KR102387787B1 - Organic light emitting diode display device and method for driving the same - Google Patents

Abstract

The present invention provides an organic light emitting display capable of improving the lifespan of an organic light emitting device and obtaining uniform luminance by correcting a temperature offset and calculating and compensating for accurate degradation information of the organic light emitting device when sensing and correcting degradation information of the organic light emitting device A device and a driving method thereof, wherein the panel driver of an organic light emitting diode display according to the present invention sets deterioration information of an organic light emitting element of a pixel with the least deterioration as a temperature offset, and uses the temperature offset to The information about deterioration of the light emitting device is corrected, and a compensated data voltage obtained by compensating for image data input from the outside is generated and supplied to the display panel.

Description

Organic light emitting display device and driving method thereof

The present invention relates to an organic light emitting display device, and more particularly, to an organic light emitting display device capable of correct compensation by correcting erroneous compensation due to temperature during external compensation due to deterioration of a light emitting device, and a driving method thereof.

A video display device that implements various information on a screen is a key technology in the information and communication era, which is developing in the direction of thinner, lighter, portable and high-performance. Accordingly, as a flat panel display capable of reducing the weight and volume, which are disadvantages of a cathode ray tube (CRT), an organic light emitting display device that displays an image by controlling the emission amount of an organic light emitting layer is in the spotlight.

In an organic light emitting diode display, a plurality of pixels are arranged in a matrix to display an image. Here, each pixel includes a pixel driving circuit including a light emitting element and a plurality of transistors independently driving the light emitting element.

In the conventional organic light emitting display device, the amount of current driving the light emitting device varies due to the difference in characteristics such as the threshold voltage (Vth) and mobility of the driving transistor for each pixel due to process variation, etc. There is a problem that occurs.

In addition, in the conventional organic light emitting diode display, the light emitting element deteriorates over time. That is, the current-voltage (I-V) characteristics of the light emitting device deteriorate over time. Accordingly, the operating point, which is the intersection of the characteristic curve of the driving transistor and the characteristic curve of the light emitting device, is changed, and accordingly, an afterimage or non-uniformity in luminance occurs in the organic light emitting display device, and the product lifespan is reduced due to the decrease in luminance.

In order to solve the above problem, a technology of detecting a threshold voltage of a driving transistor and correcting a data voltage to be applied to the pixel based on the detected threshold voltage is disclosed in Korean Patent Laid-Open No. 10-2012-0061522, Korean Patent Laid-Open Patent Publication No. It is disclosed in Publication No. 10-2015-0003093 and the like.

However, since the conventional technique cannot directly sense the deterioration of the light emitting device by detecting the threshold voltage of the driving transistor, there is a limit in sensing accurate deterioration information of the organic light emitting diode.

The present invention has been devised to solve the above-described problems, by sensing deterioration of a light emitting element, generating a temperature offset using deterioration information of the least deteriorated pixel, and applying this to the deterioration information of the light emitting element. It is an object to be solved by generating light emitting device degradation information to enable accurate deterioration compensation of the light emitting device.

In order to solve the above problems, in an organic light emitting display device according to the present invention, a sensing unit senses a threshold voltage of a driving transistor and characteristics of a light emitting device, and a driving transistor deterioration information generating unit uses the threshold voltage characteristics of the driving transistor to Deterioration information of the driving transistor is generated, and the light emitting device degradation information generating unit generates deterioration information of the light emitting device by using the characteristics of the light emitting device.

In addition, the temperature offset applying unit of the present invention analyzes the deterioration information of the driving transistor to detect a pixel with minimal deterioration, sets the light emitting element deterioration information of the pixel as a temperature offset, and applies the temperature offset to the entire light emitting element deterioration information do.

The data compensator corrects the data voltage supplied to each pixel by using the light emitting device deterioration information corrected by applying the temperature offset to the display panel.

According to the present invention, since deterioration information of the light emitting element is corrected using a temperature offset, accurate deterioration information of the light emitting element can be obtained.

Accordingly, accurate compensation is possible by preventing erroneous compensation of the data voltage output to the display panel, the lifespan of the light emitting device is improved, and reliability can be secured.

