DE60115909D1 - Reinigungsmittelzusammensetzung - Google Patents
ReinigungsmittelzusammensetzungInfo
- Publication number
- DE60115909D1 DE60115909D1 DE60115909T DE60115909T DE60115909D1 DE 60115909 D1 DE60115909 D1 DE 60115909D1 DE 60115909 T DE60115909 T DE 60115909T DE 60115909 T DE60115909 T DE 60115909T DE 60115909 D1 DE60115909 D1 DE 60115909D1
- Authority
- DE
- Germany
- Prior art keywords
- detergent composition
- detergent
- composition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000003599 detergent Substances 0.000 title 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/34—Organic compounds containing sulfur
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/0005—Other compounding ingredients characterised by their effect
- C11D3/0042—Reducing agents
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/02—Inorganic compounds
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/26—Organic compounds containing oxygen
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/26—Organic compounds containing oxygen
- C11D7/265—Carboxylic acids or salts thereof
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/26—Organic compounds containing oxygen
- C11D7/268—Carbohydrates or derivatives thereof
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23G—CLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
- C23G1/00—Cleaning or pickling metallic material with solutions or molten salts
- C23G1/14—Cleaning or pickling metallic material with solutions or molten salts with alkaline solutions
- C23G1/20—Other heavy metals
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Life Sciences & Earth Sciences (AREA)
- Organic Chemistry (AREA)
- Wood Science & Technology (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Health & Medical Sciences (AREA)
- Emergency Medicine (AREA)
- Metallurgy (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Molecular Biology (AREA)
- Inorganic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Detergent Compositions (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000181141 | 2000-06-16 | ||
JP2000181141 | 2000-06-16 | ||
PCT/JP2001/005091 WO2001097268A1 (fr) | 2000-06-16 | 2001-06-14 | Composion detergente |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60115909D1 true DE60115909D1 (de) | 2006-01-19 |
DE60115909T2 DE60115909T2 (de) | 2006-09-07 |
Family
ID=18682119
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60115909T Expired - Lifetime DE60115909T2 (de) | 2000-06-16 | 2001-06-14 | Reinigungsmittelzusammensetzung |
Country Status (5)
Country | Link |
---|---|
US (1) | US7396806B2 (de) |
EP (1) | EP1310989B1 (de) |
KR (2) | KR20030007969A (de) |
DE (1) | DE60115909T2 (de) |
WO (1) | WO2001097268A1 (de) |
Families Citing this family (40)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100410611B1 (ko) * | 2001-04-03 | 2003-12-18 | 동우 화인켐 주식회사 | 스트립후 세정제 |
TWI295076B (en) * | 2002-09-19 | 2008-03-21 | Dongwoo Fine Chem Co Ltd | Washing liquid for semiconductor substrate and method of producing semiconductor device |
KR100974034B1 (ko) * | 2002-11-08 | 2010-08-04 | 와코 쥰야꾸 고교 가부시키가이샤 | 세정액 및 이것을 이용한 세정방법 |
TWI286679B (en) | 2003-06-04 | 2007-09-11 | Kao Corp | Removing agent composition |
TWI362415B (en) * | 2003-10-27 | 2012-04-21 | Wako Pure Chem Ind Ltd | Novel detergent and method for cleaning |
KR100593668B1 (ko) | 2004-01-20 | 2006-06-28 | 삼성전자주식회사 | 세정액 조성물 및 이를 이용한 반도체 장치의 세정방법 |
US7087564B2 (en) * | 2004-03-05 | 2006-08-08 | Air Liquide America, L.P. | Acidic chemistry for post-CMP cleaning |
EP1609847B1 (de) * | 2004-06-25 | 2007-03-21 | JSR Corporation | Reinigungszusammensetzung für Halbleiterkomponente und Verfahren zur Herstellung eines Halbleitergeräts |
