GB2479572A

GB2479572A - Thickness guage for measurement of hot metal plate on the procss line

Info

Publication number: GB2479572A
Application number: GB1006280A
Authority: GB
Inventors: Paul Roderick Hayes Griffin
Original assignee: Individual
Current assignee: Individual
Priority date: 2010-04-15
Filing date: 2010-04-15
Publication date: 2011-10-19
Also published as: GB201006280D0

Abstract

The gauge determines the hot plate thickness from Laser Triangulation Meters (Optical Displacement Sensors), secured within the top and bottom arms of a C-frame gauge for measuring thickness of passing hot metal plate 2. The gauge incorporates automatic calibration for correcting for the effects of temperature, from a certified sample plate 1 secured at the pass line between the gauge throat and the line, and from temperature sensors secured on the C-Frame. These automatically calibrate the measured thickness output in relationship to established distortions in the C-frame. Furthermore, the gauge includes "external" water cooled radiators with insulation and reflectors to prevent heat ingress. Final cold plate thickness is determined by software algorithms with inputs from the temperature sensors in conjunction with calibration off the master sample. Stored hot to cold conversion tables are used to calculate cold thickness.

Description

THICKNESS GAUGE FOR MEASUREMENT OF HOT METAL PLATE ON THE PROCESS LINE

Description

The object of the Gauge is to continually" measure hot metal plate as it passes on a roller table through a C-Frame measuring head and thereby determine the final cold plate thickness to a very high resolution.

The novelty of our design is in both its construction and built-in calibration technique that thereby provides exceptionally high resolution of thickness measurement regardless of changes in both radiant and ambient temperature due to the novel and unique features incorporated in our design as outlined below.

With regard its construction, this Thickness Gauge uniquely incorporates novel external" water cooled radiators, insulation panels and reflectors to isolate it from the radiant heat emitting from the passing hot product. Furthermore, it is constructed such that any frame distortion from the temperature influences is greatly minimised due to the unique geometric cantilever construction of the Gauge. Furthermore, the temperature in the laser chambers (3 & 4) are maintained at a cooled controlled temperature to ensure linear output from the measuring devices within the chambers.

The unique, novel calibration features of the Gauge are as follows: (I) This Gauge is calibrated automatically on entry to the line from ambush position off a Certified master plate sample (to BS Standard) mounted on the nearside of the line at pass line height level.

(ii) The temperature level at critical points within the measuring C-Frame are measured by temperature measuring devices. From prior individual bench soaking of the Gauge Frame, any distortions in the frame with changing temperature are known and fed into the Gauge Controller and thereby automatically calibrates its measured output to give true thickness value.

(iii) In addition, the temperature of the Master Sample is monitored by an attached temperature measuring device and thereby its expansionlcontraction relative to ambient temperature is fed to the Gauge Controller to compensate for this change.

The sequence in which this Gauge automatically calibrates the determined thickness output is as follows: A. The Gauge is powered onto the line and as it enters the outputs from the measuring Lasers (3 & 4) are automatically calibrated from a certified master plate (1) prior to the Gauge measuring off the hot plate (2) passing between the C-Frame.

B. Once in position over the line with the hot plate (2) passing through, the C-Frame temperature measuring devices secured to the master (5) and the top and bottom arms (6 & 7), as well as the vertical arm (8 & 9) are evaluated and the Gauge PC automatically calibrates from pre-calibrated and known C-Frame distortion due to the current radiant/direct temperature/heat.

C. At the same time from the stored values in the Controller of the known expansion curves for the various metal alloys the Gauge converts the hot thickness value and automatically outputs the expected cold" thickness value.

This Thickness Gauge therefore can be mounted in an exposed harsh working environment as a result of the above novel automatic calibration features provides exceptionally high resolution determined cold plate thickness values off the hot plate on-line" as the hot plate is passing.

Known Patent Applications From Other Parties The following Patented Thickness Gauge applications listed below have been reviewed and we highlight why our Patent Application totally differs from these Patents on file as a result of its unique features.

Patent Alication No. JP1 0307008 A 19981117 -Toshiba -The calibration of this Gauge takes place (before) actual measurement off a moving sample on a random" basis by comparison" to a sample.

Whereas My Patent Application refers to a Gauge where the calibration takes place whilst" measurement is being done as well as having an input off a "fixed" master for "correction" of thickness value as a continuous "process." Patent Application No. DEl 0060144 Al 20020613 -Der DillinQer -This Gauge operates by reference to "individual master datum target plates" secured to each arm as an "independent" reference for each Sensor.

Whereas My Patent Application refers to a Gauge that operates by reference to a single master plate sample at the pass line providing "true thickness distortion." Patent Application No. JP5223526 A 19930831 -Hitachi -This Gauge operates by reflection and range finding" Laser beam with reference to temperature distortion off only the sample" Whereas My Patent Application refers to a Gauge that measures by trigonometry angle of calculation of determined distance and from temperature distortions measured from both the sample and from the actual C-Frame itself.

Patent Application No. JP3421646 B2 B2 20030630-Mesian -This Gauge operates with reference to temperature distortion in arms with no reference to master sample.

Whereas My Patent Application refers to a Gauge which is automatically calibrated from a Master Certified plate sample secured at the pass-line.

Patent Application No. 301 B 11/02 B23K 26/08 -LCTEC -This Gauge is designed purely for measuring the depth or profile of flatness of a die tool.

Whereas My Patent Application refers to a Gauge for measuring hot plate thickness.

Parent Application No. JP91 594348 A 19970620 -Yamabun Denki -This Gauge requires mounting of the Sensors within a temperature controlled chamber.

Whereas My Patent Application refers to a Gauge that is specifically designed to mount in the open in a non-temperature controlled environment.

Summary

In conclusion, the Gauge for which I have put forward a Patent Application incorporates unique novel features, not available from any of the Gauges Patented above. Claim