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JPS5853147A - Charged-particle mass energy analyzer - Google Patents

Charged-particle mass energy analyzer

Info

Publication number
JPS5853147A
JPS5853147A JP56149612A JP14961281A JPS5853147A JP S5853147 A JPS5853147 A JP S5853147A JP 56149612 A JP56149612 A JP 56149612A JP 14961281 A JP14961281 A JP 14961281A JP S5853147 A JPS5853147 A JP S5853147A
Authority
JP
Japan
Prior art keywords
field
magnetic
analyzer
electric field
magnetic field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56149612A
Other languages
Japanese (ja)
Other versions
JPH0351051B2 (en
Inventor
Kiyoshi Hashimoto
清 橋本
Kazuo Hayashi
和夫 林
Satoru Sukenobu
祐延 悟
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56149612A priority Critical patent/JPS5853147A/en
Publication of JPS5853147A publication Critical patent/JPS5853147A/en
Publication of JPH0351051B2 publication Critical patent/JPH0351051B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers
    • H01J49/284Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To increase the resolution of a charged-particle mass energy analyzer, and simplify the designing and the manufacturing of the analyzer by making a deflection angle of 180 degrees to be achieved with a magnetic field, and performing mass discriminations by making ions to pass through the area of an electric field after they are deflected with the magnetic field. CONSTITUTION:The space between magnetic poles is narrowed by installing an electrode plate outside magnetic plates 3, so that the magnet is made smaller and the magnetic-field disturbance area is reduced. In addition, by making a magnetic-field deflection angle as large as 180 degrees, the influence of field disturbances, which develop at the ends of the magnetic poles, upon the particle- beam orbit can be reduced. As for the synergistic effect of the fringe fields of the electric field and the magnetic field, the influence of the superposed fringe field upon the ion orbit is reduced by separating the areas of the electric field and the magnetic field by decreasing the space between the magnetic poles. Besides, since the electric and the magetic fields are separated, assembly of the analyzer is facilitated, and a degree of freedom can be given to the deflection method which is carried out with the electric field.

Description

【発明の詳細な説明】 本発明は荷電粒子の質量エネルギー分析器に関する。[Detailed description of the invention] The present invention relates to a charged particle mass energy analyzer.

#嵐粒子の質量や、エネルギーの分析は1通常、電場、
a1中に粒子を入射させ、そO偏肉される割合が/Ji
Ltやエネルギーによって異なることt−利用してなさ
れる。
#Analysis of the mass and energy of storm particles 1Usually, an electric field,
When particles are injected into a1, the rate of uneven thickness is /Ji
Different things are done using t- depending on Lt and energy.

#I1図、JI2図、およびJIa図は、従来から用い
らnている、看しくにll案されている分#器の例であ
る。
The #I1 diagram, the JI2 diagram, and the JIa diagram are examples of conventionally used dividers that have been proposed.

第1図、第2図は、180度偏向型の分析器C1電磁場
が、同−顧域に重責しC1−1J加されている。
In FIGS. 1 and 2, the 180 degree deflection type analyzer C1 electromagnetic field is applied to the analyzer area C1-1J.

同図では、H+やD+のような、荷電数が同じで、質量
数の異なる二種類の粒子ビームが入射した場合を代表と
して示している。真空容器lの中に収められた靜嘔偏向
板2によって耐重を、電磁石3によって磁場を発生させ
ている。同図ではその方向は同じである。また、同図で
は、X窒容器自身が11a石のヨークを兼ねたJa介を
示している。電磁場は、磁極板面積、m極板面積で規定
される領域4に存伍しCいる。この領域に入射されたH
+とD+の混合ビーム5は、ラーヌー半径の差!A#こ
僅って運動量の分析が電磁場と直角方向暑こ、また電磁
による偏向差によって貫電の分析が電磁場方向になされ
る。
The figure typically shows the case where two types of particle beams, such as H+ and D+, having the same charge number and different mass numbers are incident. A deflection plate 2 housed in a vacuum container 1 provides weight resistance, and an electromagnet 3 generates a magnetic field. In the figure, the directions are the same. Furthermore, the same figure shows a Ja container in which the X-nitrogen container itself also serves as a yoke of 11a stone. The electromagnetic field exists in a region 4 defined by the area of the magnetic pole plate and the area of the m pole plate. H incident on this area
The mixed beam 5 of + and D+ is the difference in Ranu radius! A# Momentum is only analyzed in the direction perpendicular to the electromagnetic field, and due to the difference in deflection caused by electromagnetism, the analysis of through current is performed in the direction of the electromagnetic field.