1 is an exemplary view for explaining in detail an organic light emitting diode display according to the present invention.
2 is an exemplary view for explaining a pixel of the present invention.
3 is an exemplary diagram for describing a data driver in more detail.
4 is an exemplary view for explaining the timing control unit according to the present invention in more detail.
5 is a diagram to explain a method for setting a temperature offset according to the present invention.

Prior to the present invention, the applicant has proposed a technology for sensing and compensating the characteristics of a light emitting device included in an organic light emitting display device in Korean Application No. 10-2014-0124850.

When the technology for sensing and compensating the characteristics of the organic light emitting diode is used, there is an advantage in that the degree of deterioration of the organic light emitting diode display is detected and accurate correction is possible.

However, the current capability of the light emitting device is greatly affected by temperature. In general, the current capability of the light emitting device is improved as the temperature rises, and accordingly, if a factor due to temperature is not taken into account when compensating for deterioration of the light emitting device, errors such as overcompensation occur. As a result, there is a problem in that the non-uniformity of the luminance of the display device and the deterioration of the lifespan of the light emitting device may be more severe than before compensation.

The present invention has been proposed to solve the above problem, and has a feature of applying a temperature offset to the deterioration information of the light emitting device to obtain accurate deterioration information of the light emitting device.

Hereinafter, a display device and a driving method thereof according to an exemplary embodiment of the present invention will be described in detail with reference to the accompanying drawings.

1 is an exemplary view for explaining in detail an organic light emitting diode display according to the present invention.

The organic light emitting diode display illustrated in FIG. 1 includes a scan driver 106 , a data driver 104 , a panel driver including a timing controller 108 , and a display panel 102 .

The scan driver 106 applies a high or low first scan voltage to the scan line SL formed on the display panel 102 in response to a scan control signal from the timing controller 108 and the sensing control lines SSL. A second scan voltage in a high or low state is applied to

The data driver 104 converts the digital compensation data into an analog data voltage using the control signal and the gamma voltage from the timing controller 108 , and supplies the converted analog data voltage to the data line DL. .

In addition, the data driver 104 senses the voltages supplied from the reference line RL during the sensing period and generates the first sensing data SData1 and the second sensing data SData2 converted into digital data to generate the timing control unit 104 . output as

At this time, the first sensing data SData1 senses the threshold voltage of the driving transistor and converts it into digital data, and the second sensing data SData2 detects the anode voltage or the threshold voltage of the light emitting device OLED and converts it into digital data. it has been converted A detailed description of the sensing data will be described later.

The timing controller 108 generates a plurality of control signals for controlling driving timings of the scan driver 2 and the data driver 104 . Here, the control signals generated by the timing controller 108 include a scan control signal for controlling the driving timing of the scan driver 2 and a data control signal for controlling the driving timing of the data driver 104 . .

In addition, the timing controller 108 obtains compensation values determined based on the sensing data SData1 and SData2 together with the first and second sensing data SData1 and SData2 input from the data driver 104 in a lookup table. stored in memory containing

In addition, a pixel in which a driving transistor having the least deterioration of the threshold voltage is located is set as a pixel with the minimum deterioration, and an operating point of the light emitting element OLED or a change amount of the threshold voltage in the pixel is set as a temperature offset.

Thereafter, the timing controller 108 generates digital compensation data by varying data input from the outside using the compensation values and the temperature offset, and supplies the digital compensation data to the data driver 104 .

2 is an exemplary view for explaining the pixel P of the present invention.

The display panel 102 includes a plurality of pixels P arranged in a matrix form. Each pixel P includes a light emitting device OLED and a pixel driving circuit including a plurality of transistors driving the same. The pixel driving circuit includes a driving transistor Tr_D, a switching transistor Tr_Sw, a sensing transistor Tr_Se, and a storage capacitor Cst. In the exemplary embodiment of the present invention, a pixel driving circuit having a 3T1C structure is described as an example, but the present invention is not limited thereto, and a person skilled in the art may change the structure as needed.

The switching transistor TR1 has a gate electrode connected to the scan line SL of each pixel, a source electrode connected to the data line DL, and a first node n1 that is a first terminal of the storage capacitor Cst. A drain electrode is connected.

Accordingly, the switching transistor TR1 supplies the data voltage Vdata from the data line DL to the first node n1 in response to the first scan signal from the scan line SL of each pixel.

The driving transistor TR2 has a gate electrode connected to the first node n1 , a drain electrode connected to the high potential driving voltage source VDD, and a source electrode connected to the anode electrode of the light emitting device OLED.

Accordingly, the driving transistor TR2 controls the amount of current flowing through the light emitting device OLED according to its source-gate voltage Vgs, that is, a voltage applied between the high potential voltage source VDD and the first node n1. do.

The sensing transistor TR3 has a gate electrode connected to the sensing control line SSL of each pixel, a source electrode connected to the second node n2 , and a drain electrode connected to the third node n3 .

Accordingly, the sensing transistor TR3 supplies the precharging voltage from the reference line RL to the second node n2 in response to the second scan signal from the sensing control line SSL, or the light emitting device during the sensing period. The voltage of the anode electrode of the OLED and the threshold voltage of the driving transistor TR2 are supplied to the reference line RL.

The storage capacitor Cst has a first terminal connected to a first node n1 and a second terminal connected to a second node n2 . The storage capacitor Cst charges a difference voltage between voltages supplied to each of the first and second nodes n1 and n2 and supplies it as the driving voltage Vgs of the driving transistor Tr_D. For example, the storage capacitor Cst charges a difference voltage between the data voltage Vdata supplied to each of the first and second nodes n1 and n2 and the precharging Vpre.

The reference capacitor Cref has a first terminal connected to the third node, a second terminal connected to a base voltage source, and connected in parallel with the reference line RL. The reference capacitor Cref charges the voltage of the anode electrode of the light emitting device OLED or the threshold voltage of the driving transistor Tr_D through the sensing transistor Tr_Se that is turned on during the sensing period.

3 is an exemplary diagram for explaining the data driver 104 in more detail.

The data driver 104 according to the present invention includes a precharging transistor TR_Pre, a sensing unit 114 , a sampling transistor TR_Sam, and an output unit 116 .

The precharging transistor TR_Pre initializes the reference line RL by supplying the precharging voltage Vpre to the reference line RL in response to the precharging control signal supplied from the timing controller 108 during the initialization period.

The sensing unit 114 senses the threshold voltage of the driving transistor TR2 and the anode voltage of the light emitting device OLED from the reference line RL during the sensing period and outputs the sensed values to the timing controller 108 .

To this end, the sensing unit 114 includes a plurality of analog-to-digital converters ADC, the first sensing data SData1 converted into a digital signal by converting the sensed threshold voltage of the driving transistor TR2 into a digital signal, and the sensing unit 114 . The second sensing data SData2 obtained by converting the anode voltage of the light emitting device OLED into a digital signal is generated and supplied to the timing controller 108 .

The sampling transistor TR_Sam electrically connects the reference line RL to the sensing unit 114 in response to a sensing control signal supplied from the timing controller 108 during the sensing period.

The output unit 116 converts digital compensation data (R′, G′, B′) inputted from the timing control unit 108 into a plurality of digital analogs in response to a data control signal supplied from the timing control unit 108 during the light emission period. It is converted into an analog data voltage through the DAC, and the converted analog data voltage is supplied to the data line DL.

4 is an exemplary diagram for explaining the timing control unit 108 according to the present invention in more detail.

The timing controller 108 includes a selection unit 121 , a driving transistor deterioration information generating unit 130 , a temperature offset applying unit 122 , a light emitting device deterioration information generating unit 123 , and a data correcting unit 124 .

When the first sensing data SData1 is input from the sensing unit 114 , the selector 121 outputs it to the driving transistor deterioration information generation unit 130 , and when the second sensing data SData2 is input, it outputs the light emitting device deterioration The information is output to the information generating unit 123 .

The driving transistor deterioration information generating unit 130 generates and stores deterioration information of the driving transistor.

To this end, the driving transistor degradation information generator 130 receives the first sensing data SData1 and compares threshold voltage information of the initial driving transistor Tr_D to detect the degradation information of the driving transistor. 131) and a first memory 125 that stores deterioration information of the driving transistor.

At this time, threshold voltage information of the initial driving transistor Tr_D may be stored in the first memory 125 in advance.

The light emitting device degradation information generating unit 123 generates and stores degradation information of the light emitting device OLED and outputs the generated degradation information of the light emitting device OLED to the temperature offset applying unit 122 .

