JPH02285348A - Pellicle - Google Patents
PellicleInfo
- Publication number
- JPH02285348A JPH02285348A JP1105962A JP10596289A JPH02285348A JP H02285348 A JPH02285348 A JP H02285348A JP 1105962 A JP1105962 A JP 1105962A JP 10596289 A JP10596289 A JP 10596289A JP H02285348 A JPH02285348 A JP H02285348A
- Authority
- JP
- Japan
- Prior art keywords
- pellicle
- film body
- thin film
- optical thin
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010409 thin film Substances 0.000 claims abstract description 24
- 230000003287 optical effect Effects 0.000 claims abstract description 19
- 229920000642 polymer Polymers 0.000 claims abstract description 18
- 239000010410 layer Substances 0.000 claims abstract description 17
- 239000012790 adhesive layer Substances 0.000 claims abstract description 10
- 239000000853 adhesive Substances 0.000 claims abstract description 9
- 125000000524 functional group Chemical group 0.000 claims abstract description 9
- 125000000217 alkyl group Chemical group 0.000 claims abstract description 4
- 230000001070 adhesive effect Effects 0.000 claims description 8
- 238000002834 transmittance Methods 0.000 abstract description 12
- 239000010408 film Substances 0.000 abstract description 7
- 229910052731 fluorine Inorganic materials 0.000 abstract description 6
- 239000011737 fluorine Substances 0.000 abstract description 5
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 abstract description 4
- 238000004519 manufacturing process Methods 0.000 description 8
- 238000000034 method Methods 0.000 description 7
- -1 trifluoroethylene, chlorotrifluoroethylene, tetrafluoroethylene, hexafluoropropylene Chemical group 0.000 description 6
- 239000000178 monomer Substances 0.000 description 5
- 239000002243 precursor Substances 0.000 description 5
- 229920001577 copolymer Polymers 0.000 description 4
- 230000005611 electricity Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 239000000243 solution Substances 0.000 description 4
- 230000003068 static effect Effects 0.000 description 4
- BFKJFAAPBSQJPD-UHFFFAOYSA-N tetrafluoroethene Chemical group FC(F)=C(F)F BFKJFAAPBSQJPD-UHFFFAOYSA-N 0.000 description 4
- 101000836005 Homo sapiens S-phase kinase-associated protein 1 Proteins 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- 102100025487 S-phase kinase-associated protein 1 Human genes 0.000 description 3
- 238000007664 blowing Methods 0.000 description 3
- 238000001723 curing Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 230000001681 protective effect Effects 0.000 description 3
- OBTWBSRJZRCYQV-UHFFFAOYSA-N sulfuryl difluoride Chemical group FS(F)(=O)=O OBTWBSRJZRCYQV-UHFFFAOYSA-N 0.000 description 3
- 229910000838 Al alloy Inorganic materials 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 2
- 239000000020 Nitrocellulose Substances 0.000 description 2
- 239000002390 adhesive tape Substances 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 229920002313 fluoropolymer Polymers 0.000 description 2
- 229920003303 ion-exchange polymer Polymers 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 229920001220 nitrocellulos Polymers 0.000 description 2
- 238000006116 polymerization reaction Methods 0.000 description 2
- 238000003756 stirring Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- BQCIDUSAKPWEOX-UHFFFAOYSA-N 1,1-Difluoroethene Chemical compound FC(F)=C BQCIDUSAKPWEOX-UHFFFAOYSA-N 0.000 description 1
- FVGVNEWIVOZHSZ-UHFFFAOYSA-N 4-methyloct-7-ene-1-sulfonyl fluoride Chemical compound C=CCCC(C)CCCS(F)(=O)=O FVGVNEWIVOZHSZ-UHFFFAOYSA-N 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- LSNNMFCWUKXFEE-UHFFFAOYSA-M Bisulfite Chemical compound OS([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-M 0.000 description 1
- 229920008347 Cellulose acetate propionate Polymers 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- 229920001353 Dextrin Polymers 0.000 description 1
- 239000004375 Dextrin Substances 0.000 description 1
- 229920000459 Nitrile rubber Polymers 0.000 description 1
- 229910006095 SO2F Inorganic materials 0.000 description 1
