JP6700149B2 - 姿勢変更装置 - Google Patents
姿勢変更装置 Download PDFInfo
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- JP6700149B2 JP6700149B2 JP2016190863A JP2016190863A JP6700149B2 JP 6700149 B2 JP6700149 B2 JP 6700149B2 JP 2016190863 A JP2016190863 A JP 2016190863A JP 2016190863 A JP2016190863 A JP 2016190863A JP 6700149 B2 JP6700149 B2 JP 6700149B2
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
- H01L21/67781—Batch transfer of wafers
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67196—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the transfer chamber
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
- H01L21/67265—Position monitoring, e.g. misposition detection or presence detection of substrates stored in a container, a magazine, a carrier, a boat or the like
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67288—Monitoring of warpage, curvature, damage, defects or the like
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67718—Changing orientation of the substrate, e.g. from a horizontal position to a vertical position
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67766—Mechanical parts of transfer devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
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- H—ELECTRICITY
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/6875—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of individual support members, e.g. support posts or protrusions
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/6732—Vertical carrier comprising wall type elements whereby the substrates are horizontally supported, e.g. comprising sidewalls
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/67326—Horizontal carrier comprising wall type elements whereby the substrates are vertically supported, e.g. comprising sidewalls
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Attitude Control For Articles On Conveyors (AREA)
Description
6 プッシャ
8 基板整列機構
9 基板
51 水平保持部
52 垂直保持部
53 取付ブロック
54 保持部回転機構
56 保持部シフト機構
100 制御部
S11〜S18,S21〜S29 ステップ
Claims (7)
- 基板の姿勢を水平姿勢および垂直姿勢のうち一方の姿勢から他方の姿勢へと変更する姿勢変更装置であって、
基板が垂直姿勢である場合に、前記基板の下側の端部を下方に突出させた状態で、前記端部の周方向両側にて前記基板の下縁部を挟持する垂直保持部と、
前記垂直保持部が垂直姿勢の前記基板を保持する状態において前記垂直保持部の上方に隣接して配置され、前記基板が水平姿勢である場合に、前記基板の径方向両側にて前記基板の下面を下方から支持する水平保持部と、
前記垂直保持部および前記水平保持部が取り付けられる取付ブロックと、
水平方向を向く回転軸を中心として前記取付ブロックを回転させることにより、前記垂直保持部により垂直姿勢の前記基板を保持可能な垂直保持状態と、前記水平保持部により水平姿勢の前記基板を保持可能な水平保持状態とを切り替える保持部回転機構と、
前記基板の厚さ方向において前記水平保持部を前記垂直保持部に対して相対的にシフトする保持部シフト機構と、
前記垂直保持部との間で垂直姿勢の前記基板の受け渡しを行うプッシャと、
前記垂直保持部と前記プッシャとの間の前記基板の受け渡し前に、前記基板の反り状態に基づいて前記保持部シフト機構を制御することにより、前記厚さ方向における前記水平保持部の位置を、前記反り状態に基づいて決定されるシフト距離だけ、前記垂直保持部から相対的にシフトさせる制御部と、
を備えることを特徴とする姿勢変更装置。 - 請求項1に記載の姿勢変更装置であって、
前記保持部シフト機構による前記水平保持部の相対的シフトが、前記プッシャが前記垂直保持部から前記基板を受け取るよりも前に行われることを特徴とする姿勢変更装置。 - 請求項2に記載の姿勢変更装置であって、
前記保持部シフト機構による前記水平保持部の相対的シフトが、前記垂直保持状態において行われることを特徴とする姿勢変更装置。 - 請求項1に記載の姿勢変更装置であって、
前記保持部シフト機構による前記水平保持部の相対的シフトが、前記垂直保持部が前記プッシャから前記基板を受け取るよりも前に行われることを特徴とする姿勢変更装置。 - 請求項4に記載の姿勢変更装置であって、
前記保持部シフト機構による前記水平保持部の相対的シフトが、前記水平保持状態において行われることを特徴とする姿勢変更装置。 - 請求項1ないし5のいずれかに記載の姿勢変更装置であって、
前記基板を周方向に回転して周方向の向きを変更する基板整列機構をさらに備え、
前記基板が、一の径方向において最小曲率にて前記厚さ方向の一方側に湾曲している場合、前記制御部は、前記垂直保持部と前記プッシャとの間の前記基板の受け渡し前に、前記基板の反り状態に基づいて前記基板整列機構を制御することにより、前記垂直保持部により垂直姿勢にて保持された際の前記基板の前記一の径方向を上下方向に平行とすることを特徴とする姿勢変更装置。 - 請求項1ないし6のいずれかに記載の姿勢変更装置であって、
前記垂直保持部が、垂直姿勢の前記基板の前記厚さ方向に並べて配置される垂直姿勢の他の基板を前記基板と同様に前記基板と共に保持し、
前記水平保持部が、水平姿勢の前記基板の前記厚さ方向に並べて配置される水平姿勢の前記他の基板を前記基板と同様に前記基板と共に保持し、
前記プッシャが、前記垂直保持部との間で垂直姿勢の前記他の基板の受け渡しを垂直姿勢の前記基板と共に行うことを特徴とする姿勢変更装置。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016190863A JP6700149B2 (ja) | 2016-09-29 | 2016-09-29 | 姿勢変更装置 |
KR1020170106583A KR102025472B1 (ko) | 2016-09-29 | 2017-08-23 | 자세 변경 장치 |
US15/695,142 US10395961B2 (en) | 2016-09-29 | 2017-09-05 | Posture changing device |
TW106130654A TWI653704B (zh) | 2016-09-29 | 2017-09-07 | 姿勢變更裝置 |
CN201710821036.XA CN107887312B (zh) | 2016-09-29 | 2017-09-12 | 姿势变更装置 |
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JP2016190863A JP6700149B2 (ja) | 2016-09-29 | 2016-09-29 | 姿勢変更装置 |
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JP2018056341A JP2018056341A (ja) | 2018-04-05 |
JP6700149B2 true JP6700149B2 (ja) | 2020-05-27 |
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US (1) | US10395961B2 (ja) |
JP (1) | JP6700149B2 (ja) |
KR (1) | KR102025472B1 (ja) |
CN (1) | CN107887312B (ja) |
TW (1) | TWI653704B (ja) |
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US12068149B2 (en) * | 2018-06-07 | 2024-08-20 | Acm Research (Shanghai) Inc. | Apparatus and method for cleaning semiconductor wafers |
CN110534472B (zh) * | 2019-09-06 | 2021-05-25 | 杭州众硅电子科技有限公司 | 一种晶圆传输机械手及其晶圆翻转方法 |
CN112735997A (zh) * | 2019-10-28 | 2021-04-30 | 东京毅力科创株式会社 | 批量形成机构和基板处理装置 |
JP2024030376A (ja) | 2022-08-24 | 2024-03-07 | 株式会社Screenホールディングス | 基板処理装置 |
JP2024046369A (ja) | 2022-09-22 | 2024-04-03 | 株式会社Screenホールディングス | 基板処理装置 |
JP2024046370A (ja) | 2022-09-22 | 2024-04-03 | 株式会社Screenホールディングス | 基板処理装置 |
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- 2017-08-23 KR KR1020170106583A patent/KR102025472B1/ko active IP Right Grant
- 2017-09-05 US US15/695,142 patent/US10395961B2/en active Active
- 2017-09-07 TW TW106130654A patent/TWI653704B/zh active
- 2017-09-12 CN CN201710821036.XA patent/CN107887312B/zh active Active
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KR102025472B1 (ko) | 2019-09-25 |
US20180090358A1 (en) | 2018-03-29 |
CN107887312A (zh) | 2018-04-06 |
KR20180035661A (ko) | 2018-04-06 |
JP2018056341A (ja) | 2018-04-05 |
TWI653704B (zh) | 2019-03-11 |
CN107887312B (zh) | 2021-08-27 |
TW201814813A (zh) | 2018-04-16 |
US10395961B2 (en) | 2019-08-27 |
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