CN108957045A - Automatic testing device - Google Patents
Automatic testing device Download PDFInfo
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- CN108957045A CN108957045A CN201810896271.8A CN201810896271A CN108957045A CN 108957045 A CN108957045 A CN 108957045A CN 201810896271 A CN201810896271 A CN 201810896271A CN 108957045 A CN108957045 A CN 108957045A
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- 238000012360 testing method Methods 0.000 title claims abstract description 87
- 238000001514 detection method Methods 0.000 claims abstract description 124
- 238000012546 transfer Methods 0.000 claims abstract description 88
- 239000000463 material Substances 0.000 claims abstract description 65
- 238000007689 inspection Methods 0.000 claims abstract description 6
- 230000005693 optoelectronics Effects 0.000 claims description 78
- 230000005540 biological transmission Effects 0.000 claims description 13
- 210000002421 cell wall Anatomy 0.000 claims description 12
- 239000000523 sample Substances 0.000 claims description 9
- 230000006835 compression Effects 0.000 claims description 5
- 238000007906 compression Methods 0.000 claims description 5
- 238000000034 method Methods 0.000 abstract description 3
- 238000007599 discharging Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012797 qualification Methods 0.000 description 3
- 230000005484 gravity Effects 0.000 description 2
- 230000005622 photoelectricity Effects 0.000 description 2
- 238000004378 air conditioning Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention relates to the technical field of photoelectric switches and discloses an automatic testing device which comprises a detection table, wherein the detection table comprises a working table top, and the working table top is provided with a feeding space, a loading space, a detection station and a discharging station; the feeding space comprises a feeding station and a first material pipe storage station, and the feeding space comprises a feeding station and a second material pipe storage station; the automatic detection device further comprises a pushing assembly, a first material pipe transfer assembly, a detection assembly, a chip transfer assembly, a loading assembly, a second material pipe transfer assembly and a control module. Above-mentioned automatic testing arrangement has realized the automated inspection to photoelectric switch's chip, has improved detection efficiency, and has carried out no photocurrent detection to photoelectric switch's chip, has effectively prevented the condition that the pin of photoelectric switch's chip warp simultaneously in the test process.
Description
Technical field
The present invention relates to optoelectronic switch technical field, in particular to a kind of automatic testing equipment.
Background technique
Optoelectronic switch limits as all kinds of moving components, one of the effective sensor of closed loop feedback signal, in all trades and professions
With extensive.Key sensor in place whether is slided as its sliding door in air-conditioning, directly influences the normal work of complete machine
Make.The forward current of input, the output of its chip, reverse current are joined without photoelectric current, collector current and saturation voltage etc.
Number, belongs to the required content and Key Quality Indicator of factory, incoming test.At present for such parameter testing, by transistor
Characteristic demonstrator is manually tested, and there are testing efficiencies, which lowly, without photoelectric current to be unable to test and test, leads to pin deformation
Situation.
Summary of the invention
The present invention provides a kind of automatic testing equipment, above-mentioned automatic testing equipment is realized to the chip of optoelectronic switch
Automatic detection, improves detection efficiency, and carried out unglazed current detecting to the chip of optoelectronic switch, while effectively preventing surveying
During examination the case where the pin deformation of the chip of optoelectronic switch.
In order to achieve the above objectives, the present invention the following technical schemes are provided:
A kind of automatic testing equipment is detected automatically for the chip to optoelectronic switch, including monitor station, monitor station packet
Include work top, work top have upper material space, stocking space, detection station, to loading station, discharge station;Feeding is empty
Between include that feeding station and the first expects pipe for store the empty expects pipe for unload chip store station, stocking space is including charging
Station and the second expects pipe for storing the expects pipe for being fully loaded with qualified chip store station;
For the chip being in the expects pipe of feeding station to be pushed to the pushing material component of detection station;
The first expects pipe for the empty expects pipe for unsnatching chip at feeding station to be transferred to the first expects pipe storage station shifts
Component;
Detection components for being detected to the chip at detection station;
For will test qualified chip is detected at station be transferred to loading station and will test detection at station and do not conform to
Lattice chip is transferred to the chip transfer assembly of discharge station;
For the charging component to loading station, chip push-in in the expects pipe of loading station will to be in;
For the expects pipe for filling chip on loading station to be transferred to the second expects pipe transfer group of the second expects pipe storage station
Part;
Control module, with the pushing material component, the first expects pipe transfer assembly, detection components, chip transfer assembly, charging group
Part, the connection of the second expects pipe transfer assembly signal, to control the pushing material component, the first expects pipe transfer assembly, detection components, chip
Transfer assembly, charging component, the movement of the second expects pipe transfer assembly.
The expects pipe for filling optoelectronic switch to be measured in use, is put into upper material space first by above-mentioned automatic testing equipment
Feeding station in, the optoelectronic switch in the expects pipe in feeding station is then pushed to detection station by pushing material component and is examined
It surveys, the blank pipe after optoelectronic switch has been unloaded in feeding station is transferred to the first expects pipe storage station by the first expects pipe transfer assembly,
Qualified optoelectronic switch is detected in detection station, and the position opposite with the loading station of stocking space is transferred to through chip transfer assembly
It postpones by being turned after the empty expects pipe in loading station is filled by the second expects pipe in the empty expects pipe in charging component push-in loading station
It moves component and the expects pipe for filling qualified chip is transferred to the second expects pipe storage station;Underproof photoelectricity is opened after detection station detection
It closes and is transferred to discharge station through chip transfer assembly, above-mentioned automatic testing equipment completes the automatic inspection to the chip of optoelectronic switch
It surveys, has been completed at the same time the categorised collection to qualified optoelectronic switch and underproof optoelectronic switch, qualified optoelectronic switch is filled
Feeding pipe is shifted underproof optoelectronic switch onto discharge station and is collected, and wherein control module is responsible for and the pusher group
Part, the first expects pipe transfer assembly, detection components, chip transfer assembly, charging component, the connection of the second expects pipe transfer assembly signal,
And it controls the pushing material component, the first expects pipe transfer assembly, detection components, chip transfer assembly, charging component, the second expects pipe and turns
Move component movement;After booting is powered, control module receives the photoelectric switching signal of each section, determines pushing material component, the first expects pipe
Transfer assembly, detection components, chip transfer assembly, charging component, whether standby mode is good for the second expects pipe transfer assembly.It is standby
After normal, the optoelectronic switch to be measured in feeding station is pushed into detection station by driving pushing material component, and driving detection components are surveyed
Examination, and carry out qualified or not judgement and movement.The signal of reception each section is repeated, repeats to drive action of each part.It is achieved in
Automatic detection to the chip of optoelectronic switch, saves manpower and greatly improves work efficiency.
Preferably, it is provided on the work top along first direction arrangement and the first limit plate being oppositely arranged and second
Limit plate, first limit plate and the second limit plate are perpendicular to the work top, and first limit plate is towards described
The surface of two limit plates is formed with that extending direction is vertical with the work top and orientation is vertical with the first direction
First groove, the second groove, third groove and the 4th groove, surface shape of second limit plate towards first limit plate
At have extending direction with the work top vertical and orientation fiveth groove vertical with the first direction, the 6th recessed
Slot, the 7th groove and the 8th groove are formed with the first expects pipe storing name between first groove and the 5th groove
Position, is formed with the feeding station between second groove and the 6th groove, the third groove and the described 7th recessed
It is formed with the loading station between slot, the second expects pipe storage is formed between the 4th groove and the 8th groove
Station;The detection station is located at the side that first limit plate deviates from second limit plate, and second groove
Slot bottom is formed through the discharge port of the first limit plate thickness, and the slot bottom of the third groove is formed through described first
Limit the feed inlet of plate thickness.
