KR20070023477A - Method of manufacturing thin film of vanadium oxide - Google Patents

Abstract

Provided is a method for producing a large area vanadium oxide thin film having a uniform surface and stable composition. The method injects a vanadium-organic metal compound gas into the chamber to form an adsorbate in which the vanadium-organic metal compound molecules are saturated and adsorbed on the surface of the substrate. Thereafter, an oxygen-precursor is injected into the chamber to prepare a vanadium oxide thin film by surface saturation reaction with the adsorbate.

Vanadium oxide, thin film, large area, surface saturation reaction

Description

Method of manufacturing thin film of vanadium oxide

1 is a timing chart for explaining an atomic layer deposition method according to a first embodiment of the present invention.

2 is a timing chart for explaining the atomic layer deposition method according to the second embodiment of the present invention.

3 and 4 are cross-sectional views illustrating devices in which the vanadium oxide film described in the second embodiment of the present invention is formed.

5 is a chart showing the deposition rate of the vanadium oxide film according to the temperature.

FIG. 6 is a diagram illustrating an example of analyzing a composition of a vanadium oxide film prepared at 150 ° C. using Auger Electron Spectroscopy (AES).

7 is a graph showing the resistance change with the temperature of the vanadium oxide film produced at 150 ℃.

The present invention relates to a method for manufacturing a vanadium oxide thin film, and more particularly, to a method for manufacturing a vanadium oxide thin film by an atomic layer deposition method.

Vanadium oxides such as V ₂ O _3, VO ₂ and V ₂ O ₅ from V ₂ O _3, and VO ₂ is adjustable conditions are a temperature or voltage increases to the extent insulator sharp transition metal in as (MIT) It is a substance. In particular, since VO ₂ causes a rapid resistance change near about 340K above room temperature, it can be usefully used in devices such as switches and transistors.

On the other hand, vanadium oxide has been reported a large number of insulator-metal transition phenomenon in the bulk state due to the increase in temperature, but it is still insufficient to implement the phenomenon in the form of a thin film, and applied to devices such as switches and transistors It is known that there is a limit. The method of manufacturing vanadium oxide in the form of a thin film includes, for example, sputter deposition, pulsed laser deposition, and sol-gel, among which a pulsed laser deposition method is used. It is known to form vanadium oxide thin films with the best properties.

By the way, the pulsed laser deposition method can be deposited only in a small area, and projections are formed on the surface of the thin film. This is not enough to study the properties of the vanadium oxide thin film, but is not suitable for the thin film for application devices that require a large area thin film having a uniform and flat surface and uniform thickness distribution. In addition, the vanadium oxide thin film, for example, VO ₂ thin film formed by the deposition method, the properties in particular change depending on the amount of oxygen, it is very difficult to control the amount of oxygen.

In order to obtain a VO ₂ thin film, the sol-gel method may be, for example, coated with a solution of V ₂ O ₅ powder dispersed in water, followed by heat treatment in a reducing atmosphere, or by coating an organic metal compound solution such as vanadium alkoxide. How to do is attempted. However, vanadium oxide thin films, such as VO ₂ thin films formed by the sol-gel method, have been reported to not obtain satisfactory physical properties when applied to thin films for application devices.

Vanadium oxide thin film has various characteristics such as V ₂ O ₃ , VO ₂ , V ₂ O ₅ and V ₃ O ₇ , that is, phases with different compositions are easy to coexist and are easily changed to other phases. . In general, in order to obtain a VO ₂ thin film having excellent physical properties, a method of forming a V ₂ O ₅ thin film first and then performing heat treatment in a reducing atmosphere has been widely used. That is, the method undergoes the formation of a single phase or mixed phase vanadium oxide film from the precursor and two heat treatment processes. At this time, the two heat treatment processes are divided into oxidative heat treatment to form a single or mixed vanadium oxide film completely into a V ₂ O ₅ thin film and reduction heat treatment to form VO ₂ by heat treatment in a reducing atmosphere. As such, there is a problem that the process for forming the VO ₂ thin film is complicated.

