JP4131776B2 - Screening method for multilayer capacitors - Google Patents
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Description
【０００１】
【発明の属する技術分野】
本発明は、電子部品のスクリニング方法に関し、詳しくは、特に高耐圧が要求される中高圧タイプの積層コンデンサ群から耐圧不良品を選別除去するためのスクリニング方法に関する。
【０００２】
【従来の技術及び発明が解決しようとする課題】
近年、電子機器などの小型化、面実装化などにより、積層コンデンサの小型化、大容量化が進んでいる。そして、このような小型化、大容量化の流れは中高圧コンデンサの分野にも波及しており、従来では単板コンデンサが用いられていた中高圧領域のコンデンサにおいても、積層チップ化が進行している。
【０００３】
ところで、中高圧積層コンデンサの回路用途は、大きく分けると、常時中高圧がかかる回路と、電源回りに入るサージ保護用に高耐圧が必要となる回路の２種類に分けられる。そして、後者に用いられる積層コンデンサに関しては、電源回りでの安全性確保のため、国内においては電気用品取締法により、また、諸外国においては、ＵＬ規格，ＢＳＩ規格などにより、安全規格が定められており、定格電圧とは別に、高い耐パルス試験電圧性能が要求されている。
【０００４】
このような積層コンデンサについては、一般的に、その製造工程における最終特性チェックとして、全数につき、定格電圧に応じてＤＣ、あるいはＡＣ、又はその両方で耐電圧試験を行い、絶縁抵抗不良品を選別、除去するようにしている。
なお、これらの耐圧選別を行う方法としては、ＤＣ電源、あるいはＡＣ電源、又はその両方の電源を用いて、連続処理により選別を行う方法が確立されている。
【０００５】
しかし、パルス電圧による耐圧選別試験は、単純な電源からの電圧印加により連続処理を行うことはできず、例えばＩＥＣ規格「ＩＥＣ３８４−１４」などに規定されているような特別な充放電試験電源回路が必要となるため、連続処理による耐圧選別スクリニングを行うことは非常に困難であった。
【０００６】
本発明は、上記問題点を解決するものであり、特別な充放電試験電源回路を必要とする耐パルス電圧試験を行うことなく、耐パルス電圧試験を行ったのと同等のスクリニングを効率よく行うことが可能な積層コンデンサのスクリニング方法を提供することを目的とする。
【０００７】
【課題を解決するための手段】
上記目的を達成するために、発明者らは、積層コンデンサについて、ＤＣ電圧、ＡＣ電圧、パルス電圧の各電圧破壊試験を行い、ＡＣ電圧とパルス電圧における積層コンデンサの電圧破壊値が、ワイブル確率紙において同じ傾きを持つことに着目し、さらに実験、検討を行って、パルス電圧破壊試験を、ＡＣ電圧破壊試験で代用することにより、積層コンデンサを効率よくスクリニングすることが可能な本発明（積層コンデンサのスクリニング方法）を完成した。
【０００８】
すなわち、本発明（請求項１）の積層コンデンサのスクリニング方法は、
パルス電圧に対する耐性を保証する積層コンデンサの良否を選別するスクリニング方法であって、
前記積層コンデンサの破壊電圧と平均故障率との関係を表すワイブル確率紙で示されたパルス破壊電圧の傾きｍとほぼ同様の傾きｍ値をもつ交流耐電圧スクリニング電圧から、所望の平均故障率に対応する交流耐電圧スクリニング電圧における実効電圧値を求めた後、前記積層コンデンサに、前記実効電圧を印加して、パルス電圧の耐性を保証する積層コンデンサの良否を選別すること
を特徴としている。
【０００９】
積層コンデンサの破壊電圧と平均故障率との関係を表すワイブル確率紙で示されたパルス破壊電圧の傾きｍとほぼ同様の傾きｍ値をもつ交流耐電圧スクリニング電圧から、所望の平均故障率に対応する交流耐電圧スクリニング電圧における実効電圧値を求めた後、積層コンデンサに、実効電圧を印加して、パルス電圧の耐性を保証する積層コンデンサの良否を選別することにより、特別な充放電試験電源回路を必要とする耐パルス電圧試験を行うことなく、耐パルス電圧試験を行ったのと同等のスクリニングを行うことが可能になり、所定のパルス電圧に対する耐性を備えた積層コンデンサと備えていない積層コンデンサを効率よく選別することが可能になる。
