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TW200620303A - Using a phase change memory as a replacement for a buffered flash memory - Google Patents

Using a phase change memory as a replacement for a buffered flash memory

Info

Publication number
TW200620303A
TW200620303A TW094128744A TW94128744A TW200620303A TW 200620303 A TW200620303 A TW 200620303A TW 094128744 A TW094128744 A TW 094128744A TW 94128744 A TW94128744 A TW 94128744A TW 200620303 A TW200620303 A TW 200620303A
Authority
TW
Taiwan
Prior art keywords
memory
phase change
random access
change memory
replacement
Prior art date
Application number
TW094128744A
Other languages
English (en)
Other versions
TWI284904B (en
Inventor
Ward D Parkinson
Manzur Gill
Original Assignee
Ovonyx Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ovonyx Inc filed Critical Ovonyx Inc
Publication of TW200620303A publication Critical patent/TW200620303A/zh
Application granted granted Critical
Publication of TWI284904B publication Critical patent/TWI284904B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/003—Cell access
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0004—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising amorphous/crystalline phase transition cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/02—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using elements whose operation depends upon chemical change
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/70—Resistive array aspects
    • G11C2213/76—Array using an access device for each cell which being not a transistor and not a diode
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B63/00—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
    • H10B63/20—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices comprising selection components having two electrodes, e.g. diodes
    • H10B63/24—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices comprising selection components having two electrodes, e.g. diodes of the Ovonic threshold switching type

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Semiconductor Memories (AREA)
  • Memory System (AREA)
TW094128744A 2004-09-10 2005-08-23 Using a phase change memory as a replacement for a buffered flash memory TWI284904B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/938,705 US20060056233A1 (en) 2004-09-10 2004-09-10 Using a phase change memory as a replacement for a buffered flash memory

Publications (2)

Publication Number Publication Date
TW200620303A true TW200620303A (en) 2006-06-16
TWI284904B TWI284904B (en) 2007-08-01

Family

ID=36033732

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094128744A TWI284904B (en) 2004-09-10 2005-08-23 Using a phase change memory as a replacement for a buffered flash memory

Country Status (4)

Country Link
US (1) US20060056233A1 (zh)
JP (1) JP2006079609A (zh)
KR (1) KR100704329B1 (zh)
TW (1) TWI284904B (zh)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8791448B2 (en) 2007-03-27 2014-07-29 Samsung Electronics Co., Ltd. Semiconductor memory devices having strapping contacts
TWI689941B (zh) * 2018-03-20 2020-04-01 日商東芝記憶體股份有限公司 半導體記憶裝置及其控制方法
TWI714638B (zh) * 2015-09-30 2021-01-01 美商瑟夫實驗室股份有限公司 用於多阻抗相關之電子交換器編織的方法及設備

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070156949A1 (en) * 2005-12-30 2007-07-05 Rudelic John C Method and apparatus for single chip system boot
US7414883B2 (en) * 2006-04-20 2008-08-19 Intel Corporation Programming a normally single phase chalcogenide material for use as a memory or FPLA
US20080224305A1 (en) * 2007-03-14 2008-09-18 Shah Amip J Method, apparatus, and system for phase change memory packaging
US7755935B2 (en) 2007-07-26 2010-07-13 International Business Machines Corporation Block erase for phase change memory
KR101237005B1 (ko) 2007-11-09 2013-02-26 삼성전자주식회사 저항체를 이용한 비휘발성 메모리 장치, 이를 포함하는메모리 시스템, 및 이의 구동 방법
KR20100045077A (ko) * 2008-10-23 2010-05-03 삼성전자주식회사 면적을 감소시킨 가변 저항 메모리 장치
KR101543434B1 (ko) 2008-12-15 2015-08-10 삼성전자주식회사 반도체 메모리 시스템의 제조 방법
US8239629B2 (en) * 2009-03-31 2012-08-07 Micron Technology, Inc. Hierarchical memory architecture to connect mass storage devices
US20120026802A1 (en) * 2010-07-30 2012-02-02 Emanuele Confalonieri Managed hybrid memory with adaptive power supply
US20140359196A1 (en) * 2013-05-31 2014-12-04 Daniel J. Ragland On-the-fly performance adjustment for solid state storage devices
US9806129B2 (en) * 2014-02-25 2017-10-31 Micron Technology, Inc. Cross-point memory and methods for fabrication of same
US11223014B2 (en) 2014-02-25 2022-01-11 Micron Technology, Inc. Semiconductor structures including liners comprising alucone and related methods
US9484196B2 (en) 2014-02-25 2016-11-01 Micron Technology, Inc. Semiconductor structures including liners comprising alucone and related methods
US10249819B2 (en) 2014-04-03 2019-04-02 Micron Technology, Inc. Methods of forming semiconductor structures including multi-portion liners
US9575727B2 (en) * 2014-09-26 2017-02-21 Intel Corporation Methods for generating random data using phase change materials and related devices and systems

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5714768A (en) * 1995-10-24 1998-02-03 Energy Conversion Devices, Inc. Second-layer phase change memory array on top of a logic device
JP4637380B2 (ja) * 2001-02-08 2011-02-23 ルネサスエレクトロニクス株式会社 半導体装置
US6570784B2 (en) * 2001-06-29 2003-05-27 Ovonyx, Inc. Programming a phase-change material memory
US6590807B2 (en) * 2001-08-02 2003-07-08 Intel Corporation Method for reading a structural phase-change memory
US20030047765A1 (en) * 2001-08-30 2003-03-13 Campbell Kristy A. Stoichiometry for chalcogenide glasses useful for memory devices and method of formation
US6566700B2 (en) * 2001-10-11 2003-05-20 Ovonyx, Inc. Carbon-containing interfacial layer for phase-change memory
US7030488B2 (en) * 2001-10-30 2006-04-18 Intel Corporation Packaged combination memory for electronic devices
US6625054B2 (en) * 2001-12-28 2003-09-23 Intel Corporation Method and apparatus to program a phase change memory
US6667900B2 (en) * 2001-12-28 2003-12-23 Ovonyx, Inc. Method and apparatus to operate a memory cell
US6579760B1 (en) * 2002-03-28 2003-06-17 Macronix International Co., Ltd. Self-aligned, programmable phase change memory
KR100543445B1 (ko) * 2003-03-04 2006-01-23 삼성전자주식회사 상변화 기억 소자 및 그 형성방법
JP4325275B2 (ja) * 2003-05-28 2009-09-02 株式会社日立製作所 半導体装置
US7291878B2 (en) * 2003-06-03 2007-11-06 Hitachi Global Storage Technologies Netherlands B.V. Ultra low-cost solid-state memory

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8791448B2 (en) 2007-03-27 2014-07-29 Samsung Electronics Co., Ltd. Semiconductor memory devices having strapping contacts
TWI459541B (zh) * 2007-03-27 2014-11-01 Samsung Electronics Co Ltd 具有綑綁觸點之半導體記憶體裝置
TWI714638B (zh) * 2015-09-30 2021-01-01 美商瑟夫實驗室股份有限公司 用於多阻抗相關之電子交換器編織的方法及設備
TWI689941B (zh) * 2018-03-20 2020-04-01 日商東芝記憶體股份有限公司 半導體記憶裝置及其控制方法

Also Published As

Publication number Publication date
US20060056233A1 (en) 2006-03-16
JP2006079609A (ja) 2006-03-23
KR100704329B1 (ko) 2007-04-09
TWI284904B (en) 2007-08-01
KR20060051133A (ko) 2006-05-19

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