CN108709892A - Detecting system and its method - Google Patents
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- CN108709892A CN108709892A CN201810726243.1A CN201810726243A CN108709892A CN 108709892 A CN108709892 A CN 108709892A CN 201810726243 A CN201810726243 A CN 201810726243A CN 108709892 A CN108709892 A CN 108709892A
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- 238000000034 method Methods 0.000 title claims abstract description 38
- 230000000007 visual effect Effects 0.000 claims abstract description 47
- 230000007547 defect Effects 0.000 claims abstract description 35
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- 230000002093 peripheral effect Effects 0.000 claims description 31
- 230000011514 reflex Effects 0.000 claims description 25
- 238000012545 processing Methods 0.000 claims description 23
- 238000012544 monitoring process Methods 0.000 claims description 18
- 230000001360 synchronised effect Effects 0.000 claims description 4
- 238000004458 analytical method Methods 0.000 abstract description 3
- 238000001514 detection method Methods 0.000 description 25
- 230000008901 benefit Effects 0.000 description 18
- 238000004519 manufacturing process Methods 0.000 description 13
- 238000012856 packing Methods 0.000 description 8
- 230000004044 response Effects 0.000 description 4
- 238000003854 Surface Print Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
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- 238000007689 inspection Methods 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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Abstract
One detecting system and its method, the wherein detecting system, for detecting a certain testee, including an image acquisition unit and a reflector element.The image acquisition unit has a visual field.The reflector element is arranged at the visual field of the image acquisition unit, and when the testee is in the precalculated position in the visual field of the image acquisition unit, the at least part of image in the one not visible region on one surface of the testee is reflexed to the image acquisition unit by the reflector element, so that the image acquisition unit obtains at least part of image in the not visible region on the surface of the testee, to generate an image information, wherein the image information includes at least part in the not visible region on a visible area on the surface of the testee and the surface of the testee, for the comprehensive analysis image information to carry out accurate determining defects to the testee.
Description
Technical field
The present invention relates to a kind of defect detecting technique field more particularly to a kind of detecting systems and its method.
Background technology
With the rapid development of science and technology, Industrialized processing technique is also more and more perfect, and assembly line is as a kind of work
The mode of production in industry directly influences the working efficiency of industrialized production.Assembly line is also known as assembly line, refers to each production
Unit is only absorbed in the work for handling some segment, to improve working efficiency and yield.In addition, assembly line because scalability is high,
Adaptable and flexibility it is good and by the welcome of enterprise.
However, when carrying out production on assembly line, need to detect each product in real time with the presence or absence of defect either
No qualification, so that there will be defects or underproof product to reject in time, it is ensured that the follow-up work on the assembly line is normally carried out.
For example, the assembly line for producing such as packing box, packing case or packing jar etc. container, needs to lack the surface of each container
(for example, surface printing is reverse, printing walks and bar code, Quick Response Code surface tear or dirty etc.) is fallen into be detected, so as to
The container for rejecting existing defects in time, so that it is guaranteed that the quality of final products.Due to traditional detection mode be by manually into
Row detection, and pass through the rejecting of artificial income faulty goods so that traditional detection mode depends critically upon manually, substantially increases
Add cost of labor.Further, since a large amount of product fast moves on assembly line, and need to be detected each product,
And be difficult manually to see product clearly on the too fast assembly line of the speed of service, therefore, it has to the speed of service of the assembly line is reduced,
The working efficiency of assembly line can be greatly reduced in this way.
Currently, occurring a kind of alternative artificial detection device in the market, which passes through a picture pick-up device
To obtain the image information of product surface on assembly line, and the image information is sent to computer processing system, then the meter
Calculation machine processing system handles the image information, to judge that the product is qualified with the presence or absence of defect or master, and the computer
Processing system can control a defective products device for eliminating to reject existing defects or underproof product.Although the detection device can
It substitutes and manually detects the product on assembly line, to reduce cost of labor and to improve working efficiency, but a camera shooting is set
The standby sub-fraction image information that can only obtain the product surface, can not obtain the complete image information of the product surface, difficult
It is relatively low so as to cause the accuracy of detection of the detection device with comprehensive analysis image information to carry out accurate spectral discrimination, it can not
Meets the needs of industrialized production, it is still necessary to largely manually assist detecting.
In the prior art, in order to obtain more image informations of the product surface, a kind of improved detection dress is produced
It sets comprising two or more picture pick-up devices, and two or more picture pick-up devices are arranged in the stream
The different direction of waterline, to obtain the image information of the product surface.However, although this mode can obtain the product surface
Most of image information in addition all images information, but the computer processing system not only because need and meanwhile handle several
Image information and its workload and work difficulty is significantly increased, and also need to synchronous control and coordinate between multiple picture pick-up devices
Work, increase the complexity of entire detecting system.In addition, this detection mode can also substantially increase needed for detection product
Expense, and then the production cost of the product is increased, this obviously runs in the opposite direction with developing direction inexpensive in industrialized production.
Invention content
The advantage of the present invention is the provision of a kind of detecting system and its method, can only pass through an image and obtain
Unit, it will be able to which the most of image information for obtaining a testee whether there is defect to detect the testee.
Another advantage of the present invention is the provision of a kind of detecting system and its method, can substitute artificial inspection completely
It surveys, to reduce to artificial according to lazyness, and then reduces labour cost.
Another advantage of the present invention is the provision of a kind of detecting system and its method, can improve accuracy of detection, with
It is normally carried out conducive to the follow-up work of assembly line.
Another advantage of the present invention is the provision of a kind of detecting system and its method, can be applied to an automation
Assembly line, and fast and accurately determining defects are carried out to the testee on the automatic assembly line, to improve the automation
The production efficiency of assembly line.
Another advantage of the present invention is the provision of a kind of detecting system and its method, can obtain a measured object body surface
The image information in the not visible region in face is sentenced with providing more image informations for carrying out accurate defect to the testee
It is fixed.
Another advantage of the present invention is the provision of a kind of detecting system and its method, wherein the detecting system can
The image information in the not visible region on the testee surface is obtained in the way of mirror-reflection.
Another advantage of the present invention is the provision of a kind of detecting system and its method, wherein in some realities of the present invention
It applies in example, an image acquisition unit of the detecting system can obtain all images information on the testee surface, so as to
Comprehensive analysis described image information accurately carries out determining defects.
Another advantage of the present invention is the provision of a kind of detecting system and its method, wherein in some realities of the present invention
It applies in example, a reflector element of the detecting system can be in a manner of primary event by the not visible region on a testee surface
Image reflex to an image acquisition unit so that described image acquiring unit obtains the not visible region on the testee surface
Image information.