Preferably, between first groove and second groove shared cell wall and the work top, described the
Between three grooves and the 4th groove shared cell wall and the work top, the 5th groove and the 6th groove it is total
Between cell wall and the work top, the cell wall and the work top that the 7th groove and the 8th groove are shared
Between be equipped with for expects pipe transfer expects pipe transfering channel.
Preferably, the slot bottom of the 6th groove is equipped with pusher mouthful, and the pushing material component includes:
Second limit plate is set to lead away from first limit plate side and along what the first direction extended
Rail;
The through position of the guide rail can be slidingly arranged at along the guide rail;
Be installed on the through position and for being protruded into from the pusher mouthful in the expects pipe stored in the feeding station the
One pusher ruler;
Drive the pusher driving assembly of through position's movement.
Preferably, the pusher driving assembly includes:
It is installed on the transmission chain of the monitor station, the through position is installed on the transmission chain;
Drive the stepper motor of the transmission chain movement.
Preferably, the first pusher ruler and the through position connection one end and the through position between be equipped with spring and
For detecting the optoelectronic switch of the first pusher ruler position.
Preferably, the monitor station is equipped with through its thickness direction and along first extended perpendicular to the first direction
Sliding slot;The first expects pipe transfer assembly includes:
At least one is located at the monitor station away from the work top side and can be along perpendicular to the feeding station
Extending direction and the direction for being parallel to work top are set to the first part of the monitor station, in each described first part
Equipped with the second part that can be acted along the direction perpendicular to the work top;When the second part is in running order,
A part of the second part passes through the first sliding groove to be higher by the work top, packs up when the second part is in
When state, the second part is not higher than the work top;
It is installed on the monitor station and the first driving device for driving first part's movement.
Preferably, the first driving device includes cylinder or lead screw assembly, and the first part includes sliding block.
Preferably, the first driving device deviates from the connecting rod of the work top side by being set to the monitor station
The monitor station is fixed on far from the connecting plate of the monitor station side with the connecting rod is set to.
Preferably, the first card slot is formed on the slot bottom of first groove, and the slot bottom of the 5th groove is equipped with
Second card slot, first card slot and the second card slot are formed for limiting the expects pipe in the first expects pipe storage station to close to described
The unidirectional back-off mechanism of work top direction movement, the automatic testing equipment further include that at least one is used for first material
Empty expects pipe edge in pipe storage station is pushed perpendicular to the workbench away from the work top direction so that empty expects pipe
With the third expects pipe transfer assembly of the unidirectional back-off mechanism clamping.
Preferably, monitor station position corresponding with first expects pipe storage station is formed with the first through slot, and institute
Stating third expects pipe transfer assembly includes:
It is set to the monitor station and can be from first through slot and along the perpendicular to work top direction lifting
One push plate component, when the first push plate component rises for pushing the empty expects pipe being located at below the unidirectional back-off mechanism
It is pushed into be clamped with the unidirectional back-off mechanism;
It is installed on the testboard, the second driving device to drive the first push plate component movement.
Preferably, second driving device includes cylinder.
Preferably, the cylinder body of the cylinder by be set to the monitor station away from the work top side connecting rod and
It is set to the connecting rod and is fixed on the monitor station far from the connecting plate of the monitor station side.
Preferably, the monitor station is equipped with through its thickness direction and along second extended perpendicular to the first direction
Sliding slot;The second expects pipe transfer assembly includes:
At least one is located at the monitor station away from the work top side and can be along perpendicular to the loading station
Extending direction and the direction for being parallel to work top are set to the Part III of the monitor station, on each described Part III
Equipped with the Part IV that can be acted along the direction perpendicular to the work top;When the Part IV is in running order,
A part of the Part IV passes through the second sliding slot to be higher by the work top, packs up when the Part IV is in
When state, the Part IV is not higher than the work top;
It is installed on the monitor station and the third driving device for driving the Part III movement.
Preferably, the third driving device includes cylinder or lead screw assembly, and the Part III includes sliding block.
Preferably, the third driving device deviates from the connecting rod of the work top side by being set to the monitor station
The monitor station is fixed on far from the connecting plate of the monitor station side with the connecting rod is set to.
Preferably, third card slot is formed on the slot bottom of the 4th groove, and the slot bottom of the 8th groove is equipped with
4th card slot, the third card slot and the 4th card slot are formed for limiting the expects pipe in the second expects pipe storage station to close to described
The unidirectional back-off mechanism of work top direction movement, the automatic testing equipment further include that at least one is used for second material
Expects pipe edge in pipe storage station is pushed away from the work top direction so that expects pipe and institute perpendicular to the workbench
State the 4th expects pipe transfer assembly of unidirectional back-off mechanism clamping.
Preferably, monitor station position corresponding with second expects pipe storage station is formed with the second through slot, and institute
Stating the 4th expects pipe transfer assembly includes:
It is set to the monitor station and can be from second through slot and along the perpendicular to work top direction lifting
Two push plate components, when the second push plate component rises for pushing the empty expects pipe being located at below the unidirectional back-off mechanism
It is pushed into be clamped with the unidirectional back-off mechanism;
It is installed on the monitor station, the fourth drive device to drive the second push plate component movement.
Preferably, the fourth drive device includes cylinder.
Preferably, the cylinder body of the cylinder by be set to the monitor station away from the work top side connecting rod and
It is set to the connecting rod and is fixed on the monitor station far from the connecting plate of the monitor station side.
Preferably, the charging component include be set to it is described to loading station, for qualified optoelectronic switch to be pushed away
It moves to the charging cylinder in expects pipe corresponding to the feed inlet.
Preferably, the detection components include the compression for the chip to be detected to be pressed to the detection station
Cylinder;It is set to the test machine that the monitor station deviates from the work top side;Be set to the work top for
The probe of the test machine connects the detection cylinder to push the probe alignment chip to be detected;It is set to the work
Make table top, for providing no light conditions for the chip to be detected block the shading cylinder of test.
Preferably, the work top further include: the to be measured station opposite with the feeding station is located at the detection work
Station is completed in detection of the position close to the discharge station side;The chip transfer assembly includes the chip for will test completion
The step that the detection completes the second pusher ruler of station and the second pusher ruler is driven to act is pushed to by the detection station
Into motor, further include the qualified chip that station is completed in the detection is transferred to it is described to loading station and by detection completion
The unqualified chip of station is transferred to the chip transfer cylinder of the discharge station.
Preferably, the discharge station includes through the unqualified material hole of the monitor station thickness direction.
Preferably, the monitor station is opposite with the unqualified material hole equipped with being open away from the work top side
Unqualified items material frame.
It preferably, further include the state for being used to show automatic testing equipment current state being set on the work top
Display lamp.
It preferably, further include multiple manipulation buttons and the display screen being set on the work top.
Detailed description of the invention
Fig. 1 is a kind of overall structure diagram of automatic testing equipment provided by the invention;
Fig. 2 is a kind of side view of automatic testing equipment provided by the invention;
Fig. 3 is a kind of top view of automatic testing equipment provided by the invention;
Fig. 4 is a kind of perspective view of the main view of automatic detection device provided by the invention;
Fig. 5 is the partial enlarged view of pushing material component in a kind of automatic testing equipment provided by the invention;
Fig. 6 is a kind of work top schematic diagram of the monitor station of automatic detection device provided by the invention;
Fig. 7 is a kind of work top partial structural diagram of the monitor station of automatic detection device provided by the invention;
Fig. 8 is that a kind of monitor station of automatic detection device provided by the invention deviates from work top side structural schematic diagram;
Fig. 9 is a kind of structural schematic diagram of the detection components of automatic detection device provided by the invention;
Figure 10 is a kind of top view of the detection components of automatic detection device provided by the invention.
Icon:
100- monitor station;101- work top;The upper material space of 102-;1021- feeding station;
The first expects pipe of 1022- stores station;103- stocking space;1031- loading station;
The second expects pipe of 1032- stores station;104- detection station;105- discharge station;
The unqualified material hole 1051-;The first limit plate of 106-;The first groove of 1061-;
The second groove of 1062-;1063- third groove;The 4th groove of 1064-;
The first card slot of 1065-;1068- third card slot;The second limit plate of 107-;
The 5th groove of 1071-;The 6th groove of 1072-;The 7th groove of 1073-;
The 8th groove of 1074-;1075- pusher mouthful;The second card slot of 1076-;
The 4th card slot of 1077-;108- first sliding groove;109- second sliding slot;
110- station to be measured;Station is completed in 111- detection;112- waits for loading station;
The first through slot of 113-;The second through slot of 114-;200- pushing material component;
201- guide rail;202- through position;203- the first pusher ruler;
204- pusher driving assembly;2041- transmission chain;2042- stepper motor;
205- spring;206- optoelectronic switch;300- the first expects pipe transfer assembly;
301- first part;302- second part;303- first driving device;
400- detection components;401- compression cylinder;402- test machine;
403- detects cylinder;404- shading cylinder;500- chip transfer assembly;
501- the second pusher ruler;502- chip shifts cylinder;600- charging component;
700- the second expects pipe transfer assembly;701- Part III;702- Part IV;
703- third driving device;800- control module;900- connecting rod;
1000- connecting plate;1100- third expects pipe transfer assembly;1101- the first push plate component;
The second driving device of 1102-;The 4th expects pipe transfer assembly of 1200-;1201- the second push plate component;
1202- fourth drive device;1300- unqualified items material frame;1400- state display lamp;
1500- manipulates button;1600- display screen.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
Fig. 1, Fig. 2, Fig. 3, Fig. 4 and Figure 10 are please referred to, the present invention provides a kind of automatic testing equipment, for optoelectronic switch
Automatically it is detected, including monitor station 100, monitor station 100 includes work top 101, and work top 101 has upper material space
102, stocking space 103, detection station 104, to loading station 112, discharge station 105;Upper material space 102 includes feeding station
1021 and the first expects pipe for storing the empty expects pipe for having unloaded chip store station 1022, stocking space 103 includes charger
Position 1031 and for store the expects pipe for being fully loaded with qualified chip the second expects pipe storage station 1032;
For the chip in the expects pipe for being in feeding station 1021 to be pushed to the pushing material component 200 of detection station 104;
For the empty expects pipe for unsnatching chip at feeding station 1021 to be transferred to the first of the first expects pipe storage station 1022
Expects pipe transfer assembly 300;
Detection components 400 for being detected to the chip at detection station 104;
Chip for will test detection qualification at station 104 is transferred to loading station 112 and will test station 104
Detect the chip transfer assembly 500 that unqualified chip is transferred to discharge station 105 in place;
For the charging component to loading station 112, chip push-in in the expects pipe of loading station 1031 will to be in
600;
For the expects pipe for filling chip on loading station 1031 to be transferred to the second material of the second expects pipe storage station 1032
Pipe transfer assembly 700;
Control module 800, with pushing material component 200, the first expects pipe transfer assembly 300, detection components 400, chip transfer group
Part 500, charging component 600, the connection of 700 signal of the second expects pipe transfer assembly, to control pushing material component 200, the transfer of the first expects pipe
Component 300, detection components 400, chip transfer assembly 500, charging component 600, the movement of the second expects pipe transfer assembly 700.
The expects pipe for filling optoelectronic switch to be measured in use, is put into upper material space first by above-mentioned automatic testing equipment
In 102 feeding station 1021, then the optoelectronic switch in the expects pipe in feeding station 1021 is pushed to by pushing material component 200
Detection station 104 is detected, and the blank pipe after optoelectronic switch has been unloaded in feeding station 1021 is by the first expects pipe transfer assembly 300
It is transferred to the first expects pipe storage station 1022, detects qualified optoelectronic switch through 500 turns of chip transfer assembly in detection station 104
It is pushed into loading station 1031 after moving to the position opposite with the loading station 1031 of stocking space 103 by charging component 600
In empty expects pipe, the material of qualified chip will be filled by the second expects pipe transfer assembly 700 after the empty expects pipe in loading station 112 is filled
Pipe is transferred to the second expects pipe storage station 1032;Underproof optoelectronic switch is through chip transfer assembly after detection station 104 detects
500 are transferred to discharge station 105, and above-mentioned automatic testing equipment completes the automatic detection to the chip of optoelectronic switch, while complete
At the categorised collection to qualified optoelectronic switch and underproof optoelectronic switch, qualified optoelectronic switch is packed into expects pipe, it will
Underproof optoelectronic switch is shifted discharge station 105 onto and is collected, and wherein control module 800 is responsible for and pushing material component 200, the
One expects pipe transfer assembly 300, detection components 400, chip transfer assembly 500, charging component 600, the second expects pipe transfer assembly 700
Signal connection, and control pushing material component 200, the first expects pipe transfer assembly 300, detection components 400, chip transfer assembly 500, dress
Expect component 600, the movement of the second expects pipe transfer assembly 700;After booting is powered, control module 800 receives the optoelectronic switch of each section
Signal determines pushing material component 200, the first expects pipe transfer assembly 300, detection components 400, chip transfer assembly 500, charging component
600, whether standby mode is good for the second expects pipe transfer assembly 700.It is standby it is normal after, driving pushing material component 200 is by feeding station
Optoelectronic switch to be measured in 1021 is pushed into detection station 104, and driving detection components 400 are tested, and qualified or not sentence
Disconnected and movement.The signal of reception each section is repeated, repeats to drive action of each part.It is thus achieved that the chip of optoelectronic switch
Automatic detection, saves manpower and greatly improves work efficiency.
Specifically, as shown in Figure 6, Figure 7, for arranging and being oppositely arranged along first direction is provided on work top 101
One limit plate 106 and the second limit plate 107, the first limit plate 106 and the second limit plate 107 are perpendicular to work top 101, and first
The surface of limit plate 106 towards the second limit plate 107 be formed with extending direction with work top 101 vertical and orientation with
First direction vertical the first groove 1061, the second groove 1062, third groove 1063 and the 4th groove 1064, the second limit plate
107 are formed with extending direction vertical with work top 101 and orientation and first party towards the surface of the first limit plates 106
To vertical the 5th groove 1071, the 6th groove 1072, the 7th groove 1073 and the 8th groove 1074, the first groove 1061 and
It is formed with the first expects pipe storage station 1022 between five grooves 1071, is formed between the second groove 1062 and the 6th groove 1072
Feeding station 1021 is formed with loading station 1031,1064 He of the 4th groove between third groove 1063 and the 7th groove 1073
The second expects pipe storage station 1032 is formed between 8th groove 1074;Detection station 104 is located at the first limit plate 106 away from the
The side of two limit plates 107, and the slot bottom of the second groove 1062 is formed through the discharge port of 106 thickness of the first limit plate, the
The slot bottom of three grooves 1063 is formed through the feed inlet of 106 thickness of the first limit plate.
