TWM632019U - Adjustment and correction system - Google Patents
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Abstract
本新型為一種調整補正系統,其為:一光學量測單元量測一膠水,並得到一第N三維膠水訊號, N為一常數,一演算單元接收第N三維膠水訊號,並得出膠水的體積或重量,演算單元將膠水的體積或重量與一膠水預設數值比對,若膠水的體積或重量不符膠水預設數值,則演算單元傳送一第N膠水量變更訊號給一出膠控制單元,以使出膠控制單元依據第N膠水量變更訊號調整所提供的膠水量。本新型係透過一閉迴路達到能夠依據前次的膠水量之回饋,並調整本次的膠水量,藉以解決溢膠或膠水不足,進而提升黏合的品質。The new model is an adjustment and correction system, which is: an optical measuring unit measures a glue, and obtains an Nth three-dimensional glue signal, where N is a constant, and an arithmetic unit receives the Nth three-dimensional glue signal, and obtains the glue For volume or weight, the calculation unit compares the volume or weight of the glue with a preset value of the glue. If the volume or weight of the glue does not match the preset value of the glue, the calculation unit sends an N-th glue quantity change signal to a glue dispensing control unit , so that the glue dispensing control unit adjusts the supplied glue quantity according to the Nth glue quantity change signal. This new model achieves feedback based on the previous glue amount through a closed loop, and adjusts the current amount of glue, so as to solve the problem of overflowing glue or insufficient glue, thereby improving the quality of bonding.
Description
本新型是關於一種調整補正系統 ,尤其為一種利用閉迴路系統,並依據前次膠水量,而調整本次膠水量的調整補正系統 。The new model relates to an adjustment and correction system, especially an adjustment and correction system that uses a closed-loop system and adjusts the current amount of glue according to the previous amount of glue.
晶片貼合技術或基板黏合技術,為半導體產業、電子產業或觸控顯示產業相當重要的技術或製程。現有的貼合技術係選擇性透過一視覺單元,以視覺定位基板之欲黏合處,或者預先以程式設定基板之欲黏合處,並將膠水點至欲黏合處,再進行壓合製程,而使二基板相互黏合或晶粒黏合於基板。Chip bonding technology or substrate bonding technology is a very important technology or process in the semiconductor industry, electronic industry or touch display industry. The existing bonding technology selectively uses a visual unit to visually locate the desired bonding position of the substrate, or pre-programs the desired bonding position of the substrate, and applies glue to the desired bonding position, and then performs the lamination process to make the bonding process. The two substrates are bonded to each other or die bonded to the substrate.
然上述的黏合技術仍存在有溢膠或膠水不足的問題,因膠水點至欲黏合處的膠水量會因很多變數而產生無法定量的缺點,如膠水的密度、膠水的黏度、環境的溼度、環境的溫度等。當有溢膠或膠水不足的情況發生時,於黏合製程進行時是無法及時發現,要待接續的品質檢驗(Quality Control)才能發現前述之溢膠或膠水不足,所以黏合的產品無法達到應有的品質造成成本的耗損。However, the above-mentioned bonding technology still has the problem of overflowing glue or insufficient glue, because the amount of glue from the glue point to the place to be glued will have unquantifiable shortcomings due to many variables, such as glue density, glue viscosity, environmental humidity, etc. ambient temperature, etc. When there is excess glue or insufficient glue, it cannot be detected in time during the bonding process, and the above-mentioned excess glue or insufficient glue can only be found by the subsequent quality control, so the bonded products cannot meet the expected requirements. quality leads to loss of cost.
綜合上述,現有的即時回饋並於黏合製程中調整膠水量是目前業界極為重要的項目。To sum up the above, the existing real-time feedback and adjusting the glue amount in the bonding process are extremely important items in the industry at present.
