JP2020038116A - Automatic handling of test target device for different foam factors in test cell - Google Patents

Abstract

To provide a system for executing a test using automatic test equipment (ATE).SOLUTION: A system has a robot 310 that comprises an end effector operable to pick up a DUT and move it to and from the test slot of a primitive 330. The system further has a system controller comprising a memory and a processor for controlling the robot 310. The system is also the plurality of primitives 330, wherein the primitive 330 is a modular device comprising a plurality of slots for testing the plurality of DUTs, and the robot 310 has a test rack 320 that comprises the plurality of primitives 330 configured to automatically access the slots of the plurality of primitives 330 in the test rack using the end effector.SELECTED DRAWING: Figure 3A

Description

[Cross-reference of related applications]
This application is related to US Patent Application No. 15 / 455,103, filed March 9, 2017. The specification is entitled "DEVICE TESTING USING DUAL-FAN COLLING WITH AMBIENT AIR (device test using dual fan cooling with ambient air)", the inventor is Roland Wolff, and the agent reference number is ATSY-0046-01.01US. It is. That patent application is incorporated herein by reference in its entirety and for all purposes.

  The present disclosure relates generally to the field of automatic test equipment, and more specifically, to techniques for automatically handling such equipment.

  An automatic test equipment (ATE) may be any test assembly that performs tests on packaged devices such as semiconductor wafers or dies, integrated circuits (ICs), circuit boards, or solid state drives. The ATE assembly may be used to perform automated tests that make measurements quickly and then generate test results that can be analyzed. ATE assemblies can be anything from computer systems connected to instruments to complex automated test assemblies, such complex automated test assemblies include system-on-chip (SOC) tests or integrated circuit tests. A custom dedicated computer control system and many different test equipment capable of automatically performing electronic component tests and / or semiconductor wafer tests may be included. The ATE system is intended to ensure that a given device performs as designed before it is delivered to a consumer, and to serve as a diagnostic tool to determine if there are any bad components in that device. Reduce device testing time spent on both.

  When a typical ATE system tests a device (commonly referred to as a device under test or DUT), the ATE system provides a stimulus (eg, an electrical signal) to the device and a response (eg, current or current) from the device. Voltage). Typically, the end result of a test is `` passed '' if the device successfully provided the specific response expected within the preset tolerance, and the device expected within the preset tolerance. If no response could be provided, it is one of "bad". More advanced ATE systems can evaluate bad devices and possibly determine one or more causes of failure.

  ATE systems typically include a computer that manages the operation of the ATE system. Typically, a computer executes one or more dedicated software programs to provide (i) a test development environment, and (ii) a device test environment. In a test development environment, a user typically creates a test program. The test program is a software-based construct that controls various parts of the ATE system, ie consists of one or more files. In a device test environment, a user typically provides one or more devices to the ATE system for testing and instructs the ATE system to test each device according to a test program. The user may test the additional device simply by providing the additional device to the ATE system and instructing the ATE system to test the additional device according to a test program. Thus, the ATE system allows a user to test many devices in a consistent and automated manner based on a test program.

  In a typical prior art test environment, the DUT is placed in a controlled environment chamber or "oven." The DUT is connected to a test head tester slice. Some DUTs may be connected to a single slice, and a single test chamber may include several slices. These slices contain test circuits and perform tests on the DUT according to a test plan. Once in the oven, the DUT cannot be touched by the user so as not to disturb the controlled chamber environment. When a DUT is in the chamber, the DUT cannot be removed until all tests have been completed, even if some of the DUTs finish testing early. Thereafter, the chamber is accessible.

  One of the challenges associated with this test environment is that the interior of the environmental chamber is inaccessible during testing, so that if the test is being performed using an active tester slice in the oven, Certain tester slices are idle. Another challenge is that traditional test environments typically require the manual insertion and removal of DUTs from tester slices, which is time consuming, error prone, and reduces the likelihood of DUTs during manual handling. It is disadvantageous because it can be damaged. Further, manual insertion and removal of DUTs in a mass production environment is very inefficient and error prone.

  Accordingly, a need exists for an automated method of handling different form factor DUTs in a test cell. Further, what is needed is inserting and removing a DUT from a primitive in a test head using a robot that eliminates the need for human labor and achieves higher yields in less time. It is an automated way of doing things. Further, what is needed is a test environment that allows access to the system while tests are being performed so that the system can be fully utilized. Using the beneficial aspects of the described system, without limiting each of such aspects, embodiments of the present invention provide an unprecedented solution to address these issues.

  The invention disclosed herein utilizes a plurality of primitives and an associated DUT interface board (DIB) to test a DUT. Each primitive is modular, meaning that it can operate independently of the other primitives. Each primitive is connected to a DIB, which includes multiple slots of multiple DUTs.

  Embodiments of the present invention utilize robots to partially automate the test process by automating the insertion of DUTs into and removal of DUTs from DIBs. In one embodiment, the robot utilizes interchangeable grippers to handle various form factor DUTs. The automated process can be programmed so that the robot knows what type of device is being tested automatically and selects the appropriate gripper for the form factor of the device being tested. Further, in other embodiments, the tester may also be programmed such that the robot has intelligence to also determine the orientation (horizontal or vertical) of the device in the bin and the placement of the device. In additional embodiments, the robot is further programmed with the intelligence to grasp the device without damaging the device by using a camera and an external reference point.

  According to embodiments of the present invention, heating of the device is generally caused by the operation of the DUT itself. Thus, after operation of the device is authorized, the DUT will obtain the set point temperature. Thus, cooling methods and systems (eg, fans) inside the DIB employed in embodiments of the present invention effectively cool the device to maintain a set point temperature for testing. Thus, there is no need for a temperature controlled environmental chamber to heat the device. Another advantage is that ambient air can be used successfully and cool the DUT without requiring additional cooling elements besides the fan. Thus, there is no need for expensive environmental chambers. This is because the test can be performed in a laboratory setting or on a test floor. This solution is low cost, and the combination of DIB (DUT interface board) and test execution module (or primitive) is suitable for DUT operation by robot, therefore, network card, graphic card, chip, micro It is suitable for mass testing of various electronic devices, including, but not limited to, processors, hard disk drives (HDDs), and solid state drives (SSDs).

  Furthermore, because the DUT is not located in the environmental test chamber, handling, physical manipulation, inspection, etc., are easier during a robotic test cycle. The aspects of the electronics used to test the DUT are also modularized (using primitives, as described herein). Thus, different modules may perform different tests on different form factors and DUT types, or different tests on the same DUT type (because there is no longer a need to perform tests in lockstep). No). This increases overall test efficiency and test flexibility.

  In one embodiment, a method for performing a test using an automated test equipment (ATE) is disclosed. The method comprises placing a device under test (DUT) to be tested. Further, the method includes recording a presence or absence of a DUT in a database, and a database for determining the presence or absence of an empty slot in a primitive that is a modular device having a plurality of slots for receiving and testing the plurality of DUTs. And querying the The method also includes using the robot to insert the DUT into the empty slot and reporting to the database that the empty slot has been filled. Finally, the method comprises initiating a test of the DUT.

  In a different embodiment, a system for performing a test using an automated test equipment (ATE) is provided. The system has a robot that includes an end effector operable to pick up the DUT and move the primitive into and out of the test slot. The system further has a system controller including a memory and a processor for controlling the robot. Further, the system is a plurality of primitives, the primitives are modular devices that include a plurality of slots for testing DUTs, and the robot uses end effectors to control the plurality of primitives in a test rack. It has a test rack that includes a plurality of primitives configured to automatically access a slot.

  In yet another embodiment, a system for performing a test using an automated test equipment (ATE) is disclosed. The system has a robot that includes an end effector operable to pick up the DUT and move the primitive into and out of the test slot. The system further includes an input and output module that includes a plurality of trays and is operable to present the DUT to the robot from the plurality of trays during a test. Further, the system has a system controller that includes a memory and a processor for controlling the robot. The system is also a plurality of primitives, the primitives are modular devices including a plurality of slots for testing a plurality of DUTs, and the robot is automatically inserted into a plurality of primitive slots in a test rack. There is a test rack including a plurality of primitives configured to access.

  The following detailed description together with the accompanying drawings will provide a further understanding of the nature and advantages of the present invention.

  Embodiments of the present invention are illustrated by way of example, and not by way of limitation, in the figures of the accompanying drawings. In these figures, like reference numbers refer to like elements.

1 illustrates a conventional test environment where a DUT is located in a controlled environment chamber.

FIG. 4 illustrates primitives interfaced with a DUT interface board (DIB) 400 according to one embodiment of the present invention.

4 illustrates an automatic workcell using a six-axis industrial robot used to move a DUT device (eg, a solid state drive) to and from test primitives of a test head, according to one embodiment of the present invention.

3 shows a structural weld used to hold a test rack in a stationary position arrangement in a workcell according to one embodiment of the present invention.

FIG. 4 illustrates input and output modules used to present a DUT to a robot arm during testing according to one embodiment of the invention. FIG.

4 illustrates an automatic workcell using a three-axis orthogonal industrial robot used to move a DUT device (eg, a solid state drive) to and from test primitives of a test head, according to one embodiment of the present invention.

An end effector connected to the end of the robot arm and used to grip and move a DUT device (eg, a solid state drive) of the test head according to an embodiment of the present invention to and from the test primitive. Show.

A separate, connected to the end of the robot arm and used to securely grip and move DUT devices (eg, solid state drives) of the test head according to one embodiment of the present invention to and from test primitives. 2 shows an end effector of the present invention.

1 illustrates a solid state device (SSD) DUT on a typical flat plastic tray used in customer production facilities.

1 illustrates a solid state device (SSD) DUT placed on a production floor tote.

1 illustrates a six-axis articulated industrial robot mounted on a height-adjustable rectangular Z-axis platform according to one embodiment of the present invention.

FIG. 4 illustrates a height adjustable Z-axis rectangular scissor lift module in a fully extended configuration according to one embodiment of the present invention.

4 illustrates a method in which an orthogonal robot retrieves a DUT from a tray and inserts the DUT into a slot of a primitive according to an embodiment of the present invention. 4 illustrates a method in which an orthogonal robot retrieves a DUT from a tray and inserts the DUT into a slot of a primitive according to an embodiment of the present invention. 4 illustrates a method in which an orthogonal robot retrieves a DUT from a tray and inserts the DUT into a slot of a primitive according to an embodiment of the present invention. 4 illustrates a method in which an orthogonal robot retrieves a DUT from a tray and inserts the DUT into a slot of a primitive according to an embodiment of the present invention. 4 illustrates a method in which an orthogonal robot retrieves a DUT from a tray and inserts the DUT into a slot of a primitive according to an embodiment of the present invention.

4 shows a method in which a work cell is controlled by a PC controller according to an embodiment of the present invention.

2 shows all the hardware and software required for the operation of the workcell according to one embodiment of the present invention.

4 illustrates a flowchart of an exemplary computer-implemented process for performing tests on a DUT in a workcell according to one embodiment of the present invention.

In the drawings, elements having the same name have the same or similar functions.