Furthermore, the V ₂ O ₅ thin film is also difficult to produce uniformly. For example, in the case of manufacturing a V ₂ O ₅ thin film using a sputter, it is difficult to produce a uniform thin film of V ₂ O ₅ single phase because the composition is easily changed by the degree of vacuum or the pressure of oxygen gas in the chamber. It has been pointed out.

Meanwhile, a method of depositing a vanadium oxide thin film for use in a cathode of a lithium ion battery by using plasma chemical vapor deposition using hydrogen and oxygen gas has been disclosed in US Pat. No. 6,156,395. However, even using the plasma chemical vapor deposition method proposed in the patent, the vanadium oxide thin film is a variety of phases are formed according to the oxygen atmosphere. In addition, unlike the atomic layer deposition method which is controlled by the surface saturation adsorption and the surface saturation reaction, the stability of the composition and the uniformity of the thin film are disadvantageous than the atomic layer deposition method.

Accordingly, the present invention is to provide a method for producing a large area vanadium oxide thin film having a uniform thin film thickness and stable composition.

One example of a method for manufacturing a vanadium oxide thin film according to the present invention for achieving the above technical problem is to first load the substrate into the chamber. Thereafter, vanadium-organic metal compound vapor is injected into the chamber to form an adsorbate containing vanadium uniformly on the entire surface of the substrate by surface saturation adsorption. Inert gas is injected into the chamber to purge the unadsorbed vanadium-organometallic vapor. An oxygen precursor is injected into the chamber, and a surface saturation reaction with the adsorbate forms a vanadium oxide thin film.

The substrate has a crystal lattice constant similar to that of the vanadium oxide film, so that the sapphire substrate has the most advantageous thin film characteristics, but is disadvantageous in terms of productivity and production cost. Accordingly, the substrate may be at least one selected from Si, glass, and quartz, and the diameter of the substrate is preferably 8 inches or more.

The valence of the vanadium in the vanadium-organic metal compound may be any one of +3, +4 and +5. The vanadium-organic metal compound having a valence of +4 is tetradiethylaminovanadium (V (NEt ₂ ) ₄ ), tetraethylmethylaminovanadium (V {N (EtMe)} 4) and tetradimethylaminovanadium (V (NMe). ₂ ) at least one selected from ₄ ). The vanadium-organic metal compound having a valence of +5 is triethylmethylaminooxy vanadium (VO {N (EtMe)} ₃ ), tridimethylaminooxy vanadium (VO (NMe ₂ ) ₃ ), and trimethoxyoxy vanadium (VO). (OMe) ₃ ), triethoxyoxyvanadium (VO (OEt) ₃ ), tripropoxyoxyvanadium (VO (OC ₃ H ₇ ) ₃ ) and trihalogenoxyvanadium (VOX ₃ ) (X = Cl, F, It may be at least one selected from Br, I). Me is methyl (= CH ₃ ) and Et is ethyl (= C ₂ H ₅ ). In addition, the vanadium-organic metal compound is trihalogen vanadium (VX ₃ ) (X = Cl, F, Br, I), tetrahalogen vanadium (VX ₄ ) (X = Cl, F, Br, I), vanadium hexacarr Bonyl, Vanadium 2,4-pentadionate, Vanadium Acetone Acetonate and CyclopentadienylVanadium Tetracarbonyl At least one selected from among.

The reaction temperature is preferably maintained so that the vapor pressure of the vanadium-organic metal compound of the present invention is 0.01 to 10 torr, and the reaction temperature may be 350 ° C. or less. The reaction temperature refers to the temperature of the device for supplying the organometallic compound in the vapor state, and refers to the temperature of the source storage device and the supply line.

The oxygen precursor may be at least one selected from an oxidant gas, water (H ₂ O), and an oxygen plasma.

After removing the reaction byproduct, the vanadium oxide thin film may be heat treated by an in-situ method. The heat treatment may be performed in the chamber or in a chamber adjacent to the chamber in which the same atmosphere is formed.

In order to form the vanadium oxide thin film of the present invention, the oxygen precursor may be injected into the chamber by changing the state into a plasma for a predetermined time. In this case, the time that the plasma is maintained may be the same as or shorter than the time that the oxygen precursor is injected.