To this end, the light emitting device degradation information generating unit 123 receives the second sensing data SData2 and calculates an operating point or threshold voltage of the light emitting device OLED, and the operating point or threshold voltage of the initial light emitting device OLED and It includes a light emitting device degradation detection unit 128 that compares and generates degradation information of the light emitting device OLED, and a second memory 129 that stores the generated degradation information of the light emitting device OLED.

In this case, information about the operating point or threshold voltage of the initial light emitting device OLED may be previously stored in the second memory 129 .

The temperature offset applying unit 122 receives the deterioration information of the driving transistor Tr_D and the deterioration information of the light emitting element OLED to generate a temperature offset, and applies the temperature offset to the deterioration information of the light emitting element OLED to correct the temperature offset. Deterioration information of the light emitting device OELD is generated and output to the data correction unit 124 .

To this end, the temperature offset application unit 122 receives the deterioration information of the driving transistor from the first memory 125 and receives the minimum deterioration pixel detection unit 126 for detecting the position of the minimum deterioration pixel, and the light emitting element deterioration detection unit 128 . In addition to receiving deterioration information of the light emitting element OLED, receiving the position of the minimum deterioration pixel from the minimum deterioration pixel detection unit 126, and setting the deterioration value of the light emitting element OLED in the minimum deterioration pixel as a temperature offset, and a temperature offset correcting unit 127 for outputting deterioration information of the light emitting element OLED corrected by applying the temperature offset to the input deterioration information of the light emitting element OELD to the data corrector 124 .

The data compensator 124 generates compensation data using degradation information of the driving transistor Tr_D or generates compensation data using degradation information of the light emitting device OLED and outputs the generated compensation data to the data driving unit 104 .

To this end, the data compensator 124 may store compensation values determined based on deterioration information of the driving transistor Tr_D and deterioration information of the light emitting device OLED in a memory (not shown) including a plurality of lookup tables. .

5 is for explaining the generation principle of the temperature offset according to the present invention.

In the organic light emitting diode display, as the driving time of the driving transistor TR_D increases and the degree of degradation increases, the driving time of the light emitting device OLED also increases, and the degree of degradation of the light emitting device OLED also increases.

In addition, as the threshold voltage deterioration is reduced because the driving time of the driving transistor TR_D is shortened, the driving time of the light emitting device OELD is also reduced, and thus the deterioration of the light emitting device OLED is also reduced.

If the light emitting device OLED hardly deteriorates, the change in the operating point or the threshold voltage of the light emitting device OLED may be considered to be mostly caused by the effect of temperature.

Using the above characteristics, in the organic light emitting diode display according to the present invention, as shown in FIGS. 5A and 5B , an operating point or a change in threshold voltage of a pixel having the least deterioration of the light emitting element (OLED) is set as a temperature offset, , filter the characteristic change of the light emitting device due to temperature to prevent erroneous compensation.

Hereinafter, a method of driving an organic light emitting diode display according to the present invention will be described.

In the present invention, before sensing the deterioration of the light emitting device OLED, deterioration of the driving transistor Tr_D of each driving pixel driving circuit may be sensed and compensated for this. In this case, the deterioration information of the driving transistor Tr_D is first 1 is stored in the memory 125 .

A method of sensing the threshold voltage of the driving transistor is disclosed in detail in the aforementioned Korean Patent Application Laid-Open No. 10-2015-0003093.

This will be briefly described with reference to FIGS. 2 and 3 as follows.

During the initialization period, the switching transistor Tr_Sw is turned on and the data voltage Vdata is applied to charge the data voltage Vdata in the first node n1 , the sensing transistor Tr_Se is turned on, and the sensing unit 114 . of the precharging transistor Tr_Pre is turned on, the precharging voltage Pre is supplied to the reference line RL, and the sampling transistor Tr_Sam is turned off.

Accordingly, the second node n2 is charged with the precharging voltage Vpre, and during the initialization period, the second node n2 and the reference line RL are initialized with the precharging voltage.

During the sensing period, the switching transistor Tr_Sw maintains the turned-on state, and the sensing transistor Tr_Se also maintains the turned-on state. However, the pre-charging voltage Vpre is no longer supplied to the second node n2, and the second node n2 is in a floating state.