本新型創作人鑑於上述先前技術的各項缺點,乃亟思加以改良創新,並經多年的研究實驗後,終於成功研發完成本新型之調整補正系統 。In view of the shortcomings of the above-mentioned prior art, the creator of this new type has been thinking about improving and innovating, and after years of research and experimentation, he has finally successfully developed and completed the adjustment and correction system of this new type.
本新型揭露一種調整補正系統,包含有:一光學量測單元;一出膠控制單元;以及一演算單元,電性連接該光學量測單元與該出膠控制單元;其中,光學量測單元量測一膠水,並得到一第N三維膠水訊號, N為一常數,演算單元接收第N三維膠水訊號,並得出膠水的體積或重量,演算單元將膠水的體積或重量與一膠水預設數值比對,若膠水的體積或重量不符膠水預設數值,則演算單元傳送一第N膠水量變更訊號給出膠控制單元,以使出膠控制單元依據第N膠水量變更訊號調整所提供的膠水量。The present invention discloses an adjustment and correction system, comprising: an optical measurement unit; a glue discharge control unit; and a calculation unit, which is electrically connected to the optical measurement unit and the glue discharge control unit; wherein the optical measurement unit measures Measure a glue, and obtain an Nth three-dimensional glue signal, N is a constant, the calculation unit receives the Nth three-dimensional glue signal, and obtains the volume or weight of the glue, and the calculation unit compares the volume or weight of the glue with a glue preset value By comparison, if the volume or weight of the glue does not match the preset value of the glue, the calculation unit sends an Nth glue quantity change signal to the glue control unit, so that the glue control unit adjusts the provided glue according to the Nth glue quantity change signal. water volume.
於一實施例,出膠控制單元提供膠水給一出膠單元,以使出膠單元對一第N+1基板之欲黏合處點膠。In one embodiment, the glue dispensing control unit provides glue to a glue dispensing unit, so that the glue dispensing unit dispenses glue to a place to be bonded on an N+1th substrate.
於一實施例,光學量測單元為一雷射測量儀、一三角雷射測距、一光學干涉量測、一共聚焦雷射掃描顯微鏡、一飛秒紅外雷射器與一共聚焦顯微鏡之組成或一共軛雷射。In one embodiment, the optical measurement unit is a laser measuring instrument, a triangular laser ranging, an optical interference measurement, a confocal laser scanning microscope, a femtosecond infrared laser, and a confocal microscope, or A conjugate laser.
於一實施例,光學量測單元包含有至少一上視覺模組與至少一側視覺模組,上視覺模組與側視覺模組為一電荷耦合器件相機或一電荷耦合器件影像感測器。In one embodiment, the optical measurement unit includes at least one upper vision module and at least one side vision module, and the upper vision module and the side vision module are a CCD camera or a CCD image sensor.
於一實施例,所提供的膠水的體積或重量在膠水預設數值之99%至101%之間。In one embodiment, the volume or weight of the provided glue is between 99% and 101% of the predetermined value of the glue.
藉由如上的本新型之調整補正系統 ,是將光學量測單元、出膠控制單元與演算單元設計為一閉迴路,故於每次點膠後,演算單元能夠依據光學量測單元所量測的膠水的三維資訊(三維膠水訊號),而得出膠水的體積或重量。演算單元係將膠水的體積或重量與一膠水預設數值進行比對,若不符膠水預設數值,則提供一膠水量變更訊號給出膠控制單元,以使出膠控制單元調整提供給出膠單元的膠水量。本新型係透過一閉迴路達到能夠依據前次的膠水量之回饋,並調整本次的膠水量,藉以解決溢膠或膠水不足,進而提升黏合的品質。With the above-mentioned adjustment and correction system of the present invention, the optical measurement unit, the glue control unit and the calculation unit are designed as a closed loop, so after each dispensing, the calculation unit can measure according to the measurement of the optical measurement unit. The three-dimensional information of the glue (three-dimensional glue signal), and the volume or weight of the glue is obtained. The calculation unit compares the volume or weight of the glue with a preset value of the glue, and if it does not match the preset value of the glue, it will provide a glue quantity change signal to the glue control unit, so that the glue control unit can adjust and provide the glue. The amount of glue for the unit. This new model achieves feedback based on the previous glue amount through a closed loop, and adjusts the current amount of glue, so as to solve the problem of overflowing glue or insufficient glue, thereby improving the quality of bonding.