Another example of the method for manufacturing a vanadium oxide thin film according to the present invention for achieving the above technical problem is to first load a Si substrate in the chamber. Then, tetraethylmethylamino vanadium (V {N (C ₂ H ₅ CH ₃ )} ₄ : TEMAV) gas was injected into the chamber, and an adsorbate containing vanadium on the upper surface of the Si substrate was subjected to surface saturation. To form. Inert gas is injected into the chamber to remove the TEMAV gas which is not adsorbed. Subsequently, H ₂ O is injected into the chamber, and surface saturation reaction with the adsorbate forms a vanadium oxide thin film. Inert gas is injected into the chamber to remove residual reaction byproducts.

Another example of the method for manufacturing a vanadium oxide thin film according to the present invention for achieving the above technical problem is first loading a Si substrate into a chamber. Then, tetraethylmethylamino vanadium (V {N (C ₂ H ₅ CH ₃ )} ₄ : TEMAV) gas was injected into the chamber, and an adsorbate containing vanadium on the upper surface of the Si substrate was subjected to surface saturation. To form. Inert gas is injected into the chamber to remove the TEMAV gas which is not adsorbed. Subsequently, an oxygen precursor is changed into a plasma state for a predetermined time and injected into the chamber, thereby forming a vanadium oxide thin film by surface saturation reaction with the adsorbate. In order to remove the remaining reaction by-products, an inert gas is injected into the chamber.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings. The embodiments described below may be modified in various other forms, and the scope of the present invention is not limited to the embodiments described below. Embodiments of the present invention are provided to more fully explain the present invention to those skilled in the art. Like reference numerals denote like elements throughout the embodiments.

A feature of the method for producing a vanadium oxide thin film according to an embodiment of the present invention is to use a surface saturation reaction, which is different from the conventional chemical vapor deposition (CVD) method. Embodiments of the present invention will be divided into a first embodiment using H ₂ O as an oxidant and a second embodiment using an oxygen plasma containing an inert gas.

(First embodiment)

1 is a timing chart for explaining an atomic layer deposition method according to a first embodiment of the present invention.

Referring to FIG. 1, first, a substrate is loaded into a chamber (t ₀ ˜ t ₁ ). Thereafter, a vanadium-organic metal compound gas, which is a precursor of vanadium, is injected into the chamber to form an adsorbate containing vanadium on the upper surface of the substrate by surface saturation adsorption (t ₁ to t ₂ ). Here, the surface saturation adsorption means that the adsorption of the gas is no longer performed after the gas is further adsorbed to the adsorbable surface as a monolayer. In order to remove the vanadium-organic metal compound gas remaining in the chamber without being adsorbed, an inert gas such as nitrogen gas is injected into the chamber (t ₂ to t ₃ ). An oxygen precursor is injected into the chamber, and the surface saturation reaction with the adsorbate forms a single layer of vanadium oxide thin film (t ₃ to t ₄ ). Here, the surface saturation reaction means that the adsorbate containing vanadium and the oxidant react on the surface of the adsorbate, but are no longer adsorbed even if an oxidant is further injected. Then, in order to remove the reaction by-products remaining in the chamber, an inert gas is injected into the chamber (t ₄ to t ₅ ).

In the vanadium-organic metal compound that is a precursor of vanadium oxide, the valence of vanadium may be any one of +3, +4, or +5. For example, a vanadium-organic metal compound having a valence of +4 may be tetradiethylaminovanadium (V (NEt ₂ ) ₄ ), tetraethylmethylaminovanadium (V {N (EtMe)} ₄ ) or tetradimethylaminovanadium (V ( NMe ₂ ) ₄ ) It may be at least one selected from. Me is CH ₃ and Et is C ₂ H ₅ . The vanadium-organic metal compound having a valence of +5 is triethylmethylaminooxyvanadium (VO {N (EtMe)} ₃ ), tridimethylaminooxyvanadium (VO (NMe ₂ ) ₃ ), trimethoxyoxyvanadium (VO ( OMe) ₃ ), triethoxyoxyvanadium (VO (OEt) ₃ ), tripropoxyoxyvanadium (VO (OC ₃ H ₇ ) ₃ ) and trihalogenoxyvanadium (VOX ₃ (X = Cl, F, Br, I)) at least one selected from. Me is CH ₃ and Et is C ₂ H ₅ . In addition, vanadium-organic metal compounds include trihalogen vanadium (VX ₃ (X = Cl, F, Br, I)) and tetrahalogen vanadium (VX ₄ (X = Cl, F, Br, I)) vanadium hexacarbonyl At least one selected from vanadium 2,4-pentadionate, vanadium acetone acetonate, and cyclopentadienyl vanadium tetracarbonyl. The oxygen precursor may use an oxidizing agent such as H ₂ O.