  Reference will now be made in detail to various embodiments of the present disclosure, examples of which are illustrated in the accompanying drawings. While examples are described with these embodiments, it will be understood that the disclosure is not intended to be limited to these embodiments. On the contrary, the disclosure is intended to cover alternatives, modifications, and equivalents, which are included within the spirit and scope of the disclosure as defined by the appended claims. Can be Furthermore, in the following detailed description of the present disclosure, numerous specific details are set forth in order to provide a thorough understanding of the present disclosure. However, it will be understood that the present disclosure may be practiced without these specific details. In other instances, well-known methods, procedures, components, and circuits have not been described in detail as not to unnecessarily obscure aspects of the present disclosure.

  Some portions of the detailed description that follows are presented in terms of procedures, logic blocks, processing, and other symbolic representations of operations on data bits within a computer memory. These descriptions and representations are the means used by those skilled in the data processing arts to most effectively convey the substance of their work to others skilled in the art. In this application, a procedure, logic block, process, etc., is considered to be a coherent sequence of steps or instructions leading to a desired result. These steps utilize physical manipulation of physical quantities. These quantities often, but not always, take the form of electrical or magnetic signals that can be stored, transferred, combined, compared, or manipulated in computer systems. It has proven to be convenient in some cases to refer to these signals as transactions, bits, values, elements, symbols, characters, samples, pixels, etc., primarily because they are commonly used.

  However, it should be noted that all of these and similar terms will be associated with the appropriate physical quantities and are merely convenient names applied to these quantities. Unless otherwise stated, as will be apparent from the following description, throughout this disclosure, "configuring", "programming", "updating", "testing". It is understood that descriptions utilizing terms such as ")," "polling" and the like refer to the operation and processing of a computer system or similar electronic computing device or processor (eg, flowchart 1300 of FIG. 13). You. A computer system or similar electronic computing device manipulates and transforms data, represented as physical (electronic) quantities, in computer system memory, registers or other such information storage, transmission or display devices. .

  The embodiments described herein may be implemented in the general context of computer-executable instructions residing on some form of computer-readable storage medium, such as program modules being executed by one or more computers or other devices. May be discussed. By way of example, and not limitation, computer readable storage media may include non-transitory computer readable storage media and communication media, where non-transitory computer readable media includes all computer readable media, except for temporarily propagated signals. Including. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform particular tasks or implement particular abstract data types. The functionality of the program modules may be combined or distributed as required in various embodiments.

  The computer storage medium may be volatile and non-volatile, removable and non-removable, implemented in any method or technology for storing information such as computer readable instructions, data structures, program modules, or other data. Media. Computer storage media include, but are not limited to, random access memory (RAM), read only memory (ROM), electrically erasable programmable ROM (EEPROM), memory technologies such as flash memory, compact disk ROM (CD-ROM), An optical storage device such as a digital versatile disk (DVD), a magnetic cassette, a magnetic tape, a magnetic disk storage device or other magnetic storage device, or can be used to store and retrieve necessary information Any other media that can be accessed is included.

  Communication media may embody computer-executable instructions, data structures, and program modules, and includes any information delivery media. By way of example, and not limitation, communication media includes wired media such as a wired network or direct wired connection, and wireless media such as acoustic, radio frequency (RF), infrared and other wireless media. . Combinations of any of the above may also be included within the scope of computer-readable media.

  FIG. 1 shows a conventional test environment in which a DUT is placed in a controlled environment chamber 10 or “oven”. These DUTs are connected to the tester slice of the test head 20. Many DUTs can be connected to a single tester slice 40. The tester slice includes a test circuit that performs a test on the DUT according to a test plan. There can be many tester slices for each test head 20. The DUT is placed on tray 30 when inserted into oven 10. The DUT, when in the oven 10, is typically not accessible to a user so as not to disturb the controlled environment of the chamber 10. In a typical environmental chamber, multiple tester slices operate in lockstep to execute the same test plan on multiple DUTs. Further, the test head is typically controlled by a single controller computer system (not shown) that is directly connected to the test head, and in this manner controls all slices of the test head 20.

  One of the challenges associated with this test environment is that the interior of the environmental chamber is inaccessible during testing, so that when testing with other tester slices in the test head, the tester The whole slice or the slot not occupied by the tester slice becomes idle. Another challenge is that traditional test environments typically require the manual insertion and removal of DUTs from tester slices, which is time consuming, error prone, and difficult to handle during manual handling. This is disadvantageous because the DUT can be damaged. Moreover, manually inserting and removing DUTs in a mass production environment is very inefficient.

  Embodiments of the present invention provide an automated method of handling different form factor DUTs in a test cell. Embodiments of the present invention further use robots to insert and remove DUTs into and out of primitives in test heads, thereby eliminating the need for human labor and achieving higher yields in less time. Provide an automated way. Further, embodiments of the present invention allow access to the interior of the chamber while tests are being performed within the chamber so that the chamber can be fully utilized at the same time.

  According to embodiments of the present invention, heating of the device is generally caused by the operation of the DUT itself. Thus, after operation of the device is authorized, the DUT will obtain the set point temperature. Thus, cooling methods and systems (eg, fans) inside the DIB employed in embodiments of the present invention effectively cool the device to maintain a set point temperature for testing. Thus, there is no need for a temperature controlled environmental chamber to heat the device.

  Another advantage is that ambient air can be used successfully and cool the DUT without requiring additional cooling elements besides the fan. Thus, there is no need for expensive environmental chambers. This solution is low cost, and the combination of DIB (DUT interface board) and test execution module (or primitive) is suitable for DUT operation by robot, therefore, network card, graphic card, chip, micro It is well suited for mass testing of various electronic devices, including, but not limited to, processors, hard disk drives (HDDs), and solid state drives (SSDs).