It is provided with the first limit plate 106 and the second limit plate 107 on work top 101, is formed on the first limit plate 106
First groove 1061, the second groove 1062, third groove 1063 and the 4th groove 1064 form the 5th on second limit plate 107
Groove 1071, the 6th groove 1072, the 7th groove 1073 and the 8th groove 1074, in the first limit plate 106 and the second limit plate
Feeding station 1021, the first expects pipe storage station 1022, loading station 1031 and the second expects pipe are formed between 107 opposite grooves
Station 1032 is stored, feeding station 1021, the first expects pipe storage station 1022, loading station 1031 and the second expects pipe store station
1032 are disposed adjacent, and facilitate the displacement of expects pipe, to realize the automatic transfer of expects pipe, improve above-mentioned automatic testing equipment
The quantity of optoelectronic switch detected, and detection station 104 is located at the side that the first limit plate 106 deviates from the second limit plate 107,
The slot bottom of second groove 1062 is formed through the discharge port of 106 thickness of the first limit plate, for by the material of feeding station 1021
Optoelectronic switch to be measured in pipe is sent to detection station 104, and the slot bottom of third groove 1063 is formed through the first limit plate 106
The feed inlet of thickness, the optoelectronic switch for will test qualification are sent in the expects pipe of loading station 1031 and are collected, realize
The collection of detection and the optoelectronic switch that detection is completed to optoelectronic switch chip.
Specifically, between the first groove 1061 and the second groove 1062 shared cell wall and work top 101, third groove
1063 and the 4th between the shared cell wall and work top 101 of groove 1064, the 5th groove 1071 and the 6th groove 1072 share
Cell wall and work top 101 between, between the shared cell wall and work top 101 of the 7th groove 1073 and the 8th groove 1074
It is equipped with the expects pipe transfering channel for expects pipe transfer.
The empty expects pipe that expects pipe transfering channel facilitates in the feeding station 1021 of upper material space 102 is arranged to shift by expects pipe
Channel is transferred to the first expects pipe storage station 1022 and is collected, while conjunction is filled in the loading station 1031 of stocking space 103
The expects pipe of lattice optoelectronic switch is transferred to the second expects pipe storage station 1032 by expects pipe transfering channel and is collected, and realizes to more
The chip of a optoelectronic switch is detected.
Specifically, as shown in Figure 5 and Figure 6, the slot bottom of the 6th groove 1072 is equipped with pusher mouthful 1075, pushing material component 200
Include:
It is set to the guide rail 201 that the second limit plate 107 deviates from 106 side of the first limit plate and extends in a first direction;
The through position 202 of guide rail 201 can be slidingly arranged at along guide rail 201;
Be installed on through position 202 and for being protruded into from pusher mouthful 1075 in the expects pipe stored in feeding station 1021 the
One pusher ruler 203;
The pusher driving assembly 204 for driving through position 202 to act.
Pushing material component 200 is carried out for the optoelectronic switch in the expects pipe of feeding station 1021 to be pushed to detection station 104
Detection when wherein pushing material component 200 acts, drives through position 202 along the direction that guide rail 201 extends by pusher driving assembly 204
To close to 104 direction of detection station slide, through position 202 be equipped with the first pusher ruler 203, one end of the first pusher ruler 203 with
Through position 202 connects the other end and protrudes into the expects pipe of feeding station 1021, and the movement of through position 202 is to drive the first pusher ruler
203 slide to the direction close to detection station 104, so that the optoelectronic switch to be measured in the expects pipe of feeding station 1021 be pushed extremely to examine
It surveys station 104 and carries out subsequent detection.
Specifically, as shown in figure 5, pusher driving assembly 204 includes:
It is installed on the transmission chain 2041 of monitor station 100, through position 202 is installed on transmission chain 2041;
The stepper motor 2042 for driving transmission chain 2041 to act.
Pusher driving assembly 204 drives the transmission chain 2041 connecting with stepper motor 2042 dynamic by stepper motor 2042
Make, monitor station 100 is installed on transmission chain 2041, drives monitor station 100 sliding along guide rail 201 when transmission chain 2041 acts
It is dynamic.
Specifically, as shown in figure 5, being set between the first pusher ruler 203 and one end and through position 202 of the connection of through position 202
There are spring 205 and the optoelectronic switch 206 for detecting 203 position of the first pusher ruler.
The expects pipe in determining upper material space 102 of control module 800 switches in the expects pipe in completion or feeding station 1021
There is material, detection components 400 to test completion, be underfilled in the expects pipe in loading station 1031 or stocking space 103 in material
When pipe switching completion three meets, stepper motor 2042 is acted at this time, and the first pusher ruler 203 is driven to enter in feeding station 1021
Expects pipe in, push feeding station 1021 in expects pipe in optoelectronic switch to be measured enter detection station 104, photoelectricity to be measured is opened
After light enters detection station 104, the first pusher ruler 203 can not move ahead under limited block effect, the first pusher ruler 203 and switching
The spring 205 of 202 junction of platform compresses, and triggering is for detecting the first pusher ruler after the first pusher ruler 203 misplaces with through position 202
The optoelectronic switch 206 of 203 positions after 206 feedback signal of optoelectronic switch for detecting 203 position of the first pusher ruler, controls mould
Block 800 controls the shutdown of stepper motor 2042 and awaits orders, and the optoelectronic switch to be measured completed in the expects pipe in feeding station 1021 enters inspection
After surveying station 104, control unit controls detection components 400 and starts test job.
Specifically, as shown in Figure 7 and Figure 8, monitor station 100 is equipped with through its thickness direction and along perpendicular to first direction
The first sliding groove 108 of extension;First expects pipe transfer assembly 300 includes:
At least one is located at monitor station 100 away from 101 side of work top and can be along prolonging perpendicular to feeding station 1021
It stretches direction and the direction for being parallel to work top 101 is set to the first part 301 of monitor station 100, each first part 301
It is equipped with the second part 302 that can be acted along the direction perpendicular to work top 101;When second part 302 is in running order
When, a part of second part 302 passes through first sliding groove 108 to be higher by work top 101, packs up when second part 302 is in
When state, second part 302 is not higher than work top 101;
It is installed on monitor station 100 and the first driving device 303 for driving first part 301 to act.
Specifically, first driving device 303 includes cylinder or lead screw assembly, and first part 301 includes sliding block.
First expects pipe transfer assembly 300 is used to expect the empty of chip of unsnatching in upper material space 102 in feeding station 1021
Pipe is transferred to the first expects pipe storage station 1022, the first driving dress acted including first part 301, driving first part 301
The second part 302 setting 303 and connecting with first part 301, first part 301 and second part 302 form " L " type knot
Structure, wherein second part 302 reaches work top away from 101 side of work top by monitor station 100 by first sliding groove 108
Expects pipe in feeding station 1021 is transferred to the first expects pipe storage station 1022 by 101 sides;First part 301 includes sliding
Block, first driving device 303 include cylinder or lead screw assembly, and first driving device 303 drives sliding block along perpendicular to feeding station
1021 extending direction and the direction movement for being parallel to work top 101, the empty expects pipe in feeding station 1021 is moved to
First expects pipe stores station 1022, and the effect of second part 302 is contacted with empty expects pipe, to provide an effect for empty expects pipe
Power, second part 302 can be cylinder, when the position of second part 302 is opposite with first sliding groove 108, the piston rod of cylinder
Across first sliding groove 108 to be higher by work top 101 and be contacted with empty expects pipe.
After the empty expects pipe for unsnatching chip in feeding station 1021 is transferred to the first expects pipe storage station 1022, feeding station
The expects pipe being located above in 1021 is moved down by gravity, continue to the chip of optoelectronic switch to be detected in subsequent expects pipe into
Row detection.
Specifically, first driving device 303 deviates from the connecting rod 900 of 101 side of work top by being set to monitor station 100
Monitor station 100 is fixed on far from the connecting plate 1000 of 100 side of monitor station with connecting rod 900 is set to.
First driving device 303 is set on connecting plate 1000, after by being set to connecting rod 900 and the inspection of monitor station 100
Scaffold tower 100 is fixedly connected.
Specifically, as shown in Figure 6 and Figure 8, it is formed with the first card slot 1065 on the slot bottom of the first groove 1061, and the 5th is recessed
The slot bottom of slot 1071 is equipped with the second card slot 1076, and the first card slot 1065 and the second card slot 1076 are formed for limiting the first expects pipe
The expects pipe in station 1022 is stored to the unidirectional back-off mechanism acted close to 101 direction of work top, automatic testing equipment also wraps
At least one is included for the first expects pipe to be stored to the empty expects pipe edge in station 1022 perpendicular to work top 101 to far from workbench
101 direction of face pushes the third expects pipe transfer assembly 1100 so that empty expects pipe and the clamping of unidirectional back-off mechanism.
The first card slot 1065, the 5th groove are formed on first groove 1061 at the both ends of the first expects pipe storage station 1022
The second card slot 1076 is formed on 1071, to form limitation the first expects pipe storage 1022 hollow tube position of station to prevent under it
The unidirectional back-off structure fallen uses unidirectional back-off structure to be transferred to the first expects pipe storage station by feeding station 1021 to be subsequent
1022 blank pipe provides space.
Automatic testing equipment by third expects pipe transfer assembly 1100 by the first expects pipe store station 1022 in blank pipe to
It is mobile far from 101 side of work top, cooperate unidirectional back-off structure to make the blank pipe for being transferred to the first expects pipe storage station 1022
There are gaps between work top 101, to be transferred to the first expects pipe storage station 1022 by feeding station 1021 to be subsequent
Blank pipe provide space.
Specifically, as shown in Figure 7 and Figure 8, the position corresponding with the first expects pipe storage station 1022 of monitor station 100 is formed with
First through slot 113, and third expects pipe transfer assembly 1100 includes:
Be set to monitor station 100 and can from the first through slot 113 and along perpendicular to 101 direction of work top lifting first
Push plate component 1101, when the first push plate component 1101 rises for pushing the empty expects pipe being located at below unidirectional back-off mechanism above to push away
It is clamped to unidirectional back-off mechanism;
It is installed on monitor station 100, the second driving device 1102 to drive the movement of the first push plate component 1101.
First push plate component 1101 passes through monitor station by the first through slot 113 under the promotion of the second driving device 1102
100 contact with the blank pipe in the first expects pipe storage station 1022, push blank pipe mobile to the direction far from work top 101,
In, the first push plate component 1101 be U-typed structure, push the first expects pipe storage station 1022 in blank pipe during with sky
Two end in contact of pipe, ensure that the stability of pushing course.
Specifically, the second driving device 1102 includes cylinder.
Specifically, as shown in figure 8, the cylinder body of cylinder deviates from the company of 101 side of work top by being set to monitor station 100
It bar 900 and is set to connecting rod 900 and is fixed on monitor station 100 far from the connecting plate 1000 of 100 side of monitor station.
Second driving device 1102 includes cylinder, and cylinder is set on connecting plate 1000, and connecting plate 1000 passes through connecting rod 900
It is fixed with monitor station 100 away from the side of work top 101, the first push plate component 1101 is living by linear bearing and connecting rod 900
Dynamic connection, the piston rod of cylinder is fixedly connected with the first push plate component 1101, and when cylinder movement, piston rod pushes the first push plate
Component 1101 is gone up and down along perpendicular to 101 direction of work top.
Specifically, as shown in Figure 7 and Figure 8, monitor station 100 is equipped with through its thickness direction and along perpendicular to first direction
The second sliding slot 109 of extension;Second expects pipe transfer assembly 700 includes:
At least one is located at monitor station 100 away from 101 side of work top and can be along prolonging perpendicular to loading station 1031
It stretches direction and the direction for being parallel to work top 101 is set to the Part III 701 of monitor station 100, each Part III 701
It is equipped with the Part IV 702 that can be acted along the direction perpendicular to work top 101;When Part IV 702 is in running order
When, a part of Part IV 702 passes through second sliding slot 109 to be higher by work top 101, packs up when Part IV 702 is in
When state, Part IV 702 is not higher than work top 101;
It is installed on monitor station 100 and the third driving device 703 for driving Part III 701 to act.
Specifically, third driving device 703 includes cylinder or lead screw assembly, and Part III 701 includes sliding block.
Second expects pipe transfer assembly 700 is used for the expects pipe for filling chip in stocking space 103 in loading station 1031
It is transferred to the second expects pipe storage station 1032, the third driving device acted including Part III 701, driving Part III 701
703 and the Part IV 702 that is connect with Part III 701, Part III 701 and Part IV 702 form " L " type knot
Structure, wherein Part IV 702 reaches work top away from 101 side of work top by monitor station 100 by second sliding slot 109
The expects pipe for filling chip in loading station 1031 is transferred to the second expects pipe storage station 1032 by 101 sides;Part III
701 include sliding block, third driving device 703 include cylinder or lead screw assembly, third driving device 703 drive sliding block along perpendicular to
The extending direction of loading station 1031 and the direction movement for being parallel to work top 101, by filling in loading station 1031
The expects pipe of chip is moved to the second expects pipe storage station 1032, and the effect of Part IV 702 is contacted with the expects pipe for filling chip,
There is provided an active force with the expects pipe to fill chip, Part IV 702 can be cylinder, when Part IV 702 position with
When second sliding slot 109 is opposite, the piston rod of cylinder pass through second sliding slot 109 be higher by work top 101 and with fill chip
Expects pipe contact.
After the expects pipe for filling chip in loading station 1031 is transferred to the second expects pipe storage station 1032, loading station
The empty expects pipe being located above in 1031 is moved down by gravity, continues to receive the optoelectronic switch of subsequent detection qualification
Collection.
Specifically, third driving device 703 deviates from the connecting rod 900 of 101 side of work top by being set to monitor station 100
Monitor station 100 is fixed on far from the connecting plate 1000 of 100 side of monitor station with connecting rod 900 is set to.
Third driving device 703 is set on connecting plate 1000, after by being set to connecting rod 900 and the inspection of monitor station 100
Scaffold tower 100 is fixedly connected.
Specifically, as shown in Figure 6 and Figure 8, it is formed with third card slot 1066 on the slot bottom of the 4th groove 1064, and the 8th is recessed
The slot bottom of slot 1074 is equipped with the 4th card slot 1077, and third card slot 1066 and the 4th card slot 1077 are formed for limiting the second expects pipe
The expects pipe in station 1032 is stored to the unidirectional back-off mechanism acted close to 101 direction of work top, automatic testing equipment also wraps
At least one is included for the second expects pipe to be stored to the expects pipe edge in station 1032 perpendicular to work top 101 to far from work top
101 directions push the 4th expects pipe transfer assembly 1200 so that expects pipe and the clamping of unidirectional back-off mechanism.
Third card slot 1066, the 8th groove are formed on 4th groove 1064 at the both ends of the second expects pipe storage station 1032
The 4th card slot 1077 is formed on 1074, thus formed limitation the second expects pipe storage station 1032 in expects pipe position to prevent under it
The unidirectional back-off structure fallen uses unidirectional back-off structure to be transferred to the second expects pipe storage station by loading station 1031 to be subsequent
1032 expects pipe provides space.
Automatic testing equipment by the 4th expects pipe transfer assembly 1200 by the second expects pipe store station 1032 in expects pipe to
It is mobile far from 101 side of work top, cooperate unidirectional back-off structure to make the expects pipe for being transferred to the second expects pipe storage station 1032
There are gaps between work top 101, to be transferred to the second expects pipe storage station 1032 by loading station 1031 to be subsequent
Expects pipe provide space.
Specifically, as shown in Figure 6 and Figure 8, the position corresponding with the second expects pipe storage station 1032 of monitor station 100 is formed with
Second through slot 114, and the 4th expects pipe transfer assembly 1200 includes:
Be set to monitor station 100 and can from the second through slot 114 and along perpendicular to 101 direction of work top lifting second
Push plate component 1201, when the second push plate component 1201 rises for pushing the empty expects pipe being located at below unidirectional back-off mechanism above to push away
It is clamped to unidirectional back-off mechanism;
It is installed on monitor station 100, the fourth drive device 1202 to drive the movement of the second push plate component 1201.
Second push plate component 1201 passes through monitor station by the second through slot 114 under the promotion of fourth drive device 1202
100 contact with the expects pipe in the second expects pipe storage station 1032, push expects pipe mobile to the direction far from work top 101,
In, the second push plate component 1201 be U-typed structure, push the second expects pipe storage station 1032 in expects pipe during with material
Two end in contact of pipe, ensure that the stability of pushing course.
Specifically, fourth drive device 1202 includes cylinder.
Specifically, as shown in figure 8, the cylinder body of cylinder deviates from the company of 101 side of work top by being set to monitor station 100
It bar 900 and is set to connecting rod 900 and is fixed on monitor station 100 far from the connecting plate 1000 of 100 side of monitor station.
Fourth drive device 1202 includes cylinder, and cylinder is set on connecting plate 1000, and connecting plate 1000 passes through connecting rod 900
It is fixed with monitor station 100 away from the side of work top 101, the second push plate component 1201 is living by linear bearing and connecting rod 900
Dynamic connection, the piston rod of cylinder is fixedly connected with the second push plate component 1201, and when cylinder movement, piston rod pushes the second push plate
Component 1201 is gone up and down along perpendicular to 101 direction of work top.
Specifically, as shown in figure 9, charging component 600 includes being set to loading station 112, being used for qualified light
Electric switch is pushed to the charging cylinder in expects pipe corresponding to feed inlet.
When the optoelectronic switch that detection components 400 detect is qualified, charging component 600 uses charging cylinder by qualified light
Electric switch is fitted into the expects pipe in the second expects pipe storage station 1032.
Specifically, as shown in Figure 9 and Figure 10, detection components 400 include for chip to be detected to be pressed to detection work
The compression cylinder 401 of position 104;It is set to the test machine 402 that monitor station 100 deviates from 101 side of work top;It is set to workbench
Face 101 is used to connect the detection cylinder 403 to push probe alignment chip to be detected with the probe of test machine 402;Setting
In work top 101, for providing no light conditions for chip to be detected block the shading cylinder 404 of test.
It, first will be in feeding station 1021 by pushing material component 200 during the chip to optoelectronic switch detects
Expects pipe in optoelectronic switch be pushed to detection station 104, after by compression cylinder 401 optoelectronic switch to be measured is pressed to detection work
On position 104, detection cylinder 403 connect with the probe of test machine 402 and pushes the chip of probe alignment optoelectronic switch to be detected,
And the chip of optoelectronic switch to be measured is detected, detection content includes the input of chip, the forward current of output, reversed electricity
Stream, without parameters such as photoelectric current, collector current and saturation voltages, after by shading cylinder 404 be optoelectronic switch to be measured chip
No light conditions are provided, unglazed testing current are carried out to the chip of optoelectronic switch to be measured, using above-mentioned automatic testing equipment by cylinder
It drives the mode of probe to detect the chip of optoelectronic switch to be measured, the feelings that pin deforms in detection process can be effectively prevent
Condition, and above-mentioned automatic testing equipment can carry out the detection without photoelectric current to the chip of optoelectronic switch to be measured, and greatly improve
Detection efficiency.
Specifically, as shown in Figure 9 and Figure 10, work top 101 further include: the to be measured station opposite with feeding station 1021
110, station 111 is completed in the detection positioned at detection station 104 close to 105 side of discharge station;Chip transfer assembly 500 includes using
The second pusher ruler 501 and the driving second that station 111 is completed in detection are pushed to by detection station 104 in the chip that will test completion
Pusher ruler 501 act stepper motor 2042, further include will test complete station 111 qualified chip be transferred to loading station
112 and will test complete station 111 unqualified chip be transferred to discharge station 105 chip transfer cylinder 502.
It, first will be in feeding station 1021 by pushing material component 200 during the chip to optoelectronic switch detects
Expects pipe in optoelectronic switch be pushed to detection station 104 and station to be measured 110, positioned at detection station 104 optoelectronic switch examine
After the completion of survey, drives the second pusher ruler 501 to be transferred to chip by the stepper motor 2042 in chip transfer assembly 500 and detected
At station 111, and there is pushing material component 200 that the optoelectronic switch to be measured for being located at station 110 to be measured is moved to detection station 104, after
Next step operation is carried out according to the case where optoelectronic switch of station 111 is completed in detection is located at.Station 111 is completed when being located at detection
When optoelectronic switch is qualified optoelectronic switch, chip shifts cylinder 502 and is transferred to it to charger by detection completion station 111
Position 112, after by charging cylinder will be located to loading station 112 optoelectronic switch push-in loading station 1031 in expects pipe in;When
When optoelectronic switch positioned at detection completion station 111 is underproof optoelectronic switch, chip shifts cylinder 502 for it by having detected
It is transferred to discharge station 105 at station 111, it is thus achieved that detection and classification to optoelectronic switch, save manpower and raising
Working efficiency.
Specifically, as shown in Figure 10, discharge station 105 includes through the unqualified material hole of 100 thickness direction of monitor station
1051。
When being located at detection to complete the optoelectronic switch of station 111 is underproof optoelectronic switch, chip shifts cylinder 502 will
It is completed station 111 by detection and is transferred to discharge station 105, and underproof optoelectronic switch falls directly into unqualified material hole 1051
In.
Specifically, as shown in figure 9, monitor station 100 is equipped with opening and unqualified material hole away from 101 side of work top
1051 opposite unqualified items material frames 1300.
The unqualified optoelectronic switch fallen into unqualified material hole 1051 is collected by unqualified items material frame 1300.
Specifically, as shown in Figure 1, further including being set on work top 101 to be used to show that automatic testing equipment is current
The state display lamp 1400 of state.
Specifically, as shown in Figure 1, further including multiple manipulation buttons 1500 and the display screen being set on work top 101
1600。
Operator by manipulate button 1500 control above-mentioned automatic testing equipment state and by display screen 1600 into
Row observation.
Obviously, those skilled in the art can carry out various modification and variations without departing from this hair to the embodiment of the present invention
Bright spirit and scope.In this way, if these modifications and changes of the present invention belongs to the claims in the present invention and its equivalent technologies
Within the scope of, then the present invention is also intended to include these modifications and variations.