The temperature of the source supply device is preferably maintained so that the vapor pressure of the vanadium-organic metal compound is 0.01-10 torr, and the amount of vanadium-organic metal compound required for the reaction is appropriately adjusted according to the injection time by the vapor pressure. The vanadium-organic metal compound can supply a sufficient amount of vapor even at about 300 ° C or lower.

Atomic layer deposition is the biggest difference from conventional chemical vapor deposition (CVD) in that it uses a surface saturation reaction. Atomic layer deposition is deposited on an atomic layer basis, and even if the surface of the substrate is rough or the aspect ratio of the structure formed on the surface is large, a uniform thin film can be obtained as a whole, and a thin film having a stable composition can be formed. Using the atomic layer deposition method, the deposition rate is kept constant due to surface saturation even when the precursor is supplied in excess. Meanwhile, in the case of plasma chemical vapor deposition, VO ₂ is prepared by first generating a V ₂ O ₅ thin film and then heat-treating it, but in the first embodiment of the present invention, VO ₂ having a stable composition may be directly formed.

(2nd Example)

2 is a timing chart for explaining the atomic layer deposition method according to the second embodiment of the present invention. The second embodiment is the same as the first embodiment except that the oxygen gas, which is an oxygen precursor, is converted into a plasma state.

Referring to FIG. 2, an oxygen-precursor gas such as oxygen gas is converted into a plasma state (t ₃ to t ₄ ). The plasma state of the oxygen-precursor gas may last for a time equal to or shorter than the injection time t ₃ to t ₄ of the oxygen-precursor. Specifically, the plasma may be formed at the same time as injecting the oxygen-precursor gas into the chamber, and may be formed after a predetermined time after the injection. For example, a method of forming a plasma may be directly generated in a reaction chamber, or a remote method of injecting and utilizing reactive particles generated in a neighboring plasma chamber into the reaction chamber.

Plasma atomic layer deposition method according to the second embodiment of the present invention is deposited in atomic layer units, even if the surface of the substrate is rough or the aspect ratio of the structure already formed on the substrate is large, it is possible to obtain a uniform thin film as a whole, stable composition To form a thin film. Using the atomic layer deposition method, the deposition rate is kept constant due to surface saturation even when the precursor is supplied in excess. Meanwhile, in the case of plasma chemical vapor deposition, the V ₂ O ₅ thin film is first generated and then heat-treated to prepare VO ₂ , but in the second embodiment of the present invention, VO ₂ having a stable composition may be directly formed. In addition, the second embodiment of the present invention can form a VO ₂ thin film even at a lower reaction temperature than the first embodiment. Furthermore, if the plasma state is sufficiently maintained, the crystallinity of the vanadium oxide film 12 can be further improved.

Experimental Example

A device including the vanadium oxide thin film (hereinafter referred to as vanadium oxide film 12) described in the second embodiment was fabricated with reference to FIGS. 3 and 4. 4 further forms a buffer layer 14 in the device of FIG. 3 as needed.

In order to manufacture the vanadium oxide film 12, first, a silicon substrate 10 having a size of about 12 inches is prepared. Thereafter, tetraethylmethylamino vanadium [V {N (EtMe} ₄ , TEMAV]] was injected into the chamber to form an adsorbate containing vanadium on the substrate 10, and an inert gas was injected to remove the remaining gas. Thereafter, the oxygen gas injected into the chamber was converted into a plasma state to form a single layer of vanadium oxide film 12. Thereafter, an inert gas was injected to remove the remaining reaction byproducts. A vanadium oxide film was prepared, while the buffer layer 14 formed a TiO ₂ film at a thickness of 100 nm.