為了使所屬技術領域中具有通常識者能夠充分瞭解本新型之技術特徵、內容與優點及其所能達到之功效,茲將本新型配合圖式,並以實施例之表達形式詳細說明如下,而其中所使用之圖式,其主旨僅為示意及輔助說明書之用,未必為本新型實施後之真實比例與精準配置,故不應就所附之圖式的比例與配置關係解讀、侷限本新型於實際實施上的權利範圍,合先敘明。In order to enable those skilled in the art to fully understand the technical features, contents and advantages of the present invention and the effects that can be achieved, the present invention is described in detail as follows in the form of an embodiment in conjunction with the drawings. The purpose of the drawings used is only for illustration and auxiliary instructions, and may not necessarily be the real scale and precise configuration after the implementation of the new model. Therefore, the proportion and configuration relationship of the attached drawings should not be interpreted or limited to The scope of rights in actual implementation will be described first.
請參閱圖1,其係為本新型的第一實施例之調整補正系統之動作示意圖 。如圖所示, 調整補正系統包含有:一光學量測單元10、一出膠單元11、一出膠控制單元12、一演算單元13與一輸送單元14。Please refer to FIG. 1 , which is a schematic diagram of the operation of the adjustment and correction system according to the first embodiment of the present invention. As shown in the figure, the adjustment and correction system includes: an
光學量測單元10設於輸送單元14的上方,光學量測單元10為一雷射測量儀、一三角雷射測距、一光學干涉量測、一共聚焦雷射掃描顯微鏡、一飛秒紅外雷射器與一共聚焦顯微鏡之組成或一共軛雷射。The
出膠單元11設於輸送單元14的上方,並相鄰於光學量測單元10。出膠單元11可為一點膠針頭。The
出膠控制單元12耦接出膠單元11,出膠控制單元12能夠控制提供給出膠單元11之膠水的體積或重量。The
演算單元13係電性耦接出膠控制單元12與光學量測單元10。The
輸送單元14將一欲黏合的基板(為了便於閱讀,以下稱為第一基板15) 輸送至出膠單元11的下方,出膠單元11對第一基板15之欲黏合處進行點膠。光學量測單元10係對第一基板15之欲黏合處的膠水進行量測,並得到一三維膠水訊號(為了便於閱讀,以下稱為第一三維膠水訊號)。The
於本實施例中,光學量測單元10為一共聚焦雷射掃描顯微鏡或一飛秒紅外雷射器與一共聚焦顯微鏡之組成。共聚焦雷射掃描顯微鏡(Confocal laser scanning microscopy,CLSM)之原理主要是利用針孔光圈(Pinhole)將非聚焦面的光排除在外。共聚焦雷射掃描顯微鏡的技術可去除傳統螢光顯微鏡影像中的非具焦面的光,可將樣品一層一層觀察,大大增加了影像的對比、解析度以及螢光偵測訊噪比。In this embodiment, the
第一三維膠水訊號係傳送給演算單元13,演算單元13依據第一三維膠水訊號進行演算,而得出位於第一基板15之欲黏合處的膠水的體積或重量。演算單元13將演算所得之膠水的體積或重量與一膠水預設數值進行比對。若膠水的體積或重量不符合膠水預設數值,即膠水的體積或重量超過或低於一膠水預設數值時,演算單元13傳送一膠水量變更訊號(為了便於閱讀,以下稱為第一膠水量變更訊號)給出膠控制單元12。出膠控制單元12依據第一膠水量變更訊號變更提供給出膠單元11的膠水量,以使位於基板之欲黏合處的膠水的體積或重量符合或趨近於膠水預設數值。該趨近為膠水預設數值之99%至101%之間。換句話說,所提供之膠水的體積或重量在膠水預設數值之99%至101%之間。The first three-dimensional glue signal is sent to the
請參閱圖2,其係為本新型的第一實施例之調整補正系統之另一動作示意圖 。如圖所示,輸送單元14輸送第一基板15離開出膠單元11的下方,並將另一欲黏合之基板(為了便於閱讀,以下稱為第二基板16)輸送至出膠單元11的下方。出膠單元11將來自出膠控制單元12的膠水點至第二基板16之欲黏合處。Please refer to FIG. 2 , which is a schematic diagram of another action of the adjustment and correction system according to the first embodiment of the present invention. As shown in the figure, the