Claims (27)
1. a kind of automatic testing equipment is detected automatically for the chip to optoelectronic switch, which is characterized in that including detection
Platform, the monitor station include work top, the work top have upper material space, stocking space, detection station, to charger
Position, discharge station;The upper material space includes that feeding station and the first expects pipe for storing the empty expects pipe for having unloaded chip are deposited
Station is put, the stocking space includes loading station and the second expects pipe storing name for storing the expects pipe for being fully loaded with qualified chip
Position;
For the chip in the expects pipe for being in the feeding station to be pushed to the pushing material component of the detection station;
For the empty expects pipe for unsnatching chip at the feeding station to be transferred to the first expects pipe of the first expects pipe storage station
Transfer assembly;
Detection components for being detected to the chip at the detection station;
For will be detected at the detection station qualified chip be transferred to it is described to loading station and will be at the detection station
Detect the chip transfer assembly that unqualified chip is transferred to the discharge station;
For the charging component to the chip push-in of loading station in the expects pipe of the loading station will to be in;
The second expects pipe for the expects pipe for filling chip on the loading station to be transferred to the second expects pipe storage station turns
Move component;
Control module, with the pushing material component, the first expects pipe transfer assembly, detection components, chip transfer assembly, charging component,
The connection of second expects pipe transfer assembly signal is turned with controlling the pushing material component, the first expects pipe transfer assembly, detection components, chip
Move component, charging component, the movement of the second expects pipe transfer assembly.
2. automatic testing equipment according to claim 1, which is characterized in that be provided on the work top along first party
To the first limit plate and the second limit plate for arranging and being oppositely arranged, first limit plate and the second limit plate are perpendicular to described
Work top, the surface of first limit plate towards second limit plate is formed with extending direction and the work top hangs down
Directly and orientation first groove, second groove, third groove and fourth groove vertical with the first direction, described
The surface of two limit plates towards first limit plate be formed with extending direction with the work top vertical and orientation with
The first direction vertical the 5th groove, the 6th groove, the 7th groove and the 8th groove, first groove and the described 5th
It is formed with the first expects pipe storage station between groove, is formed on described between second groove and the 6th groove
Expect station, is formed with the loading station between the third groove and the 7th groove, the 4th groove and described the
The second expects pipe storage station is formed between eight grooves;The detection station is located at first limit plate away from described the
The side of two limit plates, and the slot bottom of second groove is formed through the discharge port of the first limit plate thickness, it is described
The slot bottom of third groove is formed through the feed inlet of the first limit plate thickness.
3. automatic testing equipment according to claim 2, which is characterized in that first groove and second groove are total
Between cell wall and the work top, the cell wall and the work top that the third groove and the 4th groove are shared
Between, between the shared cell wall and the work top of the 5th groove and the 6th groove, the 7th groove and institute
State the expects pipe transfering channel being equipped between the 8th groove shared cell wall and the work top for expects pipe transfer.
4. automatic testing equipment according to claim 2, which is characterized in that the slot bottom of the 6th groove is equipped with pusher
Mouthful, the pushing material component includes:
Second limit plate is set to away from first limit plate side and along the guide rail of first direction extension;
The through position of the guide rail can be slidingly arranged at along the guide rail;
It is installed on the through position and first is pushed away for what is protruded into the expects pipe stored in the feeding station from the pusher mouthful
Expect ruler;
Drive the pusher driving assembly of through position's movement.
5. automatic testing equipment according to claim 4, which is characterized in that the pusher driving assembly includes:
It is installed on the transmission chain of the monitor station, the through position is installed on the transmission chain;
Drive the stepper motor of the transmission chain movement.
6. automatic testing equipment according to claim 4, which is characterized in that the first pusher ruler and the through position connect
Spring and the optoelectronic switch for detecting the first pusher ruler position are equipped between the one end connect and the through position.
7. automatic testing equipment according to claim 2, which is characterized in that the monitor station, which is equipped with, runs through its thickness side
To and along perpendicular to the first direction extend first sliding groove;The first expects pipe transfer assembly includes:
At least one is located at the monitor station away from the work top side and can be along the extension perpendicular to the feeding station
Direction and the direction for being parallel to work top are set to the first part of the monitor station, each described first part is equipped with
The second part that can be acted along the direction perpendicular to the work top;It is described when the second part is in running order
A part of second part passes through the first sliding groove to be higher by the work top, when the second part is in collapsed state
When, the second part is not higher than the work top;
It is installed on the monitor station and the first driving device for driving first part's movement.
8. automatic testing equipment according to claim 7, which is characterized in that the first driving device includes cylinder or silk
Thick stick component, the first part include sliding block.
9. automatic testing equipment according to claim 7, which is characterized in that the first driving device is by being set to
Monitor station is stated away from the connecting rod of the work top side and is set to connecting plate of the connecting rod far from the monitor station side
It is fixed on the monitor station.
10. automatic testing equipment according to claim 2, which is characterized in that be formed on the slot bottom of first groove
First card slot, and the slot bottom of the 5th groove is equipped with the second card slot, first card slot and the second card slot are formed for limiting
Make the unidirectional back-off mechanism that the expects pipe in the first expects pipe storage station is acted to the close work top direction, the automatic survey
It further includes that at least one is used for the empty expects pipe in first expects pipe storage station along perpendicular to the work top that trial assembly, which is set,
The third expects pipe transfer assembly so that empty expects pipe and the unidirectional back-off mechanism clamping is pushed to the separate work top direction.
11. automatic testing equipment according to claim 10, which is characterized in that the monitor station is deposited with first expects pipe
It puts the corresponding position of station and is formed with the first through slot, and the third expects pipe transfer assembly includes:
It is set to the monitor station and can be pushed away from first through slot and along first perpendicular to work top direction lifting
Board group part is pushed into the empty expects pipe being located at below the unidirectional back-off mechanism when the first push plate component rises for pushing
It is clamped with the unidirectional back-off mechanism;
It is installed on the monitor station, the second driving device to drive the first push plate component movement.
12. automatic testing equipment according to claim 11, which is characterized in that second driving device includes cylinder.
13. automatic testing equipment according to claim 12, which is characterized in that the cylinder body of the cylinder is by being set to
Monitor station is stated away from the connecting rod of the work top side and is set to connecting plate of the connecting rod far from the monitor station side
It is fixed on the monitor station.
14. automatic testing equipment according to claim 2, which is characterized in that the monitor station, which is equipped with, runs through its thickness side
To and along perpendicular to the first direction extend second sliding slot;The second expects pipe transfer assembly includes:
At least one is located at the monitor station away from the work top side and can be along the extension perpendicular to the loading station
Direction and the direction for being parallel to work top are set to the Part III of the monitor station, each described Part III is equipped with
The Part IV that can be acted along the direction perpendicular to the work top;It is described when the Part IV is in running order
A part of Part IV passes through the second sliding slot to be higher by the work top, when the Part IV is in collapsed state
When, the Part IV is not higher than the work top;
It is installed on the monitor station and the third driving device for driving the Part III movement.
15. automatic testing equipment according to claim 14, which is characterized in that the third driving device include cylinder or
Lead screw assembly, the Part III include sliding block.
16. automatic testing equipment according to claim 14, which is characterized in that the third driving device is by being set to
The monitor station deviates from the connecting rod of the work top side and is set to connection of the connecting rod far from the monitor station side
Plate is fixed on the monitor station.