After removing the reaction byproduct, the vanadium oxide film 12 may be heat treated by an in-situ method. At this time, the heat treatment is to remove the defect of the vanadium oxide film 12 generated, and does not change the phase (vanadium oxide) phase. The heat treatment may be performed in the chamber or in a chamber adjacent to the chamber in which the same atmosphere is formed.

Usually, sapphire single crystal is used as a substrate in order to form a vanadium oxide film exhibiting metal-insulator transition characteristics. This is because the sapphire single crystal has a similar lattice constant with the vanadium oxide film, and can grow a vanadium oxide film having excellent crystallinity. However, sapphire substrate is expensive and has a disadvantage of difficult to manufacture in large diameter. Accordingly, in the present invention, a large diameter, for example, 12 inch silicon substrate was used. In some cases, a substrate having a large diameter can be easily used, such as 8 inches or more glass or quartz substrate.

In order to improve the crystallinity of the vanadium oxide film, the buffer layer 14 may use a crystalline thin film having a value similar to the lattice constant of the vanadium oxide film. For example, the buffer layer 14 may use at least one of an aluminum oxide film, a high dielectric film, a crystalline metal film, and a silicon oxide film. At this time, the aluminum oxide film is sufficient to maintain the degree of crystallinity, and the silicon oxide film is preferably formed as thin as possible. In particular, a buffer layer 14 may be formed of a high dielectric film having excellent crystallinity, such as a TiO ₂ film, a ZrO ₂ film, a Ta ₂ O ₅ film, and a HfO ₂ film or a mixed film and / or a crystalline metal film thereof. Can be. On the other hand, in the case of the plasma atomic layer deposition method of the second embodiment, if the plasma state is sufficiently maintained on the vanadium oxide film 12 on the buffer layer 14, the crystallinity of the vanadium oxide film 12 can be further improved. .

5 is a chart showing the deposition rate of the vanadium oxide film according to the temperature. Referring to FIG. 5, at a temperature (A state) of about 100 ° C. to about 170 ° C., the deposition rate of the vanadium oxide film does not depend on temperature and shows a constant deposition rate depending on the temperature. The fact that the deposition rate does not show temperature dependence shows that the vanadium oxide film is formed by the surface saturation reaction.

In contrast, at a temperature of about 170 ° C. or more (B state), the deposition rate increases with temperature. This means that the vanadium oxide film is deposited by CVD. Specifically, at about 170 ° C. or more, the precursor of vanadium oxide decomposes in a gaseous state, and the reaction proceeds between the precursors, and the chemical vapor deposition reaction occurs by a gaseous reaction rather than a surface saturation reaction. Accordingly, the deposition rate increases as the temperature increases. When the vanadium oxide film is deposited by chemical vapor deposition, the thickness of the formed thin film becomes uneven and the composition becomes unstable.

Meanwhile, the temperature converted to the atomic layer deposition method and the chemical deposition method may vary depending on the precursor of vanadium oxide. For example, using triprooxide oxyvanadium (VO (OC ₃ H ₇ ) ₃ ) as a precursor, the temperature is about 200 ℃, when using trichlorideoxy vanadium (VOCl ₃ ) as a precursor, the temperature is about 300 ℃ It was. And vanadium trihalide and vanadium tetrahalogen require higher temperatures, such as 350-500 ° C., thus increasing the temperature to 500 ° C. Accordingly, depending on the precursor of the vanadium oxide, the formation temperature of the vanadium oxide film 12 formed by the atomic layer deposition method may be 100 ℃ ~ 500 ℃.

6 is a diagram illustrating an example of analyzing the composition of the vanadium oxide film of FIG. 5 manufactured at 150 ° C. using an Auger electron microscope (AES). In this case, the etching time is a time for etching the vanadium oxide film for AES analysis, and when the etching time passes about 900 seconds, the boundary portion (VO ₂ / Si) of the vanadium oxide film and the Si substrate appears. As shown, the composition ratio of vanadium and oxygen is about 1: 2, and it can be seen that vanadium having +4 valence is combined with -divalent oxygen to form VO ₂ . That is, the VO ₂ thin film has a stoichiometrically stable structure.