Another advantage of the present invention is the provision of a kind of detecting system and its method, wherein in some realities of the present invention
It applies in example, a reflector element of the detecting system can be in a manner of secondary reflection by the not visible region on a testee surface
Image reflex to an image acquisition unit so that described image acquiring unit obtains the not visible region on the testee surface
Image information.
Another advantage of the present invention is the provision of a kind of detecting system and its method, wherein in some realities of the present invention
It applies in example, the reflector element can reflex to the image of the peripheral surface of the testee positioned at the front of the testee
Described image acquiring unit, so that described image acquiring unit obtains the image information of the peripheral surface of the testee.
Another advantage of the present invention is the provision of a kind of detecting system and its method, wherein in some realities of the present invention
It applies in example, the image of the top surface of the testee can be reflexed to the institute positioned at the front of the testee by the reflector element
Image acquisition unit is stated, so that described image acquiring unit obtains the image information of the top surface of the testee.
Another advantage of the present invention is the provision of a kind of detecting system and its method, wherein in some realities of the present invention
It applies in example, the reflector element can reflex to the image of the peripheral surface of the testee positioned at the side of the testee
Described image acquiring unit, so that described image acquiring unit can obtain the image information of the peripheral surface of the testee.
Another advantage of the present invention is the provision of a kind of detecting system and its method, wherein in some realities of the present invention
Apply in example, the reflector element image of the peripheral surface of the testee can be reflexed to positioned at the testee just on
The described image acquiring unit of side, so that described image acquiring unit obtains the image information of the peripheral surface of the testee.
Another advantage of the present invention is the provision of a kind of system and method suitable for assembly line detection, wherein the inspection
Examining system and its method do not need accurate component and complicated structure, and manufacturing process is simple, of low cost.
Other advantage and characteristics of the present invention are able to fully demonstrate and can be by appended rights by following detailed descriptions
The combination of the means and device specially pointed out in it is required that is achieved.
One side under this invention can realize that the present invention of foregoing purpose and other purposes and advantage includes：
One detecting system, for a certain testee of detection, including：
One image acquisition unit, wherein described image acquiring unit have a visual field；With
One reflector element, wherein the reflector element is arranged at the visual field of described image acquiring unit, and working as should
When testee is in the precalculated position in the visual field of described image acquiring unit, the reflector element is by the measured object
At least part of image in the one not visible region on one surface of body reflexes to described image acquiring unit so that described image
Acquiring unit obtains at least part of image in the not visible region on the surface of the testee, to generate image letter
Breath, wherein described image information include a visible area on the surface of the testee and the surface of the testee should
At least part in not visible region, the wherein not visible region be the testee the surface on cannot be obtained by described image
Take the region that unit directly takes.
In some embodiments of the invention, the reflector element includes at least one first reflecting module, wherein per described
First reflecting module has one first reflecting surface, when the testee is in the precalculated position, first reflecting module
First reflecting surface by primary event by at least part of of the not visible region on the surface of the testee
Image reflexes to described image acquiring unit.
In some embodiments of the invention, described image acquiring unit and first reflecting module are arranged at respectively
The opposite both sides of one assembly line, it is described image acquiring unit, described wherein when the testee is in the precalculated position
First reflecting module and the testee are in same plane, with will be outside the one of the testee by first reflecting surface
The image of perimeter surface reflexes to described image acquiring unit.
In some embodiments of the invention, the reflector element further includes one second reflecting module, and described second
Reflecting module is located at the top of the assembly line, wherein second reflecting module has one second reflecting surface, wherein when this is tested
When object is in the precalculated position, second reflecting surface of second reflecting module is located at the top of the testee,
The image of one top surface of the testee is reflexed to described image acquiring unit by second reflecting surface.
In some embodiments of the invention, described image acquiring unit and first reflecting module are arranged at respectively
The opposite both sides of the assembly line, wherein when the testee is in the precalculated position, described image acquiring unit is located at
Above the side of the testee so that the visible area on the surface of the testee includes an outer weekly form of the testee
The part in face and a top surface of the testee.
In some embodiments of the invention, described image acquiring unit is arranged at the surface of the assembly line, described
First reflecting module is arranged at the side of the assembly line, wherein when the testee is in the precalculated position, the figure
As acquiring unit is located at the surface of the testee, first reflecting module is located at around the testee, to pass through
The image of one peripheral surface of the testee is reflexed to described image acquiring unit by first reflecting surface.
In some embodiments of the invention, the reflector element includes an at least reflecting module group, wherein the reflection
Module group and described image acquiring unit are arranged at the same side of the assembly line, when the testee is in the precalculated position
When, per the reflecting module group by secondary reflection by at least part in the not visible region on the surface of the testee
Image reflex to described image acquiring unit.
In some embodiments of the invention, per the reflecting module group include a third reflecting module and one the 4th reflection
Module, wherein the third reflecting module has a third reflecting surface, the 4th reflecting module to have one the 4th reflecting surface, and
The third reflecting surface and the 4th reflecting surface are set in a manner of aspectant, wherein when the testee is in described pre-
When positioning is set, first passes through the third reflecting surface and the image of one peripheral surface of the testee is reflexed into the 4th reflection
Behind face, then the image of the peripheral surface of the testee is reflexed to by described image by the 4th reflecting surface and obtains list
Member.
In some embodiments of the invention, the reflector element further includes at least one first reflecting module, and every institute
Stating the first reflecting module, there is one first reflecting surface, wherein described image acquiring unit and first reflecting module to be set respectively
The opposite both sides of the assembly line are placed in, when the testee is in the precalculated position, the institute of first reflecting module
The first reflecting surface is stated by primary event by at least part of image in the not visible region on the surface of the testee
Reflex to described image acquiring unit.
In some embodiments of the invention, first reflecting module is a flat surface speculum.
In some embodiments of the invention, second reflecting module is a flat surface speculum.
In some embodiments of the invention, the third reflecting module is a flat surface speculum, the 4th reflection mould
Block is a flat surface speculum.
In some embodiments of the invention, the detecting system further includes an image processing unit, wherein the figure
It, should with judgement for receiving and processing described image information as processing unit and described image acquiring unit are communicatively coupled
Whether testee is defective products, wherein when the testee is judged as defective products, described image processing unit generates one
Defective products signal.
In some embodiments of the invention, the detecting system further includes a defective products culling unit, wherein described
Defective products culling unit is communicatively coupled with described image processing unit, wherein the defective products culling unit is used to be based on institute
Defective products signal is stated, the testee corresponding with the defective products signal is rejected from the assembly line.
In some embodiments of the invention, the detecting system further includes a monitoring position unit, wherein the position
It sets monitoring unit to be communicatively coupled with described image acquiring unit, for monitoring whether each testee is in the figure
As acquiring unit the visual field in the precalculated position, it is described wherein when the testee is in the precalculated position
Monitoring position unit sends a control signal to described image acquiring unit, and it is dynamic that control described image acquiring unit executes shooting
Make, to obtain described image information.
According to another aspect of the present invention, invention further provides a methods, for detecting certain on an assembly line
One testee, including step：
By an image acquisition unit, the image of a visible area on a surface of the testee is obtained；
By described image acquiring unit, one that the surface of the testee is obtained by reflector element synchronization can not
At least part of image of viewed area；And
This of the image of the visible area on the surface based on the testee and the not visible region at least part
Image, generate an image information, for detect the testee the surface whether there is defect.
In some embodiments of the invention, the method further includes step：
By an image processing unit, the described image information from the figure acquiring unit is handled, to judge the quilt
Survey whether object is defective products；With
When the testee is judged as defective products, by a defective products culling unit, being rejected from the assembly line should
Testee.
In some embodiments of the invention, the method further includes step：
By a monitoring position unit, monitor whether the testee is in a visual field of described image acquiring unit
One precalculated position, if so, sending a control signal to described image acquiring unit, to control the execution of described image acquiring unit
The obtaining step.
In some embodiments of the invention, described by described image acquiring unit, it is synchronized and is obtained by a reflector element
The step of taking at least part of image in a not visible region on the surface of the testee, including step：
By the reflector element, by at least part of image in the not visible region on the surface of the testee
Reflex to described image acquiring unit；With
By described image acquiring unit, shoot the reflector element, with obtain the testee the surface this not
At least part of image of visible area.
In some embodiments of the invention, described by the reflector element, by being somebody's turn to do for the surface of the testee
The step of at least part of image in not visible region reflexes to described image acquiring unit, including step：
By at least one first reflecting module of the reflector element, by primary event by the surface of the testee
At least part of image in the not visible region reflex to described image acquiring unit.
In some embodiments of the invention, described by the reflector element, by being somebody's turn to do for the surface of the testee
The step of at least part of image in not visible region reflexes to described image acquiring unit, including step：
By an at least reflecting module group for the reflector element, by secondary reflection by the surface of the testee
At least part of image in the not visible region reflexes to described image acquiring unit.
By the understanding to subsequent description and attached drawing, further aim of the present invention and advantage will be fully demonstrated.
These and other objects, feature and the advantage of the present invention, by following detailed descriptions, drawings and claims obtain
To fully demonstrate.
Description of the drawings
Fig. 1 is the structural schematic diagram of the detection device of a prior art.
Fig. 2 is the system schematic of a detecting system of one first preferred embodiment according to the present invention.
Fig. 3 is the structural schematic diagram of the detecting system of above-mentioned first preferred embodiment according to the present invention.
Fig. 4 A and Fig. 4 B are the principle schematics of the detecting system of above-mentioned first preferred embodiment according to the present invention.
Fig. 5 shows one first deformation implementation of the detecting system of above-mentioned first preferred embodiment according to the present invention
Mode.
Fig. 6 shows one second deformation implementation of the detecting system of above-mentioned first preferred embodiment according to the present invention
Mode.
Fig. 7 shows a third deformation implementation of the detecting system of above-mentioned first preferred embodiment according to the present invention
Mode.
Fig. 8 shows the flow signal of an assembly line detection method of above-mentioned first preferred embodiment according to the present invention
Figure.
Fig. 9 is the principle schematic of a detecting system of one second preferred embodiment according to the present invention.
Figure 10 shows that the detection system of above-mentioned second preferred embodiment according to the present invention unifies variant embodiment.
Specific implementation mode
It is described below for disclosing the present invention so that those skilled in the art can realize the present invention.It is excellent in being described below
Embodiment is selected to be only used as illustrating, it may occur to persons skilled in the art that other obvious modifications.It defines in the following description
The present invention basic principle can be applied to other embodiments, deformation scheme, improvement project, equivalent program and do not carry on the back
Other technologies scheme from the spirit and scope of the present invention.
It will be understood by those skilled in the art that the present invention exposure in, term " longitudinal direction ", " transverse direction ", "upper",
The orientation or position of the instructions such as "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outside"
Relationship is to be based on the orientation or positional relationship shown in the drawings, and is merely for convenience of description of the present invention and simplification of the description, rather than
Indicate or imply that signified device or element must have a particular orientation, with specific azimuth configuration and operation, therefore above-mentioned
Term is not considered as limiting the invention.
It is understood that term " one " is interpreted as " at least one " or " one or more ", i.e., in one embodiment,
The quantity of one element can be one, and in a further embodiment, the quantity of the element can be multiple, and term " one " is no
It can be interpreted as the limitation to quantity.
Assembly line has been widely used in the production of various industrial products as a kind of efficient industrial mode of production
Field.Since defects detection process is as one of critical process on assembly line, directly decide that the assembly line whether can
Normal operation, or judge whether the quality of produced product is up to standard, therefore when producing product on assembly line, need reality
When detect each product with the presence or absence of defect or whether qualified, so that there will be defects or underproof product to reject in time.
For example, the assembly line for producing such as packing box, packing case or packing jar etc. container, needs to lack the surface of each container
(for example, surface printing is reverse, printing walks and bar code, Quick Response Code surface tear or dirty etc.) is fallen into be detected, so as to
The container for rejecting existing defects in time, so that it is guaranteed that the quality of final products.
However, for defect detecting device in the prior art or because a testee stops the sight of picture pick-up device
And the image in the not visible region on the testee surface can not be obtained, it is only capable of obtaining the visible area on the testee surface
Image information leads to not accurately carry out determining defects；Because using more picture pick-up devices and increasing whole detection dress
The complexity set and need to expend higher expense, cause the testing cost of the testee to greatly improve, do not meet industry
Metaplasia produces the inexpensive developing direction pursued.For example, as shown in Figure 1, producing a testee on an assembly line 600P
During 700P, testee 700P is directly shot using a picture pick-up device 10P, to obtain the one of testee 700P
Image information, convenient for carrying out determining defects to testee 700P.Due to blocking for testee 700P itself so that should
Picture pick-up device 10P can only take visible area 711P (i.e. testees of the surface 710P of testee 700P
The region that can be seen by picture pick-up device 10P on the surface 710P of 700P), and can not take testee 700P's
A not visible region 712P of surface 710P (i.e. can not be by the picture pick-up device on the surface 710P of testee 700P
The region that 10P sees), therefore the image information acquired in picture pick-up device 10P only includes the table of testee 700P
The visible area 711P of face 710P, without the not visible region 712P of the surface 710P including testee 700P,
It can not be more accurate due to smaller so as to cause the surface region of the detection device included by the acquired image information of the prior art
Ground carries out determining defects.