- 229920002472 Starch Polymers 0.000 description 1
- XTXRWKRVRITETP-UHFFFAOYSA-N Vinyl acetate Chemical compound CC(=O)OC=C XTXRWKRVRITETP-UHFFFAOYSA-N 0.000 description 1
- 229920003180 amino resin Polymers 0.000 description 1
- QGZKDVFQNNGYKY-UHFFFAOYSA-O ammonium group Chemical group [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 description 1
- 230000003667 anti-reflective effect Effects 0.000 description 1
- 125000004432 carbon atom Chemical group C* 0.000 description 1
- 229920002678 cellulose Polymers 0.000 description 1
- 229920002301 cellulose acetate Polymers 0.000 description 1
- 229920006217 cellulose acetate butyrate Polymers 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- KYKAJFCTULSVSH-UHFFFAOYSA-N chloro(fluoro)methane Chemical compound F[C]Cl KYKAJFCTULSVSH-UHFFFAOYSA-N 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 229920001940 conductive polymer Polymers 0.000 description 1
- 239000013256 coordination polymer Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 235000019425 dextrin Nutrition 0.000 description 1
- 238000007865 diluting Methods 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- UHESRSKEBRADOO-UHFFFAOYSA-N ethyl carbamate;prop-2-enoic acid Chemical compound OC(=O)C=C.CCOC(N)=O UHESRSKEBRADOO-UHFFFAOYSA-N 0.000 description 1
- 125000001153 fluoro group Chemical group F* 0.000 description 1
- XUCNUKMRBVNAPB-UHFFFAOYSA-N fluoroethene Chemical compound FC=C XUCNUKMRBVNAPB-UHFFFAOYSA-N 0.000 description 1
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 1
- 238000013007 heat curing Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000012456 homogeneous solution Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000003999 initiator Substances 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229930014626 natural product Natural products 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 229920005548 perfluoropolymer Polymers 0.000 description 1
- 229920001568 phenolic resin Polymers 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920006255 plastic film Polymers 0.000 description 1
- 229920001084 poly(chloroprene) Polymers 0.000 description 1
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 1
- 229920002037 poly(vinyl butyral) polymer Polymers 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- 239000005020 polyethylene terephthalate Substances 0.000 description 1
- 239000004926 polymethyl methacrylate Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 150000003254 radicals Chemical class 0.000 description 1
- 239000005060 rubber Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000008107 starch Substances 0.000 description 1
- 235000019698 starch Nutrition 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- BDHFUVZGWQCTTF-UHFFFAOYSA-M sulfonate Chemical compound [O-]S(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-M 0.000 description 1
- 150000005622 tetraalkylammonium hydroxides Chemical class 0.000 description 1
- TXEYQDLBPFQVAA-UHFFFAOYSA-N tetrafluoromethane Chemical compound FC(F)(F)F TXEYQDLBPFQVAA-UHFFFAOYSA-N 0.000 description 1
- 229920001169 thermoplastic Polymers 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 239000004416 thermosoftening plastic Substances 0.000 description 1
- WVLBCYQITXONBZ-UHFFFAOYSA-N trimethyl phosphate Chemical compound COP(=O)(OC)OC WVLBCYQITXONBZ-UHFFFAOYSA-N 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 230000037303 wrinkles Effects 0.000 description 1
Landscapes
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
この発明はLSI製造のリソグラフィー工程において使
用されるフォトマスクやレティクル等の透明基板(以下
マスクと略す)の異物付着を防止することを目的として
使用されるペリクルに関する。さらに詳細には、光線透
過率が優れ、かつ、帯電防止されたペリクルに関する。[Detailed Description of the Invention] [Industrial Application Field] The purpose of this invention is to prevent foreign matter from adhering to transparent substrates (hereinafter referred to as masks) such as photomasks and reticles used in the lithography process of LSI manufacturing. Concerning the pellicle used. More specifically, the present invention relates to a pellicle that has excellent light transmittance and is antistatic.
[従来の技術]
半導体製造においてウェハー上に微細な回路パターンを
形成する場合、ステッパー等の半導体製造装置を使用し
ている。ここで重要なのは前記半導体製造装置に組み込
まれる回路パターンを形成するためのマスクの品質であ
る。近年、大規模集積回路の発展に伴いその画線幅も非
常に微細になり、今後もその傾向は進むと予想され、そ
れゆえマスクの品質が半導体製造装置の稼動率や製造コ
ストに大きく影響するものとなってきている。特にマス
クに付着する異物が歩留りを低下させることが重大な問
題である。この問題を解決するひとつの手段として、い
わゆるペリクルを装着してマスクを異物から保護する方
法がとられている(例えば、特公昭54−28716号
公報参照)。一方、大規模集積回路がカスタム化し、多
品社少量生産の方向が強まってきつつある。このことは
多数のマスクを使用することを意味し、マスクの保管管
理の必要性が増してきた。その際、ペリクル装着の保管
は管理上簡便であることが認められつつある。[Prior Art] When forming fine circuit patterns on a wafer in semiconductor manufacturing, semiconductor manufacturing equipment such as a stepper is used. What is important here is the quality of the mask for forming the circuit pattern incorporated into the semiconductor manufacturing equipment. In recent years, with the development of large-scale integrated circuits, the line width has become extremely fine, and this trend is expected to continue in the future. Therefore, the quality of masks has a large impact on the operating rate and manufacturing costs of semiconductor manufacturing equipment. It's becoming a thing. In particular, it is a serious problem that foreign matter adhering to the mask reduces the yield. One way to solve this problem is to protect the mask from foreign substances by attaching a so-called pellicle (see, for example, Japanese Patent Publication No. 54-28716). On the other hand, large-scale integrated circuits are becoming more customizable, and there is a growing trend toward high-volume, low-volume production. This means that a large number of masks are used, and the need for mask storage management has increased. In this case, it is becoming recognized that storage with a pellicle attached is convenient for management.
第1図はこのようなところに使われるペリクルの説明図
である。ここに光学的薄膜体lが支持枠2に接着層3に
よりシワ、クルミなく、固着されている。支持枠2の他
の端面に粘着剤層4を有し、その上に場合により保護フ
ィルム5を配置した構造となっている。このようなペリ
クルは、保護フィルム5を剥し粘着剤層を介してマスク
に装着して使用される。FIG. 1 is an explanatory diagram of a pellicle used in such a place. Here, the optical thin film 1 is firmly fixed to the support frame 2 by the adhesive layer 3 without wrinkles or cracks. The supporting frame 2 has an adhesive layer 4 on the other end surface, and a protective film 5 is optionally placed thereon. Such a pellicle is used by peeling off the protective film 5 and attaching it to a mask via the adhesive layer.
ところで、光学的薄膜体には厚さ 0.5〜lOμ厘程
度の材質がポリマーよりなる薄膜が一般に用いられるが
、これらは極めて電気抵抗が大きくそのために帯電し易
い。静電気吸着により異物が何軒したとき、エアーブロ
ー等では極めて除去しにくい。或いは、マスクに貼り付
けたときにそのような異物がなんらかの拍子にマスク面
に落下し、これが露光パターンの欠陥となるような危険
性があった。By the way, thin films made of polymers and having a thickness of about 0.5 to 10 μm are generally used as optical thin film bodies, but these have extremely high electrical resistance and are therefore easily charged. When foreign matter gets stuck due to static electricity, it is extremely difficult to remove it with air blowing or the like. Alternatively, when the mask is attached, there is a risk that such foreign matter may somehow fall onto the mask surface and cause a defect in the exposure pattern.
このような帯電防止を目的として特開昭80−1342
39号公報には光学的薄膜体が導電性であるようなペリ
クルの提案がなされている。光学的薄膜体に導電性を付
与する方法として導電性ポリマーを添加したり表面固有
抵抗を低くした光透過プラスチックフィルムの使用が記
述されている。更に光学的薄膜体に5nOzや1nz0
3等の透明導電膜を蒸着等で付若する方法も記述されて
いる。ところがこれらの方法では、ペリクルの重要スペ
ックである光線透過率が低下してしまうという難点があ
った。For the purpose of preventing such static electricity, Japanese Patent Application Laid-Open No. 80-1342
No. 39 proposes a pellicle in which the optical thin film body is electrically conductive. As a method of imparting electrical conductivity to an optical thin film body, the use of a light-transmitting plastic film to which a conductive polymer is added or whose surface resistivity is lowered is described. Furthermore, 5nOz or 1nz0 is applied to the optical thin film body.
A method of attaching a transparent conductive film such as No. 3 by vapor deposition or the like is also described. However, these methods have the disadvantage that the light transmittance, which is an important specification of a pellicle, decreases.
【発明が解決しようとする問題点]
本発明は以上に示したような従来のペリクルが抱えてい
る問題点を解決し、光線透過率が優れ、かつ帯電防止さ
れたペリクルを提供することを目的としている。[Problems to be Solved by the Invention] The purpose of the present invention is to solve the above-mentioned problems of conventional pellicles, and to provide a pellicle that has excellent light transmittance and is antistatic. It is said that
[問題点を解決するための手段]
本発明者らは、上記のような問題を解決するために従来
より種々研究を重ねてきたが、反射防止層に導電性のあ
るフッ素系ポリマーを用いることにより解決できること
を見いだし本発明を完成するに至った。[Means for Solving the Problems] The present inventors have conducted various studies in order to solve the above-mentioned problems. The present invention has been completed based on the discovery that the problem can be solved by the following.
光学的薄膜体として最外層に屈折率が1.42以下のポ
リマーを用いる反射防止されたペリクルが特公昭63−
22570号公報に提案され、更に特公昭(13−25
(158号公報には該ポリマーがフッ素系ポリマーであ
るようなペリクルが提案されている。これらのペリクル
は、光線に対する干渉波を光学的反射防止条件に合わせ
ることにより打ち消し合うように膜厚を設定したペリク
ルであって、光線透過率は極めて高い。これらの優れた
光線透過率をベースにして、フッ素系ポリマーを探索し
た結果本発明をなすに至ったものである。即ち、本発明
は光学的薄膜体と、それを接着剤を介して一側に有し、
かつ、その反対側の端面に粘着剤層を有する支持枠とを
備えてなるペリクルにおいて、該光学的薄膜体が、−最
大−503M (ここにMはH,Na、KまたはNR4
であり、更にRはH1低級アルキル基である)で表わさ
れるイオン性官能基を分子中に含有するパーフルオロ化
重合体を、少なくとも片面に反射防止層として有してい
ることを特徴とする帯電防止されたペリクルである。An antireflection pellicle using a polymer with a refractive index of 1.42 or less as the outermost layer as an optical thin film body was published in Japanese Patent Publication No. 1983-
It was proposed in Publication No. 22570, and further published by Tokko Sho (13-25
(Publication No. 158 proposes a pellicle in which the polymer is a fluorine-based polymer.The film thickness of these pellicles is set so that interference waves with light rays cancel each other out by meeting optical anti-reflection conditions. It is a pellicle with extremely high light transmittance.Based on these excellent light transmittances, we searched for fluorine-based polymers and as a result, we came up with the present invention.That is, the present invention It has a thin film body on one side with an adhesive attached to it,
and a support frame having an adhesive layer on the opposite end surface, the optical thin film body having a maximum of -503M (herein, M is H, Na, K or NR4).
and further R is a lower alkyl group H1), which has a perfluorinated polymer containing an ionic functional group in its molecule as an antireflection layer on at least one side. It is a pellicle that is prevented.
本発明の反射防止層として使用されるこのような重合体
の先駆体は、少なくとも2種の単量体から製造され、そ
の単量体の少なくとも1種は下記の2つの群の各々から
選ばれる。The precursors of such polymers used as antireflection layers of the present invention are prepared from at least two monomers, at least one of which is selected from each of the following two groups: .
第1群は、フッ化ビニル、フッ化ビニリデン、トリフル
オロエチレン、クロロトリフルオロエチレン、テトラブ
ルオロエチレン、ヘキサフルオロプロピレン、パーフル
オロ(アルキルビニルエーテル)及びそれらの混合物で
ある。The first group is vinyl fluoride, vinylidene fluoride, trifluoroethylene, chlorotrifluoroethylene, tetrafluoroethylene, hexafluoropropylene, perfluoro(alkyl vinyl ether) and mixtures thereof.
第2群は、イオン性官能基の先駆体であるスルホニルフ
ルオライド基を有する単量体である。The second group is monomers having a sulfonyl fluoride group, which is a precursor of an ionic functional group.
更に詳しくは、CF2−CF−0−T−CF 2−50
2 Fなる一般式で示される単量体である。More specifically, CF2-CF-0-T-CF 2-50
It is a monomer represented by the general formula 2F.
式中のT基は炭素原子1〜8個からなる2官能性のフッ
素化された基であり、分岐してもしていなくてもよく、
1つまたはそれ以上のエーテル結合を有することができ
る。かかる単量体は米国特許8282875号、304
1317号、8718827号及び85005(18号
台分報に開示されており、その例にはつぎのちのがある
。The T group in the formula is a difunctional fluorinated group consisting of 1 to 8 carbon atoms, and may be branched or unbranched.
It can have one or more ether linkages. Such monomers are described in U.S. Pat. No. 8,282,875, 304.
No. 1317, No. 8718827, and No. 85005 (disclosed in the 18th edition), examples of which include:
CF2− CFOCF2CF2 SO2FeF2− C
POCP20F (CF3)OCP20P2802 F
eF2−CP[0CF2CF (CF3)]2 0CF
2 Cr21802F
CF2− CFOCF2 CF (CF20CF3 )
OCP2 CF2502F
CF2−CPOCP2 C1’ (CF3 )OCP2
CF2 CF2 S02 FeF2− Cr’OCr
’2CF20F2802 F以上のような単量体を共重
合することにより本発明に用いる共重合体の先駆体を形
成させることができる。−船釣な重合方法、例えばテト
ラフルオロエチレンを作る際に用いられる方法が適用で
きる。しかし不純物が極力少ないことが望ましいので、
例えば米国特許8041317号公報に開示されている
非水重合法により製造するのが好ましい。即ち、パーフ
ルオロカーボンまたはクロロフルオロカーボンなどの不
活性な液体を溶媒とし、パーフルオロカーボンパーオキ
サイドまたはアゾ化合物のフリーラジカル開始剤の存在
下で温度0〜200℃、圧力1〜200気圧で製造する
ことができる。CF2- CFOCF2CF2 SO2FeF2- C
POCP20F (CF3)OCP20P2802 F
eF2-CP[0CF2CF (CF3)]2 0CF
2 Cr21802F CF2- CFOCF2 CF (CF20CF3)
OCP2 CF2502F CF2-CPOCP2 C1' (CF3)OCP2
CF2 CF2 S02 FeF2- Cr'OCr
By copolymerizing monomers such as '2CF20F2802F and above, a precursor of the copolymer used in the present invention can be formed. - A conventional polymerization method, such as the method used to produce tetrafluoroethylene, can be applied. However, it is desirable to have as few impurities as possible, so
For example, it is preferable to manufacture by a non-aqueous polymerization method disclosed in US Pat. No. 8,041,317. That is, it can be produced using an inert liquid such as perfluorocarbon or chlorofluorocarbon as a solvent in the presence of a free radical initiator such as perfluorocarbon peroxide or an azo compound at a temperature of 0 to 200°C and a pressure of 1 to 200 atm. .
好ましい先駆体は次のごとき反復単位を有する重合体で
ある。Preferred precursors are polymers having repeat units as follows.
−(−CX2 CX2− ) 、 −(−CF−Cr2
−)11 =\
式中mは3〜15であり、nは 1〜lOであり、pは
0、■または2であり、Xは一緒にして4個のフッ素ま
たは3個のフッ素及び1個の塩素であり、YはF、Cr
コ、または−CF2・0CF3、qは2または3である
。-(-CX2 CX2- ) , -(-CF-Cr2
-)11 =\ where m is 3 to 15, n is 1 to 1O, p is 0, ■ or 2, and X together is 4 fluorine or 3 fluorine and 1 is chlorine, Y is F, Cr
or -CF2.0CF3, q is 2 or 3.
このようなパーフルオロ重合体としては、たとえば、C
FZ−CF2と、Cr2− CFOCF2 CP −(
CF3 )OCP20P2802 P % CF2
− CFOCP2 −CF2 802 P 、
CF2 ■ CPOCP2 CF2 Cr2 8
02 P 、CI’2 − CPOCP2 CF
(CF3 )OCP2 Cr2 Cr2 SO2F等
との共重合体等を挙げることができる。その内でも最も
好ましいのはテトラフルオロエチレン及びパーフルオロ
(3,6−シオキサー4−メチル−7−オクテンスルホ
ニルフルオライド)である。Such perfluoropolymers include, for example, C
FZ-CF2 and Cr2- CFOCF2 CP-(
CF3) OCP20P2802 P% CF2
- CFOCP2 -CF2 802 P,
CF2 ■ CPOCP2 CF2 Cr2 8
02 P, CI'2 - CPOCP2 CF
Copolymers with (CF3)OCP2 Cr2 Cr2 SO2F, etc. can be mentioned. Among them, the most preferred are tetrafluoroethylene and perfluoro(3,6-thioxer 4-methyl-7-octensulfonyl fluoride).
これらの先駆体のスルホニルフルオライド基を有するフ
ッ素化重合体は、アルキル金属やテトラアルキルアンモ
ニウムの水酸化物の水溶液またはそれに水と混和性のあ
る有機化合物、例えばジメチルスルホキシドを加えた水
溶液に接触させてスルホニルフルオライド基を転換させ
てスルホン酸型やスルホン酸塩イオン性官能基を有する
フッ素化重合体を得ることができる。These precursor fluorinated polymers with sulfonyl fluoride groups are contacted with an aqueous solution of a metal alkyl or tetraalkylammonium hydroxide or an aqueous solution to which a water-miscible organic compound, such as dimethyl sulfoxide, is added. By converting the sulfonyl fluoride groups, a fluorinated polymer having a sulfonic acid type or sulfonate ionic functional group can be obtained.
本発明の反射防止層として用いるフッ素化イオン性官能
基含有重合体は約1534〜1.38の屈折率を有する
。このようなポリマーの中でも低い屈折率は、反射防止
の為の光学的条件を満足している(特公昭θ3−258
58号公報参照)。少なくとも片面に反射防止層をこの
ような重合体を塗布することで形成すると、帯電防止効
果はある。しかし、両面に反射防止すると光線透過率は
ハ面のみよりも更に向上させることができるので、より
好ましい態様である。又、イオン性官能基を有すること
により、帯電防止に好適な低電気抵抗の薄膜となり、静
電気による異物付層を阻害することができる。即ち、こ
れらの重合体を光学的薄膜体の最外層に用いると、極め
て良好な光線透過率を有し、かつ、帯電防止の施された
ペリクルを提供できることになった。The fluorinated ionic functional group-containing polymer used as the antireflective layer of the present invention has a refractive index of about 1534 to 1.38. Among these polymers, the low refractive index satisfies the optical conditions for antireflection (Japanese Patent Publication No. 3-258
(See Publication No. 58). When an antireflection layer is formed on at least one side by coating such a polymer, an antistatic effect can be obtained. However, anti-reflection on both sides is a more preferable embodiment because the light transmittance can be further improved than when only the half side is used. Furthermore, by having an ionic functional group, the film becomes a thin film with low electrical resistance suitable for preventing static electricity, and can prevent foreign matter from attaching to the layer due to static electricity. That is, when these polymers are used in the outermost layer of an optical thin film, it is possible to provide a pellicle that has extremely good light transmittance and is antistatic.
光学的薄膜体1の中心層を構成する材料としては、石英
等の無機物やポリマーが使用できる。As the material constituting the center layer of the optical thin film body 1, an inorganic substance such as quartz or a polymer can be used.
ポリマーとしては、ポリエチレンテレフタレート、セル
ロースエステル類、ポリカーボネート、ポリメタクリル
酸メチル、ポリビニルブチラール等を挙げることができ
る。特に一般に好適な素材として、ニトロセルロース、
セルロースアセテート、セルロースアセテートブチレー
ト、セルロースアセテートプロピオネートが用いられる
。Examples of the polymer include polyethylene terephthalate, cellulose esters, polycarbonate, polymethyl methacrylate, polyvinyl butyral, and the like. Particularly commonly preferred materials include nitrocellulose,
Cellulose acetate, cellulose acetate butyrate, and cellulose acetate propionate are used.
支持枠2としてはアルミニウム合金、プラスチック、セ
ラミックス等が使用できる。その大きさはマスクの大き
さに対応して1〜8インチ径または1〜8インチ角程度
であり、その高さは2〜lO■程度である。As the support frame 2, aluminum alloy, plastic, ceramics, etc. can be used. Its size is about 1 to 8 inches in diameter or 1 to 8 inches square, depending on the size of the mask, and its height is about 2 to 1O2.
接着剤層3としては数多くのものが用いられる。例えば
、デキストリン、デンプン等の天然物、酢酸ビニル、ア
クリル樹脂等の熱可塑性接着剤、アミノ樹脂、フェノー
ル樹脂、エポキシ樹脂等の熱硬化性接着剤、ポリクロロ
プレン、ニトリルゴム等のゴム系接着剤がある。又、こ
れら接着剤の効果のタイプについてみても紫外線硬化型
、加熱硬化型、瞬間硬化型等多様なタイプがある。より
発塵の少ないものが望ましいことはもちろんである。Many adhesive layers can be used as the adhesive layer 3. For example, natural products such as dextrin and starch, thermoplastic adhesives such as vinyl acetate and acrylic resins, thermosetting adhesives such as amino resins, phenolic resins, and epoxy resins, and rubber adhesives such as polychloroprene and nitrile rubber are used. be. Furthermore, there are various types of adhesives such as ultraviolet curing type, heat curing type, and instant curing type. Of course, it is desirable to have a material that generates less dust.
粘着剤層4の素材としては、発泡もしくは無発泡のテー
プの両面に粘む剤が設けられたいわゆる両面結石テープ
が用いられる。又、結石性があり、かつ、弾性のあるポ
リマーも好適に用いられる。マスクへの装着のやり品さ
から弾性体が層の一部を構成している態様が好ましい。As the material for the adhesive layer 4, so-called double-sided calculus tape, which is a foamed or non-foamed tape provided with a sticky agent on both sides, is used. Furthermore, polymers that are calculable and elastic are also suitably used. For ease of attachment to the mask, it is preferable that the elastic body forms part of the layer.
ペリクルは使用に供されるまで洗浄なケースに収納され
、ゴミの付着を防止する。ステッパーに用いるに当たっ
ては、異物の影響が極めて鋭敏に現れるためマスクの画
像側だけでなく、他の面にもペリクルが装着されるこ−
とが多い。The pellicle is stored in a clean case until it is ready for use, to prevent dust from adhering to it. When used in a stepper, the influence of foreign objects is extremely sensitive, so a pellicle must be attached not only to the image side of the mask but also to other surfaces.
There are many.
以下実施例により本発明を更に詳細に説明する。The present invention will be explained in more detail with reference to Examples below.
[実施例]
実施例1
撹拌機付き1文オートクレーブにn−プロパツール45
hl、水300m1及びその官能基が一5O3Na型に
加水分解された粉末状の、テトラフルオロエチレンとパ
ーフルオロ(3,6−シオキサー4−メチル−7−オク
テンスルホニルフルオライド)の共重合体8grを入れ
、撹拌しな−がら 240℃に18時間加熱した後、室
温まで冷却して、透明な溶液を得た。[Example] Example 1 N-proper tool 45 in a 1-liter autoclave with a stirrer
hl, 300ml of water and 8g of a powdered copolymer of tetrafluoroethylene and perfluoro(3,6-thioxer-4-methyl-7-octensulfonyl fluoride) whose functional group has been hydrolyzed into the 15O3Na type. The mixture was heated to 240° C. for 18 hours with stirring, and then cooled to room temperature to obtain a clear solution.
別に用意しておいたニトロセルロース2.6μ麿の薄膜
の両面に、スピンコーターにより上記フッ素化イオン交
換重合体溶液を塗布した。The above fluorinated ion exchange polymer solution was applied using a spin coater to both sides of a separately prepared 2.6 μm nitrocellulose thin film.
両面とも約800人の反射防止層を有する光学的薄膜体
をえた。An optical thin film body having antireflection layers of about 800 on both sides was obtained.
アルミニウム合金からなる支持枠に、ウレタンアクリレ
ート系の接着剤(スリーボンド■製、3052C)を塗
布しておき、上記光学的薄膜体に貼り付け、紫外線硬化
により硬化し固着した。支持枠の反対端面に両面粘着テ
ープ(3M沖製、42B2)をつけてペリクルとした。A urethane acrylate adhesive (manufactured by Three Bond ■, 3052C) was applied to a support frame made of an aluminum alloy, and the adhesive was applied to the optical thin film, and was cured and fixed by ultraviolet curing. Double-sided adhesive tape (manufactured by 3M Oki, 42B2) was attached to the opposite end of the support frame to form a pellicle.
このペリクルは、g線、i線に対して99.5%の光線
透過率を示した。又、異物を付希させてからエアーブロ
ーしても極めて簡単にとることができた。This pellicle exhibited a light transmittance of 99.5% for g-line and i-line. In addition, it was possible to remove the foreign matter very easily by air blowing after diluting it.
実施例2
別のフッ素化イオン交換重合体溶液を下記のようにして
つくる以外、実施例1と同様な方法でペリクルをつくっ
た。Example 2 A pellicle was made in a manner similar to Example 1, except that another fluorinated ion exchange polymer solution was made as described below.
撹拌機付き1交オートクレーブにn−プロパツール20
0m1.メタノール160m1、水400m1及びその
官能基が一503H型に加水分解された粉末状のテトラ
フルオロエチレンとパーフルオロ(3,6−シオキサー
4−メチル−7−オクテンスルホニルフルオライド)の
共重合体8grを入れ、撹拌しながら 220℃に3時
間加熱した後、室温まで冷却し静置した。液層は2層に
分かれたが、低密度の上層を除去し、下層の透明な溶液
にリン酸トリメチル80grを加え撹拌して均一な溶液
とした。n-Propa Tool 20 in a 1-alternate autoclave with a stirrer
0m1. 160ml of methanol, 400ml of water, and 8g of a powdered copolymer of tetrafluoroethylene and perfluoro(3,6-thioxer-4-methyl-7-octensulfonyl fluoride) whose functional group has been hydrolyzed into the 1503H type. After heating at 220°C for 3 hours while stirring, the mixture was cooled to room temperature and left to stand. The liquid layer was separated into two layers, and the lower density upper layer was removed, and 80 gr of trimethyl phosphate was added to the lower transparent solution and stirred to obtain a homogeneous solution.
このペリクルも実施例1と同じ程度の光線透過率を有し
、更に帯電防止効果も抜群であった。This pellicle also had a light transmittance comparable to that of Example 1, and also had an excellent antistatic effect.
[発明の効果]
以上説明したように本発明のペリクルは、高い光線透過
率を有し、かつ、薄膜表面の電気抵抗が低減され、帯電
を防止できるので、薄膜表面に異物が付着してもエアブ
ロ−等により容品に除去することができる。[Effects of the Invention] As explained above, the pellicle of the present invention has high light transmittance, and the electrical resistance of the thin film surface is reduced, so that charging can be prevented, so even if foreign matter adheres to the thin film surface, It can be removed into the container by air blowing or the like.
第1図は一般的なペリクルの説明図、図中1は光学的薄
膜体、2は支持枠、3は接着剤層、4は両面粘むテープ
、5は保護フィルムを示す。FIG. 1 is an explanatory diagram of a general pellicle. In the figure, 1 is an optical thin film body, 2 is a support frame, 3 is an adhesive layer, 4 is a double-sided adhesive tape, and 5 is a protective film.
Claims (1)
つ、その反対側の端面に粘着剤層を有する支持枠とを備
えてなるペリクルにおいて、該光学的薄膜体が、一般式
−SO_3M(ここにMはH、Na、KまたはNR_4
であり、更にRは、H、低級アルキル基である)で表わ
されるイオン性官能基を分子中に含有するパーフルオロ
化重合体を、少なくとも片面に反射防止層として有して
いることを特徴とする帯電防止されたペリクル。In a pellicle comprising an optical thin film body and a support frame having the optical thin film body on one side via an adhesive and having an adhesive layer on the opposite end surface, the optical thin film body is generally Formula - SO_3M (where M is H, Na, K or NR_4
and R is H, a lower alkyl group), and further comprises a perfluorinated polymer containing an ionic functional group in the molecule, as an antireflection layer on at least one side. anti-static pellicle.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1105962A JPH02285348A (en) | 1989-04-27 | 1989-04-27 | Pellicle |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1105962A JPH02285348A (en) | 1989-04-27 | 1989-04-27 | Pellicle |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02285348A true JPH02285348A (en) | 1990-11-22 |
Family
ID=14421424
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1105962A Pending JPH02285348A (en) | 1989-04-27 | 1989-04-27 | Pellicle |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02285348A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5168001A (en) * | 1991-05-20 | 1992-12-01 | E. I. Du Pont De Nemours And Company | Perfluoropolymer coated pellicle |
JP2012092248A (en) * | 2010-10-28 | 2012-05-17 | Shin-Etsu Chemical Co Ltd | Antistatic adhesive |
-
1989
- 1989-04-27 JP JP1105962A patent/JPH02285348A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5168001A (en) * | 1991-05-20 | 1992-12-01 | E. I. Du Pont De Nemours And Company | Perfluoropolymer coated pellicle |
JP2012092248A (en) * | 2010-10-28 | 2012-05-17 | Shin-Etsu Chemical Co Ltd | Antistatic adhesive |
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