【００１０】
積層コンデンサは特に多層化、薄層化が進んでおり、耐圧性能も問題になりやすいが、本発明の方法を適用することにより、信頼性の高い積層コンデンサを提供することが可能になる。
【００１１】
【発明の実施の形態】
以下、本発明の実施の形態を示して、その特徴とするところをさらに詳しく説明する。
【００１２】
なお、この実施形態では、図１に示すように、チタン酸バリウム系セラミックを誘電体（Ｂ特性材料）として用いたセラミック素子１中に、セラミック層２を介して内部電極３が積層、配設されており、かつ、所定の内部電極３が、互いに対向する逆側の端面１ａ，１ｂに配設された外部電極４ａ，４ｂに接続された構造を有する積層コンデンサについて、スクリニングを行う場合を例にとって説明する。
【００１３】
［積層コンデンサの条件］
(1)誘電体の誘電率：３０００
(2)内部電極間のセラミック層の厚み：７０μm
(3)容量 ：２２０００ｐＦ
(4)定格電圧：ＤＣ６３０Ｖ
【００１４】
［破壊電圧の測定］
この実施形態では、上記のような条件の積層コンデンサについて、ＤＣ破壊電圧、ＡＣ破壊電圧、及びパルス破壊電圧を測定した。
なお、ＡＣ破壊電圧は、商用周波数（６０Ｈｚ）にて測定した。
また、パルス破壊電圧を測定するためのパルス破壊電圧回路としては、ＩＥＣ規格「ＩＥＣ３８４−１４」に準拠したものを用いた。
【００１５】
そして、破壊電圧の測定結果を、図２に示すように、ワイブル確率紙にプロットした。なお、図２において、横軸は破壊電圧（ｋＶ）、縦軸は平均故障率（Ｆ（ｔ）（％））を示す。
また、図２において、ＡＣ破壊電圧値は、実効電圧値（Ｖｒｍｓ）、パルス破壊電圧値は、パルスの０−ピーク電圧値（Ｖ0-P）である。
【００１６】
図２より、ＤＣ破壊電圧（ＤＣ−ＢＤＶ）は、パルス破壊電圧（パルスＢＤＶ）と異なる傾きを持っているのに対して、ＡＣ破壊電圧（ＡＣ−ＢＤＶ）は、パルス破壊電圧（パルスＢＤＶ）とほぼ同じ傾きを持っていることがわかる。
図２のワイブル確率紙から求めた、傾きｍ値と、平均故障率Ｆ（ｔ）＝６３％における破壊電圧値を表１に示す。
【００１７】
【表１】
表１より、このときの傾きｍ値は、ＤＣ破壊電圧（ＤＣ−ＢＤＶ）の傾きｍ値は９．８０、ＡＣ破壊電圧（ＡＣ−ＢＤＶ）の傾きｍ値は４６．４０、パルス破壊電圧（パルスＢＤＶ）の傾きｍ値は４５．９１となっており、ＡＣ破壊電圧とパルス破壊電圧は、ほぼ同じ傾きｍ値を持っていることがわかる。
【００１９】
また、傾きｍ値、平均故障率Ｆ（ｔ）＝６３％における破壊電圧値から求めた、他の平均故障率Ｆ（ｔ）における推定破壊電圧値、ＤＣ破壊電圧／パルス破壊電圧、及びＡＣ破壊電圧／パルス破壊電圧を表２に示す。
【００２０】
【表２】
表２より、ＡＣ破壊電圧とパルス破壊電圧の関係は、図２に示すように、傾き（ｍ値）がほとんど同じであるため、いずれの破壊確率においても推定破壊電圧が等倍性を示す（すなわち、ＡＣ破壊電圧／パルス破壊電圧の値がほぼ同一となっている）が、ＤＣ破壊電圧とパルス破壊電圧の関係は、図２に示すように、傾き（ｍ値）が異なるため、等倍性が成立していない（すなわち、ＤＣ破壊電圧／パルス破壊電圧の値が大きくばらついている）ことがわかる。
【００２２】
［スクリニングの実施］
次に、パルス破壊電圧とＡＣ破壊電圧の等倍性を利用した耐圧スクリニングの実施形態について説明する。
【００２３】
同じ条件で製造した積層コンデンサ（試料）を２００００個用意し、１００００個ずつ２つに振り分けて、パルス耐圧２４００Ｖ0-Pと、ＡＣ（６０Ｈｚ）耐圧１５６０Ｖｒｍｓ（＝２４００×０．６５）の条件で、耐圧スクリニングを実施した。
【００２４】
