JPS6053916A - Multi-purpose microscope - Google Patents
Multi-purpose microscopeInfo
- Publication number
- JPS6053916A JPS6053916A JP16295083A JP16295083A JPS6053916A JP S6053916 A JPS6053916 A JP S6053916A JP 16295083 A JP16295083 A JP 16295083A JP 16295083 A JP16295083 A JP 16295083A JP S6053916 A JPS6053916 A JP S6053916A
- Authority
- JP
- Japan
- Prior art keywords
- optical path
- differential interference
- slider
- dichroic mirror
- microscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/0088—Inverse microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Microscoopes, Condenser (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
Description
【発明の詳細な説明】
技術分野
本発明は、切換えによシ各種の検鏡法を実施し得る多目
的顕微鏡に関するものである。DETAILED DESCRIPTION OF THE INVENTION TECHNICAL FIELD The present invention relates to a multipurpose microscope capable of performing various microscopy techniques by switching.
従来技術
この種の倒立型顕微鏡の一従来例では、顕微鏡の本体側
に落射螢光用ダイクロツクミラーが、またレボルバ−と
対物レンズの間に微分干渉用素子がそれぞれ設置されて
いるが、この設置形式の場合は、微分干渉検鏡時にステ
ージを微分干渉素子の厚さ分だけ上げなければならない
、対物レンズと微分干渉用素子が一体であるため螢光検
鏡時と微分干渉検鏡時とでは対物レンズを交換しなけれ
ばならない（落射螢光検鏡時光学補正のための座がない
と同焦が保てない）、螢光検鏡時と微分干渉検鏡時に共
通の対物レンズを使用すると螢光検鏡時に微分干渉用素
子を光が通過することになるため性能が十分発揮できな
いと云った如き種々の不具合があり、他の検鏡法（例え
ば位相差法）を実行する場合の切換えに際しても同様の
不具合がある。又、この種倒立型顕微鏡の他の従来例で
は、レボルバ一部分に落射螢光用ダイクロツクミラーと
微分干渉用素子とが設置されているが、この設置形式の
場合は、レボルバ−を上下すると螢光光源用の投光管の
光軸とダイクロツクミラーの光軸と力′≦一致せず照明
ムラを起す、ダイクロツクミラーと微分干渉用素子をレ
ボルバ−に設けられた同一のスロット内へ挿入するよう
になっているためこれらの交換が簡単でない、各種検鏡
法への切換えが容易でないと云った如き不具合がある。Prior Art In a conventional example of this type of inverted microscope, a dichroic mirror for incident fluorescence is installed on the main body side of the microscope, and a differential interference element is installed between the revolver and the objective lens. In the case of the installation type, the stage must be raised by the thickness of the differential interference element during differential interference microscopy, and since the objective lens and the differential interference element are integrated, it is difficult to distinguish between fluorescence microscopy and differential interference microscopy. In this case, the objective lens must be replaced (parfocality cannot be maintained without a seat for optical correction during epifluoroscopy), and a common objective lens is used for fluorescence microscopy and differential interference interference microscopy. This causes various problems such as insufficient performance because the light passes through the differential interference element during fluorescence microscopy, and it is difficult to perform other microscopy methods (e.g. phase contrast method). A similar problem occurs when switching. In addition, in other conventional examples of this type of inverted microscope, a dichroic mirror for incident fluorescence and a differential interference element are installed in a part of the revolver, but in this installation type, when the revolver is moved up and down, the fluorescence is emitted. Inserting the dichroic mirror and the differential interference element into the same slot provided in the revolver, which causes uneven illumination because the optical axis of the light source flood tube and the optical axis of the dichroic mirror do not match with force' Because of this, there are problems such as it is not easy to replace them and it is not easy to switch to various microscopy methods.
目 的
本発明の目的は、上記の事情に鑑み、位相差検鏡、微分
干渉検鏡、落射螢光検鏡等各種検鏡法への切換が容易で
、而も何れの場合も良好な性能を発揮し得る倒立型顕微
鏡を提供することにある。Purpose In view of the above circumstances, an object of the present invention is to easily switch to various microscopy methods such as phase contrast microscopy, differential interference microscopy, epifluorescence microscopy, etc., and to provide good performance in all cases. The object of the present invention is to provide an inverted microscope that can demonstrate the following.
概要
この目的は、本発明によれば、微分干渉用素子をレボル
バ−内に光路に対し挿脱自在に設置し、落射螢光用ダイ
クロツクミラーを顕微鏡本体内に光路に対し挿脱自在に
設置することにょシ達成される。この場合、ダイクロツ
クミラーは関連するフィルターと一体のユニットとして
挿脱される。Summary According to the present invention, a differential interference element is installed in a revolver so that it can be inserted into and removed from the optical path, and a dichroic mirror for epifluorescence is installed inside a microscope main body so that it can be inserted into and removed from the optical path. It is achieved by doing. In this case, the dichroic mirror is inserted and removed as an integral unit with the associated filter.
実施例
以下、図示した実施例に基づき本発明を詳述する。図中
、１は顕微鏡本体′、２は照明装置、３はコンデンサー
レンズ、４は顕微鏡本体１に固定配置されたステージ、
５は対物レンズ、６は対物レンズ５を支持し且つ顕微鏡
本体１に装備されたラック−ビニオン機構を含む焦準部
６ａに取付けられていて光軸Ｏに沿って移動可能のレボ
ルバ−１７はレボルバ−６に近接して焦準部６ａに取付
けられたノマルスキースライダー、８はノマルスキース
ライダー７に取付けられていて光軸Ｏと整合した図示位
置と光軸Ｏから外れた位置とへ持ち来たされ得る微分干
渉用素子、９はアリ−アリ溝機構等により顕微鏡本体１
に対し着脱自在のダイクロツクミラーボックス、１０は
ボックス９内に設置されていてボックス９が顕微鏡本体
１に装着された時光軸Ｏと整合する位置へ持ち来たされ
る落射螢光用ダイクロツクミラー、１１はボックス９内
に設置された励起フィルター、１２はボックス９内に設
置されたバリアーフィルター、１３は螢光光源装置、１
４は螢光光源装置１３からの光をグイクロックミラー１
０へ導ひくだめの投光管、１５は接眼鏡筒である。EXAMPLES Hereinafter, the present invention will be explained in detail based on illustrated examples. In the figure, 1 is the microscope body', 2 is the illumination device, 3 is the condenser lens, 4 is the stage fixedly arranged on the microscope body 1,
5 is an objective lens; 6 is a revolver that supports the objective lens 5 and is movable along the optical axis O, and is attached to a focusing section 6a that includes a rack-binion mechanism installed in the microscope body 1; and 17 is a revolver; - A normal ski slider is attached to the focusing part 6a in close proximity to 6, and 8 is attached to the normal ski slider 7 and can be brought to the illustrated position aligned with the optical axis O and to a position off the optical axis O. The differential interference element 9 is attached to the microscope body 1 by means of a dovetail groove mechanism, etc.
10 is a removable dichroic mirror box for epi-fluorescence, which is installed in the box 9 and brought to a position aligned with the optical axis O when the box 9 is attached to the microscope body 1. , 11 is an excitation filter installed in the box 9, 12 is a barrier filter installed in the box 9, 13 is a fluorescent light source device, 1
4 is a clock mirror 1 that captures the light from the fluorescent light source device 13.
15 is an eyepiece tube.
本発明に係る倒立型顕微鏡は上記のように構成されてい
るから、例えば微分干渉検鏡を行う場合にはグイクロッ
クミラーボックス９を取外しノマルスキースライダー７
を操作して図示の如く微分干渉用素子８を光路内へ挿入
すればよいが、この場合微分干渉用素子８は対物レンズ
５の後側焦点位置と一定の関係位置に入るように予め設
計されているから、特に落射螢光検鏡の後であっても対
物レンズ５を再調整したり交換したシすることなしに直
ちに鮮明な標本像を観察することができる。Since the inverted microscope according to the present invention is configured as described above, for example, when performing differential interference microscopy, the quick lock mirror box 9 is removed and the normal ski slider 7 is removed.
The differential interference element 8 may be inserted into the optical path as shown in the figure by manipulating the Therefore, a clear specimen image can be immediately observed without readjusting or replacing the objective lens 5, especially after epifluoroscopy.
又この状態でノマルスキースライダー７を再び操作して
図示しない位相板を微分干渉用素子８の代わりに光路内
へ挿入し照明系をそれに適するようにセットすれば、直
ちに位相差検鏡を実施することができる。次に落射螢光
検鏡を行う場合には、ダイクロツクミラーボックス９を
装着しノマルスキースライダー７を操作して微分干渉用
素子８を光路外へ持ち来たし螢光光源装置１３を点灯す
ることにより、直ちに螢光検鏡を実施することができる
。この場合、ダイクロツクミラー１０と投光管１４の光
軸とはダイクロツクミラーボックス９が装着された時に
正しく一致し、而も光路内に微分干渉用素子８が存在し
ないから、高性能９落射螢光検鏡を行うことができる。In addition, in this state, if the Nomarski slider 7 is operated again, a phase plate (not shown) is inserted into the optical path instead of the differential interference element 8, and the illumination system is set appropriately, phase contrast microscopy can be performed immediately. I can do it. Next, when performing epi-fluorescence microscopy, the dichroic mirror box 9 is attached, the nomarski slider 7 is operated to bring the differential interference element 8 out of the optical path, and the fluorescence light source device 13 is turned on. Fluoroscopy can be performed immediately. In this case, the optical axes of the dichroic mirror 10 and the light projection tube 14 correctly match when the dichroic mirror box 9 is installed, and since there is no differential interference element 8 in the optical path, the high-performance 9 Fluoroscopy can be performed.
