CN108051767B

CN108051767B - A kind of automatic diagnosis method for integrated circuit tester

Info

Publication number: CN108051767B
Application number: CN201810007039.4A
Authority: CN
Inventors: 钟景华; 钱黄生
Original assignee: NANJING GLARUN-ATTEN TECHNOLOGY Co Ltd
Current assignee: NANJING GLARUN-ATTEN TECHNOLOGY Co Ltd
Priority date: 2018-01-04
Filing date: 2018-01-04
Publication date: 2019-07-19
Anticipated expiration: 2038-01-04
Also published as: CN108051767A

Abstract

The present invention relates to a kind of automatic diagnosis methods for integrated circuit tester, diagnose including external digital spc table, power supply, diagnose automatically automatically in machine；Power supply diagnoses automatically: progress impedance measurement first, digital spc table are placed in impedance shelves, start to cut relay, switching all the way have been surveyed in addition all the way, until being fully completed；By result and preset Comparative result, such as then start voltage measurement, the process of voltage measurement is as resistance measurement in range entirely；All test results are compared by last upper computer software with preset correct numerical intervals, obtain diagnostic result；Under the premise of there is no problem for the automatic diagnostic result of power supply, diagnosed automatically in carry out machine；Diagnosis includes that storage element diagnoses automatically automatically in the machine, and PE logic diagnoses automatically, PPMU simulation is automatic diagnoses.The present invention, which realizes, does not go each test point of manual measurement manually, improves testing efficiency, and avoiding test probe from encountering peripheral devices leads to short circuit.

Description

A kind of automatic diagnosis method for integrated circuit tester

Technical field

The present invention relates to a kind of automatic diagnosis methods for integrated circuit tester, the integrated circuit suitable for multichannel Tester belongs to integrated circuit tester lane testing field.

Background technique

The epoch of current informationization high development, semicon industry explosive growth.All trades and professions all be unable to do without semiconductor Chip arrives greatly aircraft satellite, small to arrive wearable device etc..And integrated circuit tester be IC chip is tested it is special Use instrument and equipment.Integrated circuit testing is applied in the full mistake of IC design, chip manufacturing, encapsulation and Application of integrated circuit Journey.The main purpose of test is to guarantee that chip can fully achieve the function and performance indicator of design specification book defined, after factory It meets the needs of users.

Manufacturing industry is the foundation stone of modern industry, is the guarantee realized modernization of the country, and the embodiment of national overall national strength, It is a backbone of a country.In industrial 4.0 epoch, first elect intelligence manufacture, low-carbon, environmental protection, energy conservation, be efficiently intelligence manufacture marrow Place.The principle of intelligence manufacture is also abided by terms of semiconductor manufacturing industry, chip testing.Present semicon industry, chip Integrated level is higher and higher, and function is stronger and stronger, and number of pins is also more and more.This requires the function of integrated circuit tester also to want More powerful, port number is more.Present tester channel generally has several hundred, and more persons reach K grades, and power supply is more, in addition System complex.It in research and development and production, manually goes debug circuit more laborious, in order to improve debugging efficiency, now devised one Cover automatic diagnosis method.

Summary of the invention

In view of the above problems, the present invention provides a kind of simple, it is efficient for the automatic of integrated circuit tester channel Diagnostic method.

In order to solve problem above, present invention employs following technical solutions: it is a kind of for integrated circuit tester from Dynamic diagnostic method, which is characterized in that diagnose including external digital spc table, power supply, diagnosed automatically in machine automatically；

The power supply diagnoses automatically, does not need manually to go the characteristic values such as impedance and the voltage of each test point of manual measurement, Digital spc table outside intelligent control is tested, and test is over being transmitted to host computer for numerical value.Impedance measurement is carried out first, it is program-controlled Digital table is placed in impedance shelves, starts to cut relay, switching all the way has been surveyed in addition all the way, until being fully completed；By result and preset Comparative result then start voltage measurement, the process of voltage measurement is as resistance measurement such as entirely in range.Finally by institute Some test results are compared with preset correct numerical intervals, obtain diagnostic result；

Under the premise of there is no problem for the automatic diagnostic result of power supply, diagnoses in carry out machine, examined automatically in the machine automatically Disconnected includes that storage element diagnoses automatically, and PE logic diagnoses automatically, PPMU simulation is automatic diagnoses；