請參閱圖3,其係為本新型的第一實施例之調整補正系統之又一動作示意圖。如圖所示,光學量測單元10係對第二基板之欲黏合處的膠水進行量測,並得到一三維膠水訊號(為了便於閱讀,以下稱為第二三維膠水訊號)。第二三維膠水訊號係傳送給演算單元13,演算單元13依據第二三維膠水訊號進行演算,而得出位於第二基板16之欲黏合處的膠水的體積或重量。演算單元13將演算所得之膠水的體積或重量與一膠水預設數值進行比對。若膠水的體積或重量不符合膠水預設數值,演算單元13傳送一膠水量變更訊號(為了便於閱讀,以下稱為第二膠水量變更訊號)給出膠控制單元12。出膠控制單元12依據第二膠水量變更訊號變更提供給出膠單元11的膠水量,以使位於基板之欲黏合處的膠水的體積或重量符合或趨近於膠水預設數值。Please refer to FIG. 3 , which is a schematic diagram of another action of the adjustment and correction system according to the first embodiment of the present invention. As shown in the figure, the
請參閱圖4,其係為本新型的第二實施例之調整補正系統之動作示意圖 。如圖所示, 調整補正系統包含有:一光學量測單元20、一出膠單元21、一出膠控制單元22、一演算單元23與一輸送單元24。Please refer to FIG. 4 , which is a schematic diagram of the operation of the adjustment and correction system of the second embodiment of the present invention. As shown in the figure, the adjustment and correction system includes: an
光學量測單元20包含有至少一上視覺模組200與至少一側視覺模組201,上視覺模組200設於輸送單元24的上方,側視覺模組201設於輸送單元24的一側。於本實施例中,上視覺模組200與側視覺模組201可為一電荷耦合器件(Charge-coupled Device,CCD)相機或一CCD影像感測器。The
出膠單元21設於輸送單元24的上方2。出膠單元21可為一點膠針頭。The
出膠控制單元22耦接出膠單元21,出膠控制單元22能夠控制提供給出膠單元21之膠水的體積或重量。The
演算單元23係電性耦接出膠控制單元22與光學量測單元20。The
輸送單元24將一欲黏合的基板(為了便於閱讀,以下稱為第三基板25) 輸送至出膠單元21的下方。出膠單元21對第三基板25之欲黏合處進行點膠。光學量測單元20係對第三基板之欲黏合處的膠水進行影像擷取。上視覺模組200擷取位於第三基板25之欲黏合處的膠水的上方影像。側視覺模組201擷取位於第三基板25之欲黏合處的膠水的側面影像。上方影像與側面影像係提供給演算單元23,演算單元23依據上方影像與側面影像,而得到一三維膠水訊號(為了便於閱讀,以下稱為第三三維膠水訊號)。The
演算單元23依據第三三維膠水訊號進行演算,而得出位於第三基板25之欲黏合處的膠水的體積或重量。演算單元23將演算所得之膠水的體積或重量與一膠水預設數值進行比對。若膠水的體積或重量不符合膠水預設數值,演算單元23傳送一膠水量變更訊號(為了便於閱讀,以下稱為第三膠水量變更訊號)給出膠控制單元22。The
請參閱圖5,其係為本新型的第二實施例之調整補正系統之另一動作示意圖 。如圖所示,輸送單元24輸送第三基板25離開出膠單元21的下方,並將另一基板(為了便於閱讀,以下稱為第四基板26) 輸送至出膠單元21的下方。出膠控制單元22依據第三膠水量變更訊號變更提供給出膠單元21的膠水量。出膠單元21將來自出膠控制單元22的膠水點至第四基板26之欲黏合處。Please refer to FIG. 5 , which is a schematic diagram of another action of the adjustment and correction system of the second embodiment of the present invention. As shown in the figure, the conveying
請參閱圖6,其係為本新型的第二實施例之調整補正系統之又一動作示意圖。如圖所示,光學量測單元20係對第四基板26之欲黏合處的膠水進行影像擷取。上視覺模組200擷取位於第四基板26之欲黏合處的膠水的上方影像。側視覺模組201擷取位於第四基板26之欲黏合處的膠水的側面影像。上方影像與側面影像係提供給演算單元23,演算單元23依據上方影像與側面影像,而得到一三維膠水訊號(為了便於閱讀,以下稱為第四三維膠水訊號)。Please refer to FIG. 6 , which is a schematic diagram of another action of the adjustment and correction system of the second embodiment of the present invention. As shown in the figure, the