  Furthermore, because the DUT is not located in the environmental test chamber, handling, physical manipulation, inspection, etc., are easier during a robotic test cycle. The aspects of the electronics used to test the DUT are also modularized (using primitives, as described herein). Thus, different modules may perform different tests on different or even the same form factor and DUT types. This increases overall test efficiency and test flexibility.

  As indicated above, embodiments of the present invention have the advantage of utilizing a robot to partially automate the test process by automating the insertion and removal of DUTs from and out of the DIB. It is. In one embodiment, the robot utilizes interchangeable grippers to handle various form factor DUTs. The automated process is programmed by the robot to have the intelligence, adaptability, and strength to recognize what type of device is being tested automatically and to select the appropriate gripper for the form factor of the device being tested. Can be done. Further, in other embodiments, the tester may also be programmed such that the robot has the intelligence to also determine the orientation (horizontal or vertical) of the device in the bin and the placement of the device. In additional embodiments, the robot is further programmed with the intelligence to grasp the device without damaging the device by using a camera and an external reference point.

  FIG. 2 shows a primitive 410 interfaced with a DUT interface board (DIB) 400 according to one embodiment of the present invention. Like the tester slice 40 shown in FIG. 2, the primitive in FIG. 4 is a kind of discrete test module that fits in the test head 20, and includes a test circuit that performs a test on a DUT according to a test plan. The primitive is a partial improvement to the tester slice 40 of FIG. 1 because the primitive has a housing 450 that houses all of the various electronic components, such as, for example, site modules, power supplies, and the like. is there. DIB 400 may include a plurality of DUTs 420 with custom connectors sized for the DUTs 420. DIB 400 may also include housing 470. The DIB 400 is interfaced with a general-purpose backplane (not shown) of the primitive 410 via a load board (not shown) to acquire high-speed signals and power. Primitive 410 includes test circuitry for implementing a test plan on DUT 420. Primitive 410 can operate independently of any other primitives and is connected to a control server.

  Embodiments of the present invention utilize multiple primitives (similar to those shown in FIG. 2) and associated DIBs to test the DUT. Each primitive is modular, meaning that it can operate independently of the other primitives. Thus, each of the plurality of primitives located in the rack may operate according to a different test plan.

  Titled "DEVICE TESTING USING DUAL-FAN COLOR WITH AMBIENT AIR" (referred to herein as "Dual-Fan Cooling Application"), which is incorporated herein by reference. In one embodiment, as described in U.S. Patent Application No. 15 / 455,103, filed March 9, 2017, when the test system uses the primitives shown in FIG. When testing DUTs associated with a particular rack, the environmental chamber is no longer needed. This is because primitives are designed to be partitioned in an efficient manner.

  As noted in the dual fan cooling application, the advantage of dual fan cooling with an ambient air system is that the ambient air is used efficiently and successfully without the need for additional cooling elements besides the fan, and the DUT (test target) Is to cool the device). Using the primitives shown in FIG. 4 eliminates the need for an environmental chamber because the heat generated by the DUT itself is used to reach the test temperature set point. There, the fan maintains the set point. Further, as indicated above, dual fan cooling with ambient air is low cost, compatible with robotic DUT (device under test) operation, and well suited for high volume testing of different types of devices (or DUTs). I have.

  In this embodiment, the primitive instant application housing 450 of FIG. 2 allows heat from the DUT to be retained inside the housing, so that a separate heating chamber is not required. . As a result, the DUT and primitives can always be directly manipulated by the user. In other words, the DUT provides the heat required to test the DUT at higher temperatures (when powered up for extended periods of time in the enclosure). Additionally, the fans and / or vents allow air to circulate through the primitive to cool the DUT, thereby reducing the internal temperature of the primitive.

  A typical test head has a plurality of primitives for testing a DUT and an associated DUT interface board (DIB). Each primitive is modular, meaning that it can operate independently of the other primitives. Each primitive is connected to a respective DIB 400, which includes a plurality of slots for a plurality of DUTs 420. The test modules 410 are modularized and communicated to one or more central control computers or test stations (not shown) in a rack supporting the modules with communication and power signals passed from the back of the modules. , Can be inserted. Individual DUT test primitives 410 and DIB 400 can be inserted into each of the rack slots, creating a customizable matrix of racks in an ambient air environment (eg, a test floor or laboratory), eliminating the need for an environmental test chamber. .

  As detailed in the dual fan cooling application, primitive 410 communicates power, instructions, signals, data, test results, and / or information with DUT 420 to perform tests on DUT 420. Operable. The test execution module 410 includes processing, communication, and storage circuits, and performs tests on the DUT 420. In addition, the primitive or test execution module 410 controls the cooling of the DUT 420 by receiving input signals from temperature sensors near the DUT 420 and by adjusting the rotation speed of the appropriate lower and upper fans. The test execution module 410 also includes an air flow path 490 for discharging airflow from the DIB 400 to the surrounding environment.

  FIG. 3A illustrates an automated workpiece using a 6-axis industrial robot used to move a DUT device (eg, a solid state drive) to and from test primitives in a test head, according to one embodiment of the present invention. Indicates a cell.

  Industrial robots can have various axis configurations. Usually, the robot with the most joints has six axes, and is also referred to as having six degrees of freedom. Six-axis robots allow for greater flexibility as compared to fewer-axis robots and may perform more diverse applications.

  FIG. 3A illustrates a 6-axis robot 310 used to move a DUT device (eg, a solid state drive) to and from test primitives while performing drive performance and functional tests. FIG. 3A also shows the entire automation workcell including five racks 320 and six primitives 330 per rack. Robot 310 operates at the center of the cell. It should be noted that while the diagram shown in FIG. 3A has five racks containing six primitives per rack, the workcell may be modified to include any number of racks and primitives, and many work floors may be placed on the production floor. It may be changed to put a cell. Thus, embodiments of the present invention advantageously obtain more output in less time by automating the insertion or removal of devices from / to primitives. In addition, since the robotic arm can reach higher places compared to the average human, embodiments of the present invention thus load primitives in the workcell higher than configurations using manual labor by humans. be able to.

  The automatic workcell may also have a large aluminum plate 311 located on the production floor and providing a single foundation for all of the hardware components. In one embodiment, the aluminum plate may have a one inch thick aluminum slab that has been machined and drilled to accommodate bolting of the steel weldment to the test rack.

  FIG. 3B shows a structural weld used to hold the test rack in a stationary position in a workcell according to one embodiment of the present invention. While placing the DUT in or removing it from the tester slot, a structural weld 312 is used as shown in FIG. 3B to ensure that the rack is not affected by vibrations or movements associated with pushing and pulling the DUT. Hold the rack in the stationary position arrangement. The structural weld may consist of an upright steel structural weld securely fixed to the slab base plate 311. Each workcell also has a crossbar that supports each of the racks in the cell.

  FIG. 3C illustrates input and output modules used to present a DUT to a robot arm during testing according to one embodiment of the present invention. The input and output modules are stand-alone systems that provide a sliding tray / tote 391 that slides from the operator side through the module to the other side and presents the DUT for robot pick-up. Some slides may be programmed for various inputs or may categorize at any given time. In one embodiment, there is a display controlled by the microcontroller that indicates to the operator which tote to load or unload. In operation, the operator places the tote or tray on a slide that is extruded and presented to the operator. The operator then presses the flashing key button to move the slide inward into the module housing. On the other side, within the robot's work envelope, during a pick and place operation, a slide with a tray or tote requesting access by the robot is slid out onto the robot's work envelope for access. It is. When the robot picks up or places the DUT, the slide quickly retracts again into the module cabinet. In this manner, at any given time, only the slides required for access by the robot can enter the robot's work envelope. As shown in FIG. 3C, the input / output module may be placed next to a test rack with primitives 330 filled with a DUT (eg, SATA SSD). The input / output module uses a double-ended drawer slide driven by a stepper motor at each station linked to the rack and pinion to slide the table surface outward to the operator or inward to the robot work envelope. .

  FIG. 4 illustrates an automatic workpiece using a three-axis orthogonal industrial robot used to move a DUT device (eg, a solid state drive) to and from a test primitive of a test head, according to one embodiment of the present invention. Indicates a cell. The workcell of FIG. 4 has a single rack 497 containing five primitives 496.

  The Cartesian robot (also referred to as a linear robot) 495 shown in FIG. 4 is an industrial robot, the three main control axes of which are linear (eg, move linearly rather than rotate) and Oriented at right angles. The three sliding joints correspond to wrist movements up and down, inside and outside, and back and forth. In certain manufacturing environments that require low cost work cells, this may be used as an alternative to a 6-axis robot. Orthogonal robot 495 may be programmed to retrieve the DUT from tray 498, move along three linear axes (x, y, z), and move the DUT to the slot of the DIB associated with primitive 496.

  FIG. 5 is an end connected to the end of a robot arm and used to move a DUT device (eg, a solid state drive) to and from test primitives of a test head, according to one embodiment of the present invention. Shows an effector. The end effector 510 is a device or tool that is originally connected to the tip of the robot arm where the robot's hand is located. The end effector is a part of the robot that interacts with the DUT 505. In other words, the end effector is a gripper that is used to grab the DUT using the gripper fingers 520 and move the DUT to and from slots in primitives.

  In one embodiment of the invention, the robot arms (both 6-axis robots and Cartesian robots) have interchangeable grippers. The gripper used depends on the form factor of the device (eg, SATA2.5, M.2 drive, etc.). The robot arm is programmed to approach the tray, pull one or more DUTs out of the tray using grippers, and then slide the one or more DUTs into the test slots of the desired primitive. Different types of DUTs have different specifications and form factors, and grippers may be selected to accommodate differences in size, type, and shape. Also, the robot arm can be programmed so that the gripper can grab the DUT at the desired location. For example, the robot arm may be programmed to allow the gripper to grip the DUT in a location and manner that is less likely to damage the DUT.

  In one embodiment, the gripper has sufficient strength and flexibility to detect the device format. Depending on the type of DUT being tested, the robot or tester knows which gripper needs to be selected, selects the appropriate device gripper, and picks up the DUT and inserts it into the appropriate slot. Can be programmed.

  In another embodiment, the robot or tester is further programmed to use the gripper to determine the orientation of the DUT or the placement of the device in the tray. For example, the DUT may be oriented either vertically or horizontally within the tray. In this embodiment, the robot or tester would be programmed to recognize the orientation of the DUT in the tray and pick up the device at the appropriate contact point based on the determined orientation. For example, the robot can be programmed so that the gripper has access to a DUT tray where there is a depression for human finger access to pick up the DUT, as well as insertion into primitive test slots and primitive testing. During removal from the slot, the gripper can be programmed to grab the DUT at the end of the device.

  FIG. 6 is used to move a DUT device (eg, a solid state drive) to and from a test primitive of a test head connected to the end of a robot arm and according to one embodiment of the present invention. Shows another end effector.