The storage unit diagnoses automatically: when integrated circuit tester is researched and developed and is generated, it is single to diagnose the inside storage The quality of component, the quality of welding read and write the correctness of logic.And inside integrated circuit tester, storage unit is very It is more, manually go to diagnose time-consuming and laborious but also not comprehensive, not in place in presence diagnosis situation.The method that the present invention uses is such as Under: FPGA generates batch data and writes into storage element different address, covers whole memory spaces, then reads these numbers again It is compared according into FPGA, all coincide, then there is no problem for the read-write logic of storage unit, welding and storage chip itself No problem, diagnosis terminate；

PE logic function is a critical function of integrated circuit tester, this function generates to swash required for chip testing Encourage the response wave shape of waveform and acquisition chip.Channel is numerous, if measured with traditional diagnostic means with oscillograph, by The test in a channel, it is time-consuming and laborious.It includes that FPGA generates waveform, driving chip that PE logic of the present invention diagnoses automatically ADATE305, comparator；FPGA generates the square-wave waveform of predetermined frequency, is input to driving chip ADATE305, driving chip tune The level of whole waveform to meet the input requirements of external chip, while this output waveform using comparator by output side Wave is compared with preset level, and waveform voltage is higher than the output of preset level higher position, otherwise output is low, and output meets FPGA's The square wave of level standard is finally input to FPGA again, and FPGA carries out frequency measurement, if frequency is identical with preset square wave frequency, Then sending and receiving link, all there is no problem, and PE logic function diagnoses automatically to be terminated；

PPMU analog functuion is another critical function of integrated circuit tester, this function be mainly capable of providing to External chip analog voltage electric current, while the voltage and current etc. of external chip output can be tested.Also in that channel is numerous, people Work is gone to measure time-consuming and laborious.The automatic diagnosis of PPMU of the present invention simulation include driving chip ADATE305, multiple selector, ADC acquisition unit；Here driving chip ADATE305 is exactly the driving chip ADATE305 in PE logic function self diagnosis, it Preset voltage is exported, multiple selector selects to enter ADC acquisition unit all the way every time, and FPGA reads this road measurement result and makes After judgement, judging result is recorded, under multiple selector reselection all the way, continues to measure, until having surveyed all channels. The automatic diagnosis of PPMU simulation terminates.

Power supply of the invention diagnoses to realize automatically does not go each test point of manual measurement manually, greatly improves test Efficiency, while personnel's discord circuit board contacts, also avoiding test probe from accidentally touching peripheral devices leads to short circuit.

Automatic diagnosis of partial carries out online fault detection by the test macro being attached in system in machine of the invention, Circuit system testability is improved, the functional reliability of system is improved, reduces system maintenance cost, when shortening debugging Between.After present system, the debugging efficiency of veneer increases, and has surveyed veneer, so that it may carry out system test, substantially increase Research and development and production efficiency.

Detailed description of the invention

The entire block diagram of Fig. 1 test macro thus.

Fig. 2 is the flow chart that power supply diagnoses automatically.

Fig. 3 is the flow chart that storage element diagnoses automatically.

Fig. 4 is the flow chart that PE logic diagnoses automatically.

Fig. 5 is that PPMU simulates the flow chart diagnosed automatically.

Specific embodiment:

With reference to the accompanying drawing, the present invention is described in further detail.

As described in Figure 1, the present invention provides a kind of automatic diagnosis methods for integrated circuit tester, including outside Digital spc table, power supply diagnose automatically, diagnose automatically in machine.

As shown in Figure 2, the power supply diagnoses automatically: progress impedance measurement first, digital spc table are placed in impedance shelves, open Beginning cuts relay, switching all the way has been surveyed in addition all the way, until being fully completed；By result and preset Comparative result, such as Quan Fan In enclosing, then start voltage measurement, the process of voltage measurement is as resistance measurement.Finally by all test result and it is preset just True numerical intervals are compared, and obtain diagnostic result；

Under the premise of there is no problem for the automatic diagnostic result of power supply, diagnoses in carry out machine, examined automatically in the machine automatically Disconnected includes that storage element diagnoses automatically, and PE logic diagnoses automatically, PPMU simulation is automatic diagnoses.