演算單元23依據第四三維膠水訊號進行演算,而得出位於第四基板26之欲黏合處的膠水的體積或重量。演算單元23將演算所得之膠水的體積或重量與一膠水預設數值進行比對。若膠水的體積或重量不符合膠水預設數值,演算單元23傳送一膠水量變更訊號(為了便於閱讀,以下稱為第四膠水量變更訊號)給出膠控制單元22。The
出膠控制單元22依據第四膠水量變更訊號變更提供給出膠單元21的膠水量,以使位於基板之欲黏合處的膠水的體積或重量符合或趨近於膠水預設數值。The glue
本新型之調整補正系統應用於一調整補正方法 ,步驟包含有:The new adjustment and correction system is applied to an adjustment and correction method, and the steps include:
步驟A、取得第N三維膠水訊號:請再參閱圖1至3,輸送單元14將第N基板輸送至出膠單元11的下方,N為一常數。出膠單元11對第N基板之欲黏合處進行點膠。若光學量測單元10為一共聚焦雷射掃描顯微鏡或一飛秒紅外雷射器與一共聚焦顯微鏡之組成。光學量測單元10係對第N基板之欲黏合處的膠水進行量測,並得到一第N三維膠水訊號。Step A. Obtaining the Nth three-dimensional glue signal: Please refer to FIGS. 1 to 3 again. The conveying
請再參閱圖3至6,若光學量測單元20為上視覺模組200與側視覺模組201。上視覺單元200係擷取第N基板之欲黏合處的膠水之上方影像。側視覺模組201擷取位於第N基板之欲黏合處的膠水的側面影像。上方影像與側面影像係提供給演算單元23,演算單元23依據上方影像與側面影像,而得到一第N三維膠水訊號。Please refer to FIGS. 3 to 6 again, if the
步驟B、取得第N膠水量變更訊號:請再參閱圖1至3,演算單元13依據第N三維膠水訊號進行演算,而得出位於第N基板之欲黏合處的膠水的體積或重量,演算單元13將演算所得之膠水的體積或重量與一膠水預設數值進行比對。若膠水的體積或重量不符合膠水預設數值,演算單元13傳送一第N膠水量變更訊號給出膠控制單元12。Step B. Obtaining the N-th glue quantity change signal: Please refer to FIGS. 1 to 3 again, the
步驟C、對第N+1基板進行點膠:輸送單元14輸送第N基板離開出膠單元11的下方,並將第N+1基板輸送至出膠單元11的下方。出膠控制單元12依據第N膠水量變更訊號調整所提供的膠水量,並將膠水提供給出膠單元11。出膠單元11將來自出膠控制單元12的膠水點至第N+1基板之欲黏合處。再回至步驟A。Step C. Dispensing the N+1 th substrate: the conveying
綜上所述, 本新型之調整補正系統 ,是將光學量測單元、出膠控制單元與演算單元設計為一閉迴路,故於每次點膠後,演算單元能夠依據光學量測單元所量測的膠水的三維資訊(三維膠水訊號),而得出膠水的體積或重量。演算單元係將膠水的體積或重量與一膠水預設數值進行比對,若不符膠水預設數值,則提供一膠水量變更訊號給出膠控制單元,以使出膠控制單元調整提供給出膠單元的膠水量。本新型係透過一閉迴路達到能夠依據前次的膠水量之回饋,並調整本次的膠水量,藉以解決溢膠或膠水不足,進而提升黏合的品質。To sum up, the adjustment and correction system of the new type is designed to be a closed loop of the optical measurement unit, the glue control unit and the calculation unit. Therefore, after each dispensing, the calculation unit can measure according to the measurement of the optical measurement unit. The three-dimensional information (three-dimensional glue signal) of the measured glue is obtained, and the volume or weight of the glue is obtained. The calculation unit compares the volume or weight of the glue with a preset value of the glue, and if it does not match the preset value of the glue, it will provide a glue quantity change signal to the glue control unit, so that the glue control unit can adjust and provide the glue. The amount of glue for the unit. This new model achieves feedback based on the previous glue amount through a closed loop, and adjusts the current amount of glue, so as to solve the problem of overflowing glue or insufficient glue, thereby improving the quality of bonding.