JP2006016438A (ja) * | 2004-06-30 | 2006-01-19 | Dongwoo Fine-Chem Co Ltd | 電子部品洗浄液 |
JP4792396B2 (ja) * | 2004-08-31 | 2011-10-12 | 三洋化成工業株式会社 | 界面活性剤 |
US7674725B2 (en) | 2005-05-25 | 2010-03-09 | Freescale Semiconductor, Inc. | Treatment solution and method of applying a passivating layer |
JP2007220891A (ja) * | 2006-02-16 | 2007-08-30 | Toshiba Corp | ポストcmp処理液、およびこれを用いた半導体装置の製造方法 |
JP4140923B2 (ja) * | 2006-03-31 | 2008-08-27 | 花王株式会社 | 洗浄剤組成物 |
US7772128B2 (en) * | 2006-06-09 | 2010-08-10 | Lam Research Corporation | Semiconductor system with surface modification |
US9058975B2 (en) * | 2006-06-09 | 2015-06-16 | Lam Research Corporation | Cleaning solution formulations for substrates |
US8685909B2 (en) | 2006-09-21 | 2014-04-01 | Advanced Technology Materials, Inc. | Antioxidants for post-CMP cleaning formulations |
TWI498422B (zh) * | 2007-05-17 | 2015-09-01 | Entegris Inc | 用於化學機械研磨後(post-CMP)清洗配方之新穎抗氧化劑 |
US20090270299A1 (en) * | 2008-04-23 | 2009-10-29 | Nissan Chemical Industries, Ltd. | Composition for removing protective layer in fabrication of MEMS and method for removing same |
KR101752684B1 (ko) | 2008-10-21 | 2017-07-04 | 엔테그리스, 아이엔씨. | 구리 세척 및 보호 조성물 |
US8765653B2 (en) | 2009-07-07 | 2014-07-01 | Air Products And Chemicals, Inc. | Formulations and method for post-CMP cleaning |
JP5515588B2 (ja) * | 2009-10-05 | 2014-06-11 | 栗田工業株式会社 | ウエハ用洗浄水及びウエハの洗浄方法 |
US8148311B2 (en) * | 2009-10-24 | 2012-04-03 | Wai Mun Lee | Composition and method for cleaning semiconductor substrates comprising an alkyl diphosphonic acid |
US8431516B2 (en) | 2009-10-24 | 2013-04-30 | Wai Mun Lee | Composition and method for cleaning semiconductor substrates comprising an alkyl diphosphonic acid |
KR101645036B1 (ko) * | 2009-10-29 | 2016-08-03 | 동우 화인켐 주식회사 | 웨이퍼 다이싱용 세정제 조성물 |
CL2010000487A1 (es) * | 2010-05-13 | 2011-04-08 | Univ Santiago Chile | Procedimiento para obtener electrodo de carbono desde desechos de pilas acidos que comprende extraer carbon de la pila, sacar recubrimiento, hervir, lavar, lijar y lavar hasta no obtener residuo, sonicar, lavar con solvente altamente apolar, sonicar y lavar con solventes organicos, hervir a ph acido y pulir. |
JP5948758B2 (ja) * | 2010-08-31 | 2016-07-06 | 三菱化学株式会社 | 半導体デバイス用基板洗浄液及び洗浄方法 |
JP5659729B2 (ja) * | 2010-11-24 | 2015-01-28 | 三菱瓦斯化学株式会社 | フォトレジスト剥離剤組成物 |
JP6066552B2 (ja) * | 2011-12-06 | 2017-01-25 | 関東化學株式会社 | 電子デバイス用洗浄液組成物 |
US9133426B2 (en) * | 2012-05-14 | 2015-09-15 | Ecolab Usa Inc. | Label removal solution for returnable beverage bottles |
KR101467270B1 (ko) * | 2013-11-07 | 2014-12-01 | 에이케이켐텍 주식회사 | 계면활성제 미포함 플럭스 제거용 수계 세정제 조성물 |
KR102261638B1 (ko) | 2013-11-15 | 2021-06-08 | 삼성디스플레이 주식회사 | 세정제 조성물 및 이를 이용한 금속배선 제조방법 |
KR101670239B1 (ko) * | 2014-10-31 | 2016-10-28 | 엘티씨에이엠 주식회사 | 포스트-에칭 포토레지스트 에칭 중합체 및 잔류물을 제거하기 위한 스트리퍼 조성물 |
US10988718B2 (en) | 2016-03-09 | 2021-04-27 | Entegris, Inc. | Tungsten post-CMP cleaning composition |
JP6697362B2 (ja) * | 2016-09-23 | 2020-05-20 | 株式会社フジミインコーポレーテッド | 表面処理組成物、ならびにこれを用いた表面処理方法および半導体基板の製造方法 |
KR101984468B1 (ko) * | 2018-04-09 | 2019-05-30 | 한남대학교 산학협력단 | 친환경 세척제 |
US11560533B2 (en) | 2018-06-26 | 2023-01-24 | Versum Materials Us, Llc | Post chemical mechanical planarization (CMP) cleaning |
CN113412324B (zh) | 2018-12-03 | 2022-12-02 | 富士胶片电子材料美国有限公司 | 蚀刻组合物 |
EP4204529A4 (de) | 2020-08-28 | 2024-10-02 | Versum Mat Us Llc | Reinigung nach einer chemisch-mechanischen planarisierung (cmp) |
JP2024536512A (ja) * | 2021-10-12 | 2024-10-04 | フジフイルム エレクトロニック マテリアルズ ユー.エス.エー., インコーポレイテッド | エッチング組成物 |
WO2023211110A1 (ko) * | 2022-04-27 | 2023-11-02 | (주)엠티아이 | 메탈 마스크 세정용 조성물 및 이를 이용한 세정 방법 |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4810405A (en) * | 1987-10-21 | 1989-03-07 | Dearborn Chemical Company, Limited | Rust removal and composition thereof |