FIG. 7 is a chart illustrating resistance change with temperature of the vanadium oxide film of FIG. As shown in FIG. 7, the vanadium oxide film deposited by the plasma atomic layer deposition method undergoing a predetermined heat treatment shows a sharp metal-insulator transition at about 65 ° C. (335 K). That is, the resistance of the vanadium oxide film was drastically decreased from about 50,000 Ω to about 10 Ω. The vanadium oxide film according to the present invention brings about 5,000 times the change in the resistance value, that is, the increase in the electrical conductivity.

As mentioned above, although the present invention has been described in detail with reference to preferred embodiments, the present invention is not limited to the above embodiments, and various modifications may be made by those skilled in the art within the scope of the technical idea of the present invention. It is possible.

According to the method for producing a vanadium oxide thin film according to the present invention described above, by using the atomic layer deposition method, the desired vanadium oxide film, for example, a VO ₂ thin film, can be formed directly on a large diameter substrate.

In the atomic layer deposition method, a surface saturation reaction can be used to form a vanadium oxide film having a stable composition and a uniform surface.

Claims (31)

Loading the substrate into the chamber; Injecting a vanadium-organic metal compound gas into the chamber to form an adsorbate including vanadium on the upper surface of the substrate uniformly by surface saturation adsorption; Injecting an inert gas into the chamber to remove the unadsorbed vanadium-organometallic vapor; And Injecting an oxygen-precursor into the chamber, and the surface saturation reaction with the adsorbate to form a vanadium oxide thin film. The method of claim 1, wherein the substrate is at least one selected from Si, glass, and quartz. The method of claim 1, wherein the substrate has a diameter of 8 inches or more. The method of claim 1, wherein the valence of the vanadium in the vanadium-organic metal compound is any one of +3, +4 and +5. The vanadium-organometallic compound according to claim 4, wherein the vanadium-organic metal compound having a valence of +4 is tetradiethylaminovanadium (V (NEt ₂ ) ₄ ), tetraethylmethylaminovanadium (V {N (EtMe)} ₄ ), and tetradimethyl. A method for producing a vanadium oxide thin film, characterized in that at least one selected from amino vanadium (V (NMe ₂ ) ₄ ). Me is methyl (= CH ₃ ) and Et is ethyl (= C ₂ H ₅ ). The vanadium-organometallic compound of claim 4, wherein the vanadium-organic metal compound having a valence of +5 is triethylmethylaminooxy vanadium (VO {N (EtMe)} ₃ ), tridimethylaminooxy vanadium (VO (NMe ₂ ) ₃ ), tri Methoxyoxyvanadium (VO (OMe) ₃ ), triethoxyoxyvanadium (VO (OEt) ₃ ), tripropoxyoxyvanadium (VO (OC ₃ H ₇ ) ₃ ) and trihalogenoxyvanadium (VOX ₃ ) ( X = Cl, F, Br, I) A method for producing a vanadium oxide thin film, characterized in that at least one selected from. Me is methyl (= CH ₃ ) and Et is ethyl (= C ₂ H ₅ ). The method of claim 1, wherein the vanadium-organic metal compound is trihalogen vanadium (VX ₃ ) (X = Cl, F, Br, I), tetrahalogen vanadium (VX ₄ ) (X = Cl, F, Br, I) Vanadium hexacarbonyl, vanadium 2,4-pentadionate, vanadium acetone acetonate and cyclopentadienyl vanadium tetracarbonyl Method for producing a vanadium oxide thin film, characterized in that at least one selected from. The method of claim 1, wherein the reaction temperature is maintained so that the vapor pressure of the vanadium-organic metal compound is 0.01 to 10 torr. The method of claim 1, wherein the reaction temperature is in the range of 100 ° C. to 350 ° C. 7. The method of claim 1, wherein the reaction temperature is 350 ° C to 500 ° C. The method of claim 10, wherein the vanadium-organic metal compound is vanadium halide. The method of claim 1, wherein the oxygen precursor is at least one selected from an oxidant gas, water (H ₂ O), and an oxygen plasma. According to claim 1, Prior to the step of injecting the vanadium-organic metal compound vapor, Forming a buffer layer having a lattice constant similar to the lattice constant of the vanadium oxide on the substrate. The method of claim 13, wherein the buffer layer is at least one of an aluminum oxide film, a silicon oxide film, an insulating film having a high dielectric constant, and a crystalline metal film. According to claim 1, After the step of removing the reaction by-products, The method of manufacturing a vanadium oxide thin film further comprising the step of heat-treating the vanadium oxide thin film by the in-situ method. The method of claim 15, wherein the heat treatment is performed in the chamber or in a chamber adjacent to the chamber in which the same atmosphere is formed, but the atmosphere moving to the neighboring chamber is vacuum or an inert gas atmosphere. Way. The method of claim 1, wherein the oxygen precursor is changed into a plasma state for a predetermined time and injected into the chamber. 18. The method of claim 17, wherein the plasma state is equal to or shorter than the time at which the oxygen precursor is implanted. 16. The method of claim 15, wherein the plasma forming method is applied directly in the chamber to directly expose a surface to the plasma or in a remote method injecting and utilizing reactive particles generated by the plasma in a neighboring chamber. Method for producing a vanadium oxide thin film, characterized in that any one. Loading a Si substrate into the chamber; Tetraethylmethylaminovanadium (V {N (C ₂ H ₅ CH 3)} ₄ : TEMAV) gas is injected into the chamber to form an adsorbate containing vanadium on the upper surface of the Si substrate by surface saturation adsorption. ; Injecting an inert gas into the chamber to remove the TEMAV gas that is not adsorbed; Injecting H ₂ O into the chamber and surface saturating the adsorbate to form a vanadium oxide thin film; And Injecting an inert gas into the chamber to remove remaining reaction byproducts, Method for producing a vanadium oxide thin film to repeat the saturation adsorption and saturation reaction. The method of claim 20, wherein the Si substrate has a diameter of 8 inches or more. The method of claim 20, wherein the reaction temperature at which the TEMAV vapor is adsorbed onto the substrate to form a thin film by surface saturation is 100 ° C to 170 ° C. The method of claim 20, wherein prior to injecting the TEMAV gas, Forming a buffer layer having a lattice constant similar to the lattice constant of the vanadium oxide on the substrate further comprising the step of forming a vanadium oxide thin film. The method of claim 20, wherein after the step of removing the reaction byproduct, The method of manufacturing a vanadium oxide thin film further comprising the step of heat-treating the vanadium oxide thin film by the in-situ method. Loading a Si substrate into the chamber; Tetraethylmethylaminovanadium (V {N (C ₂ H ₅ CH ₃ )} ₄ : TEMAV) vapor is injected into the chamber to form an adsorbate containing vanadium on the upper surface of the Si substrate by surface saturation. step; Injecting an inert gas into the chamber to remove the unadsorbed TEMAV gas; Injecting an oxygen-precursor into a state in a plasma state for a predetermined time, and injecting the oxygen precursor into a surface saturation reaction with the adsorbate to form a vanadium oxide thin film; And Injecting an inert gas into the chamber to remove remaining reaction byproducts, Method for producing a vanadium oxide thin film to repeat the saturation adsorption and saturation reaction. The method of claim 25, wherein the Si substrate has a diameter of 8 inches or more. The method of claim 25, wherein the reaction temperature at which the TEMAV vapor is adsorbed onto the substrate to form a thin film by surface saturation is 100 ° C. to 170 ° C. 27. 27. The method of claim 25, wherein the plasma state is the same as or shorter than the time when the oxygen precursor is injected. 27. The method of claim 25, wherein the plasma forming method is applied directly in the chamber to directly expose a surface to the plasma or in a remote method injecting and utilizing reactive particles generated by the plasma in a neighboring chamber. Method for producing a vanadium oxide thin film, characterized in that any one. The method of claim 25, wherein prior to injecting the TEMAV gas, Forming a buffer layer having a lattice constant similar to the lattice constant of the vanadium oxide on the substrate further comprising the step of forming a vanadium oxide thin film. The method of claim 25, wherein after removing the reaction byproduct, The method of manufacturing a vanadium oxide thin film further comprising the step of heat-treating the vanadium oxide thin film by the in-situ method.

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