Then, the voltage of the second node n2 increases to Vdata-Vth by the current flowing through the driving transistor Tr_D and is maintained constant.

Then, the switching transistor Tr_Sw and the sensing transistor Tr_Se maintain a turned-on state, the sampling transistor Tr_Sam included in the sensing unit 114 is turned on, and the precharging transistor Tr_Pre is turned off.

Accordingly, the sensing unit 114 detects the Vdata-Vth value charged in the second node through the reference line RL.

Since the data voltage Vdata applied to the first node N1 is already known, the threshold voltage of the driving transistor Tr_D is detected using the data voltage Vdata and the Vdata-Vth voltage detected at the second node at this time. can do.

The detected threshold voltage of the driving transistor Tr_D is converted into digital first sensing data SData1 by the sensing unit 114 and output to the timing controller 108 .

The selection unit 121 of the timing control unit 108 outputs the first sensing data SData1 to the driving transistor deterioration detection unit 131 .

The driving transistor deterioration detection unit 131 may calculate deterioration information of the threshold voltage Vth of the driving transistor Tr_D, store it in the first memory 125 , and output it to the data corrector 124 .

It is preferable that the data corrector 124 corrects the data voltage Vdata by using the threshold voltage of the driving transistor Tr_D before performing the anode voltage sensing of the light emitting device OLED, and thus more accurate In addition to sensing the anode voltage value of the light emitting element OLED, the luminance non-uniformity compensation of the organic light emitting diode display may be more accurately performed.

A driving method for sensing the anode voltage of a light emitting device (OLED) is described in detail in the aforementioned Korean Patent Application No. 10-2014-0124850, etc., which will be briefly described with reference to FIGS. 2 and 3 as follows.

In the initialization period T1, driving is performed in the same manner as in the initialization period T1 when the threshold voltage of the driving transistor Tr_D is previously compensated.

For sensing the anode voltage of the light emitting device OLED, as described above, it is preferable to supply the data voltage Vdata' obtained by compensating the threshold voltage Vth of the driving transistor Tr_D to each pixel driving circuit.

Accordingly, during the initialization period, the source electrode and the reference line RL of the driving transistor Tr_D are initialized to the precharging voltage. At this time, the difference voltage between the data voltage Vdata' and the precharging voltage Vpre is stored in the storage capacitor Cst.

Next, in the light emission period T2 , the switching transistor Tr_Sw and the sensing transistor Tr_Se are turned off, the sampling transistor Tr_Sam of the sensing unit 114 is turned off, and the precharging transistor Tr_Pre is turned on. .

Accordingly, the voltage stored in the storage capacitor Cst is supplied as the driving voltage Vgs of the driving transistor Tr_D, and the driving transistor Tr_D is turned on by the voltage Vdata′-Vpre stored in the storage capacitor Cst. and a driving current is supplied to the light emitting element OLED to emit light.

In the first half of the sensing period T3, the switching transistor Tr_Sw, the precharging transistor Tr_Pre, and the sampling transistor Tr_Sam are turned off, the sensing transistor Tr_Se is turned on, and the capacitor Cref of the reference line RL is turned on. Charges the voltage of the second node (Vn2), that is, the voltage of the anode electrode.

Next, in the second half of the sensing period T3, the switching transistor Tr_Sw and the precharging transistor Tr_Pre are turned off, the sensing transistor Tr_Se maintains a turned-on state, and the sampling transistor Tr_Sam is turned on to turn on the reference line ( RL) is connected to the sensing unit 114 .

Accordingly, the sensing unit 114 may calculate the operating point of the light emitting device OELD by sensing the voltage of the second node N2 , that is, the voltage Vs of the anode electrode when the light emitting device OLED emits light.

The sensing unit 114 senses the voltage of the reference line RL, that is, the voltage Vs supplied to the anode electrode when the light emitting device OLED emits light, and uses the sensed voltage Vs as second sensing data in digital form. (SData2) and provided to the timing control unit 108.

The applicant has also proposed a method of sensing the threshold voltage of a light emitting device (OLED) in Korean Patent Application No. 10-2014-0124850. This will be briefly described with reference to FIGS. 2 and 3 as follows.

First, the initialization period T1, the light emission period T2, and the first sensing period are the initialization period T1, the light emission period T2, and the sensing period T3 when sensing the operating point of the light emitting device OLED. ) is the same as

In the first half of the second sensing period T4, both the sampling control voltage Sam and the precharging control voltage Pre maintain a low state so that both the precharging transistor Tr_Pre and the sampling transistor T_Sam are turned off.

In addition, the switching transistor Tr_Sw and the sensing transistor Tr_Se are turned on, and the black data voltage is supplied to the gate electrode of the driving transistor Tr_D from the data line DL through the turned-on switching transistor Tr_Sw. .

Accordingly, the driving transistor Tr_D is turned off, the voltage of the first node n1 is lowered, and the voltage of the third node n3 is the voltage level of the second node n2 through the turned-on sensing transistor Tr_Se. descend to

Accordingly, the voltage charged in the capacitor Cref of the reference line RL is discharged to the low voltage source Vss until it becomes equal to the threshold voltage Vth of the light emitting device OLED.

Next, in the second half of the second sensing period T4 , the sampling transistor Tr_Sam is turned on so that the reference line RL is connected to the sensing unit 114 , and the sensing unit 114 is connected to the voltage of the second node n2 . That is, the threshold voltage Vth of the light emitting device OLED may be calculated by sensing the voltage Vs supplied to the anode electrode when the light emitting device OLED does not emit light.

The selection unit 121 of the timing control unit 108 receives the second sensing data SData2 and outputs it to the light emitting device degradation information generating unit 123 , and the light emitting device deterioration of the light emitting device degradation information generating unit 123 . The detector 128 calculates deterioration data representing a change in the operating point or threshold voltage of the light emitting device OLED by using the second sensing data SData2 , and stores it in the second memory 129 .

At this time, the light emitting device deterioration detection unit 128 detects the initial operating point or threshold voltage of the light emitting device OLED stored in the second memory 129 and the second sensing data SData2 of the operation of the light emitting device OLED. The light emitting device deterioration data is calculated by comparing the point or threshold voltage, and the data is again stored in the second memory and output to the temperature offset generator 122 and the temperature offset application unit 130 .

The minimum deterioration pixel detection unit 126 of the temperature offset generator 122 detects a pixel in which the deterioration of the driving transistor Tr_D has occurred to a minimum by referring to deterioration information of the driving transistor Tr_D stored in the first memory 125 . The position information is output to the temperature offset correcting unit 127 .

The temperature offset correcting unit 127 sets the change in the operating point due to the deterioration of the light emitting element at this time as the temperature offset using the light emitting element deterioration data of the pixel in which the deterioration of the driving transistor Tr_D is minimal.

Then, the temperature offset correcting unit 127 calculates the corrected light emitting element deterioration data to which the temperature offset is applied to the received light emitting element deterioration data, and outputs it to the data correcting unit 124 .

The data compensator 124 stores compensation values determined based on the light emitting device degradation data in a third memory (not shown) including a plurality of lookup tables, and uses the compensation values to vary data input from the outside. After generating digital compensation data, it is supplied to the data driver 104 .

The data driver 104 converts the digital compensation data into an analog data voltage using the control signal and the gamma voltage from the timing controller 108 and supplies it to the data line DL.

As described above, the organic light emitting diode display according to the present invention can accurately calculate a compensation value according to the degree of deterioration of the light emitting element OLED by reflecting the temperature offset when sensing deterioration of the light emitting element OLED.

Accordingly, according to the present invention, the luminance of the organic light emitting diode display is made uniform and the lifespan of the light emitting device (OLED) is improved.

The above description is merely illustrative of the present invention, and various modifications may be made by those of ordinary skill in the art to which the present invention pertains without departing from the technical spirit of the present invention. Therefore, the embodiments disclosed in the specification of the present invention do not limit the present invention. The scope of the present invention should be construed by the following claims, and all technologies within the scope equivalent thereto should be construed as being included in the scope of the present invention.