以上所述僅為舉例性,用以說明本新型之技術內容的可行具體實施例,而非用於限制本新型。本新型所屬技領域具有通常知識者基於說明書中所揭示內容之教示所為的等效置換、修改或變更,均包含於本新型之申請專利範圍中,未脫離本新型的權利範疇。The above descriptions are only exemplary, and are used to illustrate the practical embodiments of the technical content of the present invention, but are not intended to limit the present invention. Equivalent replacements, modifications or alterations made by those with ordinary knowledge in the technical field of the present invention based on the teachings of the contents disclosed in the specification are included in the scope of the patent application of the present invention and do not depart from the scope of the rights of the present invention.
10,20:光學量測單元
11,21:出膠單元
12,22:出膠控制單元
13,23:演算單元
14,24:輸送單元
15:第一基板
16:第二基板
25:第三基板
26:第四基板
200:上視覺模組
201:側視覺模組
10,20:
圖1為本新型的第一實施例之調整補正系統之動作示意圖。 圖2為本新型的第一實施例之調整補正系統之另一動作示意圖。 圖3為本新型的第一實施例之調整補正系統之又一動作示意圖。 圖4為本新型的第二實施例之調整補正系統之動作示意圖。 圖5為本新型的第二實施例之調整補正系統之另一動作示意圖。 圖6為本新型的第二實施例之調整補正系統之又一動作示意圖。 FIG. 1 is a schematic diagram of the operation of the adjustment and correction system according to the first embodiment of the new type. FIG. 2 is a schematic diagram of another operation of the adjustment and correction system according to the first embodiment of the novel. FIG. 3 is a schematic diagram of another operation of the adjustment and correction system according to the first embodiment of the novel. FIG. 4 is a schematic diagram of the operation of the adjustment and correction system according to the second embodiment of the novel. FIG. 5 is a schematic diagram of another operation of the adjustment and correction system according to the second embodiment of the novel. FIG. 6 is a schematic diagram of another operation of the adjustment and correction system according to the second embodiment of the novel.
10:光學量測單元 10: Optical measurement unit
11:出膠單元 11: glue unit
12:出膠控制單元 12: glue control unit
13:演算單元 13: Calculation Unit
14:輸送單元 14: Conveyor unit
15:第一基板 15: The first substrate
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TWI794119B (en) * | 2022-06-20 | 2023-02-21 | 高科晶捷自動化股份有限公司 | Adjustment correction system and its method |
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