US5192460A (en) * | 1988-02-10 | 1993-03-09 | Colgate-Palmolive Company | Safe acidic hard surface cleaner |
JPH0244355A (ja) * | 1988-08-05 | 1990-02-14 | Fuji Photo Film Co Ltd | ハロゲン化銀カラー写真感光材料の処理方法 |
TW263531B (de) * | 1992-03-11 | 1995-11-21 | Mitsubishi Gas Chemical Co | |
US5607718A (en) * | 1993-03-26 | 1997-03-04 | Kabushiki Kaisha Toshiba | Polishing method and polishing apparatus |
JPH07247500A (ja) | 1994-03-09 | 1995-09-26 | Mitsubishi Gas Chem Co Inc | 半導体装置用洗浄剤及び配線パターンの形成方法 |
JP3397501B2 (ja) * | 1994-07-12 | 2003-04-14 | 株式会社東芝 | 研磨剤および研磨方法 |
US5612304A (en) * | 1995-07-07 | 1997-03-18 | Olin Microelectronic Chemicals, Inc. | Redox reagent-containing post-etch residue cleaning composition |
US5700383A (en) * | 1995-12-21 | 1997-12-23 | Intel Corporation | Slurries and methods for chemical mechanical polish of aluminum and titanium aluminide |
TW416987B (en) | 1996-06-05 | 2001-01-01 | Wako Pure Chem Ind Ltd | A composition for cleaning the semiconductor substrate surface |
US6030932A (en) * | 1996-09-06 | 2000-02-29 | Olin Microelectronic Chemicals | Cleaning composition and method for removing residues |
US6265781B1 (en) * | 1996-10-19 | 2001-07-24 | Micron Technology, Inc. | Methods and solutions for cleaning polished aluminum-containing layers, methods for making metallization structures, and the structures resulting from these methods |
US6242407B1 (en) * | 1996-11-22 | 2001-06-05 | The Procter & Gamble Company | Laundry bleaching compositions |
JPH10289891A (ja) | 1997-04-11 | 1998-10-27 | Mitsubishi Gas Chem Co Inc | 半導体回路用洗浄剤及びそれを用いた半導体回路の製造方法 |
US6734155B1 (en) * | 1997-07-09 | 2004-05-11 | The Procter & Gamble Company | Cleaning compositions comprising an oxidoreductase |
JPH11138113A (ja) | 1997-11-06 | 1999-05-25 | Kurita Water Ind Ltd | 微粒子の除去方法 |
US6372699B1 (en) | 1997-12-22 | 2002-04-16 | Kurita Water Industries Ltd. | Cleaning solution for electronic materials and method for using same |
JPH11251280A (ja) | 1998-03-04 | 1999-09-17 | Nippon Steel Corp | 半導体基板の洗浄方法 |
PT1105778E (pt) * | 1998-05-18 | 2009-09-23 | Mallinckrodt Baker Inc | Composições alcalinas contendo silicato para limpeza de substratos microelectrónicos |
JP3111979B2 (ja) | 1998-05-20 | 2000-11-27 | 日本電気株式会社 | ウエハの洗浄方法 |
JP4014741B2 (ja) | 1998-11-17 | 2007-11-28 | 株式会社フジミインコーポレーテッド | リンス用組成物 |
US6395693B1 (en) * | 1999-09-27 | 2002-05-28 | Cabot Microelectronics Corporation | Cleaning solution for semiconductor surfaces following chemical-mechanical polishing |
US6413923B2 (en) * | 1999-11-15 | 2002-07-02 | Arch Specialty Chemicals, Inc. | Non-corrosive cleaning composition for removing plasma etching residues |
US6492308B1 (en) * | 1999-11-16 | 2002-12-10 | Esc, Inc. | Post chemical-mechanical planarization (CMP) cleaning composition |
-
2001
- 2001-06-14 WO PCT/JP2001/005091 patent/WO2001097268A1/ja active IP Right Grant
- 2001-06-14 EP EP01941051A patent/EP1310989B1/de not_active Expired - Lifetime
- 2001-06-14 DE DE60115909T patent/DE60115909T2/de not_active Expired - Lifetime
- 2001-06-14 US US10/311,471 patent/US7396806B2/en not_active Expired - Fee Related
- 2001-06-14 KR KR1020027017099A patent/KR20030007969A/ko not_active Application Discontinuation
- 2001-06-14 KR KR1020087000669A patent/KR100867287B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR100867287B1 (ko) | 2008-11-06 |
EP1310989A1 (de) | 2003-05-14 |
US20030158059A1 (en) | 2003-08-21 |
EP1310989B1 (de) | 2005-12-14 |
US7396806B2 (en) | 2008-07-08 |
KR20030007969A (ko) | 2003-01-23 |
DE60115909T2 (de) | 2006-09-07 |
EP1310989A4 (de) | 2003-07-16 |
KR20080011243A (ko) | 2008-01-31 |
WO2001097268A1 (fr) | 2001-12-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |