JPS5263637A - Device for non-volatile semiconductor memory - Google Patents
Device for non-volatile semiconductor memoryInfo
- Publication number
- JPS5263637A JPS5263637A JP50139590A JP13959075A JPS5263637A JP S5263637 A JPS5263637 A JP S5263637A JP 50139590 A JP50139590 A JP 50139590A JP 13959075 A JP13959075 A JP 13959075A JP S5263637 A JPS5263637 A JP S5263637A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor memory
- volatile semiconductor
- facilitate
- screening
- matrix
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0425—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a merged floating gate and select transistor
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Non-Volatile Memory (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Abstract
PURPOSE:To facilitate detection of the electric charge of MOS memory transistor arranged in the form of matrix in order to facilitate the screening of its production and achieve the cost reduction and high reliability.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50139590A JPS5263637A (en) | 1975-11-20 | 1975-11-20 | Device for non-volatile semiconductor memory |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50139590A JPS5263637A (en) | 1975-11-20 | 1975-11-20 | Device for non-volatile semiconductor memory |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5263637A true JPS5263637A (en) | 1977-05-26 |
JPS576199B2 JPS576199B2 (en) | 1982-02-03 |
Family
ID=15248799
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50139590A Granted JPS5263637A (en) | 1975-11-20 | 1975-11-20 | Device for non-volatile semiconductor memory |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5263637A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5671898A (en) * | 1979-11-15 | 1981-06-15 | Nippon Texas Instr Kk | Nonvolatile semiconductor memory device and its testing method |
JPS60111396A (en) * | 1983-11-18 | 1985-06-17 | Matsushita Electronics Corp | Semiconductor memory device |
JPS63302495A (en) * | 1987-04-03 | 1988-12-09 | Toshiba Corp | Semiconductor memory device |
US9030877B2 (en) | 2007-08-30 | 2015-05-12 | Infineon Technologies Ag | Memory cell arrangement, method for controlling a memory cell, memory array and electronic device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4874757A (en) * | 1971-12-30 | 1973-10-08 |
-
1975
- 1975-11-20 JP JP50139590A patent/JPS5263637A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4874757A (en) * | 1971-12-30 | 1973-10-08 |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5671898A (en) * | 1979-11-15 | 1981-06-15 | Nippon Texas Instr Kk | Nonvolatile semiconductor memory device and its testing method |
JPS6221199B2 (en) * | 1979-11-15 | 1987-05-11 | Nippon Tekisasu Insutsurumentsu Kk | |
JPS60111396A (en) * | 1983-11-18 | 1985-06-17 | Matsushita Electronics Corp | Semiconductor memory device |
JPS63302495A (en) * | 1987-04-03 | 1988-12-09 | Toshiba Corp | Semiconductor memory device |
JPH0427638B2 (en) * | 1987-04-03 | 1992-05-12 | Tokyo Shibaura Electric Co | |
US9030877B2 (en) | 2007-08-30 | 2015-05-12 | Infineon Technologies Ag | Memory cell arrangement, method for controlling a memory cell, memory array and electronic device |
Also Published As
Publication number | Publication date |
---|---|
JPS576199B2 (en) | 1982-02-03 |
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