JP7164411B2 - 積層体の加工方法 - Google Patents
積層体の加工方法 Download PDFInfo
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- JP7164411B2 JP7164411B2 JP2018214793A JP2018214793A JP7164411B2 JP 7164411 B2 JP7164411 B2 JP 7164411B2 JP 2018214793 A JP2018214793 A JP 2018214793A JP 2018214793 A JP2018214793 A JP 2018214793A JP 7164411 B2 JP7164411 B2 JP 7164411B2
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- 229920005989 resin Polymers 0.000 claims description 61
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- 238000000034 method Methods 0.000 claims description 27
- 239000012790 adhesive layer Substances 0.000 claims description 14
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 14
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- DHKHKXVYLBGOIT-UHFFFAOYSA-N acetaldehyde Diethyl Acetal Natural products CCOC(C)OCC DHKHKXVYLBGOIT-UHFFFAOYSA-N 0.000 description 1
- 125000002777 acetyl group Chemical class [H]C([H])([H])C(*)=O 0.000 description 1
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
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- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
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- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
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- H01L27/144—Devices controlled by radiation
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- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
- H01L27/14698—Post-treatment for the devices, e.g. annealing, impurity-gettering, shor-circuit elimination, recrystallisation
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2103/00—Materials to be soldered, welded or cut
- B23K2103/50—Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26
- B23K2103/56—Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26 semiconducting
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- H—ELECTRICITY
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- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
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- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68309—Auxiliary support including alignment aids
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68327—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68381—Details of chemical or physical process used for separating the auxiliary support from a device or wafer
- H01L2221/68386—Separation by peeling
- H01L2221/6839—Separation by peeling using peeling wedge or knife or bar
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- Engineering & Computer Science (AREA)
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- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Dicing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Battery Electrode And Active Subsutance (AREA)
Description
上記したように積層体20を形成したならば、積層体20のガラス基板18側から切削溝を形成する切削溝形成工程を実施する。以下に、切削溝形成工程について、図2、及び図3を参照しながら説明する。
上記した切削溝形成工程を実施したならば、積層体支持工程、及び分割起点形成工程を実施する。以下に、図5、図6を参照しながら、積層体支持工程と、分割起点形成工程とについて説明する。
波長 :1342nm
繰り返し周波数 :60kHz
平均出力 :1W
加工送り速度 :600mm/秒
上記したように、積層体20を、拡張テープTを介して環状のフレームFにより支持し、積層体20を構成するウエーハ10の分割予定ライン14に対応する領域の内部に沿って分割起点110を形成したならば、図7(a)に示す分割装置50を用いて積層体20に対して外力を付与し、積層体20のウエーハ10に形成されたイメージセンサー12を個々のイメージセンサーチップ12’に分割する分割工程を実施する。
上記した分割工程を実施したならば、水溶性樹脂充填工程を実施する。図8を参照しながら、水溶性樹脂充填工程の実施態様について説明する。
上記したように、水溶性樹脂充填工程が完了したならば、改質層除去工程を実施する。以下に、図9を参照しながら、改質層除去工程の実施態様について説明する。
12:イメージセンサー
12’:イメージセンサーチップ
14:分割予定ライン
18:ガラス基板
20:積層体
30、70:ダイシング装置
34、73:切削ブレード
40:レーザー加工装置
42:レーザー光線照射手段
42a:集光器
50:分割装置
56:テープ拡張手段
60:水溶性樹脂供給手段
62:水溶性樹脂
100、130:切削溝
110:分割起点
110a:改質層
110b:クラック
120:分割溝
Claims (3)
- 複数のイメージセンサーが分割予定ラインで区画され表面に複数形成されたウエーハの表面に透明な接着層を介してガラス基板が配設された積層体を個々のイメージセンサーチップに分割する積層体の加工方法であって、
積層体のガラス基板側から切削ブレードを位置付けて分割予定ラインに対応する領域を切削して接着層に達する切削溝を該ガラス基板に形成する切削溝形成工程と、
ウエーハの裏面側から該ウエーハに対して透過性を有する波長のレーザー光線の集光点を該ウエーハの分割予定ラインに対応する領域の内部に位置付けて照射し、該ウエーハの内部に連続的に改質層を形成すると共に該改質層から該接着層に達するクラックを形成して分割起点を形成する分割起点形成工程と、
少なくとも該切削溝形成工程の後、該積層体を収容する大きさの開口部を有するフレームに拡張テープを介して該積層体のガラス基板側を支持する積層体支持工程と、
該分割起点形成工程と該積層体支持工程とを実施した後、該拡張テープを拡張して該積層体を該分割起点に沿って形成する分割溝によって個々のイメージセンサーチップに分割する分割工程と、
該分割工程によって形成された該分割溝に水溶性樹脂を充填する水溶性樹脂充填工程と、
該水溶性樹脂が固化、又は半固化した状態で切削ブレードを該ウエーハの裏面に形成された該分割溝に位置付けて切削することにより該改質層を除去する改質層除去工程と、
該拡張テープの該拡張状態を維持した状態で洗浄水を該ウエーハの裏面から供給して該切削溝及び該分割溝に充填された水溶性樹脂を除去する水溶性樹脂除去工程と、
から少なくとも構成される積層体の加工方法。 - 該分割工程を実施する前に予め該ウエーハの裏面に水溶性樹脂を被覆しておき、該分割工程によって該積層体を個々のイメージセンサーチップに分割する際に、該水溶性樹脂を該ウエーハの裏面から該分割溝に充填し該水溶性樹脂充填工程を実施する請求項1に記載の積層体の加工方法。
- 該分割工程の完了後から該水溶性樹脂除去工程開始までの間のいずれかにおいて、該積層体と該フレームとの間にある拡張テープに熱を加えて収縮させて拡張状態を維持する請求項1に記載の積層体の加工方法。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
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JP2018214793A JP7164411B2 (ja) | 2018-11-15 | 2018-11-15 | 積層体の加工方法 |
KR1020190135413A KR102713532B1 (ko) | 2018-11-15 | 2019-10-29 | 적층체의 가공 방법 |
CN201911080421.9A CN111192852B (zh) | 2018-11-15 | 2019-11-07 | 层叠体的加工方法 |
US16/680,625 US11056361B2 (en) | 2018-11-15 | 2019-11-12 | Laminate processing method |
TW108141348A TWI801691B (zh) | 2018-11-15 | 2019-11-14 | 疊層體之加工方法 |
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JP2018214793A JP7164411B2 (ja) | 2018-11-15 | 2018-11-15 | 積層体の加工方法 |
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JP2020087973A JP2020087973A (ja) | 2020-06-04 |
JP7164411B2 true JP7164411B2 (ja) | 2022-11-01 |
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JP (1) | JP7164411B2 (ja) |
KR (1) | KR102713532B1 (ja) |
CN (1) | CN111192852B (ja) |
TW (1) | TWI801691B (ja) |
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JP7241580B2 (ja) * | 2019-03-26 | 2023-03-17 | 株式会社ディスコ | ウエーハの加工方法 |
JP7530763B2 (ja) * | 2020-08-06 | 2024-08-08 | Towa株式会社 | 切断装置、及び、切断品の製造方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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CN103358032A (zh) | 2013-07-31 | 2013-10-23 | 江阴长电先进封装有限公司 | 一种cis产品的圆片级划片方法 |
JP2015207604A (ja) | 2014-04-17 | 2015-11-19 | 株式会社ディスコ | ウェーハの加工方法 |
JP2017028259A (ja) | 2015-07-24 | 2017-02-02 | ソニーセミコンダクタソリューションズ株式会社 | 撮像素子、製造方法、基板分割方法 |
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CN1241253C (zh) * | 2002-06-24 | 2006-02-08 | 丰田合成株式会社 | 半导体元件的制造方法 |
JP4944642B2 (ja) * | 2007-03-09 | 2012-06-06 | 株式会社ディスコ | デバイスの製造方法 |
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