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DE3483371D1 - Abschirmung fuer optischen fuehler. - Google Patents

Abschirmung fuer optischen fuehler.

Info

Publication number
DE3483371D1
DE3483371D1 DE8484302329T DE3483371T DE3483371D1 DE 3483371 D1 DE3483371 D1 DE 3483371D1 DE 8484302329 T DE8484302329 T DE 8484302329T DE 3483371 T DE3483371 T DE 3483371T DE 3483371 D1 DE3483371 D1 DE 3483371D1
Authority
DE
Germany
Prior art keywords
shielding
optical probe
probe
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8484302329T
Other languages
English (en)
Inventor
Yoshihiro C O Fujitsu Miyamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP58061754A external-priority patent/JPS59186364A/ja
Priority claimed from JP58061753A external-priority patent/JPS59186363A/ja
Priority claimed from JP58062659A external-priority patent/JPS59188171A/ja
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of DE3483371D1 publication Critical patent/DE3483371D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/06—Restricting the angle of incident light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J5/061—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0216—Coatings
    • H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02162—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors
    • H01L31/02164—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors for shielding light, e.g. light blocking layers, cold shields for infrared detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/28—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using photoemissive or photovoltaic cells
    • G01J2005/283—Array
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00—Stock material or miscellaneous articles
    • Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
    • Y10T428/24149—Honeycomb-like
    • Y10T428/24165—Hexagonally shaped cavities

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Radiation Pyrometers (AREA)
DE8484302329T 1983-04-07 1984-04-05 Abschirmung fuer optischen fuehler. Expired - Fee Related DE3483371D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP58061754A JPS59186364A (ja) 1983-04-07 1983-04-07 冷却型光電変換装置
JP58061753A JPS59186363A (ja) 1983-04-07 1983-04-07 冷却型光電変換装置
JP58062659A JPS59188171A (ja) 1983-04-08 1983-04-08 冷却型光電変換装置

Publications (1)

Publication Number Publication Date
DE3483371D1 true DE3483371D1 (de) 1990-11-15

Family

ID=27297622

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484302329T Expired - Fee Related DE3483371D1 (de) 1983-04-07 1984-04-05 Abschirmung fuer optischen fuehler.

Country Status (3)

Country Link
US (1) US4609820A (de)
EP (1) EP0125016B1 (de)
DE (1) DE3483371D1 (de)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2586292B1 (fr) * 1985-08-13 1989-02-03 Thomson Csf Barrette de detecteurs infrarouge comportant un ecran froid a angle de vue constant
JPS63176A (ja) * 1986-06-19 1988-01-05 Honda Motor Co Ltd 複合型光センサ
FR2613831B1 (fr) * 1987-04-10 1993-09-17 Trt Telecom Radio Electr Procede pour ameliorer les performances d'une mosaique de detecteurs dont tous les elements n'ont pas le meme champ de vue
US4814620A (en) * 1987-12-01 1989-03-21 Honeywell Inc. Tilted array with parallel cold shield
US4898435A (en) * 1988-06-24 1990-02-06 Honeywell Inc. Dark mirror coated prism
IL87640A (en) * 1988-09-01 1991-12-12 Israel Atomic Energy Comm Infra-red sensing system
DE3908627A1 (de) * 1989-03-16 1990-09-20 Bodenseewerk Geraetetech Infrarotdetektor
US5378892A (en) * 1990-09-28 1995-01-03 Martin Marietta Corporation Angle filter for use in an infrared optical system
US5288537A (en) * 1992-03-19 1994-02-22 Hexcel Corporation High thermal conductivity non-metallic honeycomb
DE4214036A1 (de) * 1992-04-29 1993-11-04 Abb Patent Gmbh Vorrichtung zum empfang von fokussierter lichtstrahlung
US5466507A (en) * 1993-10-14 1995-11-14 Hexcel Corporation High thermal conductivity non-metallic honeycomb with laminated cell walls
US5470633A (en) * 1993-10-14 1995-11-28 Hexcel Corporation High thermal conductivity non-metallic honeycomb with optimum pitch fiber angle
US5527584A (en) * 1993-10-19 1996-06-18 Hexcel Corporation High thermal conductivity triaxial non-metallic honeycomb
US6593213B2 (en) * 2001-09-20 2003-07-15 Heliovolt Corporation Synthesis of layers, coatings or films using electrostatic fields
US7060991B2 (en) * 2002-04-11 2006-06-13 Reilly Thomas L Method and apparatus for the portable identification of material thickness and defects along uneven surfaces using spatially controlled heat application
DE102005048022A1 (de) * 2005-10-06 2007-02-01 Siemens Ag Messkopf für ein Leuchtdichte- und/oder Chroma-Messgerät
US20070160763A1 (en) * 2006-01-12 2007-07-12 Stanbery Billy J Methods of making controlled segregated phase domain structures
US8084685B2 (en) * 2006-01-12 2011-12-27 Heliovolt Corporation Apparatus for making controlled segregated phase domain structures
KR20090101084A (ko) * 2008-03-21 2009-09-24 후지논 가부시키가이샤 촬상 필터
US20100258180A1 (en) * 2009-02-04 2010-10-14 Yuepeng Deng Method of forming an indium-containing transparent conductive oxide film, metal targets used in the method and photovoltaic devices utilizing said films
EP2430209A1 (de) * 2009-06-05 2012-03-21 Heliovolt Corporation Verfahren zur synthetisierung eines dünnfilms oder einer verbindungsschicht mittels kontaktloser druckeinschliessung
US8256621B2 (en) * 2009-09-11 2012-09-04 Pro-Pak Industries, Inc. Load tray and method for unitizing a palletized load
US8021641B2 (en) * 2010-02-04 2011-09-20 Alliance For Sustainable Energy, Llc Methods of making copper selenium precursor compositions with a targeted copper selenide content and precursor compositions and thin films resulting therefrom
WO2011146115A1 (en) 2010-05-21 2011-11-24 Heliovolt Corporation Liquid precursor for deposition of copper selenide and method of preparing the same
US9142408B2 (en) 2010-08-16 2015-09-22 Alliance For Sustainable Energy, Llc Liquid precursor for deposition of indium selenide and method of preparing the same
US9006655B2 (en) * 2011-12-22 2015-04-14 Fluke Corporation Thermal imager with protective grid
US9105797B2 (en) 2012-05-31 2015-08-11 Alliance For Sustainable Energy, Llc Liquid precursor inks for deposition of In—Se, Ga—Se and In—Ga—Se
DE102017201129A1 (de) * 2017-01-25 2018-07-26 Robert Bosch Gmbh Bauelement zum Begrenzen eines Einfallswinkels von Licht, Mikrospektrometer und Verfahren zum Herstellen des Bauelements
KR102709153B1 (ko) * 2017-01-26 2024-09-25 주식회사 아모센스 센서 패키지용 윈도우 커버

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3105428A (en) * 1961-06-12 1963-10-01 Bell & Howell Co Backlighting and reflectance error compensation devices
CH525495A (de) * 1971-05-03 1972-07-15 Contraves Ag Wandstruktur zur Bildung einer Gehäuseoberfläche mit vorbestimmten Absorptions- und Emissionseigenschaften für elektromagnetische Strahlung
US4027160A (en) * 1971-05-18 1977-05-31 The United States Of America As Represented By The Secretary Of The Army Infrared detection system with parallel strip reticle means
US3942008A (en) * 1974-12-23 1976-03-02 The United States Of America As Represented By The Secretary Of The Army Thermal imaging device
US3963926A (en) * 1975-01-09 1976-06-15 Texas Instruments Incorporated Detector cold shield
US3996599A (en) * 1975-03-19 1976-12-07 The United States Of America As Represented By The Secretary Of The Army Image detector with background suppression
US4360797A (en) * 1978-05-02 1982-11-23 The United States Of America As Represented By The United States Department Of Energy Coded aperture imaging with uniformly redundant arrays
JPS57142526A (en) * 1981-02-27 1982-09-03 Fujitsu Ltd Infrared detector
US4431918A (en) * 1981-03-27 1984-02-14 Honeywell Inc. Etchable glass cold shield for background limited detectors
US4446372A (en) * 1981-07-01 1984-05-01 Honeywell Inc. Detector cold shield
US4485305A (en) * 1981-08-20 1984-11-27 Sanyo Electric Co., Ltd. Infrared detector with vibrating chopper

Also Published As

Publication number Publication date
US4609820A (en) 1986-09-02
EP0125016A2 (de) 1984-11-14
EP0125016A3 (en) 1987-02-04
EP0125016B1 (de) 1990-10-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee