JP4305095B2 - 光学部品の洗浄機構を搭載した液浸投影露光装置及び液浸光学部品洗浄方法 - Google Patents
光学部品の洗浄機構を搭載した液浸投影露光装置及び液浸光学部品洗浄方法 Download PDFInfo
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- JP4305095B2 JP4305095B2 JP2003305749A JP2003305749A JP4305095B2 JP 4305095 B2 JP4305095 B2 JP 4305095B2 JP 2003305749 A JP2003305749 A JP 2003305749A JP 2003305749 A JP2003305749 A JP 2003305749A JP 4305095 B2 JP4305095 B2 JP 4305095B2
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- Prior art keywords
- optical component
- liquid
- cleaning
- immersion
- exposure apparatus
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Description
ここで、kはプロセス係数である。(1)式より、光源の波長λが短いほど、投影レンズの開口数NAが大きいほど高い解像度Rが得られることがわかる。
[発明の実施の形態1]
なお、プロパノール15は、純水13に比べて表面張力が小さいので、洗浄時に光学部品12の一部のみにしかプロパノールが接触せず、接液面12aの洗浄が部分的にしか行なわれないおそれがある。そこで、光学部品12の全体にプロパノール15を張り付かせるために、光学部品12と露光対象物(シリコンウエハー14)の間隔は、プロパノール15による液浸時には、純水13による液浸時に比して狭くすることが望ましい。すなわち、純水13を徐々にプロパノール15に置換する際に、プロパノール15による置換量に応じて、ステージ31を調節して、徐々に光学部品12と露光対象物(シリコンウエハー14)の間隔を狭めていくとよい。このようにステージ31を調節することによって、光学部品12の接液面12a全体に渡って、洗浄除去処理が確実に行われる。
11 投影光学系
12 光学部品
12a 接液面
13 純水
14 シリコンウエハー
21 液体媒体供給タンク
21a バルブ
22 洗浄液体供給タンク
22a バルブ
23 管路
24 ノズル
25 乾燥窒素
31 ステージ
31a 排水溝
32 拭き取り装置
32a 拭き布
Claims (2)
- 光学部品と露光対象物との間を液体媒体で満たして解像度を高めた液浸投影露光装置において、
前記光学部品の接液面における前記液体媒体の残留液体を洗浄液体を用いて除去可能とし、
前記液体媒体を供給する管路と前記洗浄液体を供給する管路は、一つの管路で結合されていることを特徴とする光学部品の洗浄機構を備えた液浸投影露光装置。 - 光学部品と露光対象物との間を液体媒体で満たして解像度を高めた液浸投影露光装置において、前記光学部品の接液面の残留液体を洗浄除去する方法であって、
露光終了後、前記光学部品と前記露光対象物の間にある前記液体媒体を洗浄液体に置換して該洗浄液体で満たすことによって前記液体媒体を除去する第一工程と、
前記洗浄液体によって前記接液面を洗浄する第二工程と、
前記洗浄液体を除去して前記接液面を乾燥させる第三工程とを有することを特徴とする液浸光学部品洗浄方法。
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JP2003305749A JP4305095B2 (ja) | 2003-08-29 | 2003-08-29 | 光学部品の洗浄機構を搭載した液浸投影露光装置及び液浸光学部品洗浄方法 |
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JP2008169435A Division JP4553037B2 (ja) | 2008-06-27 | 2008-06-27 | 光学部品の洗浄機構を備えた液浸投影露光装置および液浸光学部品洗浄方法 |
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JP4305095B2 true JP4305095B2 (ja) | 2009-07-29 |
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