17. automatic testing equipment according to claim 2, which is characterized in that be formed on the slot bottom of the 4th groove
Third card slot, and the slot bottom of the 8th groove is equipped with the 4th card slot, the third card slot and the 4th card slot are formed for limiting
Make the unidirectional back-off mechanism that the expects pipe in the second expects pipe storage station is acted to the close work top direction, the automatic survey
Trial assembly set further include at least one be used for by second expects pipe store station in expects pipe along perpendicular to the work top to
The 4th expects pipe transfer assembly so that expects pipe and the unidirectional back-off mechanism clamping is pushed far from the work top direction.
18. automatic testing equipment according to claim 17, which is characterized in that the monitor station is deposited with second expects pipe
It puts the corresponding position of station and is formed with the second through slot, and the 4th expects pipe transfer assembly includes:
It is set to the monitor station and can be pushed away from second through slot and along second perpendicular to work top direction lifting
Board group part is pushed into the empty expects pipe being located at below the unidirectional back-off mechanism when the second push plate component rises for pushing
It is clamped with the unidirectional back-off mechanism;
It is installed on the monitor station, the fourth drive device to drive the second push plate component movement.
19. automatic testing equipment according to claim 18, which is characterized in that the fourth drive device includes cylinder.
20. automatic testing equipment according to claim 19, which is characterized in that the cylinder body of the cylinder is by being set to
Monitor station is stated away from the connecting rod of the work top side and is set to connecting plate of the connecting rod far from the monitor station side
It is fixed on the monitor station.
21. automatic testing equipment according to claim 2, which is characterized in that the charging component is described including being set to
To loading station for qualified optoelectronic switch to be pushed to the charging cylinder in expects pipe corresponding to the feed inlet.
22. automatic testing equipment according to claim 1, which is characterized in that the detection components include for will be to be checked
The chip surveyed is pressed to the compression cylinder of the detection station;The monitor station is set to away from the work top side
Test machine;Be set to the work top for being connect with the probe of the test machine to push the probe alignment to be checked
The detection cylinder for the chip surveyed;It is set to the work top, for providing no light conditions for the chip to be detected
Block the shading cylinder of test.
23. automatic testing equipment according to claim 1, which is characterized in that the work top further include: on described
Expect the opposite station to be measured of station, complete station close to the detection of the discharge station side positioned at the detection station;It is described
Chip transfer assembly includes being pushed to the detection by the detection station for will test the chip of completion to complete the of station
Two pusher rulers and the stepper motor for driving the second pusher ruler movement further include the qualified chip that the detection is completed to station
It is transferred to the chip that the discharge station is transferred to loading station and by the unqualified chip that station is completed in the detection
Shift cylinder.
24. automatic testing equipment according to claim 1, which is characterized in that the discharge station includes running through the inspection
The unqualified material hole of scaffold tower thickness direction.
25. automatic testing equipment according to claim 24, which is characterized in that the monitor station deviates from the work top
Side is equipped with the unqualified items material frame opposite with the unqualified material hole that be open.
26. automatic testing equipment according to claim 1, which is characterized in that further include being set on the work top
For showing the state display lamp of automatic testing equipment current state.
27. automatic testing equipment according to claim 1, which is characterized in that further include being set on the work top
Multiple manipulation buttons and display screen.
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CN110596497A (en) * | 2019-10-09 | 2019-12-20 | 北京无线电计量测试研究所 | Transposition device for surface-mounted components |
CN111123093A (en) * | 2020-02-21 | 2020-05-08 | 绍兴图雅电子科技有限公司 | Photoelectric switch detection device |
CN111487490A (en) * | 2020-04-02 | 2020-08-04 | 湖南橡博电气有限公司 | Bus connecting device and inflatable ring main unit performance test system method based on bus connecting device |
CN112834899A (en) * | 2020-12-30 | 2021-05-25 | 广州奥松电子有限公司 | Chip detection device |
CN113219325A (en) * | 2021-04-30 | 2021-08-06 | 无锡新微阳科技有限公司 | BGA chip detection system |
CN115135130A (en) * | 2021-03-26 | 2022-09-30 | 上海理光办公设备有限公司 | Chip socket pushing mechanism and feeding device |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100931323B1 (en) * | 2009-02-20 | 2009-12-11 | (주)큐엠씨 | Led chip classifying apparatus |
CN103426800A (en) * | 2013-07-20 | 2013-12-04 | 福州派利德电子科技有限公司 | Semiconductor chip automatic feeding double-station detection device |
CN103529383A (en) * | 2012-02-29 | 2014-01-22 | 温州奔龙自动化科技有限公司 | Automatic testing device |
CN105510805A (en) * | 2016-01-08 | 2016-04-20 | 上海恒浥智能科技股份有限公司 | Chip automatic detection device |
CN105572147A (en) * | 2016-01-08 | 2016-05-11 | 上海恒浥智能科技股份有限公司 | Chip automatic detection method |
CN106311633A (en) * | 2016-08-30 | 2017-01-11 | 福州派利德电子科技有限公司 | Multi-station series-connection labeling, testing and sorting device for integrated circuit chips |
CN208383937U (en) * | 2018-08-08 | 2019-01-15 | 格力电器(武汉)有限公司 | Automatic testing device |
-
2018
- 2018-08-08 CN CN201810896271.8A patent/CN108957045B/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100931323B1 (en) * | 2009-02-20 | 2009-12-11 | (주)큐엠씨 | Led chip classifying apparatus |
CN103529383A (en) * | 2012-02-29 | 2014-01-22 | 温州奔龙自动化科技有限公司 | Automatic testing device |
CN103426800A (en) * | 2013-07-20 | 2013-12-04 | 福州派利德电子科技有限公司 | Semiconductor chip automatic feeding double-station detection device |
CN105510805A (en) * | 2016-01-08 | 2016-04-20 | 上海恒浥智能科技股份有限公司 | Chip automatic detection device |
CN105572147A (en) * | 2016-01-08 | 2016-05-11 | 上海恒浥智能科技股份有限公司 | Chip automatic detection method |
CN106311633A (en) * | 2016-08-30 | 2017-01-11 | 福州派利德电子科技有限公司 | Multi-station series-connection labeling, testing and sorting device for integrated circuit chips |
CN208383937U (en) * | 2018-08-08 | 2019-01-15 | 格力电器(武汉)有限公司 | Automatic testing device |
Non-Patent Citations (2)
Title |
---|
姚兴田;刘建峰;邱自学;周一丹;: "集成电路芯片引脚外观自动检测系统的研究", 机械设计与制造, no. 11 * |
杨红伟;张岩;齐利芳;尹顺政;: "雪崩光电二极管芯片自动测试系统", 半导体技术, no. 06 * |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110596497A (en) * | 2019-10-09 | 2019-12-20 | 北京无线电计量测试研究所 | Transposition device for surface-mounted components |
CN111123093A (en) * | 2020-02-21 | 2020-05-08 | 绍兴图雅电子科技有限公司 | Photoelectric switch detection device |
CN111123093B (en) * | 2020-02-21 | 2020-11-06 | 国网上海市电力公司 | Photoelectric switch detection device |
CN111487490A (en) * | 2020-04-02 | 2020-08-04 | 湖南橡博电气有限公司 | Bus connecting device and inflatable ring main unit performance test system method based on bus connecting device |
CN112834899A (en) * | 2020-12-30 | 2021-05-25 | 广州奥松电子有限公司 | Chip detection device |
CN115135130A (en) * | 2021-03-26 | 2022-09-30 | 上海理光办公设备有限公司 | Chip socket pushing mechanism and feeding device |
CN113219325A (en) * | 2021-04-30 | 2021-08-06 | 无锡新微阳科技有限公司 | BGA chip detection system |
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