以上、本発明を倒立型顕微鏡に適用した場合の実施例に
つき説明したが、これは正立型顕微鏡にもそのまま適用
できることは云うまでもない。The embodiments in which the present invention is applied to an inverted microscope have been described above, but it goes without saying that the present invention can also be applied to an upright microscope as is.
発明の効果
上述の如く本発明によれば、位相差検鏡、微分干渉検鏡
、落射螢光検鏡、明視野検鏡への相互間の切換えが容易
且つ簡単で、而も何れの形式の検鏡時でもその性能が十
分に発揮され得る多目的顕微鏡を提供することができる
。Effects of the Invention As described above, according to the present invention, switching between phase contrast microscopy, differential interference microscopy, epifluorescence microscopy, and bright field microscopy is easy and simple, and any type of microscopy can be easily and easily switched. It is possible to provide a multipurpose microscope that can fully demonstrate its performance even during microscopy.
図面は本発明に係る多目的顕微鏡の一実施例の説明図で
ある。
１・・・・顕微鏡本体、４・・・・ステージ、５・・・
・・対物レンズ、６ ・・・・レボルバ−１７・・・・
ノマルスキースライダー、８・・・・微分干渉用素子、
９・・・・ダイクロツクミラーボックス、１０・・・・
落射螢光用ダイクロックミラー、１１・・・・励起フィ
ルター、１２・・・・バリアーフィルター、１３・・・
・螢光光源装置、１４・・・・投光管。The drawing is an explanatory diagram of an embodiment of a multipurpose microscope according to the present invention. 1... Microscope body, 4... Stage, 5...
...Objective lens, 6 ...Revolver-17...
Nomarski slider, 8...Differential interference element,
9...Dichrotsu mirror box, 10...
Dichroic mirror for epifluorescence, 11...excitation filter, 12...barrier filter, 13...
- Fluorescent light source device, 14...light tube.
Claims (2)
対物レンズを含んだ光軸に沿って移動可能のレボルバ−
とを備えた多目的顕微鏡において、上記レボルバ−内に
微分干渉用素子を光路に対し挿脱自在に設置し、且つ顕
微鏡の本体内に落射螢光用ダイクロツクミラーを光路に
対し挿脱自在に設置したことを特徴とする多目的顕微鏡
。(1) A fixed stage and a revolver that is movable along the optical axis and includes an objective lens for focusing.
In a multipurpose microscope equipped with the above, a differential interference element is installed in the revolver so that it can be inserted into and removed from the optical path, and a dichroic mirror for epifluorescence is installed inside the main body of the microscope so that it can be inserted into and removed from the optical path. A multipurpose microscope characterized by:
及びバリアーフィルターと共にユニット化して、このユ
ニットを光路に対し挿脱自在とした特許請求の範囲（１
）に記載の多目的顕微鏡。(2) The scope of claims (1) in which a dichroic mirror for epifluorescence is formed into a unit together with an excitation filter and a barrier filter, and this unit can be freely inserted into and removed from the optical path.
) Multipurpose microscope described in .
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16295083A JPS6053916A (en) | 1983-09-05 | 1983-09-05 | Multi-purpose microscope |
| DE19843432636 DE3432636A1 (en) | 1983-09-05 | 1984-09-05 | Multipurpose microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16295083A JPS6053916A (en) | 1983-09-05 | 1983-09-05 | Multi-purpose microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6053916A true JPS6053916A (en) | 1985-03-28 |
Family
ID=15764340
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16295083A Pending JPS6053916A (en) | 1983-09-05 | 1983-09-05 | Multi-purpose microscope |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPS6053916A (en) |
| DE (1) | DE3432636A1 (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63133115A (en) * | 1986-11-26 | 1988-06-04 | Nikon Corp | Optical microscope |
| JPH0459815U (en) * | 1990-09-29 | 1992-05-22 | ||
| JPH11271640A (en) * | 1998-03-23 | 1999-10-08 | Olympus Optical Co Ltd | Inverted microscope |
| WO2001071406A1 (en) * | 2000-03-24 | 2001-09-27 | Olympus Optical Co., Ltd. | Microscope unit |
| JP2005308985A (en) * | 2004-04-20 | 2005-11-04 | Olympus Corp | Scanning laser microscope |
| JP2016014833A (en) * | 2014-07-03 | 2016-01-28 | オリンパス株式会社 | Microscope system and correction ring operation device |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1290485B1 (en) * | 2000-06-14 | 2007-01-03 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Method for measuring surface topography in a quantitative and optical manner |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5014448B1 (en) * | 1968-02-07 | 1975-05-28 | ||
| JPS5567718A (en) * | 1978-11-16 | 1980-05-22 | Mitsubishi Chem Ind Ltd | Optical system of multipurpose photometric microscope |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3230504C2 (en) * | 1981-08-26 | 1989-09-21 | Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar | Transmitted light and / or reflected light inverted microscope |
-
1983
- 1983-09-05 JP JP16295083A patent/JPS6053916A/en active Pending
-
1984
- 1984-09-05 DE DE19843432636 patent/DE3432636A1/en not_active Ceased
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5014448B1 (en) * | 1968-02-07 | 1975-05-28 | ||
| JPS5567718A (en) * | 1978-11-16 | 1980-05-22 | Mitsubishi Chem Ind Ltd | Optical system of multipurpose photometric microscope |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63133115A (en) * | 1986-11-26 | 1988-06-04 | Nikon Corp | Optical microscope |
| JPH0459815U (en) * | 1990-09-29 | 1992-05-22 | ||
| JPH11271640A (en) * | 1998-03-23 | 1999-10-08 | Olympus Optical Co Ltd | Inverted microscope |
| WO2001071406A1 (en) * | 2000-03-24 | 2001-09-27 | Olympus Optical Co., Ltd. | Microscope unit |
| US6657781B2 (en) | 2000-03-24 | 2003-12-02 | Olympus Optical Co., Ltd. | Microscope unit |
| KR100806023B1 (en) * | 2000-03-24 | 2008-02-26 | 올림푸스 가부시키가이샤 | Microscope unit |
| JP4834272B2 (en) * | 2000-03-24 | 2011-12-14 | オリンパス株式会社 | Microscope unit |
| JP2005308985A (en) * | 2004-04-20 | 2005-11-04 | Olympus Corp | Scanning laser microscope |
| JP4576150B2 (en) * | 2004-04-20 | 2010-11-04 | オリンパス株式会社 | Scanning laser microscope |
| JP2016014833A (en) * | 2014-07-03 | 2016-01-28 | オリンパス株式会社 | Microscope system and correction ring operation device |
| US10317658B2 (en) | 2014-07-03 | 2019-06-11 | Olympus Corporation | Microscope system and correction collar operating device |
Also Published As
| Publication number | Publication date |
|---|---|
| DE3432636A1 (en) | 1985-04-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4148552A (en) | Microscope adaptable to various observing methods | |
| US4756611A (en) | Multiple-purpose microscope | |
| US6563113B1 (en) | Microscope, especially a fluorescence microscope, particularly a stereo fluorescence microscope | |
| US8300308B2 (en) | Eyepiece base unit and microscope | |
| US20070236785A1 (en) | Microscope | |
| JPH0735986A (en) | Inverted type and erected type microscope | |
| JPH06289301A (en) | Vertical illuminating optical system for microscope | |
| JPS6053916A (en) | Multi-purpose microscope | |
| JP2007322579A (en) | Vertical illuminating optical system for microscope | |
| US8243365B2 (en) | Microscope | |
| JPS63183414A (en) | Universal capacitor for microscope | |
| JP2004318181A (en) | Inverted microscope | |
| US7206128B2 (en) | Illumination unit of stereomicroscope | |
| JP3927057B2 (en) | Differential interference microscope | |
| JPH07501629A (en) | microscope illumination device | |
| JP3757529B2 (en) | Microscope illumination optics | |
| JP4792163B2 (en) | Microscope equipment | |
| JP2002196218A (en) | Microscope | |
| JPH028283B2 (en) | ||
| JPH0697304B2 (en) | microscope | |
| US20050099679A1 (en) | Microscope especially inverted microscope | |
| JPH11194277A (en) | Inverted microscope | |
| JP2002006224A (en) | Dark/bright field vertical illuminating device for microscope | |
| JP2003005082A (en) | Microscopic system | |
| JP2980157B2 (en) | microscope |