さて、このような構成に3い”Cは、JJIL量弁別も
電#l他板間で行わせようとするため、必然的擾こ電l
B1m間−を大きくとる必要がでてくる。そのため電磁
石には大きな起磁力が求められ電磁石には大きな起磁力
が求められ電磁石は大渥化Tる。また、極板間噛が広が
ることにより、フリンジ場など礁板j!!部での電#B
場の乱れの効果が大きくなる。この効果が大きいことは
、IA案的SCは、荷電粒子軌道の解析をamにし、分
析器の設計を劇しくする。
Now, in such a configuration, since the JJIL amount discrimination is also to be performed between the other boards, the inevitable
It becomes necessary to take a large distance between B1m. Therefore, electromagnets are required to have a large magnetomotive force, and electromagnets are required to have a large magnetomotive force. In addition, by expanding the contact between the polar plates, reef plates such as fringe areas can be formed. ! Telephone number B at the department
The effect of field disturbance increases. This effect is large, and the IA proposed SC makes the analysis of charged particle trajectories am am and dramatically improves the design of the analyzer.

−万、$I3図の例は、磁石を小型化し良いとして考え
られている方式である。即ち、電mV磁1間からとりだ
丁ことにより磁@Wlnllk狭くし、更に磁場による
ビームの偏向角を小さくする゛ことにより磁石の小型化
を図ろうとするものである。友しかにこの方法は原理的
にはすぐれ先方法とい入る。即ち、上述の効果の他憂こ
、電磁石のレンズ効果を利用して、ビームの集束点に粒
子検出器をおけば、運動量分ml@も向上で者る。しか
しながらこの方式は、実際の設計、製作を考えると構案
的でない。その理由は、磁場が、IIm板端部で不逼続
的に変化するのではL<、端部近傍では必ず場の乱れが
存在する。それに対して、菖3wgの方式は、まさ−こ
、この乱れの多い領域を利用して分析しようとするもの
で、荷電粒子のふるまいを迩壷に把−することは甚だ内
離であり、集束点を利用しτ分#舵をあげるという試み
(こは多くの回路がある。
- 10,000, $I The example in Figure 3 is a method that is considered to be suitable for reducing the size of the magnet. That is, the aim is to reduce the size of the magnet by narrowing the magnetic field by taking it out from between the electric mV and the magnetic field, and by reducing the deflection angle of the beam due to the magnetic field. This method is, in principle, a superior method. That is, in addition to the above-mentioned effects, if a particle detector is placed at the focal point of the beam by utilizing the lens effect of the electromagnet, the momentum ml@ can also be improved. However, this method is not practical when considering actual design and manufacturing. The reason for this is that if the magnetic field changes discontinuously at the edge of the IIm plate, field disturbance will always exist near the edge if L<. On the other hand, the Iris 3wg method attempts to analyze using this highly disordered region, and it is extremely difficult to understand the behavior of charged particles in a focused manner. An attempt to raise the rudder by τ using the point (there are many circuits for this).

本発明は、このような点に鑑みてなされたもので、磁場
による場内角を180度にえらび、磁場による偏向後に
電場領域を通過させて′X菫弁別を行うものである。#
!4図にその構成を示す。図では、H+とD+のように
二種類のビームの分析例を示している。この方式は、第
1図、第2図の方式と、纂3凶の方式の利点ン兼zaそ
なん死力式といえる。
The present invention has been made in view of these points, and involves selecting an internal field angle of 180 degrees and performing 'X violet discrimination by passing through an electric field region after being deflected by the magnetic field. #
! Figure 4 shows its configuration. The figure shows an example of analysis of two types of beams, H+ and D+. This method can be said to be a combination of the methods shown in Figures 1 and 2, and the 3 worst methods.

つまり、電極板を磁惚板の外にだすことにより磁極間隙
をせまくして、磁石を小型化するととも曇こ、−場の乱
れ領域を少くしている。加入て、tiiJa偏向角を1
80度と大きくとることにより、磁極端部の場の乱れの
粒子ビーム軌道への影ll1lを小さくできる。
In other words, by extending the electrode plate outside the magnetic plate, the gap between the magnetic poles is narrowed, thereby making the magnet smaller and reducing the field disturbance area. join and set the tiiJa deflection angle to 1
By setting the angle to be as large as 80 degrees, the influence of field disturbance at the magnetic pole tip on the particle beam trajectory can be reduced.

また、電場、磁場のフリンジ場の相乗効果に対しては、
磁極間I!s4を小さくして、電磁場領域を別個にする
ことで、41.2図におけるようなフリンジ場のかさな
り−こよるイオン軌道への影#を小さくしでいる。
In addition, regarding the synergistic effect of the fringe fields of electric and magnetic fields,
Between magnetic poles I! By reducing s4 and making the electromagnetic field regions separate, the shadow # on the ion trajectory caused by the size of the fringe field as shown in Fig. 41.2 is reduced.

以上は、第1.2.3図の別の欠点を補う賜のであるが
、当該方式によっても%各方式における利点は保存され
ている。例えば、j11図、纂4図ではいずれも、磁場
偏向角は1801[であり、磁場暑こ対しては、垂直入
出射する。これは、工作・組立・−!Iv簡単にする。
Although the above is an attempt to compensate for another drawback of FIG. 1.2.3, the advantages of each method are preserved even with this method. For example, in both figures j11 and 4, the magnetic field deflection angle is 1801[, and the magnetic field enters and exits the magnetic field perpendicularly. This is work, assembly...! IV Make it easy.

まえ、電磁場を別個にすることは、第1図番こ比して纂
3.第4図のように、帆立を容易曇こするほか、電場に
よる偏向法に自由度を容入ること曇こなる。例えば、第
411Iのように。
First, separating the electromagnetic fields can be summarized as 3. As shown in Figure 4, not only can the scallops be easily fogged, but also the degree of freedom can be added to the deflection method using an electric field. For example, like No. 411I.

電1klIILをji当な形状にすることにより、電磁
場方向への粒子の一位距離を選択することができ、粒子
検出##を−ii[縁上に並べることなどが可能である
By making the electron 1klIIL a suitable shape, it is possible to select the first distance of the particles in the direction of the electromagnetic field, and it is possible to arrange the particle detection ## on the -ii [edge, etc.

以上述べ友ように、本発明は、電磁場領域を分離し、磁
場偏向角を180度とすることにより、値米の分析方式
の長所を生かしつつ、設計製作を簡牢番こすることがで
きる。
As mentioned above, in the present invention, by separating the electromagnetic field region and setting the magnetic field deflection angle to 180 degrees, it is possible to simplify the design and manufacture while taking advantage of the advantages of the value analysis method.

上述した′AIIIA例では粒子の1a類は二種類とし
たが、二a1類にこだわることはなく多穏鎖に拡大で會
る。tた、分析器の小形化の九め番こ電磁石と真空容器
は一体とし九が、これも、二つを分離し、―石Vt11
g5図のように処置形として4さしつかえないことはい
うまでもない。
In the above-mentioned 'AIIIA example, there are two types of particles of class 1a, but they are not limited to class 2a1, and they meet in a wide range of moderate chains. In order to make the analyzer more compact, the electromagnet and the vacuum container were integrated into one, but in this case, the two were also separated.
It goes without saying that 4 can be used as a treatment form as shown in Figure g5.

【図面の簡単な説明】[Brief explanation of the drawing]

謳1図は、従来例の電磁場を重畳させる方式の土間断面
図、@2図はその@FiJ#向図、纂3図はa場−内角
を小ざくし、電a場1分離した方式を示している稠向断
向図、謁4図は本発明の実施例を示T上面wfr面図、
菖5図は第4図の清面断面−1116wtAは本発明の
他の実應例をしめ丁上面断IiillIgで′める。 l・・・臭11!器(電磁石ヨークを零ねる。)2・・
・靜題−向板、  3・・・電磁石#1礁板、4・・・
電場鎖酸、   5・・・#11Ea子ビーム、6・・
・コリメータ、  7・・・出射点、8・・・粒子検出
器、   9・・・コイル、10・・・値場餉域、  
 11・・・真空容器、ν・・・電磁石。
Figure 1 is a cross-sectional view of the soil floor of the conventional method in which electromagnetic fields are superimposed, Figure @2 is the view facing @FiJ#, and Figure 3 is the method in which the a-field interior angle is made smaller and the electric a-field is separated by one. The vertical sectional view shown in FIG. 4 shows an embodiment of the present invention;
Figure 5 shows another embodiment of the present invention at a top cross section IillIg, which is a cross section of the bottom surface of FIG. l...smell 11! (Slips the electromagnetic yoke.) 2...
・Question - Facing plate, 3...Electromagnet #1 reef plate, 4...
Electric field chain acid, 5...#11Ea beam, 6...
・Collimator, 7...Emission point, 8...Particle detector, 9...Coil, 10...Value field area,
11...Vacuum container, ν...Electromagnet.

Claims (1)

【特許請求の範囲】[Claims] 電磁場中に荷電粒子を入射させ、電磁場による偏向作用
によって、粒子の質量とエネルギーを分析するものにお
いて、磁場によって、180度偏向させたのち、磁場と
同一方向、若しくは、逆方向の向きをもつ電場t/経過
させることにより荷電粒子の51L重とエネルギーの分
析をおこなうよ−う11威したことを特値とする荷電粒
子質量エネルギー分析器。
In systems where charged particles are introduced into an electromagnetic field and the mass and energy of the particles are analyzed by the deflection action of the electromagnetic field, after the particles are deflected 180 degrees by the magnetic field, an electric field that is in the same direction as the magnetic field or in the opposite direction. A charged particle mass energy analyzer that has the special feature of being able to analyze the 51L weight and energy of charged particles by allowing the 51L to elapse.
JP56149612A 1981-09-24 1981-09-24 Charged-particle mass energy analyzer Granted JPS5853147A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56149612A JPS5853147A (en) 1981-09-24 1981-09-24 Charged-particle mass energy analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56149612A JPS5853147A (en) 1981-09-24 1981-09-24 Charged-particle mass energy analyzer

Publications (2)

Publication Number Publication Date
JPS5853147A true JPS5853147A (en) 1983-03-29
JPH0351051B2 JPH0351051B2 (en) 1991-08-05

Family

ID=15479007

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56149612A Granted JPS5853147A (en) 1981-09-24 1981-09-24 Charged-particle mass energy analyzer

Country Status (1)

Country Link
JP (1) JPS5853147A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55159557A (en) * 1979-05-31 1980-12-11 Jeol Ltd Mass analyzer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55159557A (en) * 1979-05-31 1980-12-11 Jeol Ltd Mass analyzer

Also Published As

Publication number Publication date
JPH0351051B2 (en) 1991-08-05

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