  The end effector shown in FIG. 6 also has a gripper 610 containing a custom mechanical assembly and the equipment required for operation in the workcell. The gripper may include a position sensor for detecting an operation and an optical sensor for detecting the presence or absence of a DUT.

  The end effector of FIG. 6 includes, for example, a laser transducer 630 for measuring the depth of movement. Transducers can also be used during automatic position reference calibration. Part of the function of robot directivity and mechanical registration is the ability to precisely measure the distance between the robot and the effector primitive, which the robot can use for self-correction of the position reference.

  The end effector also has a camera 640 that is used to properly position the gripper on the DUT. The camera is used to achieve a precise position reference while picking up the DUT and placing it in and out of the tote and tray. It can also be used to read and interpret all serial numbers and barcodes from the DUT.

  The gripper 610 moves the gripper finger 660 holding the DUT 620 to be moved. Camera 640 may be used by a tester to grab the DUT at precise contact points without damaging the DUT. The tester has intelligence using predetermined reference points and signals from the camera, and picks up the DUT without damaging the device. Further, the camera 640 can also be used to determine the orientation and placement of the DUT in the tray. The laser transducer 630 can also be used in conjunction with a camera to determine when a DUT needs to be removed from a tray and to insert and remove a DUT from a slot in a primitive.

  In one embodiment, the end effector is motorized, which allows the gripping power of the gripper finger to be adjusted. Gripper fingers 660 may have custom gripping that allows the robot to pick up several different types and form factors of DUTs. In an exemplary embodiment, the parallel grippers of the end effector are designed to hold one DUT form factor at a time. In different embodiments, the end effector is pneumatic. In one embodiment, the end effector may have a pneumatic vacuum suction cup that can pick up a DUT lying flat in a tray.

  In one embodiment, the grippers may be designed to allow for snap-in and bolting of the gripper fingers to accommodate different types of form factors. This involves the use of an automatic gripper change mechanism, which allows the robot to insert a parallel robot gripper into the change station so that a specific product type of robot gripper can be replaced within seconds with a different product type of gripper. Can be replaced. As described above, the tester can be programmed with the intelligence to determine the type of gripper needed and perform this exchange without user intervention.

  In one embodiment, the end effector is a dual end effector that can return a DUT that is currently in a gripper, and then immediately and quickly grab another DUT in a similar gripper. The robot simply needs to twist the wrist 180 ° to direct the gripper to another DUT. This can almost double the throughput of a single gripper. In one embodiment, on a DUT that lays flat in a flat plastic input tray, there is a series of 1-2 suction cups as part of an end effector that the robot can place. Once the DUT has been acquired, the DUT is placed in a temporary fixed exchange station, the final robotic joint is twisted, and picked up again with the necessary grippers to place the DUT into and out of the primitive.

  In one embodiment, a fixed and stable gripper changing station is located on a steel column in front of the robot. The exchange station has an automatic rapid exchange mechanism and various grippers required for handling a particular product. In operation, the robot simply pushes the existing gripper into the station, the gripper exchange mechanism grabs the gripper and removes the gripper from the pneumatic (or motorized) parallel device. The robot then pulls out the empty parallel gripper component, pushes it into different exchange stations, and picks up the different product type grippers needed for the next move. In one embodiment, the exchange station may also have a fixedly mounted barcode scanner that reads the DUT barcode label when the DUT is stable in the gripper. The robot can also scan the DUT as it passes over a barcode reader. In other words, while the device is held at the station, the barcode scanner reads the serial number of the device, either statically or by having the robot scan the device nonstop after the barcode scanner. obtain. In one embodiment, the serial number can be read out electronically (as opposed to using a barcode reader) because the DUT already stores the serial number inside the RAM memory.

  In one embodiment, the fixed exchange station has a plurality of devices that interface with the end effectors that are primarily used to move the DUT from the vacuum cup to the parallel gripper and vice versa. The fixed exchange station also removes one type of product gripper and handles the installation of a different type of product gripper. All of this is done with the motion of the robot within 2 seconds.

  FIG. 7 shows a solid state device (SSD) DUT on a typical flat plastic tray used in customer production facilities. Since the tray shown in FIG. 7 can be delicate, it can easily bend or deform. The DUT is held in a flat orientation. The robot of the present invention can be advantageously programmed to recognize the flat orientation of the DUT, and the end effector uses a vacuum cup to pick up the DUT from the tray where the risk of damage to the DUT is minimized. obtain.

  FIG. 8 shows a solid state device (SSD) DUT placed on a production floor tote. It is made of antistatic cardboard carton or hard plastic. They are demarcated to position the DUT so that the connector is facing down, and the robot gripper accesses the end of the drive where corner contact is allowed.

  The end effector shown in FIG. 6 is thus capable of performing various functions. For example, the end effector may use a vacuum cup to pick up the DUT lying flat outside the tray or to place the DUT flat on the exiting tray (as shown in FIG. 7). obtain. Further, the end effector (as shown in FIG. 8) may use parallel grippers to grip a device that stands vertically in the tote slot. Further, the end effector may use a parallel gripper to push the DUT into the primitive slot location or to grab and pull the DUT out of the primitive. After picking up the DUT with the vacuum cup, for example, the end effector may place the DUT on a parallel gripper at a change station. While the gripper is at the exchange station, the barcode serial number can be read out at the exchange station by a fixed barcode scanner.

  FIG. 9A illustrates a six-axis articulated industrial robot mounted on a height-adjustable Z-axis rectangular platform, according to one embodiment of the present invention. The robot 901 will be mounted on a rectangular platform, which is in fact a height-adjustable Z-axis motion device 902, to orient the robot with respect to the items in the workcell. The motion device 902 is comprised of a precision scissor lift having a high torque stepper motor and associated electronics. The scissor lift can move the entire robot up to access any higher rack height. The 6-axis robot 901 has a long reach, which can be mounted on a height-adjustable Z-axis rectangular platform 902, so that the robot can advantageously access heights that are normally unreachable to human operators. .

  FIG. 9B illustrates a height adjustable Z-axis rectangular scissor lift module in a fully extended configuration, according to one embodiment of the present invention. The scissor lift can be heavy and is therefore composed of its own steel weldment structure. The scissor lift module may have its own electronic components built-in and mainly require power and Ethernet connectivity. The scissor lift operates as its own independent module. Via the local Ethernet, the robot is simply raised or lowered to the specified position as commanded by the system controller. Scissor-active operation results from a high-torque stepper motor driving a thick, narrow-pitch linear screw capable of handling the extremes in weight movement required at the lowest point of operation. . At both the top and bottom, linear slides are used that correspond to the movement required for scissor movement. The stepper motor assembly has built-in clutches and brakes, which perform any downward creep, or any operation during a power loss, specifically when an emergency power down situation is required. Stop. There are optical laser transducers that measure the height of the scissor platform relative to the base and verify that the required operation has been achieved. The lift electronics are comprised of a fanless Windows®-based embedded PC along with a stepper motor indexer.

  FIGS. 10A-10E show how an orthogonal robot retrieves a DUT from a tray and inserts the DUT into a slot of a primitive under computer control according to one embodiment of the present invention. FIG. 10A shows an orthogonal robot moving in x, y, and z planes accessing a vertically oriented DUT on a production floor tote. The robot will typically be programmed with the intelligence to determine the location of the tote and the orientation of the DUT located within the tote. In one embodiment, the location of the tote (eg, x, y, and z coordinates) may be programmed into a tester. As mentioned above, the DUT will be placed with the connector facing down and the robot gripper will access the end of the drive where corner contact is allowed.

  FIG. 10B shows an end effector accessing two DUTs in parallel using two parallel grippers. The robot may move up and down (z-direction) to access the tray and pick up two DUTs at once. In one embodiment, each gripper is mounted at a separate timing. In different embodiments, both grippers can be mounted simultaneously. FIG. 10C shows an orthogonal robot rotating about a pivot point 1002 that allows the robot arm to move in the xy plane to insert a DUT into a primitive slot. Finally, FIGS. 10D and 10E show different views of an end effector inserting two DUTs into vacant slots in a primitive.

  FIG. 11 shows a method in which a work cell is controlled by a PC controller according to an embodiment of the present invention. In one embodiment, the system controller 1102 may be a standard PC and may be configured to manage and perform all operations throughout the workcell. In one embodiment, a dedicated monitor 1104 in each cell may be used to interact with the system controller 1102. In one embodiment, the touch screen monitor 1104 is used to observe and control the direct operation of the automation, which is useful for debugging or further programming for ongoing improvements.

  The system controller determines where all of the DUTs are currently located, prioritizes and optimizes picking and placing conditions, and then sends those command commands to the robot controller 1106, which controls the robot and gripper 1108. I do. After the robot controller performs the operation, the sensor verifies that the operation was successfully completed and sends the newly updated location and status information to the SQL database over the network.

  In one embodiment, the SQL database is configured to receive SQL commands and queries from robot controllers or primitives. It is formatted into a series of tables representing each of the primitive, rack, and all tester socket locations. The information is populated with the current status or presence or absence of the DUT, the appropriate serial number and test result information, and any other information that the factory floor can use to determine the current situation. The SQL database provides a main interface to allow the primitive to understand what the robot is trying to complete at that time and the status of all DUTs on the factory floor. Robot test cell automation places data in a database about the current situation in the robot test cell and reads information placed by primitives during operation. This allows completely asynchronous and independent communication between all items on the factory floor.

  As shown in FIG. 11, in one embodiment, the system controller has a recipe file 1120 that contains all parameters and configuration values needed to perform the workcell with the required performance. In addition, the system controller also has an archive log file 1122 that contains a record of all activity in the workcell. Each action is recorded and time stamped. In addition, the log file contains all serial number exchanges with the DUT and all exchanges with the SQL database.

  FIG. 12 shows all hardware and software necessary for the operation of the workcell according to the embodiment of the present invention. System controller 1102 and monitor 1104 may be used to interface with primitives in a rack. Monitors and system controllers can be directly linked to rack electronics for local control and debugging. The monitor may have an interface 1124 that allows a user to interact directly with the primitives in the rack.

Further, monitor 1104 may have an interface 1226 with an automation package that includes robot controller 1106.
Further, the monitor may also provide control and debug functions. The monitor may also have an HTML web interface 1228 for system control and configuration, monitoring, maintenance, and debugging. Interfaces are typically used on production floors and in factories, and operations may be performed via local intranet 1236.

The monitor may further have an HTML interface 1230 for control and configuration, monitoring, maintenance, and debugging of the system, which may be used outside of the facility, where a user logs in from a remote location, Operations may be performed on workcells via the Internet 1236.
The monitor may also have an HTML web interface 1232 for monitoring the system running on the mobile device.

  The SQL database 1234 described above can be installed by the customer and used for maintenance of internal security protocols at the customer's test site.

  FIG. 13 shows a flowchart of an exemplary computer-implemented process for performing tests on a DUT in a workcell, according to one embodiment of the present invention. However, the invention is not limited to the description provided in flowchart 1300. Rather, it will be apparent to those skilled in the art from the teachings provided herein that other functional flows are within the scope and spirit of the present invention. The flowchart 1300 will be described with continued reference to the exemplary embodiments described above, but the method is not limited to these embodiments.