評価数１００００個に対して、スクリニングできた耐圧不良数並びに不良率を表３に示す。なお、耐圧不良は、絶縁抵抗が１桁以上低下したものを対象とした。
【００２５】
【表３】
表３より、パルス耐圧２４００Ｖ0-Pと、ＡＣ（６０Ｈｚ）耐圧１５６０Ｖｒｍｓ（＝２４００×０．６５）の耐圧スクリニングにおいて、ほぼ同じスクリニング性が得られており、パルス耐圧スクリニングを、ＡＣ耐圧スクリニングにより代用できることがわかる。
【００２７】
なお、上記実施形態では、パルス破壊電圧とＡＣ破壊電圧の関係が、
ＡＣ破壊電圧（Ｖｒｍｓ）＝０．６５×パルス破壊電圧（Ｖ0-P）
である場合を例にとって説明したが、一般的には
ＡＣ破壊電圧（Ｖｒｍｓ）＝Ａ×パルス破壊電圧（Ｖ0-P）
となり、この場合の定数Ａは、素子の設計構造、容量、材料、パルス波形などにより変化する。
【００２８】
また、上記実施形態では、周波数６０ＨｚのＡＣ電圧で評価したが、ＡＣ電圧の周波数が異なるとＡは変化する。このため、積層コンデンサに応じてＡを設定することが必要になるが、等倍性に変化はなく、パルス耐圧スクリニングを、ＡＣ耐圧スクリニングにより代用できることに変わりはない。
【００２９】
また、上記実施形態において、積層コンデンサを対象としてスクリニングを行っているが、本発明は、積層コンデンサに限らず、セラミック素子中に、複数の内部電極がセラミック層を介して積層された構造を有するＬＣ複合部品など、種々の積層コンデンサについてスクリニングを行う場合に広く適用することが可能である。
【００３０】
本発明は、さらにその他の点においても上記実施形態に限定されるものではなく、発明の要旨の範囲内において、種々の応用、変形を加えることが可能である。
【００３１】
【発明の効果】
上述のように、本発明（請求項１）の積層コンデンサのスクリニング方法は、積層コンデンサの破壊電圧と平均故障率との関係を表すワイブル確率紙で示されたパルス破壊電圧の傾きｍとほぼ同様の傾きｍ値をもつ交流耐電圧スクリニング電圧から、所望の平均故障 率に対応する交流耐電圧スクリニング電圧における実効電圧値を求めた後、積層コンデンサに、実効電圧を印加して、パルス電圧の耐性を保証する積層コンデンサの良否を選別するようにしているので、特別な充放電試験電源回路を必要とする耐パルス電圧試験を行うことなく、耐パルス電圧試験を行ったのと同等のスクリニングを行うことができるようになり、所定のパルス電圧に対する耐性を備えた積層コンデンサと備えていない積層コンデンサを効率よく選別することができる。
【００３２】
積層コンデンサは特に多層化、薄層化が進んでおり、耐圧性能も問題になりやすいが、本発明の方法を適用することにより、効率よく、しかも確実に、信頼性の高い積層コンデンサを提供することができるようになる。
【図面の簡単な説明】
【図１】 本発明のスクリニング方法の対象となる積層コンデンサの構成を示す断面図である。
【図２】 本発明の一実施形態にかかる方法で、積層コンデンサの耐圧スクリニングを行った場合の、電圧（破壊電圧値）（ｋＶ）と、平均故障率（Ｆ（ｔ）（％））の関係を示す図である。
【符号の説明】
１ セラミック素子
１ａ，１ｂ セラミック素子の端面
２ セラミック層
３ 内部電極
４ａ，４ｂ 外部電極[0001]
BACKGROUND OF THE INVENTION
The present invention relates to subscription training method of the electronic component, For details, relates to subscription training method for culling the breakdown voltage defective products from laminated capacitor group of the high pressure type in which is required particularly high breakdown voltage.
[0002]
[Prior art and problems to be solved by the invention]
In recent years, the downsizing and large capacity of multilayer capacitors have been progressing due to downsizing and surface mounting of electronic devices. This trend of downsizing and increasing capacity has spread to the field of medium- and high-voltage capacitors, and in the middle- and high-voltage capacitors where single-plate capacitors have been used in the past, the production of multilayer chips has progressed. ing.
[0003]
By the way, the circuit application of the medium- and high-voltage multilayer capacitor can be broadly divided into two types, that is, a circuit that is constantly subjected to medium- and high-voltages and a circuit that requires a high withstand voltage for surge protection around the power source. For the multilayer capacitors used in the latter, safety standards are established by the Electrical Appliance and Material Control Law in Japan and by UL standards, BSI standards, etc. in other countries to ensure safety around the power supply. In addition to the rated voltage, high pulse resistance test voltage performance is required.
[0004]
For such multilayer capacitors, in general, as a final characteristic check in the manufacturing process, a withstand voltage test is performed on all units in accordance with the rated voltage at DC and / or AC, and defective insulation resistance is selected. To be removed.
In addition, as a method of performing such pressure-resistant sorting, a method of performing sorting by continuous processing using a DC power source, an AC power source, or both power sources has been established.
[0005]
However, the withstand voltage selection test using a pulse voltage cannot be performed continuously by applying a voltage from a simple power supply. For example, a special charge / discharge test power supply circuit as defined in the IEC standard “IEC384-14” or the like. Therefore, it is very difficult to perform pressure-resistant screening by continuous processing.
[0006]
The present invention solves the above-mentioned problems, and efficiently performs the same screening as the pulse voltage test without performing the pulse voltage test that requires a special charge / discharge test power supply circuit. An object of the present invention is to provide a method for screening a multilayer capacitor that can be performed.
[0007]
[Means for Solving the Problems]
To achieve the above object, the inventors with the multilayer capacitor, DC voltage, AC voltage, performs the voltage breakdown test of the pulse voltage, the voltage breakdown value of the multilayer capacitor in the AC voltage and the pulse voltage, Weibull Focusing on the fact that the paper has the same inclination, the present invention is capable of efficiently screening a multilayer capacitor by substituting the pulse voltage breakdown test with the AC voltage breakdown test by conducting further experiments and examinations. Completed the screening method for multilayer capacitors .
[0008]
That is, the screening method of the multilayer capacitor of the present invention (Claim 1)
A screening method for selecting the quality of a multilayer capacitor that guarantees tolerance to a pulse voltage,
From the AC withstand voltage subscription training voltage having substantially the same slope m value and the slope m of the pulse breakdown voltage indicated by Weibull probability paper representing the relationship between the destruction voltage and the average failure rate of the multilayer capacitor, a desired average failure after determining the effective voltage value at AC withstand voltage subscription training voltages corresponding to the rate, the multilayer capacitor, by applying the effective voltage, as characterized by selecting the quality of the multilayer capacitor to guarantee resistance of the pulse voltage Yes.
[0009]
From the AC withstand voltage subscription training voltage having substantially the same slope m value and the slope m of the pulse breakdown voltage indicated by Weibull probability paper representing the relationship between the corrupted voltage fracture of the multilayer capacitor and the average failure rate, desired average failure rate after determining the effective voltage value at AC withstand voltage subscription training voltages corresponding to, in the multilayer capacitor, by applying an effective voltage, by selecting the quality of the multilayer capacitor to guarantee resistance of the pulse voltage, a special charge and discharge It is possible to perform screening equivalent to the pulse withstand voltage test without performing the pulse withstand voltage test that requires a test power supply circuit, and it is equipped with a multilayer capacitor with tolerance to a predetermined pulse voltage This makes it possible to efficiently sort the multilayer capacitors that are not.
[0010]
Multilayer capacitors are particularly becoming multilayered and thinned, and the withstand voltage performance is likely to be a problem. However, by applying the method of the present invention, it is possible to provide a highly reliable multilayer capacitor.
[0011]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, the embodiment of the present invention will be shown and the features thereof will be described in more detail.
[0012]
In this embodiment, as shown in FIG. 1, an
[0013]
[Conditions for multilayer capacitors]
(1) Dielectric constant of dielectric: 3000
(2) Thickness of ceramic layer between internal electrodes: 70 μm
(3) Capacity: 22000pF
(4) Rated voltage: DC630V
[0014]
[Measurement of breakdown voltage]
In this embodiment, the DC breakdown voltage, the AC breakdown voltage, and the pulse breakdown voltage were measured for the multilayer capacitor under the above conditions.
The AC breakdown voltage was measured at a commercial frequency (60 Hz).
As a pulse breakdown voltage circuit for measuring the pulse breakdown voltage, a circuit conforming to the IEC standard “IEC384-14” was used.
[0015]
And the measurement result of the breakdown voltage was plotted on the Weibull probability paper as shown in FIG. In FIG. 2, the horizontal axis represents the breakdown voltage (kV), and the vertical axis represents the average failure rate (F (t) (%)).
In FIG. 2, the AC breakdown voltage value is an effective voltage value (Vrms), and the pulse breakdown voltage value is a pulse 0-peak voltage value (V 0-P ).
[0016]
From FIG. 2, the DC breakdown voltage (DC-BDV) has a different slope from the pulse breakdown voltage (pulse BDV), whereas the AC breakdown voltage (AC-BDV) is equal to the pulse breakdown voltage (pulse BDV). It can be seen that it has almost the same inclination.
Table 1 shows the slope m value obtained from the Weibull probability paper of FIG. 2 and the breakdown voltage value at an average failure rate F (t) = 63%.
[0017]
[Table 1]
From Table 1, the slope m value at this time is 9.80 for the DC breakdown voltage (DC-BDV), 46.40 for the AC breakdown voltage (AC-BDV), and the pulse breakdown voltage ( The slope m value of the pulse BDV is 45.91, and it can be seen that the AC breakdown voltage and the pulse breakdown voltage have substantially the same slope m value.
[0019]
Further, the estimated breakdown voltage value, DC breakdown voltage / pulse breakdown voltage, and AC breakdown at other average failure rates F (t) obtained from the breakdown m value, breakdown voltage value at average failure rate F (t) = 63% The voltage / pulse breakdown voltage is shown in Table 2.
[0020]
[Table 2]
According to Table 2, the relationship between the AC breakdown voltage and the pulse breakdown voltage has almost the same slope (m value) as shown in FIG. 2, and therefore the estimated breakdown voltage shows the same magnification at any breakdown probability ( That is, the values of AC breakdown voltage / pulse breakdown voltage are almost the same), but the relationship between the DC breakdown voltage and the pulse breakdown voltage is different because the slope (m value) is different as shown in FIG. It can be seen that the characteristics are not established (that is, the values of the DC breakdown voltage / pulse breakdown voltage vary widely).
[0022]
[Screening]
Next, an embodiment of withstand voltage screening utilizing the equality of the pulse breakdown voltage and the AC breakdown voltage will be described.
[0023]
20000 multilayer capacitors (samples) manufactured under the same conditions are prepared, divided into two 10000 pieces each, under the conditions of a pulse withstand voltage of 2400 V 0-P and an AC (60 Hz) withstand voltage of 1560 Vrms (= 2400 × 0.65). , Pressure-resistant screening was carried out.
[0024]
Table 3 shows the number of pressure-resistant defects that can be screened and the defect rate with respect to 10,000 evaluations. Note that the breakdown voltage failure was targeted for the case where the insulation resistance decreased by one digit or more.