Therefore, the present invention provides a detecting system and its method, so as to only with a picture pick-up device,
The picture pick-up device can obtain the image of the not visible region 712P of the surface 710P of testee 700P, that is to say, that
Acquired image information had not only included the image of the visible area 711P of the surface 710P of testee 700P, but also including
The image of the not visible region 712P of the surface 710P of testee 700P, to only with a picture pick-up device energy
Most of image information of the surface 710P of testee 700P is enough obtained, and more reference letters are provided for determining defects
Breath, to carry out more accurate determining defects.
Specifically, shown in Fig. 2 to Fig. 4 B of refer to the attached drawing, a detection system of one first preferred embodiment according to the present invention
System 1 and its method are elucidated with, wherein the detecting system 1 is used to detect the testee 700P on assembly line 600P, with
Just defect dipoles are carried out to testee 700P.As shown in Figures 2 and 3, the detecting system 1 includes an image acquisition unit
10 and a reflector element 20, wherein described image acquiring unit 10 be set to obtain the image of testee 700P, with life
At corresponding image information, wherein the reflector element 20 is arranged in the visual field 100 of described image acquiring unit 10, with logical
The reflector element 20 is crossed by at least part of of the not visible region 712P of the surface 710P of testee 700P
Image reflexes to described image acquiring unit 10 so that the described image information acquired in described image acquiring unit 10 includes should
At least part of image of the not visible region 712P of the surface 710P of testee 700P, to increase described image
The image range of the surface 710P of included testee 700P, is convenient for accurate determining defects in information.It answers
Work as understanding, testee 700P can be, but not limited to be implemented as such as packing box, packing case, storage tank or bottle etc. appearance
Device needs to carry out defects detection (for example, surface printing is reverse, printing walks and bar code, Quick Response Code surface to the surface of container
Scratch or dirty etc.), certainly, testee 700P can also be implemented as other productions for needing to carry out open defect detection
Product are not in the present invention limited testee 700P.
More specifically, as shown in Figure 4 A and 4 B shown in FIG., when the testee 700P on assembly line 600P enters the figure
As acquiring unit 10 a visual field 100 when, described image acquiring unit 10 can directly take the table of testee 700P
The visible area 711P of face 710P, at the same time, described image acquiring unit 10 also can directly take the testee
The image formed in the reflector element 20 at least partially of the not visible region 712P of the surface 710P of 700P,
So that the described image information acquired in described image acquiring unit 10 had both included the surface 710P of testee 700P
The image of visible area 711P, but include the surface 710P of testee 700P the not visible region 712P this extremely
At least part of image.It should be appreciated that described image acquiring unit 10 can be, but not limited to be implemented as such as camera, camera shooting
The professional camera equipment of machine, camera etc. can also be implemented as such as smart mobile phone, computer, intelligent robot
Etc. with image-acquisition functions intelligent terminal, the type of described image acquiring unit 10 is not limited in the present invention.
It is worth noting that, as shown in figure 3, the detecting system 1 is needed to each measured object on assembly line 600P
Body 700P is detected, that is to say, that described image acquiring unit 10 needs the image for obtaining each testee 700P
Corresponding image information is generated, determining defects are carried out to corresponding testee 700P to be based on described image information.By
It moves along assembly line 600P in testee 700P, therefore, in first preferred embodiment of the present invention, keeps
The described image acquiring unit 10 of the detecting system 1 and the position of the reflector element 20 are constant, and testee 700P exists
The visual field 100 that described image acquiring unit 10 is passed sequentially through on assembly line 600P, successively so as to described image acquiring unit 10
Obtain the image of testee 700P.It should be appreciated that in other embodiments of the invention, the testee can also be kept
The position of 700P is constant, the position of mobile described image acquiring unit 10 and the reflector element 20, so that the testee
700P is in the visual field 100 of described image acquiring unit 10 successively, and then successively by described image acquiring unit 10
The image for obtaining testee 700P, to generate corresponding image information.
It is noted that as shown in Figure 4 A, the reflector element 20 includes at least one first reflecting module 21, wherein institute
Stating the first reflecting module 21 has at least one first reflecting surface 211, wherein first reflection of first reflecting module 21
The not visible region 712P of face 211 corresponding to the surface 710P of testee 700P so that first reflecting surface 211
It can show the image of the not visible region 712P of the surface 710P of testee 700P, at the same time, described first is anti-
First reflecting surface 211 for penetrating module 21 also corresponds to described image acquiring unit 10 so that first reflecting module 21
First reflecting surface 211 by primary event by the not visible region 712P of the surface 710P of testee 700P
Image reflex to described image acquiring unit 10, so that described image acquiring unit 10 can obtain testee 700P's
The image of the not visible region 712P of surface 710P.
It should be appreciated that the present invention first preferred embodiment in, first reflecting module 21 can with but it is unlimited
In being implemented as a plane mirror (i.e. first reflecting surface 211 of first reflecting module 21 is a flat surface), with shape
At testee 700P etc. big image, and the image of testee 700P and testee 700P be symmetrical with it is described
First reflecting surface 211 of first reflecting module 21.Certainly, in other embodiments of the invention, the first reflection mould
Block 21 can be implemented as the curved reflector (i.e. described of such as concave mirror, convex mirror or free-form curved mirror etc.
First reflecting surface 211 of one reflecting module 21 is a curved surface), to form the big image such as non-of testee 700P, example
Such as larger than the image of testee 700P, less than the image of testee 700P, or part amplification and part reduce
Image etc..
Illustratively, as illustrated in figs. 3 and 4, described image acquiring unit 10, first reflecting module 21 and should
Testee 700P is located in same level, and described image acquiring unit 10 is arranged at the one of assembly line 600P
First reflecting module 21 of side, the reflector element 20 is arranged at the other side (i.e. opposite one of assembly line 600P
Side), that is to say, that assembly line 600P is between described image acquiring unit 10 and the reflector element 20 so that at this
The testee 700P moved on assembly line 600P can pass sequentially through the visual field 100 of described image acquiring unit 10, wherein
When each testee 700P is moved to the precalculated position in the visual field 100 of described image acquiring unit 10, institute
The visible area 711P and the quilt of surface 710P of testee 700P can directly be taken by stating image acquisition unit 10
The image that the not visible region 711P of the surface 710P of object 700P is formed in first reflecting module 21 is surveyed, to obtain
Obtain the image of the visible area 711P and the not visible region 712P of the surface 710P of testee 700P.
Significantly, since first reflecting module 21 of the reflector element 20, which is located at described image, obtains list
Between 10 and testee 700P of member, it is possible that because testee 700P blocks the institute of first reflecting module 21
It states the first reflecting surface 211 and causes described image acquiring unit 10 that can not take and be somebody's turn to do by first reflecting surface 211 formation
The image of testee 700P, therefore first reflecting module 21 of described image acquiring unit 10 and the reflector element 20
Between specific location arrangement needs be designed according to the shape and size of testee 700P, to ensure that described image obtains
Take unit 10 that can take the table of testee 700P by first reflecting surface 211 of first reflecting module 21
At least part of the not visible region 711P of face 710P.
Illustratively, as shown in Figure 4 B, the visual field 100 of described image acquiring unit 10 includes one first visual field 101
At least one second visual field 102, and first visual field 101 and per 102 non-overlapping copies of the second visual field, wherein described the
First reflecting surface 211 of one reflecting module 21 is arranged at second visual field 102, and the precalculated position is located at described the
In one visual field 101, and when testee 700P is in the precalculated position, testee 700P is blocked completely just
The first visual field 101 is stated in residence, therefore when testee 700P is in the precalculated position, 10 energy of described image acquiring unit
Testee 700P and first reflecting surface 211 are shot, and testee 700P can be avoided to block institute
State the first reflecting surface 211.
Preferably, as shown in Figure 4 B, the visual field 100 of described image acquiring unit 10 includes two second visual fields
102, wherein first visual field 101 is between described two second visual fields 102, wherein the reflector element 20 includes described in two
First reflecting module 21, and two first reflecting module 21 is arranged at second visual field 102 respectively, it is tested to work as this
When object 700P is located at first visual field 101, described two first reflecting modules 21 are located at the two of testee 700P
Side, so that the image of the different piece of the surface 710P of testee 700P is passed through described two first reflecting modules respectively
21 form so that described image acquiring unit 10 can obtain the different piece of the surface 710P of testee 700P simultaneously
Image.
It is highly preferred that as shown in Figure 4 B, described two first reflecting modules 21 are symmetrically disposed on described image and obtain list
Second visual field 102 of member 10, and when testee 700P is located at first visual field 101, described two first reflections
Module 21 is symmetrically located at the both sides of testee 700P, to simplify the arrangement difficulty of the detecting system 1.
It is noted that in first preferred embodiment of the present invention, although attached drawing 2 is to Fig. 4 B and next
Description by taking testee 700P has cylindrical structure as an example, illustrate the feature of the detecting system 1 of the present invention and excellent
Gesture, it will be appreciated by those skilled in the art that the detection disclosed in attached drawing 2 to Fig. 4 B and following description
System 1 is only for example, and does not constitute the limitation to present disclosure and range, for example, the detecting system 1 other
In example, the structure of testee 700P can also be cube, square, sphere, centrum etc. structure.
Illustratively, in first preferred embodiment of the present invention, as shown in Figure 4 B, testee 700P's should
Surface 710P is implemented as the peripheral surface of testee 700P, can quilt wherein in the peripheral surface of testee 700P
The region that described image acquiring unit 10 takes is defined as the visible area of the surface 710P of testee 700P
711P cannot be defined as by the region that described image acquiring unit 10 takes in the peripheral surface of testee 700P
The not visible region 712P of the surface 710P of testee 700P.In order to ensure described image acquiring unit 10 can lead to
Cross first reflecting module 21 first reflecting surface 211 obtain this of surface 710P of testee 700P can not
The image of the complete image of viewed area 711P, the not visible region 711P of the surface 710P of testee 700P has needed
It is located in second visual field 102 of the visual field 100 of described image acquiring unit 10 entirely.
It is noted that the described image acquiring unit 10 when the detecting system 1 obtains testee 700P's
Image needs to handle acquired described image information, to judge the testee after generating described image information
Whether 700P is with the presence or absence of defect or be defective products.Therefore, in first preferred embodiment of the present invention, such as Fig. 2 and
Shown in Fig. 3, the detecting system 1 further includes an image processing unit 30, wherein described image processing unit 30 and described image
Acquiring unit 10 is communicatively coupled, for receiving and processing the described image information from described image acquiring unit 10, with
Determining defects are carried out to testee 700P based on described image information, to judge whether testee 700P is bad
Product.It should be appreciated that described image processing unit 30 can be, but not limited to be implemented as such as CPU, server, cloud computing etc. tool
There is the system of computing capability.
Then, if testee 700P is judged as non-defective unit, testee 700P can continue in the assembly line
It is moved on 600P, to enter next process；If testee 700P is judged as defective products, described image processing is single
Member 30 will generate a defective products signal.At the same time, another testee 700P is moved into described image processing unit 10
The visual field 100 the precalculated position, to continue to be detected another testee 700P and determining defects, such as
This circulate operation is sentenced with realizing to be detected each product (i.e. the testee 700P) on assembly line 600P with defect
It is fixed.
However, once a testee 700P is judged as after defective products (i.e. existing defects), if will not be somebody's turn to do accordingly
Testee 700P is rejected from assembly line 600P, then can influence being normally carried out for subsequent handling.Therefore, such as Fig. 2 and Fig. 3 institutes
Show, the detecting system 1 further includes a defective products culling unit 40, wherein at the defective products culling unit 40 and described image
Reason unit 30 is communicatively coupled, and the defective products culling unit 40 is used to be based on the defective products signal, from the assembly line
The testee 700P for being judged as defective products is rejected on 600P, to ensure the normal operation of assembly line 600P.It should manage
Solution, the defective products culling unit 40 can be, but not limited to be implemented as a pneumatic device for eliminating, will in a manner of by air blowing
Testee 700P blows off assembly line 600P, i.e., testee 700P is rejected from assembly line 600P.Certainly at this
In the other embodiment of invention, the defective products culling unit 40 can also be implemented as a mechanical arm, to pass through mechanical driven
Mode the testee is pushed away into assembly line 600P, i.e., testee 700P is rejected from assembly line 600P.
Further, as shown in Figures 2 and 3, the detecting system 1 further includes a monitoring position unit 50, wherein described
Monitoring position unit 50 is communicatively coupled with described image acquiring unit 10, wherein the monitoring position unit 50 is for monitoring
Whether each testee 700P is in the precalculated position of the visual field 100 of described image acquiring unit 10, and at this
When testee 700P is in the precalculated position, the monitoring position unit 50 generates a control signal, and by the control
Signal is sent to described image acquiring unit 10.Then, described image acquiring unit 10 is used to, in response to the control signal, obtain
The image for taking the testee 700P in the precalculated position, to generate described image information.It should be appreciated that the position
Monitoring unit 50 can be, but not limited to be implemented as an infrared inductor or an infrared induction switch, in the present invention to institute's rheme
The type for setting monitoring unit 50 is not limited.
It is worth noting that, in first preferred embodiment of the present invention, by described image acquiring unit 10, institute
It states the first reflecting module 21 and testee 700P is located in same level so that described image acquiring unit 10 can not
Obtain the image of a top surface of testee 700P.However, in order to carry out comprehensive defect to testee 700P
Judgement, also needs to the image for obtaining the top surface of testee 700P sometimes, for example, judging being somebody's turn to do for testee 700P
Trade mark on top surface whether foul, fold etc..Therefore, attached drawing 5 shows that according to the present invention first preferably implements
One first variant embodiment of the detecting system 1 of example, wherein the reflector element 20 further includes at least one second reflection
Module 22, wherein second reflecting module 22 is located in the visual field 100 of described image acquiring unit 10, and when this is tested
When object 700P is in the precalculated position in first visual field 101, second reflecting module 22 is located at the measured object
The top of body 700P, so that described image acquiring unit 10 can take the testee by second reflecting module 22
The image of the top surface of 700P, to while obtaining the image of the peripheral surface of testee 700P, additionally it is possible to
Obtain the image of the top surface of testee 700P.
More specifically, as shown in figure 5, second reflecting module 22 has at least one second reflecting surface 221, wherein described
Second reflecting surface 221 is towards the top surface 710P of described image acquiring unit 10 and testee 700P, and this is tested
The light of the top surface 710P reflections of object 700P or the light sent out reflex to the figure by second reflecting surface 221
As acquiring unit 10 so that described image acquiring unit 10 can obtain the testee by second reflecting surface 221
The image of the top surface 710P of 700P.
It should be appreciated that in first variant embodiment, second reflecting module 22 can be, but not limited to be carried out
It is a flat surface speculum (i.e. second reflecting surface 221 of second reflecting module 22 is a flat surface), it is tested to form this
Object 700P etc. big image, and the image of testee 700P and testee 700P are symmetrical with second reflection
Second reflecting surface 221 of module 22.Certainly, in other embodiments of the invention, second reflecting module 22 can be with
It is implemented as curved reflector (the i.e. described second reflection mould of such as concave mirror, convex mirror or free-form curved mirror etc.
Second reflecting surface 221 of block 22 is a curved surface), to form the big image such as non-of testee 700P, it is greater than this
The image of testee 700P amplifies the image etc. reduced with part less than the image of testee 700P, or part.
Attached drawing 6 shows one second deformation of the detecting system 1 of the first preferred embodiment according to the present invention
Embodiment, wherein when testee 700P is located at the precalculated position of the visual field 100, described image acquiring unit
10 above the side of testee 700P, so that described image acquiring unit 10 can directly shoot testee 700P
The top surface and the peripheral surface a part (i.e. visible area 711P of the surface 710P of testee 700P).
At the same time, first reflecting surface 211 of first reflecting module 21 of the reflector element 20 is still towards described image
Another part (i.e. surface 710P of testee 700P of acquiring unit 10 and the peripheral surface of testee 700P
The not visible region 712P) so that described image acquiring unit 10 is described first anti-by first reflecting module 21
Another part that face 211 takes the peripheral surface of testee 700P is penetrated, so as to obtain testee 700P
The top surface and the peripheral surface image.
In other words, in second variant embodiment, any reflecting module 21 need not be increased, it is only necessary to adjust
Position of the whole described image acquiring unit 10 relative to testee 700P or assembly line 600P, and correspondingly described in adjustment
The angle of inclination of first reflecting surface 211 of first reflecting module 21 of reflector element 20, it will be able to so that the figure
As acquiring unit 10 simultaneously obtain testee 700P the top surface and the peripheral surface image, with generate accordingly scheme
As information.
Attached drawing 7 shows the third deformation of the detecting system 1 of the second preferred embodiment according to the present invention
Embodiment, wherein when testee 700P is located at the precalculated position of the visual field 100, described image acquiring unit
10 are located at the surface of testee 700P, so that described image acquiring unit 10 only can directly shoot the testee
The top surface (i.e. visible area 711P of the surface 710P of testee 700P) of 700P.At the same time, described anti-
First reflecting surface 211 of first reflecting module 21 of unit 20 is penetrated still towards described image acquiring unit 10 and the quilt
Survey the peripheral surface (i.e. not visible region 712P of the surface 710P of testee 700P) of object 700P so that institute
It states image acquisition unit 10 and the testee is taken by first reflecting surface 211 of every first reflecting module 21
At least part of the peripheral surface of 700P, so as to obtain the top surface and the peripheral surface of testee 700P
Image.
Particularly, as shown in fig. 7, two first reflecting modules 21 are symmetrically disposed on the two of assembly line 600P
Side, when the precalculated position to be in the visual field 100 of described image acquiring unit 10 in testee 700P, one
First reflecting surface 211 of first reflecting module 21 shows the half of the peripheral surface of testee 700P, separately
First reflecting surface 211 of one first reflecting module 21 then shows the another of the peripheral surface of testee 700P
Half, that is to say, that two first reflecting modules 21 can show the peripheral surface of testee 700P completely so that institute
The complete image of the peripheral surface of testee 700P can be obtained by stating image acquisition unit 10, to improve the detecting system
1 judgement precision.
It is worth noting that, in some other embodiments of the present invention, the reflector element 20 can also include three
Or three or more first reflecting modules 21, to be located at the pre-determined bit of the visual field 100 in testee 700P
When setting, it is located at around testee 700P per first reflecting module 21, to pass through all the first reflection moulds
First reflecting surface 211 of block 21 completely shows the peripheral surface of testee 700P.It should be appreciated that being located at
Gap between first reflecting module 21 of arbitrary the two of the assembly line both sides be more than testee 700P perpendicular to
Size on testee 700P moving directions hinders testee 700P in the stream to prevent first reflecting module 21
Normal movement on waterline.
According to another aspect of the present invention, invention further provides an assembly line detection methods, tested for detection one
Object 700P whether there is defect.Specifically, as shown in figure 8, the flowing water line detecting method includes step：
S1：By an image acquisition unit 10, a visible area of a surface 710P of testee 700P is obtained
The image of 711P；
S2：By described image acquiring unit 10, is synchronized by a reflector element 20 and obtain being somebody's turn to do for testee 700P
At least part of image of a not visible region 712P of surface 710P；And
S3：The image of the visible area 711P on the surface based on testee 700P and the not visible region 712P
At least part of image, an image information is generated, for detecting the surface 710P of testee 700P with the presence or absence of lacking
It falls into.
