hirayama Kawasaki-Shi | Composition for forming antireflection coating |
WO2006065321A1 (en) * | 2004-12-17 | 2006-06-22 | Dow Corning Corporation | Method for forming anti-reflective coating |
-
2006
- 2006-12-07 WO PCT/US2006/046811 patent/WO2007094849A2/en active Application Filing
-
2007
- 2007-01-08 TW TW096100715A patent/TW200731015A/en unknown
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030120018A1 (en) * | 1999-06-10 | 2003-06-26 | Teresa Baldwin | Spin-on-glass anti-reflective coatings for photolithography |
US20020187422A1 (en) * | 2000-06-23 | 2002-12-12 | International Business Machines Corporation | Antireflective silicon-containing compositions as hardmask layer |
US20050282090A1 (en) * | 2002-12-02 | 2005-12-22 | Hirayama Kawasaki-Shi | Composition for forming antireflection coating |
WO2006065321A1 (en) * | 2004-12-17 | 2006-06-22 | Dow Corning Corporation | Method for forming anti-reflective coating |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8809482B2 (en) | 2008-12-10 | 2014-08-19 | Dow Corning Corporation | Silsesquioxane resins |
Also Published As
Publication number | Publication date |
---|---|
WO2007094849A2 (en) | 2007-08-23 |
TW200731015A (en) | 2007-08-16 |
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