[0025]
[Table 3]
From Table 3, the pulse-voltage 2400 V 0-P, in the breakdown voltage subscription training of AC (60 Hz) withstand 1560Vrms (= 2400 × 0.65), and approximately the same subscription training property is obtained, a pulse-voltage subscription training, AC It turns out that it can substitute by pressure | voltage resistant screening.
[0027]
In the above embodiment, the relationship between the pulse breakdown voltage and the AC breakdown voltage is
AC breakdown voltage (Vrms) = 0.65 × pulse breakdown voltage (V 0-P )
In the example described above, the AC breakdown voltage (Vrms) = A × pulse breakdown voltage (V 0-P ).
In this case, the constant A varies depending on the element design structure, capacitance, material, pulse waveform, and the like.
[0028]
Moreover, in the said embodiment, although evaluated with the AC voltage of a frequency of 60 Hz, A changes if the frequency of an AC voltage differs. For this reason, it is necessary to set A according to the multilayer capacitor, but there is no change in the equality, and the pulse withstand voltage screening can be replaced by the AC withstand voltage screening.
[0029]
Further, in the above embodiment, screening is performed for a multilayer capacitor, but the present invention is not limited to a multilayer capacitor, and a structure in which a plurality of internal electrodes are laminated via a ceramic layer in a ceramic element. The present invention can be widely applied in the case of performing screening on various multilayer capacitors such as LC composite parts.
[0030]
The present invention is not limited to the above embodiment in other points, and various applications and modifications can be made within the scope of the gist of the invention.
[0031]
【The invention's effect】
As described above, subscription training method of the multilayer capacitor of the present invention (Claim 1) includes a slope m of the pulse breakdown voltage indicated by Weibull probability paper representing the relationship between the destruction voltage and the average failure rate of the multilayer capacitor from the AC withstand voltage subscription training voltage having substantially the same slope m value, after obtaining the effective voltage value at AC withstand voltage subscription training voltage corresponding to the desired average failure rate, in the multilayer capacitor, by applying an effective voltage, since so as to screen the quality of the multilayer capacitor to guarantee resistance of the pulse voltage, without performing a withstand voltage pulse tests requiring special charge and discharge test power supply circuit, similar to that performed withstand pulse voltage test that thing will be able to perform a subscription training, sorted efficiently multilayer capacitor which is not provided with a multilayer capacitor having a resistance to a predetermined pulse voltage Kill.
[0032]
Multilayer capacitors are becoming increasingly multilayered and thinned, and withstand voltage performance is likely to be a problem, but by applying the method of the present invention , an efficient , reliable, and highly reliable multilayer capacitor is provided. Will be able to.
[Brief description of the drawings]
1 is a cross-sectional view showing the structure of interest and ing multilayer capacitor subscription training method of the present invention.
FIG. 2 shows a voltage (breakdown voltage value) (kV) and an average failure rate (F (t) (%)) when the breakdown voltage screening of the multilayer capacitor is performed by the method according to the embodiment of the present invention. It is a figure which shows the relationship.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1
Claims (1)
前記積層コンデンサの破壊電圧と平均故障率との関係を表すワイブル確率紙で示されたパルス破壊電圧の傾きｍとほぼ同様の傾きｍ値をもつ交流耐電圧スクリニング電圧から、所望の平均故障率に対応する交流耐電圧スクリニング電圧における実効電圧値を求めた後、前記積層コンデンサに、前記実効電圧を印加して、パルス電圧の耐性を保証する積層コンデンサの良否を選別すること
を特徴とする積層コンデンサのスクリニング方法。A screening method for selecting the quality of a multilayer capacitor that guarantees tolerance to a pulse voltage,
From the AC withstand voltage subscription training voltage having substantially the same slope m value and the slope m of the pulse breakdown voltage indicated by Weibull probability paper representing the relationship between the destruction voltage and the average failure rate of the multilayer capacitor, a desired average failure after determining the effective voltage value at AC withstand voltage subscription training voltages corresponding to the rate, the multilayer capacitor, by applying the effective voltage, and characterized in that selecting the quality of the multilayer capacitor to guarantee resistance of the pulse voltage Screening method for multilayer capacitors .
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