  In step 1302, the automated test system places the incoming DUT and records the presence or absence of a new DUT in the SQL database. In one embodiment, the serial number of the DUT may be scanned at the switching station.

  In step 1304, the robot prepares the DUT for loading on a test rack. The automated test system queries the SQL database to determine if there are any empty slots in the primitive. In addition, the automated system verifies that the configuration or tester is correct for the particular product being tested, and that the selected slot is online and available.

  In step 1306, the robot loads the DUT into the selected slot. In addition, the test system changes the DUT table location information and status to available in the SQL database so that the tester starts the test process.

  At step 1308, the primitives in the rack continuously poll the SQL DUT table to determine if the socket is full. If the socket is full, the tester sets the status in the SQL database to "Testing" and starts a normal test cycle.

  At step 1310, at the conclusion of the test cycle, the tester updates the status of the DUT in the SQL database, along with pass / fail and other information (eg, classification category).

  At step 1312, the automated test system polls the SQL database and receives the DUT test results. When the tester receives the response, it may retrieve the DUT from the primitive and place the DUT in a particular output bin based on the information received (eg, information about the stored category).

  The foregoing description, for purpose of explanation, has been described with reference to specific embodiments. However, the above illustrative description is not intended to be exhaustive or to limit the invention to the precise forms disclosed. Many modifications and variations are possible in light of the above teaching. The person of ordinary skill in the art will best describe the principles of the invention and its practical applications so that various embodiments with various modifications that may be suitable for the present invention and the particular use contemplated. These embodiments have been selected and described in order to allow the most appropriate utilization.

Claims (27)

A method for performing a test using an automatic test equipment (ATE), the method comprising:
Placing and gripping a device under test (DUT) to be tested;
Recording the presence or absence of the DUT in a database;
Querying the database to determine the presence or absence of empty slots in a primitive that is a modular device having a plurality of slots for testing a plurality of DUTs;
Using a robot to automatically place and insert the DUT into the empty slot;
Reporting to the database that the empty slot has been filled;
Initiating a test of the DUT.   The method of claim 1, wherein the DUT is a solid state drive (SSD).   The method according to claim 1, wherein the primitive is one of a plurality of primitives in a test rack, and wherein the robot is operable to access a slot in the plurality of primitives in the test rack. the method of. The method of claim 1, further comprising updating a status of the DUT in the database based on a result of the test. The method of claim 4, further comprising using the robot to automatically retrieve the DUT from the primitive and return the DUT to a tray.   The method of claim 1, wherein the robot is a six-axis robot.   The method of claim 1, wherein the robot is an orthogonal robot.   The method of claim 1, wherein the robot has an end effector operable to hold and move the DUT to and from a test slot of the primitive.   The method of claim 8, wherein the robot further comprises a camera operable to facilitate accurately picking and placing the DUT.   The method of claim 9, wherein the robot further comprises a laser transducer operable to measure a depth of movement of the end effector. A system for performing a test using an automatic test equipment (ATE), the system comprising:
A robot having an end effector operable to automatically pick up the DUT and to move the primitive into and out of the test slot;
A system controller having a memory and a processor for controlling the robot,
A test rack having a plurality of primitives, each primitive being a modular device including a plurality of slots for testing a plurality of DUTs, and wherein the robot uses the end effector to A test rack configured to automatically access slots of a plurality of primitives.   The system of claim 11, wherein the robot further comprises a camera operable to facilitate picking up and placing the DUT accurately.   The system of claim 12, wherein the robot further comprises a laser transducer operable to measure a depth of movement of the end effector.   The system of claim 11, wherein the robot is a six axis robot.   The system of claim 11, wherein the robot is an orthogonal robot. A monitor connected to the system controller, the monitor being used for observing and controlling the operation of the robot, and further used for debugging problems with the robot. The system of claim 11. An exchange station having a plurality of end effectors, wherein the robot automatically recognizes the form factor of the DUT and is programmed to exchange end effectors at the exchange station according to the form factor of the DUT. The system of claim 11, further comprising: a switching station operable on a switching station. A system for performing a test using an automatic test equipment (ATE), the system comprising:
A robot having an end effector operable to automatically grab, pick up, and move the DUT into and out of the primitive test slot;
An input and output module having a plurality of trays and operable to present a DUT from the plurality of trays to the robot during a test;
A system controller having a memory and a processor for controlling the robot,
A test rack having a plurality of primitives, wherein each primitive is a modular device including a plurality of slots for testing a plurality of DUTs, and wherein the robot is provided in a slot of the plurality of primitives in the test rack. A system comprising: a test rack configured to access.   The robot is operable to be programmed to automatically access the DUT directly from the input and output module trays prior to inserting the DUT into a slot in a designated primitive. Item 19. The system according to Item 18.   20. The system of claim 19, wherein the robot is further operable to retrieve the DUT from the slot and return the DUT to a tray of input and output modules after a test has been performed.   19. The system of claim 18, wherein the robot further comprises a camera operable to facilitate accurately picking and placing the DUT.   22. The system of claim 21, wherein the robot further comprises a laser transducer operable to measure a depth of movement of the end effector.   23. The system of claim 22, wherein the robot further comprises a vacuum cup operable to pick up the DUT lying flat out of the tray and place the DUT flat on the exiting tray.   19. The system according to claim 18, wherein the robot is a six axis robot.   19. The system according to claim 18, wherein said robot is an orthogonal robot.   19. The system of claim 18, wherein a plurality of structural welds are operable to hold the test rack in a stationary position of a workcell.   27. The system of claim 26, wherein the plurality of structural welds secure the robot and the input and output modules to the test rack.