102: display panel 104: data driver
106: scan driver 108: timing controller
114: sensing unit 116: output unit
121: selection unit 122: temperature offset application unit
123: light emitting element deterioration information generation unit 124: data correction unit
125: first memory 126: minimum deterioration pixel detection unit
127: temperature offset correcting unit 128: light emitting element deterioration detection unit
129: second memory 131: driving transistor deterioration detection unit
130: drive transistor deterioration information generation unit

Claims (6)

A light emitting display panel including a light emitting element and a plurality of pixels having a pixel driving circuit for driving the light emitting element;
A compensated data voltage is supplied to the plurality of pixels, a threshold voltage of a driving transistor provided in each pixel is sensed to generate deterioration information of a driving transistor of each pixel, and an operating point or a threshold voltage of the light emitting device is sensed to generate the degradation information of the light emitting device, and set a temperature offset based on the degradation information of the light emitting device of the least degraded pixel in which the threshold voltage of the driving transistor has the least degradation, and then the entire light emitting device positioned in each pixel An organic light emitting diode display including a panel driver configured to generate compensation data for the light emitting device by applying the temperature offset to the light emitting device deterioration information. The method of claim 1,
The panel driver,
A sensing unit sensing a threshold voltage of a driving transistor provided in each pixel to output first sensing data, or sensing an anode voltage of a light emitting device provided in each pixel to output second sensing data;
a driving transistor degradation information generator configured to generate degradation information of the driving transistor of each pixel by using the first sensing data;
a light emitting device degradation information generating unit for generating degradation information of a light emitting device indicating degradation information of an operating point or threshold voltage of each of the light emitting devices by using the second sensing data;
A pixel with the least deterioration of the driving transistor is detected using the deterioration information of the driving transistor, and deterioration information of the light emitting element of the pixel with the least deterioration of the driving transistor is generated as a temperature offset, and deterioration information of each light emitting element A temperature offset applying unit that generates corrected light emitting device deterioration information by applying a temperature offset to the
a data correction unit for correcting and outputting a data voltage input to each pixel using the deterioration information of the driving transistor and the corrected light emitting element deterioration information;
and a selector configured to output the first sensed data to the driving transistor degradation information generator and output the second sensed data to the light emitting device degradation information generator. 3. The method of claim 2,
The driving transistor deterioration information generation unit,
a driving transistor deterioration detection unit receiving the first sensing data from the selection unit and calculating threshold voltage deterioration information by comparing it with an initial value of the threshold voltage of the driving transistor; and
and a first memory configured to output an initial value of the threshold voltage of the driving transistor stored in advance to the driving transistor deterioration detection unit, and store the calculated threshold voltage deterioration information. 4. The method of claim 3,
The light emitting device deterioration information generation unit,
a light emitting device degradation detection unit receiving the second sensing data and comparing the second sensing data with an initial value of an operating point or threshold voltage of the light emitting device to calculate degradation information of the light emitting device; and
and a second memory configured to supply the previously stored initial value of the operating point or threshold voltage of the light emitting device to the light emitting device degradation detection unit and to store the calculated degradation information of the light emitting device. 5. The method of claim 4,
The temperature offset application unit,
a minimum deterioration pixel detection unit receiving the threshold voltage deterioration information of the driving transistor from the first memory and detecting a minimum deterioration pixel in which the threshold voltage deterioration of the driving transistor is minimal; and
Light emission corrected by receiving the deterioration information of the light emitting element and the position of the least deterioration pixel, using the deterioration information of the light emitting element of the minimum deterioration pixel as a temperature offset, and applying the temperature offset to the deterioration information of all the light emitting elements An organic light emitting diode display including a temperature offset correcting unit configured to generate element deterioration information. A method of driving an organic light emitting display device comprising: a light emitting display panel including a light emitting device, a plurality of pixels having a pixel driving circuit for driving the light emitting device, and a panel driving circuit for driving the light emitting display panel, the method comprising:
sensing and storing a threshold voltage of a driving transistor provided in the pixel driving circuit;
Sensing the threshold voltage or operating point of the light emitting device, and calculating light emitting device degradation information that is deterioration information compared to an initial value of the threshold voltage or operating point;
detecting a minimum deterioration pixel in which the threshold voltage deterioration of the driving transistor is the least, and detecting deterioration information of a threshold voltage or an operating point of a light emitting element of the minimum deterioration pixel and setting a temperature offset;
generating corrected light emitting device degradation information by applying the temperature offset to the light emitting device degradation information for the entire light emitting device positioned in each pixel; and
A method of driving an organic light emitting display device for generating a corrected data voltage by using the corrected light emitting device degradation information and supplying it to each pixel.

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