As shown in figure 3, the storage unit diagnoses automatically: FPGA generates batch data and writes into storage element differently Location covers whole memory spaces, then reads these data again and is compared into FPGA, all coincide, then stores list There is no problem for the read-write logic of member, and also no problem, diagnosis terminate with storage chip itself for welding；

As shown in figure 4, it includes that FPGA generates waveform, driving chip ADATE305, compares that the PE logic diagnoses automatically Device；The square-wave waveform that FPGA generates preset certain frequency is input to driving chip ADATE305, and driving chip adjusts waveform Level is to meet the input requirements of external chip, while this output waveform will export square wave and default using comparator Level compare, waveform voltage exported than preset level higher position it is high, otherwise output is low, output meets the level standard of FPGA Square wave be finally input to FPGA again, FPGA carries out frequency measurement, if frequency is identical with preset square wave frequency, send and All there is no problem for receives link, and PE logic function diagnoses automatically to be terminated；

As shown in figure 5, the PPMU simulation self-test includes driving chip ADATE305, multiple selector, ADC acquisition Unit；Here driving chip ADATE305 is exactly the driving chip ADATE305 in PE logic function self diagnosis, it exports pre- The voltage set, multiple selector select to enter ADC acquisition unit all the way every time, and FPGA reads this road measurement result and judges Afterwards, judging result is recorded, under multiple selector reselection all the way, continues to measure, until having surveyed all channels.PPMU The automatic diagnosis of simulation terminates.

An integrated circuit tester is diagnosed manually, the time of several days is needed under the premise of there is no problem for hardware, From single-board testing to integral united test, with automatic diagnosis method of the present invention, all works can be completed in a hour Make, has saved a large amount of time for the research and development and production of integrated circuit tester, efficiency greatly improves, and realizes intelligence manufacture.

The foregoing is only a preferred embodiment of the present invention, is not restricted to the present invention, for the technology of this field For personnel, the invention may be variously modified and varied.All within the spirits and principles of the present invention, made any to repair Change, equivalent replacement, improvement etc., should be included within scope of the presently claimed invention.

Claims

1. a kind of automatic diagnosis method for integrated circuit tester, which is characterized in that including external digital spc table, electricity Source diagnoses automatically, diagnoses automatically in machine；

The power supply diagnoses automatically: progress impedance measurement first, digital spc table are placed in impedance shelves, start to cut relay, survey Complete switching all the way is other all the way, until being fully completed；By result and preset Comparative result, such as then start electricity in range entirely Pressure measurement, the process of voltage measurement is as resistance measurement；Last upper computer software is by all test result and preset correct Numerical intervals be compared, obtain diagnostic result；

It under the premise of there is no problem for the automatic diagnostic result of power supply, is diagnosed automatically in carry out machine, diagnosis is wrapped automatically in the machine It includes storage element to diagnose automatically, PE logic diagnoses automatically, PPMU simulation is automatic diagnoses.

The storage unit diagnoses automatically: FPGA generates batch data and writes into storage element different address, covers whole Then memory space reads these data again and is compared into FPGA, all coincide, then the read-write logic of storage unit does not have Problem, also no problem, diagnosis terminate with storage chip itself for welding；

It includes that FPGA generates waveform, driving chip ADATE305, comparator that the PE logic diagnoses automatically；FPGA generates preset The square-wave waveform of frequency is input to driving chip ADATE305, and driving chip adjusts the level of waveform to meet external chip Input requirements, while this output waveform will export square wave using comparator and compare with preset level, waveform voltage It is higher than the output of preset level higher position, on the contrary output is low, and the square wave for exporting the level standard for meeting FPGA is finally input to again FPGA, FPGA carry out frequency measurement and send and receive link if frequency is identical with preset square wave frequency and do not ask Topic, PE logic function diagnoses automatically to be terminated；

The PPMU simulation self-test includes driving chip ADATE305, multiple selector, ADC acquisition unit；Here drive Dynamic chip ADATE305 is exactly the driving chip ADATE305 in PE logic function self diagnosis, it exports preset voltage, multichannel Selector selects to enter ADC acquisition unit all the way every time, and FPGA is read after this road measurement result judges, and judging result is remembered Record is got off, and under multiple selector reselection all the way, continues to measure, until having surveyed all channels；The automatic diagnosis knot of PPMU simulation Beam.