Further, the flowing water line detecting method further includes step：
S4：By an image processing unit 30, described image information is handled, it is corresponding with described image information to judge
Whether testee 700P is defective products；With
S5：By a defective products culling unit 40, testee 700P is rejected from assembly line 600P.
Significantly, since testee 700P is moved on an assembly line 600P, therefore in the step S1
Further include before step with the step S2：
By a monitoring position unit 50, monitor whether testee 700P is in the one of described image acquiring unit 10
One precalculated position of visual field 100, if so, sending a control signal to described image acquiring unit 10, to control described image
Acquiring unit 10 executes the obtaining step.
Preferably, the step S2 further includes step：
By the reflector element 20, extremely by the not visible region 712P of the surface 710P of testee 700P
At least part of image reflexes to described image acquiring unit 10；With
By described image acquiring unit 10, the reflector element 20 is shot, to obtain the table of testee 700P
At least part of image of the not visible region 712P of face 710P.
Shown in refer to the attached drawing 9, the detecting system 1A and its method of one second preferred embodiment according to the present invention are explained
It is bright.Compared to the first preferred embodiment according to the present invention, the second preferred embodiment according to the present invention it is described
Detecting system 1A the difference is that：The reflector element 20A of the detecting system 1A further includes an at least reflecting module
Group 23A, and described image acquiring unit 10 and the reflecting module group 23A are located at the same side of assembly line 600P, wherein
Include a third reflecting module 231A and one corresponding with the third reflecting module 231A the per the reflecting module group 23A
Four reflecting module 232A, and when testee 700P is located at the described pre- of the visual field 100 of described image acquiring unit 10
When positioning is set, the image of testee 700P is reflexed to by described image by secondary reflection per the reflecting module group 23A
Acquiring unit 10, that is to say, that per the reflecting module group 23A the third reflecting module 231A by first reflection come
Show the first image of testee 700P, then the 4th reflecting module 232A shows the quilt by the second secondary reflection
Survey the second image of object 700P so that described image acquiring unit 10 shoots being somebody's turn to do shown by the 4th reflecting module 232A
Second image of testee 700P to obtain the image of testee 700P, and generates an image information, wherein described
Image information include the not visible region 711P of the surface 710P of testee 700P at least part of image and
The image of a part of visible area 212P.
More specifically, as shown in figure 9, a third of the third reflecting module 231A of the reflecting module group 23A is anti-
It penetrates module 2311A and one the 4th reflecting surface 2321A of the 4th reflecting module 232A is set in a manner of aspectant.When this
When testee 700P is in the precalculated position, the third reflecting module 231A's of the reflecting module group 23A is described
Third reflecting surface 2311A is towards testee 700P, to show the testee by the third reflecting surface 2311A
A part for a part and the not visible region 712P of the visible area 711P of the surface 710P of 700P；The reflection mould
The 4th reflecting surface 2321A of the 4th reflecting module 232A of block group 23A is shown by the third reflecting surface 2311A
Part and the not visible region 712P of the visible area 711P of the surface 710P of the testee 700P of display
The part so that described image acquiring unit 10 can pass through the 4th reflection mould for shooting the reflecting module group 23A
The 4th reflecting surface 2321A of block 232A, come obtain testee 700P surface 710P visible area 711P
The part and the not visible region 712P the part image, to generate described image information.
It should be appreciated that since described image acquiring unit 10 can obtain the measured object by the reflecting module group 23A
A part of image of the not visible region 712P of body 700P, therefore when obtaining the complete image in the not visible region, it is described
Image acquisition unit 10 needs the not visible region by the testee 700P acquired in first reflecting module 21
Range become smaller so that the installation site of first reflecting module 21 is more flexible, and first reflecting module 21
Installation site may be located remotely from the assembly line 600P, stop testee 700P in the stream to prevent first reflecting module 21
Waterline 600P normal movements.
Preferably, as shown in figure 9, the reflector element 20A includes the two reflecting module group 23A, and when this is tested
When object 700P is in the precalculated position, the two reflecting module group 23A are symmetrically located at the two of testee 700P
Side, and two the 4th reflecting surface 2321A intersections ground connections, so that two the 4th reflecting surface 2321A cooperate, with complete
Site preparation shows the visible area 711P of testee 700P, described acquired in described image acquiring unit 10 to ensure
Image information include the visible area 711P of testee 700P complete image and the not visible region 712P at least
The image of a part.
It should be appreciated that in second preferred embodiment of the present invention, the third reflecting module 231A and described the
Four reflecting module 232A can be, but not limited to be implemented as such as a plane mirror or a curved reflector.
Attached drawing 10 shows that a deformation of the detecting system 1A of above-mentioned second preferred embodiment according to the present invention is real
Mode is applied, wherein the reflector element 20A of the detecting system 1A does not include first reflecting module 21, wherein the figure
As acquiring unit 10 obtains the table of testee 700P by the reflecting module group 23A of the reflector element 20A
At least part of image of the not visible region 712P of face 710P.
Significantly, since described image acquiring unit 10 and the reflecting module group 23A are located at the assembly line
The same side of 600P, and it is not provided with any reflecting module (such as described first reflection mould in the other side of assembly line 600P
Block), therefore, assembly line 600P can be arranged in a manner of the environment wall surface for closing on such as factory's wall etc., so as to
Rationally utilize production space.
Those skilled in the art would appreciate that shown in attached drawing and the embodiment of the present invention described above is only to this hair
Bright example rather than limit.
It can thus be seen that the object of the invention can be efficiently accomplished fully.For explaining function and structure principle of the present invention
The embodiment is absolutely proved and is described, and the present invention is not limited by based on the change on these embodiment basis.
Therefore, the present invention includes all modifications covered within appended claims claimed range and spirit.
Claims (21)
1. a detecting system, for detecting a certain testee, which is characterized in that including：
One image acquisition unit, wherein described image acquiring unit have a visual field；With
One reflector element, wherein the reflector element is arranged at the visual field of described image acquiring unit, and when this is tested
When object is in the precalculated position in the visual field of described image acquiring unit, the reflector element is by the testee
At least part of image in the one not visible region on one surface reflexes to described image acquiring unit so that described image obtains
Unit obtains at least part of image in the not visible region on the surface of the testee, to generate an image information,
Wherein described image information include a visible area on the surface of the testee and the surface of the testee this not
At least part of visible area, the wherein not visible region be the testee the surface on cannot be obtained by described image
The region that unit directly takes.
