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TW200725775A - Systems and methods for optical measurement - Google Patents

Systems and methods for optical measurement

Info

Publication number
TW200725775A
TW200725775A TW095119155A TW95119155A TW200725775A TW 200725775 A TW200725775 A TW 200725775A TW 095119155 A TW095119155 A TW 095119155A TW 95119155 A TW95119155 A TW 95119155A TW 200725775 A TW200725775 A TW 200725775A
Authority
TW
Taiwan
Prior art keywords
coefficient
determines
systems
methods
optical measurement
Prior art date
Application number
TW095119155A
Other languages
English (en)
Other versions
TWI299889B (en
Inventor
Joung-Wei Liou
Jacky Huang
Chih-Ming Ke
Szu-An Wu
Original Assignee
Taiwan Semiconductor Mfg Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Semiconductor Mfg Co Ltd filed Critical Taiwan Semiconductor Mfg Co Ltd
Publication of TW200725775A publication Critical patent/TW200725775A/zh
Application granted granted Critical
Publication of TWI299889B publication Critical patent/TWI299889B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/211—Ellipsometry

Landscapes

  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
TW095119155A 2005-12-30 2006-05-30 Systems and methods for optical measurement TWI299889B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/322,540 US7349086B2 (en) 2005-12-30 2005-12-30 Systems and methods for optical measurement

Publications (2)

Publication Number Publication Date
TW200725775A true TW200725775A (en) 2007-07-01
TWI299889B TWI299889B (en) 2008-08-11

Family

ID=38224011

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095119155A TWI299889B (en) 2005-12-30 2006-05-30 Systems and methods for optical measurement

Country Status (2)

Country Link
US (1) US7349086B2 (zh)
TW (1) TWI299889B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111279147A (zh) * 2017-11-01 2020-06-12 柯尼卡美能达株式会社 膜厚测定方法、膜厚测定系统、光反射膜的制造方法及光反射膜的制造系统

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8936057B2 (en) * 2005-08-30 2015-01-20 Rockwell Collins, Inc. Substrate lamination system and method
US7787685B2 (en) * 2006-04-17 2010-08-31 Taiwan Semiconductor Manufacturing Company, Ltd. Extracting ordinary and extraordinary optical characteristics for critical dimension measurement of anisotropic materials
KR101229372B1 (ko) * 2010-10-08 2013-02-05 대한민국 기름탐지시스템 및 이를 이용한 기름탐지방법
US8830464B2 (en) * 2012-11-06 2014-09-09 Kla-Tencor Corporation Film thickness, refractive index, and extinction coefficient determination for film curve creation and defect sizing in real time
JP7576827B2 (ja) 2020-11-12 2024-11-01 学校法人東京電機大学 非晶質炭素膜の細胞凝集機能を判定する検査方法。

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6532076B1 (en) * 2000-04-04 2003-03-11 Therma-Wave, Inc. Method and apparatus for multidomain data analysis
US6900892B2 (en) * 2000-12-19 2005-05-31 Kla-Tencor Technologies Corporation Parametric profiling using optical spectroscopic systems
IL145699A (en) * 2001-09-30 2006-12-10 Nova Measuring Instr Ltd Method of thin film characterization

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111279147A (zh) * 2017-11-01 2020-06-12 柯尼卡美能达株式会社 膜厚测定方法、膜厚测定系统、光反射膜的制造方法及光反射膜的制造系统

Also Published As

Publication number Publication date
TWI299889B (en) 2008-08-11
US7349086B2 (en) 2008-03-25
US20070153272A1 (en) 2007-07-05

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