2. detecting system as described in claim 1, wherein the reflector element includes at least one first reflecting module, wherein
There is one first reflecting surface per first reflecting module, when the testee is in the precalculated position, described first is anti-
First reflecting surface of module is penetrated by primary event by least the one of the not visible region on the surface of the testee
Partial image reflexes to described image acquiring unit.
3. detecting system as claimed in claim 2, wherein described image acquiring unit and first reflecting module respectively by
The opposite both sides of an assembly line are set to, wherein when the testee is in the precalculated position, described image obtains single
First, described first reflecting module and the testee are in same plane, with by first reflecting surface by the measured object
The image of one peripheral surface of body reflexes to described image acquiring unit.
4. detecting system as claimed in claim 3, wherein the reflector element further includes one second reflecting module, and institute
The top that the second reflecting module is located at the assembly line is stated, wherein second reflecting module has one second reflecting surface, wherein when
When the testee is in the precalculated position, second reflecting surface of second reflecting module is located at the testee
Top, the image of one top surface of the testee is reflexed to described image acquiring unit by second reflecting surface.
5. detecting system as claimed in claim 2, wherein described image acquiring unit and first reflecting module respectively by
The opposite both sides of an assembly line are set to, wherein when the testee is in the precalculated position, described image obtains single
Member is located above the side of the testee so that the visible area on the surface of the testee includes the one of the testee
A part for peripheral surface and a top surface of the testee.
6. detecting system as claimed in claim 2, wherein described image acquiring unit be arranged at an assembly line just on
Side, first reflecting module are arranged at the side of the assembly line, wherein when the testee is in the precalculated position,
Described image acquiring unit is located at the surface of the testee, and first reflecting module is located at around the testee,
The image of one peripheral surface of the testee is reflexed to described image acquiring unit by first reflecting surface.
7. detecting system as described in claim 1, wherein the reflector element includes at least a reflecting module group, wherein institute
It states reflecting module group and described image acquiring unit is arranged at the same side of an assembly line, when the testee is in described pre-
Positioning is when setting, per the reflecting module group by secondary reflection by the not visible region on the surface of the testee at least
The image of a part reflexes to described image acquiring unit.
8. detecting system as claimed in claim 7, wherein include a third reflecting module and one the per the reflecting module group
Four reflecting modules, wherein the third reflecting module has a third reflecting surface, the 4th reflecting module to have one the 4th reflection
Face, and the third reflecting surface and the 4th reflecting surface are set in a manner of aspectant, wherein at the testee
When the precalculated position, first pass through the third reflecting surface image of one peripheral surface of the testee is reflexed to it is described
After 4th reflecting surface, then the image of the peripheral surface of the testee reflexed to by described image by the 4th reflecting surface
Acquiring unit.
9. detecting system as claimed in claim 8, wherein the reflector element further includes at least one first reflecting module, and
And there is one first reflecting surface per first reflecting module, wherein described image acquiring unit and first reflecting module are divided
It is not arranged at the opposite both sides of the assembly line, when the testee is in the precalculated position, the first reflection mould
First reflecting surface of block is by primary event by at least part in the not visible region on the surface of the testee
Image reflex to described image acquiring unit.
10. the detecting system as described in any in claim 2 to 6, wherein first reflecting module is a flat surface reflection
Mirror.
11. detecting system as claimed in claim 4, wherein second reflecting module is a flat surface speculum.
12. detecting system as claimed in claim 8 or 9, wherein the third reflecting module is a flat surface speculum, described
4th reflecting module is a flat surface speculum.
13. the detecting system as described in any in claim 1 to 9 further includes an image processing unit, wherein at described image
Reason unit is communicatively coupled with described image acquiring unit, for receiving and processing described image information, to judge that this is tested
Whether object is defective products, wherein when the testee is judged as defective products, it is bad that described image processing unit generates one
Product signal.
14. detecting system as claimed in claim 13 further includes a defective products culling unit, wherein the defective products rejects list
Member is communicatively coupled with described image processing unit, wherein the defective products culling unit is used to believe based on the defective products
Number, the testee corresponding with the defective products signal is rejected from the assembly line.
15. detecting system as claimed in claim 13 further includes a monitoring position unit, wherein the monitoring position unit with
Described image acquiring unit is communicatively coupled, for monitoring whether each testee is in described image acquiring unit
The precalculated position in the visual field, wherein when the testee is in the precalculated position, the monitoring position unit
A control signal is sent to described image acquiring unit, control described image acquiring unit executes shooting action, described in acquisition
Image information.
16. a method, for detecting a certain testee, which is characterized in that including step：
By an image acquisition unit, the image of a visible area on a surface of the testee is obtained；
By described image acquiring unit, an invisible range on the surface for obtaining the testee is synchronized by a reflector element
At least part of image in domain；And
At least part of figure of the image of the visible area on the surface based on the testee and the not visible region
Picture generates an image information, and the surface for detecting the testee whether there is defect.
17. the method described in claim 16 further includes step：
By an image processing unit, the described image information from the figure acquiring unit is handled, to judge the measured object
Whether body is defective products；With
When the testee is judged as defective products, by a defective products culling unit, it is tested that this is rejected from an assembly line
Object.
18. the method described in claim 16 further includes step：
By a monitoring position unit, it is pre- to monitor whether the testee is in a visual field of described image acquiring unit one
Positioning is set, if so, sending a control signal to described image acquiring unit, to control described in the execution of described image acquiring unit
Obtaining step.
19. the method as described in one of claim 16 to 18, wherein it is described by described image acquiring unit, pass through one
Reflector element synchronizes the step of at least part of image in a not visible region on the surface for obtaining the testee, including
Step：
By the reflector element, at least part of image in the not visible region on the surface of the testee is reflected
To described image acquiring unit；With
By described image acquiring unit, shoot the reflector element, with obtain the testee the surface this is not visible
At least part of image in region.
20. method as claimed in claim 19, wherein it is described by the reflector element, by the surface of the testee
At least part of image in not visible region the step of reflexing to described image acquiring unit, including step：
By at least one first reflecting module of the reflector element, pass through primary event being somebody's turn to do the surface of the testee
At least part of image in not visible region reflexes to described image acquiring unit.
21. method as claimed in claim 20, wherein it is described by the reflector element, by the surface of the testee
At least part of image in not visible region the step of reflexing to described image acquiring unit, including step：
By an at least reflecting module group for the reflector element, by secondary reflection by the surface of the testee this not
At least part of image of visible area reflexes to described image acquiring unit.
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